Claims
- 1. A system for making a mask comprising:
- a liquid crystal shutter array;
- means for rendering said liquid crystal shutter array transmissive in a pattern in accordance with mask pattern design data;
- means for supporting a mask blank in alignment with said liquid crystal shutter array; and
- means for exposing a photoresist layer on a mask blank to photoresist-activating illumination through said liquid crystal shutter array in a pattern which produces isolated mask regions intended for sequential exposure of a common area of a common workpiece.
- 2. A system for making a mask comprising:
- a liquid crystal shutter array;
- means for rendering said liquid crystal shutter array transmissive in a pattern in accordance with mask pattern design data;
- means for supporting a mask blank in alignment with said liquid crystal shutter array; and
- means for exposing a photoresist layer on a mask blank to photoresist-activating illumination through said liquid crystal shutter array;
- said means for supporting comprising means for translating said mask to dispose different portions of said mask blank in alignment with said liquid crystal shutter array.
- 3. An exposure station for exposing photoresist disposed on a substrate to a desired pattern of light, comprising:
- a liquid crystal shutter array;
- means for directing a beam of actinic light at said liquid crystal shutter array;
- means for supporting said substrate in alignment with said liquid crystal shutter array for exposure of said photoresist by actinic light which passes through said liquid crystal shutter array; and
- means for activating the cells of said liquid crystal shutter array in a pattern which corresponds to the desired pattern of photoresist exposure, said desired pattern being one which creates isolated mask regions intended for sequential exposure of a common area of a common workpiece.
- 4. The exposure station recited in claim 3 further comprising:
- means for activating the cells of said liquid crystal shutter array in a pattern which corresponds to the desired pattern of photoresist exposure.
- 5. The exposure station recited in claim 3 further comprising:
- means for producing a reduced image on said photoresist to expose said photoresist with finer detail than is present in said liquid crystal shutter.
- 6. A mask for controlling the exposure of photoresist comprising:
- a liquid crystal shutter array; and
- means for activating the cells for said liquid crystal shutter array in a pattern which corresponds to the desired pattern of exposure for said photoresist, said desired pattern being one which creates isolated mask regions intended for sequential exposure of a common area of a common workpiece.
- 7. A mask for controlling photoablation comprising:
- a liquid crystal shutter array; and
- means for activating the cells of said liquid crystal shutter array in a pattern which corresponds to the desired pattern of ablation.
Parent Case Info
This application is a division of application Ser. No. 07/629,084, filed Dec. 17, 1990, which is a continuation of application Ser. No. 07/415,693, filed Oct. 2, 1989, now abandoned.
US Referenced Citations (2)
Number |
Name |
Date |
Kind |
3764211 |
Morse et al. |
Oct 1973 |
|
3824604 |
Stein |
Jul 1974 |
|
Divisions (1)
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Number |
Date |
Country |
Parent |
629084 |
Dec 1990 |
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Continuations (1)
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Number |
Date |
Country |
Parent |
415693 |
Oct 1989 |
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