Number | Name | Date | Kind |
---|---|---|---|
5150366 | Bardell, Jr. et al. | Sep 1992 | A |
5572712 | Jamal | Nov 1996 | A |
6154715 | Dinteman et al. | Nov 2000 | A |
6158033 | Wagner et al. | Dec 2000 | A |
6199184 | Sim | Mar 2001 | B1 |
6260165 | Whetsel | Jul 2001 | B1 |
Entry |
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W. H. McAnney et al., “Improving the Diagnostic Resolution of Built-In Test” Jan. 1988, IBM Technical Disclosure Bulletin vol. 30, No. 8, pp. 478-480. |
E. M. Barna, “Self-Test Diagnosis Using Parallel Superposition” Jul. 1985, IBM Technical Disclosure Bulletin vol. 28 No. 2, pp. 609-614. |
W. H. McAnney, “Diagnosis of Self-Test Failures” Feb. 1984, IBM Technical Disclosure Bulletin vol. 26, No. 9, pp. 4483-4488. |