Methodologies therefor

Industry

CPC
G01R31/318371

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/318371Methodologies therefor

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for integrated circuit testing
- Patent number 12,007,439
- Issue date Jun 11, 2024
- Winbond Electronics Corp.
- Kuo-Min Liao
- G01 - MEASURING TESTING
Information Patent Grant
Data recovery method and measurement instrument
- Patent number 11,846,671
- Issue date Dec 19, 2023
- Rohde & Schwarz GmbH & Co. KG
- Adrian Ispas
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for testing system-on-chip, electronic device usi...
- Patent number 11,846,672
- Issue date Dec 19, 2023
- Hon Hai Precision Industry Co., Ltd.
- Jun-Kui Huang
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 11,726,895
- Issue date Aug 15, 2023
- Kioxia Corporation
- Masashi Niimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reformatting scan patterns in presence of hold type pipelines
- Patent number 11,694,010
- Issue date Jul 4, 2023
- Synopsys, Inc.
- Amit Gopal M. Purohit
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Deterministic stellar built-in self test
- Patent number 11,555,854
- Issue date Jan 17, 2023
- SIEMENS INDUSTRY SOFTWARE INC.
- Yingdi Liu
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing a digital electronic circuit to be tested, corre...
- Patent number 11,531,064
- Issue date Dec 20, 2022
- STMicroelectronics S.r.l.
- Matteo Brivio
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and system for efficient testing of digital integrated circuits
- Patent number 11,494,537
- Issue date Nov 8, 2022
- Palo Alto Research Center Incorporated
- Aleksandar B. Feldman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device
- Patent number 11,431,326
- Issue date Aug 30, 2022
- Samsung Electronics Co., Ltd.
- San Ha Kim
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor device
- Patent number 11,392,478
- Issue date Jul 19, 2022
- Kioxia Corporation
- Masashi Niimura
- G01 - MEASURING TESTING
Information Patent Grant
Safety circuit and method for testing a safety circuit in an automa...
- Patent number 11,353,506
- Issue date Jun 7, 2022
- WAGO Verwaltungsgesellschaft mit beschraenkter Haftung
- Alexander Buelow
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor integrated circuit
- Patent number 11,262,404
- Issue date Mar 1, 2022
- Rohm Co., Ltd.
- Hiromitsu Kimura
- G01 - MEASURING TESTING
Information Patent Grant
Layout-aware test pattern generation and fault detection
- Patent number 11,237,210
- Issue date Feb 1, 2022
- Synopsys, Inc.
- Alodeep Sanyal
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 11,152,922
- Issue date Oct 19, 2021
- Samsung Electronics Co., Ltd.
- San Ha Kim
- G01 - MEASURING TESTING
Information Patent Grant
Performance calculation system, performance calculation method, and...
- Patent number 11,095,251
- Issue date Aug 17, 2021
- Global Unichip Corporation
- Ting-Hao Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reconfiguring monitoring circuitry
- Patent number 11,022,647
- Issue date Jun 1, 2021
- Mentor Graphics Corporation
- Andrew Brian Thomas Hopkins
- G01 - MEASURING TESTING
Information Patent Grant
Fuse-based logic repair
- Patent number 10,853,542
- Issue date Dec 1, 2020
- QUALCOMM Incorporated
- Samit Sengupta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Logic built in self test circuitry for use in an integrated circuit...
- Patent number 10,739,401
- Issue date Aug 11, 2020
- International Business Machines Corporation
- Satya R. S. Bhamidipati
- G01 - MEASURING TESTING
Information Patent Grant
Narrow-parallel scan-based device testing
- Patent number 10,656,205
- Issue date May 19, 2020
- Oracle International Corporation
- Mark Semmelmeyer
- G01 - MEASURING TESTING
Information Patent Grant
Functional diagnostics based on dynamic selection of alternate cloc...
- Patent number 10,585,142
- Issue date Mar 10, 2020
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Grant
Reconfiguring debug circuitry
- Patent number 10,539,615
- Issue date Jan 21, 2020
- UltraSoc Technologies Limited
- Andrew Brian Thomas Hopkins
- G01 - MEASURING TESTING
Information Patent Grant
Automatic test-pattern generation for memory-shadow-logic testing
- Patent number 10,535,416
- Issue date Jan 14, 2020
- STMicroelectronics International N.V.
- Nishu Kohli
- G01 - MEASURING TESTING
Information Patent Grant
Test point insertion for low test pattern counts
- Patent number 10,444,282
- Issue date Oct 15, 2019
- Mentor Graphics Corporation
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Grant
System and method for use in physical design processes
- Patent number 10,437,567
- Issue date Oct 8, 2019
- Cadence Design Systems, Inc.
- Li-Chien Ting
- G01 - MEASURING TESTING
Information Patent Grant
Automated semiconductor platform testing
- Patent number 10,436,838
- Issue date Oct 8, 2019
- Intel Corporation
- Sneha S. Pingle
- G01 - MEASURING TESTING
Information Patent Grant
Generation device, generation method, and program
- Patent number 10,394,676
- Issue date Aug 27, 2019
- International Business Machines Corporation
- Shunichi Amano
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for obtaining a maximally compressed verificat...
- Patent number 10,330,728
- Issue date Jun 25, 2019
- Samsung Electronics Co., Ltd.
- Mrinal Bose
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for controlling wireless device under test using non-link te...
- Patent number 10,326,540
- Issue date Jun 18, 2019
- LitePoint Corporation
- Christian Volf Olgaard
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Multi-bank digital stimulus response in a single field programmable...
- Patent number 10,288,685
- Issue date May 14, 2019
- Keysight Technologies, Inc.
- John H. Guilford
- G01 - MEASURING TESTING
Information Patent Grant
Layout-aware test pattern generation and fault detection
- Patent number 10,254,343
- Issue date Apr 9, 2019
- Synopsys, Inc.
- Alodeep Sanyal
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL TUNING TEST SYSTEM USING PARALLEL OVEN PIPELINES WITH PARAL...
- Publication number 20240353491
- Publication date Oct 24, 2024
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Application
TESTING SYSTEM AND TESTING METHOD
- Publication number 20240345164
- Publication date Oct 17, 2024
- ASMedia Technology Inc.
- Te-Ming Kung
- G01 - MEASURING TESTING
Information Patent Application
FORWARD ERROR CORRECTION (FEC) ENCODED PHYSICAL LAYER TEST PATTERN
- Publication number 20240248135
- Publication date Jul 25, 2024
- Cisco Technology, Inc.
- Fabio Bottoni
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INTEGRATED CIRCUIT TESTING
- Publication number 20240219465
- Publication date Jul 4, 2024
- WINBOND ELECTRONICS CORP.
- Kuo-Min Liao
- G01 - MEASURING TESTING
Information Patent Application
Test Abstraction Data Model
- Publication number 20230266390
- Publication date Aug 24, 2023
- National Instruments Corporation
- Andrew Philip Dove
- G01 - MEASURING TESTING
Information Patent Application
DATA RECOVERY METHOD AND MEASUREMENT INSTRUMENT
- Publication number 20220373596
- Publication date Nov 24, 2022
- ROHDE & SCHWARZ GMBH & CO. KG
- Adrian Ispas
- G01 - MEASURING TESTING
Information Patent Application
SHORT PATTERN WAVEFORM DATABASE BASED MACHINE LEARNING FOR MEASUREMENT
- Publication number 20220373598
- Publication date Nov 24, 2022
- Tektronix, Inc.
- Kan TAN
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR EFFICIENT TESTING OF DIGITAL INTEGRATED CIRCUITS
- Publication number 20220365136
- Publication date Nov 17, 2022
- Palo Alto Research Center Incorporated
- Aleksandar B. Feldman
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20220318121
- Publication date Oct 6, 2022
- KIOXIA Corporation
- Masashi Niimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR TESTING A DIGITAL ELECTRONIC CIRCUIT TO BE TESTED, CORRE...
- Publication number 20220137131
- Publication date May 5, 2022
- STMicroelectronics S.r.l
- Matteo Brivio
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20220085797
- Publication date Mar 17, 2022
- Samsung Electronics Co., Ltd.
- SAN HA KIM
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DETERMINISTIC STELLAR BUILT-IN SELF TEST
- Publication number 20210373077
- Publication date Dec 2, 2021
- Yingdi Liu
- G01 - MEASURING TESTING
Information Patent Application
FUSE-BASED LOGIC REPAIR
- Publication number 20200394274
- Publication date Dec 17, 2020
- QUALCOMM Incorporated
- Samit SENGUPTA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20200395923
- Publication date Dec 17, 2020
- Samsung Electronics Co., Ltd.
- SAN HA KIM
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT
- Publication number 20200309855
- Publication date Oct 1, 2020
- Rohm Co., Ltd.
- Hiromitsu Kimura
- G01 - MEASURING TESTING
Information Patent Application
RECONFIGURING MONITORING CIRCUITRY
- Publication number 20190353705
- Publication date Nov 21, 2019
- UltraSoC Technologies Limited
- Andrew Brian Thomas Hopkins
- G01 - MEASURING TESTING
Information Patent Application
NARROW-PARALLEL SCAN-BASED DEVICE TESTING
- Publication number 20190235023
- Publication date Aug 1, 2019
- Oracle International Corporation
- MARK SEMMELMEYER
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR INTRA-SUBGRAPH OPTIMIZATION IN TUPLE GRAPH PROGRAMS
- Publication number 20190065162
- Publication date Feb 28, 2019
- Google Inc.
- Gautham Thambidorai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for Controlling Wireless Device Under Test Using Non-Link Te...
- Publication number 20180359170
- Publication date Dec 13, 2018
- LITEPOINT CORPORATION
- Christian Volf Olgaard
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR TESTING AN EMBEDDED CONTROLLER
- Publication number 20180348301
- Publication date Dec 6, 2018
- Raytheon Company
- Terence J. McKiernan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR USE IN PHYSICAL DESIGN PROCESSES
- Publication number 20180336017
- Publication date Nov 22, 2018
- Li-Chien Ting
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LOGIC BUILT IN SELF TEST CIRCUITRY FOR USE IN AN INTEGRATED CIRCUIT...
- Publication number 20180306858
- Publication date Oct 25, 2018
- International Business Machines Corporation
- Satya R.S. Bhamidipati
- G01 - MEASURING TESTING
Information Patent Application
Reconfiguring Debug Circuitry
- Publication number 20180188323
- Publication date Jul 5, 2018
- UltraSoC Technologies Limited
- Andrew Brian Thomas Hopkins
- G01 - MEASURING TESTING
Information Patent Application
MONITORING METHOD, MONITORING APPARATUS, AND ELECTRONIC DEVICE
- Publication number 20150323602
- Publication date Nov 12, 2015
- Huawei Technologies Co., Ltd
- Shichun ZHONG
- G01 - MEASURING TESTING
Information Patent Application
Localizing Fault Flop in Circuit by Using Modified Test Pattern
- Publication number 20140281777
- Publication date Sep 18, 2014
- Synopsys, Inc.
- Parthajit Bhattacharya
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR DATA GENERATION
- Publication number 20140143525
- Publication date May 22, 2014
- GENROCKET, INC.
- Hycel B. Taylor
- G01 - MEASURING TESTING
Information Patent Application
LAYOUT-AWARE TEST PATTERN GENERATION AND FAULT DETECTION
- Publication number 20140032156
- Publication date Jan 30, 2014
- Synopsys, Inc.
- Alodeep Sanyal
- G01 - MEASURING TESTING
Information Patent Application
Test Executive System With Process Model Plug-ins
- Publication number 20140006867
- Publication date Jan 2, 2014
- James A. Grey
- G01 - MEASURING TESTING
Information Patent Application
Test Executive System With Processing of Results Data in Chunks
- Publication number 20140006860
- Publication date Jan 2, 2014
- National Instruments Corporation
- James A. Grey
- G01 - MEASURING TESTING
Information Patent Application
Test Executive System With Offline Results Processing
- Publication number 20140006868
- Publication date Jan 2, 2014
- James A. Grey
- G01 - MEASURING TESTING

Methodologies therefor

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and apparatus for integrated circuit testing

Data recovery method and measurement instrument

Method and device for testing system-on-chip, electronic device usi...

Semiconductor device

Reformatting scan patterns in presence of hold type pipelines

Deterministic stellar built-in self test

Method for testing a digital electronic circuit to be tested, corre...

Method and system for efficient testing of digital integrated circuits

Semiconductor device

Semiconductor device

Safety circuit and method for testing a safety circuit in an automa...

Semiconductor integrated circuit

Layout-aware test pattern generation and fault detection

Semiconductor device

Performance calculation system, performance calculation method, and...

Reconfiguring monitoring circuitry

Fuse-based logic repair

Logic built in self test circuitry for use in an integrated circuit...

Narrow-parallel scan-based device testing

Functional diagnostics based on dynamic selection of alternate cloc...

Reconfiguring debug circuitry

Automatic test-pattern generation for memory-shadow-logic testing

Test point insertion for low test pattern counts

System and method for use in physical design processes

Automated semiconductor platform testing

Generation device, generation method, and program

Method and apparatus for obtaining a maximally compressed verificat...

Method for controlling wireless device under test using non-link te...

Multi-bank digital stimulus response in a single field programmable...

Layout-aware test pattern generation and fault detection

Patents Applicationslast 30 patents

OPTICAL TUNING TEST SYSTEM USING PARALLEL OVEN PIPELINES WITH PARAL...

TESTING SYSTEM AND TESTING METHOD

FORWARD ERROR CORRECTION (FEC) ENCODED PHYSICAL LAYER TEST PATTERN

METHOD AND APPARATUS FOR INTEGRATED CIRCUIT TESTING

Test Abstraction Data Model

DATA RECOVERY METHOD AND MEASUREMENT INSTRUMENT

SHORT PATTERN WAVEFORM DATABASE BASED MACHINE LEARNING FOR MEASUREMENT

METHOD AND SYSTEM FOR EFFICIENT TESTING OF DIGITAL INTEGRATED CIRCUITS

SEMICONDUCTOR DEVICE

METHOD FOR TESTING A DIGITAL ELECTRONIC CIRCUIT TO BE TESTED, CORRE...

SEMICONDUCTOR DEVICE

DETERMINISTIC STELLAR BUILT-IN SELF TEST

FUSE-BASED LOGIC REPAIR

SEMICONDUCTOR DEVICE

SEMICONDUCTOR INTEGRATED CIRCUIT

RECONFIGURING MONITORING CIRCUITRY

NARROW-PARALLEL SCAN-BASED DEVICE TESTING

METHOD FOR INTRA-SUBGRAPH OPTIMIZATION IN TUPLE GRAPH PROGRAMS

Method for Controlling Wireless Device Under Test Using Non-Link Te...

SYSTEMS AND METHODS FOR TESTING AN EMBEDDED CONTROLLER

SYSTEM AND METHOD FOR USE IN PHYSICAL DESIGN PROCESSES

LOGIC BUILT IN SELF TEST CIRCUITRY FOR USE IN AN INTEGRATED CIRCUIT...

Reconfiguring Debug Circuitry

MONITORING METHOD, MONITORING APPARATUS, AND ELECTRONIC DEVICE

Localizing Fault Flop in Circuit by Using Modified Test Pattern

SYSTEMS AND METHODS FOR DATA GENERATION

LAYOUT-AWARE TEST PATTERN GENERATION AND FAULT DETECTION

Test Executive System With Process Model Plug-ins

Test Executive System With Processing of Results Data in Chunks

Test Executive System With Offline Results Processing