This invention relates to an improved logic built in self test (LBIST) system and more particularly to a LBIST with distributed SRSG and MISR functions, which facilitate scan vector loading and signature generation. Trademarks: S/390 and IBM are registered trademarks of International Business Machines Corporation, Armonk, N.Y., U.S.A. and Lotus is a registered trademark of its subsidiary Lotus Development Corporation, an independent subsidiary of International Business Machines Corporation, Armonk, N.Y. Other names may be registered trademarks or product names of International Business Machines Corporation or other companies.
Number | Name | Date | Kind |
---|---|---|---|
4071902 | Eichelberger et al. | Jan 1978 | |
4688222 | Blum | Aug 1987 | |
4841485 | Prilik et al. | Jun 1989 | |
5150366 | Bardell et al. | Sep 1992 | |
5239262 | Grutzner et al. | Aug 1993 | |
5278842 | Berry, Jr. et al. | Jan 1994 | |
5313424 | Adams et al. | May 1994 | |
5488612 | Heybruck | Jan 1996 | |
5535164 | Adams et al. | Jul 1996 | |
5553082 | Conner et al. | Sep 1996 | |
5557619 | Rapoport | Sep 1996 | |
5633877 | Shephard, III et al. | May 1997 | |
5659551 | Huott et al. | Aug 1997 | |
5661732 | Lo et al. | Aug 1997 | |
5790564 | Adams et al. | Aug 1998 |
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“Built-In Test for Complex Integrated Circuits”, B. Chinaman, J. Much, G. Zwiehoff, IEEE Journal of solid State Circuits, vol. SC-15, pp. 315-318, Jun. 1980. |
“Circular Self-Test Path: A Low-Cost Bist Technique”, Andrzej Krasniewski, Technical University of Warsaw, Oct. 2, 1986. |
W. H. McAnney et al., “Improving the Diagnostic Resolution of Built-In Test” Jan. 1988, IBM Technical Disclosure Bulletin vol. 30, No. 8, pp. 478-480. |
E. M. Barna, “Self-Test Diagnosis Using Parallel Superposition” Jul. 1985, IBM Technical Disclosure Bulletin vol. 28 No. 2, pp. 609-614. |
W. H. McAnney, “Diagnosis of Self-Test Failures” Feb. 1984, IBM Technical Disclosure Bulletin vol. 26, No. 9, pp. 4483-4488. |