Functional testing

Industry

CPC
G01R31/3181

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/3181Functional testing

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Error protection analysis of an integrated circuit
- Patent number 12,188,979
- Issue date Jan 7, 2025
- International Business Machines Corporation
- Benjamin Neil Trombley
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for performing multiple tests on a device under test
- Patent number 12,181,515
- Issue date Dec 31, 2024
- NANYA TECHNOLOGY CORPORATION
- Chien-Hwa Su
- G01 - MEASURING TESTING
Information Patent Grant
System testing using partitioned and controlled noise
- Patent number 12,174,251
- Issue date Dec 24, 2024
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Grant
Virtual quality control interpolation and process feedback in the p...
- Patent number 12,105,137
- Issue date Oct 1, 2024
- SanDisk Technologies LLC
- Yusuke Ikawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
In system test of chips in functional systems
- Patent number 12,078,678
- Issue date Sep 3, 2024
- NVIDIA Corporation
- Shantanu Sarangi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems, methods, and devices for high-speed input/output margin te...
- Patent number 12,055,584
- Issue date Aug 6, 2024
- Tektronix, Inc.
- Daniel S. Froelich
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test system for memory card
- Patent number 12,038,470
- Issue date Jul 16, 2024
- Huawei Technologies Co., Ltd.
- Weiwen Pang
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for generating command sequence, method and devic...
- Patent number 12,040,030
- Issue date Jul 16, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Yu Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Adaptive port ceiling assignment for background I/O operations betw...
- Patent number 11,994,557
- Issue date May 28, 2024
- Dell Products, L.P.
- Ananthakrishnan Anirudhan
- G01 - MEASURING TESTING
Information Patent Grant
Test architecture for electronic circuits, corresponding device and...
- Patent number 11,940,492
- Issue date Mar 26, 2024
- STMicroelectronics S.r.l.
- Lorenzo Re Fiorentin
- G01 - MEASURING TESTING
Information Patent Grant
Systems, methods, and devices for high-speed input/output margin te...
- Patent number 11,927,627
- Issue date Mar 12, 2024
- Tektronix, Inc.
- Daniel S. Froelich
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test method and apparatus of communication chip, device and medium
- Patent number 11,927,631
- Issue date Mar 12, 2024
- MORNINGCORE TECHNOLOGY CO., CHINA
- Shanzhi Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Parameter setting method and apparatus, system, and storage medium
- Patent number 11,867,760
- Issue date Jan 9, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Hao He
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods to detect cell-internal defects
- Patent number 11,837,308
- Issue date Dec 5, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ankita Patidar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Identifying data valid windows
- Patent number 11,815,554
- Issue date Nov 14, 2023
- Micron Technology, Inc.
- Phillip A. Rasmussen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for reusing manufacturing content across multi...
- Patent number 11,808,811
- Issue date Nov 7, 2023
- Intel Corporation
- Kalyana Kantipudi
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for managing transactions burstiness and generati...
- Patent number 11,797,409
- Issue date Oct 24, 2023
- HCL America Inc.
- Manickam Muthiah
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Programmable scan chain debug technique
- Patent number 11,754,624
- Issue date Sep 12, 2023
- Seagate Technology LLC
- Bharat Londhe
- G01 - MEASURING TESTING
Information Patent Grant
Scheduling of scenario models for execution within different comput...
- Patent number 11,748,240
- Issue date Sep 5, 2023
- Breker Verification Systems
- Adnan Hamid
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit device and operating method thereof
- Patent number 11,740,285
- Issue date Aug 29, 2023
- Kioxia Corporation
- Yuusuke Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
In-system test of chips in functional systems
- Patent number 11,726,139
- Issue date Aug 15, 2023
- NVIDIA Corporation
- Shantanu Sarangi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Transition fault testing of functionally asynchronous paths in an i...
- Patent number 11,709,203
- Issue date Jul 25, 2023
- Texas Instruments Incorporated
- Prakash Narayanan
- G01 - MEASURING TESTING
Information Patent Grant
Simulating memory cell sensing for testing sensing circuitry
- Patent number 11,699,502
- Issue date Jul 11, 2023
- SanDisk Technologies LLC
- Iris Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reformatting scan patterns in presence of hold type pipelines
- Patent number 11,694,010
- Issue date Jul 4, 2023
- Synopsys, Inc.
- Amit Gopal M. Purohit
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Computer-readable recording medium storing analysis program, analys...
- Patent number 11,693,054
- Issue date Jul 4, 2023
- Fujitsu Limited
- Daisuke Maruyama
- G01 - MEASURING TESTING
Information Patent Grant
Reducing leakage power in low-power mode of an integrated circuit d...
- Patent number 11,687,147
- Issue date Jun 27, 2023
- Marvell Asia Pte, Ltd.
- Kushal Kamal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Self diagnostic apparatus for electronic device
- Patent number 11,686,772
- Issue date Jun 27, 2023
- PHOSPHIL INC.
- Byung Kyu Kim
- G01 - MEASURING TESTING
Information Patent Grant
Memory temperature controlling method and memory temperature contro...
- Patent number 11,635,460
- Issue date Apr 25, 2023
- Hefei Core Storage Electronic Limited
- Biao Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Test arrangement for adjusting a setup of testing a device under te...
- Patent number 11,630,146
- Issue date Apr 18, 2023
- Rohde & Schwarz GmbH & Co. KG
- Simon Schmid
- G01 - MEASURING TESTING
Information Patent Grant
Trajectory-optimized test pattern generation for built-in self-test
- Patent number 11,585,853
- Issue date Feb 21, 2023
- SIEMENS INDUSTRY SOFTWARE INC.
- Grzegorz Mrugalski
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ERROR PROTECTION ANALYSIS OF AN INTEGRATED CIRCUIT
- Publication number 20240402246
- Publication date Dec 5, 2024
- International Business Machines Corporation
- BENJAMIN NEIL TROMBLEY
- G01 - MEASURING TESTING
Information Patent Application
COMPRESSION-BASED SCAN TEST SYSTEM
- Publication number 20240393393
- Publication date Nov 28, 2024
- STMicroelectronics International N.V.
- Sandeep Jain
- G01 - MEASURING TESTING
Information Patent Application
DETECTING AND MITIGATING SIDE CHANNEL ATTACKS WITH RAZOR-FLOPS
- Publication number 20240235806
- Publication date Jul 11, 2024
- Microsoft Technology Licensing, LLC
- Bharat S. PILLILLI
- G01 - MEASURING TESTING
Information Patent Application
DETECTING AND MITIGATING SIDE CHANNEL ATTACKS WITH RAZOR-FLOPS
- Publication number 20240137203
- Publication date Apr 25, 2024
- Microsoft Technology Licensing, LLC
- Bharat S. PILLILLI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Automatic Test Pattern Generation-Based Circuit Verification Method...
- Publication number 20240125850
- Publication date Apr 18, 2024
- Huawei Technologies Co., Ltd
- Huiling Zhen
- G01 - MEASURING TESTING
Information Patent Application
PROCESSOR TEST PATTERN GENERATION AND APPLICATION FOR TESTER SYSTEMS
- Publication number 20240118340
- Publication date Apr 11, 2024
- Advantest Corporation
- Edmundo De La Puente
- G01 - MEASURING TESTING
Information Patent Application
GRPC-Based Chip Test Method, GRPC-Based Chip Test Apparatus, and St...
- Publication number 20240103075
- Publication date Mar 28, 2024
- Beijing ESWIN Computing Technology Co., Ltd.
- Zeliang Xie
- G01 - MEASURING TESTING
Information Patent Application
Adaptive Port Ceiling Assignment for Background I/O Operations Betw...
- Publication number 20240085474
- Publication date Mar 14, 2024
- Dell Products, L.P.
- Ananthakrishnan Anirudhan
- G01 - MEASURING TESTING
Information Patent Application
IN SYSTEM TEST OF CHIPS IN FUNCTIONAL SYSTEMS
- Publication number 20230349970
- Publication date Nov 2, 2023
- NVIDIA Corporation
- Shantanu Sarangi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR REUSING MANUFACTURING CONTENT ACROSS MULTI...
- Publication number 20230288479
- Publication date Sep 14, 2023
- Intel Corporation
- Kalyana KANTIPUDI
- G01 - MEASURING TESTING
Information Patent Application
BUILT-IN TESTING IN MODULAR SYSTEM-ON-CHIP DEVICE
- Publication number 20230258720
- Publication date Aug 17, 2023
- Marvell Asia Pte Ltd.
- Xiongzhi Ning
- G01 - MEASURING TESTING
Information Patent Application
GLITCH DETECTOR WITH HIGH RELIABILITY
- Publication number 20230228813
- Publication date Jul 20, 2023
- MEDIATEK INC.
- Tze-Chien Wang
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
APPRATUS FOR PERFORMING MULTIPLE TESTS ON A DEVICE UNDER TEST
- Publication number 20230184821
- Publication date Jun 15, 2023
- NANYA TECHNOLOGY CORPORATION
- Chien-Hwa SU
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM TESTING USING PARTITIONED AND CONTROLLED NOISE
- Publication number 20230094107
- Publication date Mar 30, 2023
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Application
MEMORY TEMPERATURE CONTROLLING METHOD AND MEMORY TEMPERATURE CONTRO...
- Publication number 20230074401
- Publication date Mar 9, 2023
- Hefei Core Storage Electronic Limited
- Biao Zhang
- G01 - MEASURING TESTING
Information Patent Application
PARAMETER SETTING METHOD AND APPARATUS, SYSTEM, AND STORAGE MEDIUM
- Publication number 20230055833
- Publication date Feb 23, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Hao He
- G01 - MEASURING TESTING
Information Patent Application
VIRTUAL QUALITY CONTROL INTERPOLATION AND PROCESS FEEDBACK IN THE P...
- Publication number 20220413036
- Publication date Dec 29, 2022
- SANDISK TECHNOLOGIES LLC
- Yusuke Ikawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPUTER-READABLE RECORDING MEDIUM STORING ANALYSIS PROGRAM, ANALYS...
- Publication number 20220390516
- Publication date Dec 8, 2022
- Fujitsu Limited
- Daisuke Maruyama
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR EFFICIENT TESTING OF DIGITAL INTEGRATED CIRCUITS
- Publication number 20220365136
- Publication date Nov 17, 2022
- Palo Alto Research Center Incorporated
- Aleksandar B. Feldman
- G01 - MEASURING TESTING
Information Patent Application
TEST ARCHITECTURE FOR ELECTRONIC CIRCUITS, CORRESPONDING DEVICE AND...
- Publication number 20220317186
- Publication date Oct 6, 2022
- STMicroelectronics S.r.l
- Lorenzo Re Fiorentin
- G01 - MEASURING TESTING
Information Patent Application
IDENTIFYING DATA VALID WINDOWS
- Publication number 20220229108
- Publication date Jul 21, 2022
- Micron Technology, Inc.
- Phillip A. Rasmussen
- G01 - MEASURING TESTING
Information Patent Application
TEST ASSISTANCE DEVICE, TEST ASSISTANCE METHOD AND STORAGE MEDIUM S...
- Publication number 20220196737
- Publication date Jun 23, 2022
- NEC Corporation
- Kazuki TANABE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20220200595
- Publication date Jun 23, 2022
- NUVOTON TECHNOLOGY CORPORATION JAPAN
- Kazuyuki NAKANISHI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TRANSISTION FAULT TESTING OF FUNTIONALLY ASYNCHRONOUS PATHS IN AN I...
- Publication number 20220196738
- Publication date Jun 23, 2022
- TEXAS INSTRUMENTS INCORPORATED
- PRAKASH NARAYANAN
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DEBUGGING INTEGRATED CIRCUIT SYSTEMS USING...
- Publication number 20220187369
- Publication date Jun 16, 2022
- Western Digital Technologies, Inc.
- Amir Segev
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, METHODS, AND DEVICES FOR HIGH-SPEED INPUT/OUTPUT MARGIN TE...
- Publication number 20220163588
- Publication date May 26, 2022
- Tektronix, Inc.
- Daniel S. Froelich
- G01 - MEASURING TESTING
Information Patent Application
REFORMATTING SCAN PATTERNS IN PRESENCE OF HOLD TYPE PIPELINES
- Publication number 20220137126
- Publication date May 5, 2022
- Synopsys, Inc.
- Amit Gopal M. PUROHIT
- G01 - MEASURING TESTING
Information Patent Application
Test System for Memory Card
- Publication number 20220074986
- Publication date Mar 10, 2022
- Huawei Technologies Co., Ltd
- Weiwen Pang
- G01 - MEASURING TESTING
Information Patent Application
CROSSTALK PATTERN DETECTING DEVICE AND DETECTING METHOD
- Publication number 20220003818
- Publication date Jan 6, 2022
- TCL China Star Optoelectronics Technology Co., Ltd.
- Guangxing XIAO
- G01 - MEASURING TESTING
Information Patent Application
DETERMINISTIC STELLAR BUILT-IN SELF TEST
- Publication number 20210373077
- Publication date Dec 2, 2021
- Yingdi Liu
- G01 - MEASURING TESTING

Functional testing

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Error protection analysis of an integrated circuit

Apparatus for performing multiple tests on a device under test

System testing using partitioned and controlled noise

Virtual quality control interpolation and process feedback in the p...

In system test of chips in functional systems

Systems, methods, and devices for high-speed input/output margin te...

Test system for memory card

Method and device for generating command sequence, method and devic...

Adaptive port ceiling assignment for background I/O operations betw...

Test architecture for electronic circuits, corresponding device and...

Systems, methods, and devices for high-speed input/output margin te...

Test method and apparatus of communication chip, device and medium

Parameter setting method and apparatus, system, and storage medium

Systems and methods to detect cell-internal defects

Identifying data valid windows

Apparatus and method for reusing manufacturing content across multi...

Method and system for managing transactions burstiness and generati...

Programmable scan chain debug technique

Scheduling of scenario models for execution within different comput...

Semiconductor integrated circuit device and operating method thereof

In-system test of chips in functional systems

Transition fault testing of functionally asynchronous paths in an i...

Simulating memory cell sensing for testing sensing circuitry

Reformatting scan patterns in presence of hold type pipelines

Computer-readable recording medium storing analysis program, analys...

Reducing leakage power in low-power mode of an integrated circuit d...

Self diagnostic apparatus for electronic device

Memory temperature controlling method and memory temperature contro...

Test arrangement for adjusting a setup of testing a device under te...

Trajectory-optimized test pattern generation for built-in self-test

Patents Applicationslast 30 patents

ERROR PROTECTION ANALYSIS OF AN INTEGRATED CIRCUIT

COMPRESSION-BASED SCAN TEST SYSTEM

DETECTING AND MITIGATING SIDE CHANNEL ATTACKS WITH RAZOR-FLOPS

DETECTING AND MITIGATING SIDE CHANNEL ATTACKS WITH RAZOR-FLOPS

Automatic Test Pattern Generation-Based Circuit Verification Method...

PROCESSOR TEST PATTERN GENERATION AND APPLICATION FOR TESTER SYSTEMS

GRPC-Based Chip Test Method, GRPC-Based Chip Test Apparatus, and St...

Adaptive Port Ceiling Assignment for Background I/O Operations Betw...

IN SYSTEM TEST OF CHIPS IN FUNCTIONAL SYSTEMS

APPARATUS AND METHOD FOR REUSING MANUFACTURING CONTENT ACROSS MULTI...

BUILT-IN TESTING IN MODULAR SYSTEM-ON-CHIP DEVICE

GLITCH DETECTOR WITH HIGH RELIABILITY

APPRATUS FOR PERFORMING MULTIPLE TESTS ON A DEVICE UNDER TEST

SYSTEM TESTING USING PARTITIONED AND CONTROLLED NOISE

MEMORY TEMPERATURE CONTROLLING METHOD AND MEMORY TEMPERATURE CONTRO...

PARAMETER SETTING METHOD AND APPARATUS, SYSTEM, AND STORAGE MEDIUM

VIRTUAL QUALITY CONTROL INTERPOLATION AND PROCESS FEEDBACK IN THE P...

COMPUTER-READABLE RECORDING MEDIUM STORING ANALYSIS PROGRAM, ANALYS...

METHOD AND SYSTEM FOR EFFICIENT TESTING OF DIGITAL INTEGRATED CIRCUITS

TEST ARCHITECTURE FOR ELECTRONIC CIRCUITS, CORRESPONDING DEVICE AND...

IDENTIFYING DATA VALID WINDOWS

TEST ASSISTANCE DEVICE, TEST ASSISTANCE METHOD AND STORAGE MEDIUM S...

SEMICONDUCTOR DEVICE

TRANSISTION FAULT TESTING OF FUNTIONALLY ASYNCHRONOUS PATHS IN AN I...

METHOD AND APPARATUS FOR DEBUGGING INTEGRATED CIRCUIT SYSTEMS USING...

SYSTEMS, METHODS, AND DEVICES FOR HIGH-SPEED INPUT/OUTPUT MARGIN TE...

REFORMATTING SCAN PATTERNS IN PRESENCE OF HOLD TYPE PIPELINES

Test System for Memory Card

CROSSTALK PATTERN DETECTING DEVICE AND DETECTING METHOD

DETERMINISTIC STELLAR BUILT-IN SELF TEST