| Number | Name | Date | Kind |
|---|---|---|---|
| 3566367 | Gardner et al. | Feb 1971 | |
| 3665173 | Bouricius | May 1972 | |
| 3665418 | Bouricius | May 1972 | |
| 3670148 | Moses | Jun 1972 | |
| 3750173 | Kemerer | May 1972 | |
| 3751685 | Jaeger | Aug 1973 | |
| 3800164 | Miller | Mar 1974 | |
| 3805039 | Stiffler | Apr 1974 | |
| 3818243 | McMahon | Jun 1974 | |
| 3961270 | Ullmann et al. | Jun 1976 | |
| 4493055 | Osman | Jan 1975 | |
| 4606013 | Yoshimoto | Aug 1986 | |
| 4621201 | Amdahl et al. | Nov 1986 | |
| 4689654 | Brockmann | Aug 1987 | |
| 4691123 | Hashimoto | Sep 1987 | |
| 4700187 | Furtek | Oct 1987 | |
| 4709166 | Banker et al. | Nov 1987 |
| Entry |
|---|
| Bond, IBM TDB vol. 15, No. 4, 1972, pp. (1145-1146. |
| Jessep, Jr., IBM TDB vol. 11, No. 10, Mar. 1969, pp. (1227-1228. |
| "Yield and Reliability Enhancement Via Redundancy for VLSI Chips and Wafers", IBM T.D.B., vol. 28, No. 1, Jun. 1985, pp. 36-42. |
| Mano et al., "A Redundancy Circuit for a Fault-Tolerant 256K MOSRAM", IEEE JSSC, vol. SC-17, No. 4, Aug. 1982, pp. 726-730. |