1. Field of the Invention
The present invention relates to a magnetron sputtering apparatus, particularly, relates to a magnetron sputtering apparatus, which enables to expand an erosion area while maintaining higher sputtering efficiency and further enables to improve usable efficiency of target.
2. Description of the Related Arts
A sputtering apparatus has been utilized for forming various kinds of thin films such as conductive films, dielectric films and semiconductive films. A magnetron sputtering apparatus in particular enables to ensure a higher film forming speed by capturing high density plasma in an area neighboring a target.
Further, a magnetron sputtering apparatus enables to generate stable plasma in a pressure range of a high vacuum. The plasma is low in impurity.
Accordingly, a magnetron sputtering apparatus has been established as the mainstream of sputtering apparatuses in the field of forming a thin film.
In
Inside the vacuum chamber 10, the anode 14 is disposed as a substrate holder to hold the substrate 13 of which surface is formed with a thin film, and the cathodic body 16 on which the target 15 is securely placed is disposed so as to confront with the anode 14.
Further, a high frequency power supply 19 is connected to the cathodic body 16 through an impedance matching device 18, wherein the high frequency power supply 19 and the vacuum chamber 10 is grounded respectively.
The cathodic body 16 is further composed of a cylinder section 16a and a target supporting section 16b and disposed inside a cathode shielding section 10a, which constitutes the vacuum chamber 10, through an insulative member 17.
Further, the cathodic body 16 makes the target 15 expose to an open area of the cathode shielding section 10a in the vacuum chamber 10.
Furthermore, the magnetic field generating section 20 is provided at a position close to the target 15 inside the cathodic body 16 and generates magnetic field on a surface of the target 15.
In this particular case, the target 15 is a square flat plate, so that the magnetic field generating section 20 is composed of a yoke 21 in flat plate corresponding to the target 15 and three permanent magnets 22, 23 and 24 in rectangular parallelepiped. The permanent magnets 22, 23 and 24 are fixed on the yoke 21 in parallel with each other. The permanent magnet 22 disposed in the middle of the yoke 21 is magnetized such that a top end surface toward the target supporting section 16b is the N-pole. In case of the permanent magnets 23 and 24 disposed on the both ends of the yoke 21, each top end surface of them toward the target supporting section 16b is magnetized in the S-pole.
Operations of the first conventional magnetron sputtering apparatus are described next.
When electric power is supplied from the high frequency power supply 19 to the cathodic body 16, discharge occurs between the target supporting section 16b, which functions as a cathode, and the anode 14, and resulting in generating plasma in the vacuum chamber 10. Positive ions of the plasma hit impulsively the target 15 on the surface and make atoms of the target 15 scatter inside the vacuum chamber 10. The scattered atoms are deposited on the surface of the substrate 13 as a thin film. In this case, the plasma is converged in a magnetic field, that is, a magnetron area, which is constituted by the magnetic field generating section 20 in a neighborhood of the surface of the target 15. A sputtering efficiency enables to be improved by higher plasma density caused by the converged plasma, and resulting in accelerating film forming speed.
In the above-mentioned first conventional magnetron sputtering apparatus, the magnetic field that confines plasma is statically formed on a part of the surface of the target 15, so that erosion is consequentially concentrated on the part.
As shown in
Various ideas for improving the above-mentioned problem of concentration of erosion have been proposed. Following ideas, for example, have been proposed.
(1) The Japanese publication of unexamined utility model applications No. 05-20303/1993 teaches that sputtering efficiency is improved by constituting a strong toroidal magnetic field on the surface of a target by means of a magnetic circuit in specific configuration.
(2) The Japanese publication of unexamined patent applications No. 05-179441/1993 teaches that rotating a magnetic field generating section 30 shown in
(3) The Japanese publication of unexamined patent applications No. 2002-69637 discloses a magnetic field generating section 40 shown in
According to the Japanese publication of unexamined patent applications No. 2002-69637, as shown in
Accordingly, moving the magnetic field generating section 40 vertically makes a plasma converged area move in the radial direction, and resulting in enabling to expand an erosion area extremely.
According to a magnetron sputtering apparatus that is proposed by the Japanese publication of unexamined utility model applications No. 05-20303/1993, the magnetic circuit for generating a strong toroidal magnetic field is complicated in constitution.
Further, a configuration of a magnetic field is basically identical to that shown in
Accordingly, the magnetron sputtering apparatus proposed by the Japanese publication of unexamined utility model applications No. 05-20303/1993 is not effective to improve usable efficiency of target.
According to the second conventional magnetron sputtering apparatus shown in
Accordingly, the second conventional magnetron sputtering apparatus shown in
According to the third conventional magnetron sputtering apparatus shown in
Accordingly, the third conventional magnetron sputtering apparatus shown in
Accordingly, in consideration of the above-mentioned problems of the prior arts, an object of the present invention is to provide a magnetron sputtering apparatus, which enables to uniform erosion of a target as flat as possible while higher sputtering efficiency is realized. The magnetron sputtering apparatus enables to improve usable efficiency of target as well as sputtering efficiency.
In order to achieve the above object, the present invention provides, according to an aspect thereof, a magnetron sputtering apparatus comprising: a vacuum chamber; a target; a substrate; an anode for supporting the substrate disposed in the vacuum chamber; a cathodic body for supporting the target allocated so as to confront with the anode; and a magnetic field generating section for generating a magnetic field on a surface of the target, being allocated in neighborhood of one side of the cathodic body opposite to the target, wherein the target is in a shape of square flat plate, and wherein the magnetic field generating section is further composed of a yoke in flat plate corresponding to the target, a first permanent magnet in rectangular parallelepiped being disposed in the middle of the yoke and second and third permanent magnets in rectangular parallelepiped being disposed in both end portions of the yoke respectively, the magnetron sputtering apparatus further comprising a driving means for swinging the magnetic field generating section within a prescribed angle with centering a line as an axis of rotation, wherein the line passes through an approximate center of the yoke and is perpendicular to magnetic flux lines of the magnetic field and in parallel with the target.
According to another aspect of the present invention, there provided a magnetron sputtering apparatus comprising: a vacuum chamber; a target; a substrate; an anode for supporting the substrate disposed in the vacuum chamber; a cathodic body for supporting the target allocated so as to confront with the anode; and a magnetic field generating section for generating a magnetic field on a surface of the target, being allocated in neighborhood of one side of the cathodic body opposite to the target, wherein the target is in a shape of circular flat plate, and wherein the magnetic field generating section is further composed of a yoke in circular flat plate having a smaller diameter than the target, a first permanent magnet being disposed in a middle of the yoke and a second permanent magnet in annular shape being disposed in a circumferential area of the target, and wherein the first and second permanent magnets of the magnetic field generating section are designated such that a product of a mean value of magnetic field strength at and an area of a top end surface of the first permanent magnet is larger that another product of a mean value of magnetic field strength at and an area of a top end surface of the second permanent magnet, the magnetron sputtering apparatus further comprising a rotational driving means for revolving the magnetic field generating section in orbital motion with maintaining a distance from the target constant while rotating the magnetic field generating section.
According to a further aspect of the present invention, there provided a magnetron sputtering apparatus comprising: a vacuum chamber; a target; a substrate; an anode for supporting the substrate disposed in the vacuum chamber; a cathodic body for supporting the target allocated so as to confront with the anode; and a magnetic field generating section for generating a magnetic field on a surface of the target, being allocated in neighborhood of one side of the cathodic body opposite to the target, wherein the magnetic field generating section is further composed of a yoke in flat plate corresponding to the target, a first permanent magnet being disposed in the middle of the yoke, a second permanent magnet in annular shape having the same magnetic polarity being disposed in an outer circumferential area of the yoke and a third permanent magnet in annular shape having an inverse magnetic polarity to the first and second permanent magnets being disposed between the first and second permanent magnets, and wherein the first and second permanent magnets of the magnetic field generating section are designated such that a product of a mean value of magnetic field strength at and an area of a top end surface of the third permanent magnet is larger that another product of a mean value of each magnetic field strength at and a sum of each area of top end surfaces of the first and second permanent magnet.
According to a furthermore aspect of the present invention, there provided a magnetron sputtering apparatus comprising: a vacuum chamber; a target; a substrate; an anode for supporting the substrate disposed in the vacuum chamber; a cathodic body for supporting the target allocated so as to confront with the anode; and a magnetic field generating section for generating a magnetic field on a surface of the target, being allocated in neighborhood of one side of the cathodic body opposite to the target, wherein the magnetic field generating section is further composed of a yoke in flat plate corresponding to the target, a first permanent magnet being disposed in the middle of the yoke and a second permanent magnet having an inverse magnetic polarity to the first permanent magnet and magnetic field strength weaker than the first permanent magnet being disposed in an end portion of the yoke with surrounding the first permanent magnet, the magnetron sputtering apparatus further comprising a motion controller unit for moving the magnetic field generating section horizontally and vertically within reach of the magnetic field generated between the first and second permanent magnets to the target.
According to a more aspect of the present invention, there provided a magnetron sputtering apparatus comprising: a vacuum chamber; a target; a substrate; an anode for supporting the substrate disposed in the vacuum chamber; a cathodic body for supporting the target allocated so as to confront with the anode; and a magnetic field generating section for generating a magnetic field on a surface of the target, being allocated in neighborhood of one side of the cathodic body opposite to the target, wherein the magnetic field generating section is further composed of a yoke in flat plate corresponding to the target, a first permanent magnet being disposed in the middle of the yoke and a second permanent magnet having an inverse magnetic polarity to the first permanent magnet and magnetic field strength weaker than the first permanent magnet being disposed in an end portion of the yoke with surrounding the first permanent magnet, the magnetron sputtering apparatus further comprising a slanting motion controller unit for swinging the magnetic field generating section within a prescribed angle while pivoting an approximate center of the magnetic field generating section within reach of the magnetic field generated between the first and second permanent magnets to the target.
Other object and further features of the present invention will be apparent from the following detailed description when read in conjunction with the accompanying drawings.
FIGS. 2(a) to 2(c) are pattern diagrams showing a relationship between a magnetic field (magnetic flux lines) and a target when swinging a magnetic field generating section of the magnetron sputtering apparatus according to the first embodiment of the present invention.
FIGS. 4(a) to 4(c) are pattern diagrams showing a relationship between a magnetic field (magnetic flux lines) and a target when swinging a magnetic field generating section of the magnetron sputtering apparatus according to the second embodiment of the present invention.
FIGS. 17(a) and 17(b) are pattern diagrams showing a relationship between a magnetic field (magnetic flux lines) and a target when a magnetic field generating section of the magnetron sputtering apparatus shown in
FIGS. 2(a) to 2(c) are pattern diagrams showing a relationship between a magnetic field (magnetic flux lines) and a target when swinging a magnetic field generating section of the magnetron sputtering apparatus shown in
In
Inside the vacuum chamber 10, the anode 14 is disposed as a substrate holder to hold the substrate 13 of which surface is formed with a thin film, and the cathodic body 16 on which the target 15 is securely placed is disposed so as to confront with the anode 14.
Further, a high frequency power supply 19 is connected to the cathodic body 16 through an impedance matching device 18, wherein the high frequency power supply 19 and the vacuum chamber 10 is grounded.
The cathodic body 16 is further composed of a cylinder section 16a and a target supporting section 16b and disposed inside a cathode shielding section 10a, which constitutes the vacuum chamber 10, through an insulative member 17.
The magnetic field generating section 50 is provided at a position close to the target 15 inside the cathodic body 16 and generates a magnetic field on a surface of the target 15.
In this first embodiment, the target 15 is a square flat plate, so that the magnetic field generating section 50 is composed of a yoke 51 in flat plate corresponding to the target 15 in square and three permanent magnets 52, 53 and 54 in rectangular parallelepiped. First, second and third permanent magnets 52, 53 and 54 are fixed on the yoke 52 in parallel with each other. The first permanent magnet 52 disposed in the middle of the yoke 51 is magnetized such that a top end surface toward the target supporting section 16b is the N-pole. In case of the second and third permanent magnets 53 and 54 disposed on the both ends of the yoke 51, each top end surface of them toward the target supporting section 16b is magnetized in the S-pole respectively.
The yoke 51 is provided with a hole 55 drilled at the center of a side wall of the yoke 51, so that the magnetic field generating section 50 enables to be supported and pivoted freely by the hole 55. Consequently, the magnetic field generating section 50 enables to be swung to the left and the right within a prescribe angle with centering the hole 55 by means of a driving unit 56 for swinging the magnetic field generating section 50 totally.
As shown in FIGS. 2(a) to 2(d), a magnetic field is configured above the magnetic field generating section 50 by magnetic flux lines between the first permanent magnet 52 disposed in the middle of the yoke 51 and the second and third permanent magnets 53 and 54 disposed on the both ends of the yoke 51.
In case the magnetic field generating section 50 is in neutral state as shown in
In case the magnetic field generating section 50 is swung and slanted to the left as shown in
On the contrary, in case the magnetic field generating section 50 is swung and slanted to the right as shown in
As mentioned above, a plasma converged area moves on the surface of the target 15 as long as the magnetic field generating section 50 is swung by the driving unit 56 while sputtering.
Accordingly, an erosion area reciprocates right and left on the surface of the target 15.
As a result of reciprocating erosion area, an erosion state conducted by the magnetron sputtering apparatus of the first embodiment is exhibited by a block line in
According to the first embodiment of the present invention, the magnetron sputtering apparatus shown in
In the first embodiment of the present invention, top end surfaces of the first permanent magnet 52 and the second and third permanent magnets 53 and 54, which confront with the target supporting section 16b, are magnetized in the N-pole and the S-pole respectively. However, a plasma converged area is independent from the magnetic polarity, so that the same effect enables to be conducted even by the first to third permanent magnets 52, 53 and 54 of which magnetic polarities are inverted respectively.
A magnetron sputtering apparatus according to a second embodiment is identical to that shown in
FIGS. 4(a) to 4(c) are pattern diagrams showing a relationship between a magnetic field (magnetic flux lines) and a target when swinging a magnetic field generating section of the magnetron sputtering apparatus according to the second embodiment of the present invention.
In FIGS. 4(a) to 4(c), a magnetic field generating section 60 is composed of a yoke 61 in flat plate corresponding to the target 15 in square and three permanent magnets 62, 63 and 64 in rectangular parallelepiped. First, second and third permanent magnets 62, 63 and 64 are fixed on the yoke 62 in parallel with each other. The first permanent magnet 62 disposed in the middle of the yoke 61 is magnetized such that a top end surface toward the target supporting section 16b is the N-pole. In case of the second and third permanent magnets 63 and 64 disposed on the both ends of the yoke 61, each top end surface of them toward the target supporting section 16b is magnetized in the S-pole respectively.
The yoke 61 is provided with a hole 65 drilled at the center of a side wall of the yoke 61, so that the magnetic field generating section 60 enables to be supported and pivoted freely by the hole 65. Consequently, the magnetic field generating section 60 enables to be swung to the right and the left within a prescribed angle with centering the hole 65.
Magnetic field strength at the N-pole surface (top end surface) of the first permanent magnet 62 is designated to be disproportionated against magnetic field strength at the S-pole surface (top end surface) of the second or third permanent magnet 63 or 64. Consequently, as shown in FIGS. 4(a) to 4(c), a magnetic field (magnetic flux lines) generated between the first permanent magnet 62 and the second or third permanent magnet 63 or 64 is shifted outward in comparison with the magnetic field shown in FIGS. 2(a) to 2(c) generated by the magnetic field generating section 50 according to the first embodiment of the present invention. More accurately, with defining that a mean value of magnetic field strength at the top end surface of the first permanent magnet 62 is H21, an area of the top end surface of the first permanent magnet 62 is S21, a mean value of each magnetic field strength at the respective top end surfaces of the second and third permanent magnets 63 and 64 is H22, and a summed area of the respective top end surfaces of the second and third permanent magnets 63 and 64 is S22, the first, second and third permanent magnets 62, 63 and 64 are magnetized so as to satisfy a relationship of “H21×S21>H22×S22”.
Accordingly, magnetic flux lines radiated from the top end surface of the first permanent magnet 62 are apt to invade into outside areas of the second and third permanent magnets 63 and 64, and resulting in shifting a magnetic field outward.
When the magnetic field generating section 60 is swung to the left or the right within a prescribed angle with centering the hole 65, the magnetic field generated as mentioned above is formed on the target 15 as shown in FIGS. 4(b) and 4(c).
In this case, one of the second and third permanent magnets 63 and 64 leaves from the target 15 and the other approaches the target 15 alternately when the magnetic field generating section 60 is swung. A magnetic filed generated between the first permanent magnet 62 and either one of the second and third permanent magnets 63 and 64, which departs from the target 15, moves outward extremely.
On the other hand, another magnetic field generated between the first permanent magnet 62 and either one of the second and third permanent magnets 63 and 64, which approaches the target 15, moves inward. A most converged area of plasma also moves outward or inward in accordance with the moving magnetic field.
Consequently, a sputtering process enables to be conducted by making the plasma converged area move to the right and left in the both sides of the target 15 on the surface, and resulting in improving sputtering efficiency and usable efficiency of the target 15 more than the case conducted by the magnetic field generating section 50 according to the first embodiment of the present invention. In
A magnetron sputtering apparatus according to a third embodiment is identical to that shown in
In
Further, with defining that a mean value of magnetic field strength at a top end surface of the first permanent magnet 72 is H31, an area of the top end surface of the first permanent magnet 72 is S31, a mean value of magnetic field strength at a top end surface of the second permanent magnet 73 is H32, and an area of the top end surface of the second permanent magnet 73 is S32, the first permanent magnet 72 and the second permanent magnet 73 is magnetized so as to satisfy a relationship of “H31×S31>H32×S32”.
Furthermore, as shown in
As shown in
Further, the second rotary shaft 76 is mounted with a planet gear mechanism. The planet gear mechanism is composed of a sun gear 77 and a planet gear 78. The sun gear 77 is fixed to the second rotary shaft 76 with centering a center axis of the second rotary shaft 76. The planet gear 78 that engages with the sun gear 77 is mounted on a bottom end of the first rotary shaft 74, wherein the first rotary shaft 74 passes through the rotary platform 75 so as to be rotatable freely. Consequently, a rotational and orbital mechanism is constituted such that the magnetic field generating section 70 is totally revolved in orbital motion with centering the second rotary shaft 76 while rotating with centering the first rotary shaft 74 by rotating the second rotary shaft 76.
According to the magnetron sputtering apparatus of the third embodiment, as mentioned above, magnetic field strength at the top end surface of the first permanent magnet 72 is deferent from that of the second permanent magnet 73, and each top end surface of the first and second permanent magnets 72 and 73 is formed in a shape that is cut by a virtual inclined plane. Therefore, a magnetic field generated by the magnetic field generating section 70 is shifted outward from the center of the target 15A. A magnetic field generated on the top end surface of the second permanent magnet 73, which is closer to the target 15, is shifted further to the inner side of the magnetic field generating section 70. On the contrary, another magnetic field generated on the top end surface of the second permanent magnet 73, which is away from the target 15, is shifted further to the outer side of the magnetic field generating section 70.
As shown in
In other words, each of magnetic flux lines of a magnetic filed that is generated by the magnetic field generating section 70 moves allover the surface of the target 15A while each of the magnetic flux lines describes a locus of the cycloidal curve, and resulting in forming a plasma converged area allover the surface of the target 15A uniformly.
However, an area through which magnetic flux lines do not pass may happen to be produced in case each of the magnetic flux lines always describes the same locus.
Accordingly, it is desirable for the rotation and revolution mechanism shown in
An erosion state of the target 15A according to the third embodiment of the present invention is shown in
Accordingly, by using the magnetron sputtering apparatus according to the third embodiment, usable efficiency of target enables to be improved more.
In the third embodiment, it is defined that each top end surface of the first and second permanent magnets 72 and 73 is formed in the shape being cut by a virtual inclined plane common to them. However, it is not necessary for them that they must be in the same slanting condition. It shall be understood that the first and second permanent magnets 72 and 73 enable to be in any shape as long as a magnetic field between the first permanent magnet 72 and the second permanent magnet 73 is slanted with respect to the surface of the target 15A.
A magnetron sputtering apparatus according to a fourth embodiment is identical to the magnetron sputtering apparatus according to the third embodiment of the present invention except for the magnetic field generating section 70, so that descriptions for the same functions and operations as the third embodiment are omitted and description is mainly given to operations of a magnetic field generating section.
In
The magnetic field generating section 80 generates a magnetic field on the surface of the target 15A under a disproportionated condition, so that relationship between magnetic field strength and an area with respect to the first and second permanent magnets 82 and 83 is the same as the relationship described in the third embodiment above.
Accordingly, the magnetron sputtering apparatus according to the fourth embodiment enables to realize the same erosion state as that of the third embodiment shown in
A magnetron sputtering apparatus according to a fifth embodiment is identical to the magnetron sputtering apparatus according to the third embodiment of the present invention except for the magnetic field generating section 70, so that descriptions for the same functions and operations as the third embodiment are omitted and description is mainly given to operations of a magnetic field generating section.
In
Further, the magnetic field generating section 85 is fixed to the top end of the first rotary shaft 74 with being slanted off the first rotary shaft 74 by a prescribed angle.
The magnetic field generating section 85 generates a magnetic field on the surface of the target 15A under a disproportionated condition, so that relationship between magnetic field strength and an area with respect to the first and second permanent magnets 87 and 88 is the same as the relationship described in the third embodiment above.
Accordingly, the magnetron sputtering apparatus according to the fifth embodiment enables to realize the same erosion state as that of the third embodiment shown in
A magnetron sputtering apparatus according to a sixth embodiment is identical to the magnetron sputtering apparatus according to the third embodiment of the present invention except for the magnetic field generating section 70, so that descriptions for the same functions and operations as the third embodiment are omitted and description is mainly given to operations of a magnetic field generating section.
In
The magnetic field generating section 90 according to the sixth embodiment generates a magnetic field on the surface of the target 15A under a disproportionated condition, so that relationship between magnetic field strength and an area with respect to the first and second permanent magnets 92 and 93 is the same as the relationship described in the third embodiment above.
Accordingly, the magnetron sputtering apparatus according to the sixth embodiment enables to realize the same erosion state as that of the third embodiment shown in
A magnetron sputtering apparatus according to a seventh embodiment is identical to the magnetron sputtering apparatus shown in
In
As shown in
On the other hand, as shown in
In the third permanent magnet 104 (104A), a top end surface toward the target supporting section 16b is inversely magnetized with respect to top end surfaces of the first permanent magnet 102 (102A) and the second permanent magnet 103 (103A). In this seventh embodiment, as shown in
Further, with defining that a mean value of magnetic field strength at the top end surface of the third permanent magnet 104 (104A) is H41, an area of the top end surface of the third permanent magnet 104 (104A) is S41, a mean value of each magnetic field strength at the respective top end surfaces of the first and second permanent magnets 102 (102A) and 103 (103A) is H42, and a summed area of the top end surfaces of the first and second permanent magnets 102 (102A) and 103 (103A) is S42, the first, second and third permanent magnets 102 (102A), 103 (103A) and 104 (104A) are magnetized so as to satisfy a relationship of “H41×S41>H42×S42”.
Consequently, as shown in FIGS. 12 to 13(b), a first magnetic field is generated between the first permanent magnet 102 (102A) and the third permanent magnet 104 (104A), and a second magnetic field is generated between the second permanent magnet 103 (103A) and the third permanent magnet 104 (104A) respectively. On the surface of the target 15 (15A), a magnetic field is generated in two annular areas. However, as shown in
Further, the first, second and third permanent magnets 102 (102A), 103 (103A) and 104 (104A) are disposed closely with respect to each other. Therefore, the first and second magnetic fields, which are formed in the target 15 (15A), appropriately describe a closed loop although an area of the target 15 (15A) is relatively large, and resulting in constituting duplicate plasma converged areas in which magnetron discharge is enabled.
Accordingly, strong erosion occurs in a wide area of duplicated annular magnetic fields, which are formed on the surface of the target 15 (15A). An erosion state of the target 15 (15A) is shown in
In this connection, since a location of a most converged area of plasma is fixed regardless of distance between a top end surface of each permanent magnet and the top surface of the target 15 (15A), an erosion area hardly moves in case magnetic field strength of the permanent magnets of the magnetic field generating section 100 (100A) is not designated to be the above-mentioned disproportionated relationship among them. Consequently, the target 15 (15A) is partially eroded as shown in
In other words, erosion develops only in an annular area, and resulting in forming narrow grooves 105a and 106a. Consequently, sputtering efficiency and usable efficiency of target is extremely deteriorated.
A magnetron sputtering apparatus according to a eighth embodiment is identical to that shown in
FIGS. 17(a) and 17(b) are pattern diagrams showing a relationship between a magnetic field (magnetic flux lines) and a target when a magnetic field generating section of the magnetron sputtering apparatus shown in
As shown in
In FIGS. 17(a) and 17(b), annular areas 116 and 117 move horizontally in accordance with the vertical movement of the magnetic field generating section 100, wherein the annular areas are caused by the first and second magnetic fields that are generated between the first and third permanent magnets 102 and 104 and between the second and third permanent magnets 103 and 104 respectively and constitute a plasma converged area on the surface of the target 15.
As mentioned in the seventh embodiment above, the first magnetic field generated between the first permanent magnet 102 and the third permanent magnet 104 is shifted toward the center of the first permanent magnet 102 and the second magnetic field generated between the second permanent magnet 103 and the third permanent magnet 104 is shifted toward the outer circumferential area of the magnetic field generating section 100. Therefore, the annular area 116 moves outward and the other annular area 117 moves inward, when the magnetic field generatign section 100 is moved upward as shown in
Consequently, an erosion area on the surface of the target 15 is expanded by the movement of the annular areas 116 and 117 in response to the vertical movement of the magnetic field generating section 100, and finally resulting in obtaining an erosion state shown in
Further, erosion is also developed in outer circumferential areas 119 and 120 more than that equivalent to in
Accordingly, it is understood that sputtering efficiency and usable efficiency of target is improved furthermore.
A magnetron sputtering apparatus according to a ninth embodiment is identical to that shown in
In
Further, the magnetic field generating section 200 is linked to a motion controller unit 206 through a shaft 205. The motion controller unit 206 drives the magnetic field generating section 200 to move vertically and horizontally. More accurately, the motion controller unit 206 moves the magnetic field generating section 200 upward first, to the right, downward and finally to the left reciprocally.
As mentioned above, the magnetic field strength of the top end surface of the first permanent magnet 202 is stronger than that of the second permanent magnet 203, so that a magnetic field (magnetic flux lines) that is generated from the first permanent magnet 202 to the second permanent magnet 203 is shifted outward.
When the motion controller unit 206 makes the magnetic field generating section 200 move horizontally within reach of the magnetic field generated between the first and second permanent magnets 202 and 203 to the target 15, the magnetic field moves horizontally. Consequently, an erosion area to be appeared on the surface of the target 15 enables to be expanded horizontally.
Further, when the magnetic field generating section 200 is moved downward, the magnetic field, which is generated between the first permanent magnet 202 and the second permanent magnet 203 and shifted outward, moves outward furthermore on the surface of the target 15. Consequently, the vertical movement of the magnetic field generating section 200 enables to expand an erosion area wider in conjunction with expansion of an erosion area caused by the horizontal movement of the magnetic field generating section 200.
With referring to FIGS. 20 to 24, development of an erosion area is depicted next.
As shown in
As shown in
In this connection, when the magnetic field generating section 200 is moved vertically and horizontally in a sequential motion, the target 15 is resulted in being eroded as shown in
Accordingly, an erosion area in uniform depth enables to be formed over the surface of the target 15 except for the outer circumferential area.
As mentioned above, according to the ninth embodiment of the present invention, the magnetron sputtering apparatus is provided with the magnetic filed generating section 200, which is composed of the first permanent magnet 202 having stronger magnetic field strength and the second permanent magnet 203 having weaker magnetic field strength, and the motion controller unit 206 so as to move the magnetic field generating section 200 vertically and horizontally within reach of the magnetic field generated between the first and second permanent magnets 202 and 203 to the target 15.
Accordingly, by moving the magnetic field generating section 200 vertically and horizontally in a sequential motion, an erosion area enables to be expanded, and resulting in enabling to improve sputtering efficiency and usable efficiency of target.
A magnetron sputtering apparatus according to a tenth embodiment is identical to that shown in
As shown in
With referring to FIGS. 26 to 30, development of an erosion area is depicted next.
As shown in
On the contrary, in the right side of the magnetic field generating section 200, a magnetic field in the right (hereinafter referred to as right magnetic field) is substantially the same condition as the magnetic field shown in
Further, as shown in
In this connection, when the magnetic field generating section 200 is moved horizontally while the magnetic field generating section 200 is slanted to the left and right within the prescribed angle as shown in
Accordingly, by swinging the magnetic field generating section 200 and by moving the magnetic field generating section 200 horizontally in a sequential motion, an erosion area enables to be expanded, and resulting in enabling to improve sputtering efficiency and usable efficiency of target.
As mentioned above, according to the present invention, there provided a magnetron sputtering apparatus, which enables to develop erosion uniformly on a surface of a target, and resulting in improving useable efficiency of target as well as sputtering efficiency.
While the invention has been described above with reference to a specific embodiment thereof, it is apparent that many changes, modifications and variations in configuration, materials and the arrangement of equipment and devices can be made without departing form the invention concept disclosed herein.
Further, it will be apparent to those skilled in the art that various modifications and variations could be made in the magnetron sputtering apparatus field in the present invention without departing from the scope of the invention.
Number | Date | Country | Kind |
---|---|---|---|
2004-154485 | May 2004 | JP | national |
2004-182724 | Jun 2004 | JP | national |