Claims
- 1. A gas sensor comprising:
(a) a microresonator comprising a piezoelectric substrate having a first face and a second opposite face, wherein said first face of said piezoelectric substrate comprises an electrode deposited on said first face; (b) a heat flow sensor coupled thermally to said piezoelectric substrate of said microresonator; and (c) a heat sink coupled thermally to said heat flow sensor;
wherein said microresonator is capable of measuring at least one property of a process of a gas sample interacting with said first face, and said heat flow sensor is capable of measuring the flow of heat from said process to said heat sink.
- 2. The gas sensor of claim 1, wherein said heat flow sensor is capable of simultaneously measuring the flow of heat from said process to said heat sink coupled thermally to said heat flow sensor, in real time with the measurement of said at least one property of said process by said microresonator.
- 3. The gas sensor of claim 1, wherein one of said at least one property of said process measured by said microresonator is mass.
- 4. The gas sensor of claim 1, wherein a property of said process measured by said sensor is a heat per unit mass change.
- 5. The gas sensor of claim 1, wherein a property of said process measured by said sensor is the molar heat of adsorption of a known gas.
- 6. The gas sensor of claim 1, wherein a property of said process measured by said sensor is the heat of reaction.
- 7. The gas sensor of claim 1, wherein said microresonator is selected from the group of microresonators consisting of bulk acoustic wave sensors, quartz crystal microbalances, surface acoustic wave sensors, flexural plate wave sensors, and acoustic plate mode sensors.
- 8. A gas sensor comprising:
(a) a coated microresonator comprising a piezoelectric substrate having a first face and a second opposite face, wherein said first face of said piezoelectric substrate comprises a coating layer deposited on said first face; (b) a heat flow sensor coupled thermally to said piezoelectric substrate of said microresonator and (c) a heat sink coupled thermally to said heat flow sensor;
wherein said microresonator is capable of measuring at least one property of a process of a gas sample interacting with said coating layer, and said heat flow sensor is capable of measuring the flow of heat from said process to said heat sink.
- 9. The gas sensor of claim 8, wherein said heat flow sensor is capable of simultaneously measuring the flow of heat from said process to said heat sink coupled thermally to said heat flow sensor, in real time with the measurement of said at least one property of said process by said microresonator.
- 10. The gas sensor of claim 8, wherein said coating layer is a polymer layer.
- 11. The gas sensor of claim 8, wherein said coating layer is a protein layer.
- 12. The gas sensor of claim 8, wherein one of said at least one property of said process measured by said microresonator is mass.
- 13. The gas sensor of claim 8, wherein one of said at least one property of said process measured by said microresonator is polymer modulus.
- 14. The gas sensor of claim 8, wherein a property of said process measured by said sensor is a heat per unit mass change.
- 15. The gas sensor of claim 8, wherein a property of said process measured by said sensor is the molar heat of adsorption of a known gas.
- 16. The gas sensor of claim 8, wherein a property of said process measured by said sensor is the heat of reaction.
- 17. The gas sensor of claim 8, wherein said microresonator is selected from the group of microresonators consisting of bulk acoustic wave sensors, quartz crystal microbalances, surface acoustic wave sensors, flexural plate wave sensors, and acoustic plate mode sensors.
- 18. A method for measuring a process at an interface of a gas and a solid, the method comprising the steps of:
(a) providing a microresonator which comprises a piezoelectric substrate having a first solid face for directly contacting a gas sample and a second opposite solid face isolated from contacting said sample, said piezoelectric substrate having a resonant frequency and capable of producing a measurement signal based on said resonant frequency; (b) providing a heat flow sensor coupled thermally to said piezoelectric substrate of said microresonator; (c) providing a heat sink coupled thermally to said heat flow sensor; (d) measuring the changes in at least one property of a process of said sample interacting with said first face utilizing said microresonator; and (e) measuring the flow of heat from said process to said heat sink.
- 19. The method of claim 18, wherein said heat flow sensor is capable of simultaneously measuring the flow of heat from said process to said heat sink, in real time with the measurement of said at least one property of said process by said microresonator.
- 20. The method of claim 18, wherein said first solid face comprises a coating layer deposited on said first solid face.
RELATED APPLICATION
[0001] This application claims priority to U.S. Provisional Patent Application No. 60/067,239, filed Dec. 2, 1997, and is a continuation of U.S. patent application Ser. No. 09/585,815, filed May 26, 2000, which is a continuation of U.S. patent application Ser. No. 09/203,940, filed Dec. 2, 1998, now U.S. Pat. No. 6,106,149.
Provisional Applications (1)
|
Number |
Date |
Country |
|
60067239 |
Dec 1997 |
US |
Continuations (2)
|
Number |
Date |
Country |
Parent |
09585815 |
May 2000 |
US |
Child |
09768652 |
Jan 2001 |
US |
Parent |
09203940 |
Dec 1998 |
US |
Child |
09585815 |
May 2000 |
US |