Claims
- 1. An analytical method for analyzing the structure of an ionized sample on the basis of the mass spectrometric data measured on said sample and the mass spectrometric data of dissociated ions obtained by cleaving said sample as a parent ion, whereinat least one of the thermal, chemical energetic properties of the candidates of said parent ion acquired on the basis of said mass spectrometric data is calculated to derive the structural characteristics of the parent ion candidates; in that the dissociated ions of the parent ion candidates are derived as dissociated ion candidates on the basis of the characteristics; and in that said parent ion candidates are evaluated by comparing the mass spectra of said dissociated ion candidates and said dissociated ions measured, thereby to identify said parent ion.
- 2. A mass spectrometric data analyzing method as set forth in claim 1, wherein the interatomic bonding strength of said parent ion candidates is derived as the structural characteristics of said parent ion candidates.
- 3. A mass spectrometric data analyzing method as set forth in claim 1, wherein the reactivity of said parent ion candidates is derived as the structural characteristics of said parent ion candidates.
- 4. A mass spectrometric data analyzing method as set forth in claim 1, wherein an activation energy or a dissociation energy is derived as the structural characteristics of said parent ion candidates.
- 5. A mass spectrometric data analyzing method as set forth in claim 1, wherein the bondability of protons or dissociativeness of the atoms constructing said parent ion candidates is derived as the structural characteristics of said parent ion candidates.
- 6. A mass spectrometric data analyzing method as set forth in claim 5, wherein the charge distribution or static potential in the neutral state is derived as the bondability or dissociativeness of protons.
- 7. A mass spectrometric data analyzing method as set forth in claim 1, wherein the molecular orbit of said parent ion candidates is derived as the structural characteristics of said parent ion candidates.
- 8. A mass spectrometric data analyzing method as set forth in claim 7, wherein said molecular orbit is at least one of the highest occupied orbit, the lowest unoccupied orbit, the peripheral molecular orbit of the highest occupied orbit and the peripheral molecular orbit of the lowest unoccupied orbit of said parent ion candidates.
- 9. A mass spectrometric data analyzing method as set forth in claim 8, wherein the unbondability of said parent ion candidates is derived on the basis of said molecular orbit.
- 10. A mass spectrometric data analyzing method as set forth in claim 1, wherein molecular orbit calculations, molecular kinetic calculations or molecular dynamic calculations are done on said parent ion candidates for deriving the structural characteristics of said parent ion candidates.
Priority Claims (1)
Number |
Date |
Country |
Kind |
2002-185072 |
Jun 2002 |
JP |
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Parent Case Info
This is a continuation of U.S. patent application Ser. No. 10/253,481, filed Sep. 25, 2002, the entire disclosure of which is incorporated herein by reference.
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Date |
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5932384 |
Mitsumori et al. |
Aug 1999 |
A |
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Aug 2000 |
A |
6483109 |
Reinhold et al. |
Nov 2002 |
B1 |
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Number |
Date |
Country |
08180830 |
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JP |
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Apr 2002 |
JP |
Continuations (1)
|
Number |
Date |
Country |
Parent |
10/253481 |
Sep 2002 |
US |
Child |
10/361599 |
|
US |