Claims
- 1. A mass spectrometer comprising a sprayer for spraying a sample solution, a needle electrode for ionizing the sample contained in said sample solution, an aperture for introducing the ions of said sample into a lower pressure region having a pressure lower than a pressure of a region in which said needle electrode is disposed, and a mass spectrometric apparatus for analyzing the ions introduced from said aperture, wherein a direction of a spray caused by said sprayer is one of substantially perpendicular to and at an angle with respect to a center axis of said aperture, and a tip of said needle electrode is disposed facing an electrode having said aperture therein.
- 2. A mass spectrometer comprising a sprayer for spraying a sample solution by heating, a needle electrode for ionizing the sample contained in said sample solution, an aperture for introducing the ions of said sample into a lower pressure region having a pressure lower than a pressure of a region in which said needle electrode is disposed, and a mass spectrometric apparatus for analyzing the ions introduced from said aperture, wherein a direction of a spray caused by said sprayer is at an angle with respect to a center axis of said aperture, the direction of said spray is directed toward a wall surface, and a tip of said needle electrode is disposed facing an electrode having said aperture therein.
- 3. A mass spectrometer according to claim 2, wherein a vaporizer is disposed between said sprayer and said needle electrode.
- 4. A mass spectrometer according to claim 2, wherein said vaporizer includes means for heating and a metallic block.
- 5. A mass spectrometer comprising a sprayer for spraying a sample solution by heating, a needle electrode for ionizing the sample contained in said sample solution, an aperture for introducing the ions of said sample into a lower pressure region having a pressure lower than a pressure of a region in which said needle electrode is disposed, and a mass spectrometric apparatus for analyzing the ions introduced from said aperture, wherein a direction of a jet stream caused by said sprayer is at an angle with respect to a center axis of said aperture, and a tip of said needle electrode is disposed facing an electrode having said aperture therein.
Priority Claims (1)
Number |
Date |
Country |
Kind |
6-292589 |
Nov 1994 |
JP |
|
CROSS REFERENCE TO RELATED APPLICATION
This is a continuation of U.S. application Ser. No. 09/492,352, filed Jan. 27, 2000 now U.S. Pat. No. 6,252,225, which is a continuation of U.S. application Ser. No. 08/968,898, filed Nov. 6, 1997, U.S. Pat. No. 6,121,608, issued Sep. 19, 2000, which is a continuation of U.S. application Ser. No. 08/562,369, filed Nov. 22, 1995, now abandoned, the subject matter of which is incorporated by reference herein.
US Referenced Citations (19)
Foreign Referenced Citations (4)
Number |
Date |
Country |
60-079656 |
May 1985 |
JP |
5-325882 |
Dec 1993 |
JP |
61-02246 |
Apr 1994 |
JP |
6-102246 |
Apr 1994 |
JP |
Non-Patent Literature Citations (3)
Entry |
“Characteristics of a Liquid Chromatograph/Atmospheric Pressure Ionization Mass Spectrometer”, M. Sakairi et al, pp. 774-780, 1988. |
“A Mass Spectrometric Study of Positive and Negative Ion Formation in an SF6 Corona. Part I: Sources of Sulphur-Fluoride Ions”, I. Sauers et al, 1261, Journal of Physics D: Applied Physics 25, May 14, 1992, No. 5, Bristol, GA, pp. 761-773. |
“Atmospheric-Pressure-Ionization Mass Spectrometry II. Applications in Pharmacy, Biochemistry and General Chemistry”, A. P. Bruins, 8196 Trac: Trends in Analytical Chemistry, Feb. 13, 1994, No. 2, Amsterdam, NL pp. 81-90. |
Continuations (3)
|
Number |
Date |
Country |
Parent |
09/492352 |
Jan 2000 |
US |
Child |
09/859508 |
|
US |
Parent |
08/968898 |
Nov 1997 |
US |
Child |
09/492352 |
|
US |
Parent |
08/562369 |
Nov 1995 |
US |
Child |
08/968898 |
|
US |