Claims
- 1. A material analyzing apparatus, comprising an analyzer body, the analyzer body including:
a material casing; material analyzing circuitry, the material analyzing circuitry comprising a transmitter, a receiver, and a control, an antenna system, the antenna system comprising a transmitting antenna, a receiving antenna, and a ground layer; and a coupling structure that couples the antenna system to the material analyzing circuitry, wherein the transmitter of the material analyzing circuitry generates an electromagnetic wave signal, the electromagnetic wave signal being adapted to be sent by the transmitting antenna into a material to be analyzed, the receiving antenna receiving a returned signal from the material, the returned signal then sent to the receiver and to the control, the control then able to analyze the returned signal for material characteristics of the material, wherein the transmitting antenna and the receiving antenna of the antenna system and the ground layer comprise a configuration of a two conductor transmission line with in-between ground layer, and wherein the antenna system provides a uniform coverage and does not present dead zones and provides field shaping that results in return signals being less effected by material surface properties, characteristics, and configurations of a material surface of the material.
- 2. The material analyzing apparatus of claim 1, wherein the material characteristics comprise at least one of density, segregation, and moisture content.
- 3. The material analyzing apparatus of claim 1, wherein the transmitting antenna and the receiving antenna of the antenna system and the ground layer comprise a configuration of a “Z”.
- 4. A material analyzing apparatus for measuring density of a material, the apparatus comprising:
an analyzer body, the analyzer body comprising a material casing; material analyzing circuitry, the material analyzing circuitry comprising a transmitter, a receiver, and a control; an antenna system, the antenna system comprising a transmitting antenna, a receiving antenna, and a ground layer; a coupling structure that couples the antenna system to the material analyzing circuitry; wherein the transmitter of the material analyzing circuitry generates an electromagnetic wave signal, the electromagnetic wave signal being adapted to be sent by the transmitting antenna into a material to be adapted to be sent by the transmitting antenna into a material to be analyzed, the receiving antenna receiving a returned signal from the material, the returned signal then sent to the receiver and to the control, the control then able to analyze the returned signal for material characteristics of the material, the density of the material being linearly related to a returned signal, and the control is adapted to determine a density D being generally equal to a measured returned voltage V on the antenna times a constant slope m, plus an offset b, in accordance with: D=m×V+b, and wherein the transmitting antenna and the receiving antenna of the antenna system and the ground layer comprise a configuration of a two conductor transmission line with in-between ground layer, wherein the antenna system provides a uniform coverage and does not present dead zones and provides field shaping that results in return signals being less effected by material surface properties, characteristics, and configurations of a material surface of the material.
- 5. The material analyzing apparatus of claim 4, wherein the transmitting antenna and the receiving antenna of the antenna system and the ground layer comprise a configuration of a “Z.
- 6. A method for analyzing a material, the method comprising:
providing an analyzer body, the analyzer body comprising a material casing; providing material analyzing circuitry, the material analyzing circuitry comprising a transmitter, a receiver, and a control; providing an antenna system, the antenna system comprising a transmitting antenna, a receiving antenna, and a ground layer; coupling the antenna system to the material analyzing circuitry; generating an electromagnetic wave signal; transmitting the electromagnetic wave signal by the transmitting antenna; directing the signal to be analyzed into the material; receiving a returned signal from the material; sending the returned signal to the receiver and control; and analyzing the returned signal for material characteristics of the material, wherein the transmitting antenna and the receiving antenna of the antenna system and the ground layer comprise a configuration of a two conductor transmission line with in-between ground layer, and wherein the antenna system provides a uniform coverage and does not present dead zones and provides field shaping that results in return signals being less effected by material surface properties, characteristics, and configurations of a material surface of the material.
- 7. The method of claim 6, wherein the transmitting antenna and the receiving antenna of the antenna system and the ground layer comprise a configuration of a “Z”.
- 8. The method of claim 6, wherein the material characteristics of the material include moisture content of the material.
- 9. The method of claim 8, wherein analyzing the returned signal comprises measuring a phase shift caused by the moisture content of the material.
- 10. A method for analyzing a material for measuring density of a material, the method comprising:
providing an analyzer body, the analyzer body comprising a material casing; providing material analyzing circuitry, the material analyzing circuitry comprising a transmitter, a receiver, and a control; providing an antenna system, the antenna system comprising a transmitting antenna, a receiving antenna, and a ground layer; coupling the antenna system to the material analyzing circuitry; and generating an electromagnetic wave signal; transmitting the electromagnetic wave signal by the transmitting antenna; directing the signal to be analyzed into the material; receiving any returned signal from the material; sending the returned signal to the receiver and control; and analyzing the signal for material density characteristics of the material; the density of the material being linearly related to a returned signal, and determining density D being generally equal to a measured returned voltage V times a constant slope m, plus an offset b, in accordance with: D=m×V+b. wherein the transmitting antenna and the receiving antenna of the antenna system and the ground layer comprise a configuration of a two conductor transmission line with in-between ground layer, wherein the antenna system provides a uniform coverage and does not present dead zones and provides field shaping that results in return signals being less effected by material surface properties, characteristics, and configurations of a material surface of the material.
- 11. The method of claim 10, wherein the transmitting antenna and the receiving antenna of the antenna system and the ground layer comprise a configuration of a “Z”.
Parent Case Info
[0001] The present patent application is a continuation-in-part of copending U.S. patent application Ser. No.: 09/864,050, filed May 23, 2001 and entitled “Material Segregation and Density Analyzing Apparatus and Method.”
Continuation in Parts (1)
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Number |
Date |
Country |
| Parent |
09864050 |
May 2001 |
US |
| Child |
10159675 |
May 2002 |
US |