ord et al. "A Computer-Operated Following Ellipsometer" Applied Optics, 10-67, pp. 1673-1677. |
Richartz; M. "Mesmethoden des MacCullaghschen Kompensators" Zeitschrift fur Instrumentenkunde vol. 74, 4-66, pp. 120-125. |
Aspnes et al. "High Precision Scanning Ellipsometer" Applied Optics, vol. 14, 1-75, pp. 220-228. |
Kent et al. "A Photoelectric Method for the Determination of the Parameters of Elliptically Polarized Light," Jr. Optical Soc. of America vol. 27, 3-1937 pp. 117-119. |
Reinberg, A. R. "Ellipsometer Data Analysis with a Small Programmable Desk Calculator", Applied Optics vol. 11, 5-72, pp. 1273-1274. |
Born et al. "Principles of Optics," MacMillan Co. 1964 pp. 554-555. |