The present invention relates to transducers for converting sound waves into electrical signals, in particular to a micro-electro-mechanical systems (MEMS) microphone.
With the development of wireless communication, the users have increasingly higher requirements for the call quality of mobile phones, and the design of microphone as a speech pickup device has a direct influence on the call quality of mobile phone.
As MEMS technology is featured by miniaturization, good integratability, high performance, low cost and the like, it has been appreciated by the industry, and MEMS microphone is widely used in current mobile phones; the common MEMS microphone is capacitive, i.e., including a vibrating diaphragm and a back plate which both constitutes a MEMS acoustic sensing capacitance, and the MEMS acoustic sensing capacitance further outputs an acoustic signal to a processing chip for signal processing by connecting to the processing chip through a connecting plate. To further improve the performance of MEMS microphone, a dual-diaphragm MEMS microphone structure has been proposed in the prior art, i.e., two layers of vibrating diaphragm are used to constitute a capacitance structure with the back plate respectively.
However, the pressure in the space between the back plate and the diaphragm is usually less than the external pressure or vacuum. The environmental pressure makes the diaphragm deflect, which reduces the reliability and sensitivity of MEMS devices.
Therefore, it is necessary to provide an improved MEMS microphone with equal internal and external pressure.
Many aspects of the exemplary embodiments can be better understood with reference to the following drawings. The components in the drawing are not necessarily drawn to scale, the emphasis instead being placed upon clearly illustrating the principles of the present invention.
The present invention will hereinafter be described in detail with reference to several exemplary embodiments. To make the technical problems to be solved, technical solutions and beneficial effects of the present invention more apparent, the present invention is described in further detail together with the figure and the embodiments. It should be understood the specific embodiments described hereby is only to explain the invention, not intended to limit the invention.
Referring to
The material of the base 101 is preferably semiconductor material, such as silicon, which has a back cavity 102, a first surface 101A and a second surface 101B opposite to the first surface, an insulation layer 107 provided on the first surface 101A of the base 101 with a back cavity 102 through the insulation layer 107, and the first and second surfaces of the base 101. Wherein the back cavity 102 can be formed through corrosion by a bulk-silicon process and dry method.
The capacitance system 103 comprises a back plate 105 and a first vibrating diaphragm 104 and a second vibrating diaphragm 106 provided opposite to the back plate 105 at the two upper and lower sides of the back plate 105 respectively, with an insulation layer 107 provided between all the first vibrating diaphragm 104 and the back plate 105, the second vibrating diaphragm 106 and the back plate 105, the vibrating diaphragm 104 and the base 101. The central main body area 105A of the back plate 105 includes an acoustic through-hole 108 arranged at intervals. In the present invention, the central main body area of the back plate 105 is, for example, the area corresponding to the back cavity 102, and the area outside the area is the edge area of the back plate 105, and the areas on the left and right sides are respectively the first edge area 105B and the second edge area 105C. The supporting part 109 penetrates through the acoustic through hole 108 to fixedly connect the first vibrating diaphragm 104 with the second vibrating diaphragm 106. Specifically, the supporting part 109 is abutted with a top surface of the first vibrating diaphragm 104 and a bottom surface of the second vibrating diaphragm 106 respectively. The acoustic through hole 108 communicates with the area between the first vibrating diaphragm 104 and the second vibrating diaphragm 106 to form an internal cavity 110. When the MEMS microphone is powered on to work, the first vibrating diaphragm 104 and the back plate 105, the second vibrating diaphragm 106 and the back plate 105 will carry charges of opposite polarity to form capacitance, when the first vibrating diaphragm 104 and the second vibrating diaphragm 106 vibrate under the action of acoustic wave, the distance between the back plate 105 and the first vibrating diaphragm 104, between it and the second vibrating diaphragm 106 will change, so as to cause changes in capacitance of the capacitance system, which in turn converts the acoustic wave signal into an electrical signal to realize corresponding functions of the microphone.
In this embodiment, the first vibrating diaphragm 104 and the second vibrating diaphragm 106 are square, round or elliptical, at least one supporting part 109 is placed between the bottom surface of the first vibrating diaphragm 104 and the top surface of the second vibrating diaphragm 106.
The supporting part 109 is placed to penetrate through the acoustic through hole 108 of the back plate 105 to fixedly connect the first vibrating diaphragm 104 and the second vibrating diaphragm 106; i.e., the supporting part 109 has no contact with the back plate 105 and no influence from the back plate 105.
The supporting part 109 can be formed on the top surface of the first vibrating diaphragm 104 with all kinds of preparing technology, such as physical vapor deposition, electrochemical deposition, chemical vapor deposition and molecular beam epitaxy.
The supporting part 109 can be constituted by semiconductor material such as silicon or can comprise semiconductor material such as silicon. For example, germanium, SiGe, silicon carbide, gallium nitride, indium, indium gallium nitride, indium gallium arsenide, indium gallium zinc oxide or other element and/or compound semiconductor (e.g., III-V compound semiconductor or II-VI compound semiconductor such as gallium arsenide or indium phosphide, or ternary compound semiconductor or quaternary compound semiconductor). It can also be constituted by or comprise at least one of the followings: metal, dielectric material, piezoelectric material, piezo-resistive material and ferroelectric material. It can also be made from dielectric material such as silicon nitride.
According to the embodiments, the supporting part 109 can be integrally molded with the first vibrating diaphragm 104 and the second vibrating diaphragm 106.
According to each embodiment, the second diaphragm 106 of the present invention includes a releasing hole 111. The releasing hole 111 is sealed by a dielectric material 112.
According to various embodiments, the first edge area 105B of the present invention includes a first barrier releasing structure 113 penetrating the back plate to isolate the acoustic through hole 108 and the insulation layer 107; the second edge area 105C includes a plurality of second barrier releasing structure 114 spaced on the back plate 105, and the second barrier releasing structure is separated from the acoustic through hole 108 and the insulation layer 107.
The releasing hole 111 is communicated with the internal cavity 110, so it allows to eliminate the sacrifice oxidation layer inside the internal cavity 110 by using a releasing solution such as BOE solution or HF vapor-phase etching technology, as the barrier releasing structures 113, 114 exist, the insulation layer 107 between the first vibrating diaphragm and the second vibrating diaphragm is preserved.
According to the embodiments, it also comprises the extraction electrodes of the first vibrating diaphragm 104, the second vibrating diaphragm 106 and the back plate 105, correspondingly a first electrode 115, a second electrode 116, a third electrode 117.
According to the embodiments, it also comprises a passivation protective layer of surface 118 which simultaneously has a function to achieve mutual insulation among the first electrode 115, the second electrode 116, the third electrode 117.
Refer to
The structure of the present invention is made by conventional semiconductor process, wherein the insulation layer 107 is silicon dioxide, the material of the first diaphragm and the second diaphragm is polycrystalline silicon material, and the back plate is a composite laminated structure composed of polycrystalline silicon whose upper and lower surfaces are all silicon nitride.
In the MEMS microphone structure provided by the present invention, the pressure in the inner cavity of the double diaphragm is the same as that of the outside, the influence of the environmental pressure on the performance of the device is avoided, and the reliability and sensitivity of the device are improved.
It is to be understood, however, that even though numerous characteristics and advantages of the present exemplary embodiments have been set forth in the foregoing description, together with details of the structures and functions of the embodiments, the invention is illustrative only, and changes may be made in detail, especially in matters of shape, size, and arrangement of parts within the principles of the invention to the full extent indicated by the broad general meaning of the terms where the appended claims are expressed.
Number | Date | Country | Kind |
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201822279342.8 | Dec 2018 | CN | national |
Number | Name | Date | Kind |
---|---|---|---|
20150001647 | Dehe | Jan 2015 | A1 |
20160167946 | Jenkins | Jun 2016 | A1 |
20180146296 | Meisel | May 2018 | A1 |
20190023562 | Fueldner | Jan 2019 | A1 |
20200204925 | Zou | Jun 2020 | A1 |
20200365447 | Mays | Nov 2020 | A1 |
Number | Date | Country |
---|---|---|
103702268 | Apr 2014 | CN |
107666645 | Feb 2018 | CN |
107835477 | Mar 2018 | CN |
Entry |
---|
PCT search report dated Jan. 15, 2020 by SIPO in related PCT Patent Application No. PCT/CN2019/113317 (4 Pages). |
Number | Date | Country | |
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20200213690 A1 | Jul 2020 | US |