This is a continuation of application Ser. No. 08/329,231 filed Oct. 26, 1994, now abandoned.
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---|---|---|---|
438406 | Dewey | Oct 1890 | |
2767466 | Faulkner | Oct 1956 | |
2892431 | Killian et al. | Jun 1959 | |
4041746 | Kraft | Aug 1977 | |
4290876 | Nishiyama et al. | Sep 1981 | |
4341816 | Lauterbach et al. | Jul 1982 | |
4885075 | Hillman | Dec 1989 | |
4889772 | Bergmann et al. | Dec 1989 | |
4953778 | Critton et al. | Sep 1990 | |
4961831 | Bergmann et al. | Oct 1990 | |
4961832 | Shagun et al. | Oct 1990 | |
4963239 | Shamura et al. | Oct 1990 | |
4963240 | Fukasawa et al. | Oct 1990 | |
4964962 | Nobutani et al. | Oct 1990 | |
4964968 | Arita | Oct 1990 | |
4964969 | Kasakube et al. | Oct 1990 | |
4966676 | Fukasawa et al. | Oct 1990 | |
4966677 | Aichert et al. | Oct 1990 | |
4971674 | Hata | Nov 1990 | |
5009765 | Qamar et al. | Apr 1991 | |
5143590 | Strothers et al. | Sep 1992 | |
5282943 | Lannutti et al. | Feb 1994 |
Number | Date | Country |
---|---|---|
6158497 | Jul 1994 | JPX |
1648601 | May 1991 | SUX |
Entry |
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J.A. Dunlop et al., "Effects of aluminum silicon copper sputtering target processing methods on thin film uniformity and process control during very large scale integrated device fabrication", Journal of Vacuum Science & Technology, Second Series, vol. 11, No. 4, Part 1, Jul./Aug. 1993, pp. 1558-1565. |
Number | Date | Country | |
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Parent | 329231 | Oct 1994 |