Claims
- 1. An apparatus for measuring the index of refraction for a formation fluid sample, comprising:
a channel in communication with a formation for capturing a sample from the formation; a light source for directing light towards an interface between the channel through a first channel wall and into a region of investigation for a sample contained in the channel; a stray light reduction device for reducing a stray light from entering the electronic analysis system; and an electronic analysis system for measuring a light signal reflected from the sample at the interface.
- 2. The apparatus of claim 1, the fluid channel further comprising:
wherein the stray light reduction device comprises a non reflective material intercepting light entering a sample beyond the region of investigation.
- 3. The apparatus of claim 2, further comprising:
Wherein the non reflective material is black.
- 4. The apparatus of claim 1, wherein the light source is placed in a black chrome plated housing.
- 5. The apparatus of claim 1 further comprising:
wherein the light reduction device comprises a black matte coating.
- 6. The apparatus of claim 1, wherein the light reduction device comprises a spiral pattern on the inside of the apparatus for reducing reflected stray light.
- 7. The apparatus of claim 1, further comprising:
a optical filter for selecting an optimally absorbing wavelength of light.
- 8. The apparatus of claim 7, wherein the optimally absorbing wavelength of light is 1740 nm.
- 9. A method for measuring the index of refraction for a formation fluid sample, comprising:
capturing a sample from the formation in a channel; directing light towards an interface between a first channel wall and into a region of investigation in the sample contained in the channel; and measuring an amount of light at an optimally absorbing wavelength reflected from the interface.
- 10. The method of claim 9, the fluid channel further comprising:
intercepting light entering a sample beyond the region of investigation.
- 11. The method of claim 10:wherein the non reflective material is black.
- 12. The method of claim 9, wherein the light source is placed in a black chrome housing.
- 13. The method of claim 9 further comprising:
wherein the light reduction device comprises a black matte coating.
- 14. The method of claim 9, wherein the light reduction device comprises a spiral pattern on the inside of the apparatus for reducing reflected stray light.
- 15. The method of claim 9, further comprising:
filtering out all but an optimally absorbing wavelength of light.
- 16. The method of claim 15, wherein the optimally absorbing wavelength of light is 1740 nm.
- 17. A computer readable medium containing instructions which when executed by a computer perform a method for measuring the index of refraction for a formation fluid sample, comprising:
capturing a sample from the formation; directing light towards an interface between the channel through a first channel wall and into a region of investigation for a sample contained in the channel; reducing a stray light from entering the electronic analysis system; and measuring a light signal reflected from the sample at the interface.
- 18. The method of claim 17, the fluid channel further comprising:
intercepting light entering a sample beyond the region of investigation.
- 19. The method of claim 18:wherein the non reflective material is black.
- 20. The method of claim 17, wherein the light source is placed in a black chrome housing.
- 21. The method of claim 17 further comprising:
wherein the light reduction device comprises a black matte coating.
- 22. The method of claim 17, wherein the light reduction device comprises a spiral pattern on the inside of the apparatus for reducing reflected stray light.
- 23. The method of claim 17, further comprising:
detecting an optimally absorbing wavelength of light.
- 24. The method of claim 23, wherein the optimally absorbing wavelength of light is 1740 nm.
CROSS REFERENCE TO RELATED APPLICATIONS
[0001] This application is a continuation in part of and takes priority from U.S. patent application No. 10/119,492 filed on Apr. 10, 2002 by Rocco DiFoggio et al., entitled “A Method and Apparatus for Downhole Refractometer And Attenuated Reflectance Spectrometer” which is hereby incorporated herein by reference in its entirety.
Continuation in Parts (1)
|
Number |
Date |
Country |
Parent |
10119492 |
Apr 2002 |
US |
Child |
10641400 |
Aug 2003 |
US |