K. S. Abedin, M. Hyodo, and N. Onodera, “Measurement of the chromatic dispersion of an optical fiber using a Sagnac interferometer employing asymmetric modulation”, Opt. Lett., 25, pp. 299-301 (2000).
K. S. Abedin, “Rapid, cost-effective measurement of chromatic dispersion of optical fibre over 1440-1625 nm using Sagnac interferometer”, Electronics Letters, vol. 41, No. 8 (2005).
The present invention is related to a novel measurement technique for chromatic dispersion of single mode fibers based on optoelectronic oscillations.
Nowadays, transmission bandwidth has been increased in long-haul optical transmission systems from 2.5 Gbit/second to 10 Gbit/second and soon to 40 Gbit/second. Higher bandwidth means that the transmitted optical pulses become near to each other and can overlap if they experience sufficient chromatic dispersion. Therefore, chromatic dispersion measurement of long-haul network is of a great importance to ensure proper operation of such networks.
Tremendous efforts have been spent to find suitable method for chromatic dispersion measurement. Among those methods the Time-of-Flight, the Modulation Phase Shift, and the Interferometric method are recommended by the International Telecommunication Union (ITU-T G.650) and by the International Electro-technical Commission (IEC 60793-1-42:2013).
Although the time-of-flight technique (U.S. Pat. No. 4,752,125 by Schicketanz) is simple to implement, it has low accuracy and is not suitable to resolve small chromatic dispersions.
The modulation phase shift technique became an industry standard and covered by several patents (references: U.S. Pat. No. 5,033,846 by Hernday et al., U.S. Pat. No. 5,406,368 by Horiuci et al.). This technique has better accuracy than the time-of-flight technique, however, it is time consuming and expensive to implement since it needs an expensive network analyzer. An example of a commercial device that implements this technique is the Agilent 86038C.
The best chromatic dispersion measurement accuracy can be obtained from the Interferometric technique (U.S. Pat. No. 7,787,12 by Michael Galle); however, it can only measure short fibers of lengths in the order of one meter.
Further techniques have been investigated to provide fast operation and higher accuracies with less complex system. A ring-type Sagnac interferometer has been proposed to measure chromatic dispersion cost-effectively (K. S. Abedin et al. Opt. Lett., (2000)); however, this technique is time-consuming due to the time required for the analysis of the acquired fringes at every wavelength. Although further improvement has been made to this technique to make the measurement time considerably smaller (K. S. Abedin, Electronics Letters, (2005)), the chromatic dispersion measurement through voltage change degrades its accuracy and makes the traceability to the SI unit of time not easily possible.
Therefore, a need still exists for a technique that is: precise, fast, low-cost and traceable to the SI unit of time for chromatic dispersion measurement.
The Present invention comprises a novel technique for chromatic dispersion measurement. This technique is based on creating a relatively low-frequency optoelectronic oscillation (OEO), in which the electro-to-optic converter is a tunable laser source. In order to measure chromatic dispersion, the tunable laser is swept over the wavelengths range of interest, while change in the oscillation frequency of the optoelectronic oscillator is measured. Consequently, the chromatic dispersion can be calculated from the change in oscillation frequency and the change in wavelength.
An additional optoelectronic oscillator (OEO) can be used with the main oscillator simultaneously to compensate for the thermal fluctuations in the fiber under test, which can greatly affect the results if the fiber under test is not in a stable weather conditions.
embodiments of the present invention are illustrated as an example and are not limited by the figures of the accompanying drawings, in which like references may indicate similar elements and in which:
The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention.
Novel chromatic dispersion measurement technique is discussed herein. This technique is based on the optoelectronic oscillation (OEO). In addition, a technique for compensation of the thermal fluctuations in the fiber under test by using another optoelectronic oscillator is presented.
The basic oscillator comprises a tunable laser (TL) (1), an intensity modulator (MZI) (1), fiber under test (FT) (3), a photodetector (PD) (4), an amplifier (AMP) (5), a filter (BPF) (6), power splitter (7) and a frequency counter (FC)(8) which are connected as shown in
The RF amplifier (5) should provide sufficient gain to compensate the loss inside the loop and therefore starting the oscillation. The basic condition for the OEO oscillation is that the accumulated phase around the loop in the optical and RF part to be integer multiples of 2π.
The oscillation frequency of the OEO cavity can be described by the following equation:
Where, τF is the time-of-flight of the light inside the fiber under test, τ, τsys are the delays inside the whole cavity and inside the measurement system respectively, L is the length of the fiber under test, q is the oscillation mode number, f is the cavity fundamental oscillation frequency, co: the speed of light in vacuum (299792458 m/s), n: the refractive index of the fiber under test which is 1.4682 at 1550 nm.
The chromatic dispersion coefficient (D) is defined as the change in the time-of-flight of the light inside the fiber under test (dτF) as its wavelength changes by (dλ):
Therefore, by changing the wavelength of the tunable laser by (dλ) while measuring the change in the OEO oscillation frequency (dfq), D can be calculated from equation (2).
Therefore, by changing the wavelength of the tunable laser while measuring the change in the oscillation frequency of the OEO, D can be calculated from equation (2).
The setup shown in
The second OEO, which is used to compensate the thermal drift of the fiber under test (25) during measurement, consists of a laser at 1310 nm (DFBL) (11) (or any different wavelength), another similar photodetector (PD2) (17), amplifier (AMP2) (13), bandpass filter (BPF2) (12) and frequency counter (FC2) (14).
The light from the tunable laser (9) is directed to the MZI (21). The light after the MZI (21) is sent through the fiber under test together with the light from the DFB laser (11) using a fiber combiner (24). The two beams are separated again using a 1310/1550 WDM multiplexer (23), so that the light from tunable laser falls on PD1 (18) while the light from the DFBL (11) falls on PD2 (17). Two RF filters (12, 20) are used to select the oscillating frequency. The RF amplifiers (AMP1, AMP2) (19, 13) are used to compensate the losses in the optical and electrical routs to maintain the oscillation. The frequencies are counted using the two frequency counters.
The RF spectrum analyzer (16) is used to characterize the oscillation beat and to measure the fundamental frequency by measuring the mode-spacing as shown in FIG. (3).
The exact wavelength of the tunable laser is measured continuously using an accurate wavemeter (10).
Since the wavelengths 1310 nm, 1550 nm have different sensitivity to temperature, a test can be made to find this ratio. A 10 km fiber is placed into temperature controlled champer and a temperature change of around 15° C. is made while measuring the OEO oscillation frequencies of both lasers. The measurement results are shown in
Therefore, it is possible to compensate the thermal effects on the oscillation frequency of the tunable laser by using the oscillation frequency of the 1310 nm laser multiplied by this ratio.
According to equation 2, the oscillation mode number has to be determined for each fiber under test (25). This number can be determined easily from the RF spectrum of the optoelectronic oscillation by dividing the oscillation frequency by the spacing between two consecutive peaks which represents the fundamental frequency, see
The setup in
For long fibers, the mode number q is large enough to resolve CD with precision as low as 0.005 ps/nm.km in step of 5 nm (0.018 ps/nm.km in step of 1 nm) with such relatively low oscillation frequency (56 MHz). However, for short fibers, higher oscillation frequencies are required to reach comparable mode number and consequently reach similar precision. For example, for 40 km fiber, q≈11000 at 56 MHz; on the other hand, for 1 km fiber, q≈285 at 56 MHz, while it is q≈4583 at 900 MHz. Therefore, in order to enhance the measurement precision for short fibers, higher frequencies is required.
When comparing the proposed setup with the best available commercial measuring device currently available (ex. Agilent 86037C), optoelectronic oscillation setup is 3 times faster than Agilent since it measures chromatic dispersion from 1500 to 1630 nm in 5 nm steps in 20 seconds, while Agilent measures it in around 1 minute. The measurement resolution for Agilent system reported to be 0.1 ps/nm which is similar to the proposed setup herein which is 0.09 ps/nm (obtained from the 400 m nonzero dispersion shifted fiber measurement) for the low modulation frequency of 56 MHz. However, by increasing the oscillation frequency the resolution is expected to be much better depending on the frequency selected. The price of the OEO system should be much lower than the Agilent system, since the Agilent system employ a vector analyzer to measure the phase change which is more expensive than the component of the proposed setup herein. The proposed setup can be reduced to simple scheme (like the setup in