Number | Name | Date | Kind |
---|---|---|---|
3931506 | Borrelli et al. | Jan 1976 | |
4194113 | Fulks et al. | Mar 1980 | |
4459693 | Prang et al. | Jul 1984 | |
4555783 | Swanson | Nov 1985 | |
4588945 | Groves et al. | May 1986 | |
4594558 | Congdon | Jun 1986 | |
4601032 | Robinson | Jul 1986 | |
4620304 | Faran, Jr. et al. | Oct 1986 | |
4727312 | Fulks | Feb 1988 | |
4774455 | Williams | Sep 1988 | |
4827208 | Oliver et al. | May 1989 |
Entry |
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Mastrocola, Effective Utilization of In-Circuit Techniques when Testing Complex Digital Assemblies, Automated Testing & Test Measurement, '81 Conference, Weisbaden, Germany, Mar. 23-26, 1981, pp. 106-117. |