Current or voltage test

Industry

CPC
G01R31/3004

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/3004Current or voltage test

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
System and method for parallel testing of electronic device
- Patent number 12,203,982
- Issue date Jan 21, 2025
- STMICROELECTRONICS INTERNATIONAL N.V.
- Rajesh Narwal
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for performing multiple tests on a device under test
- Patent number 12,181,515
- Issue date Dec 31, 2024
- NANYA TECHNOLOGY CORPORATION
- Chien-Hwa Su
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring circuit, integrated circuit including the same, and oper...
- Patent number 12,158,501
- Issue date Dec 3, 2024
- Samsung Electronics Co., Ltd.
- Yongwoo Kim
- G01 - MEASURING TESTING
Information Patent Grant
Modular multilevel converter system and voltage detection method an...
- Patent number 12,119,741
- Issue date Oct 15, 2024
- Delta Electronics (Shanghai) Co., Ltd.
- Peng Xiao
- G01 - MEASURING TESTING
Information Patent Grant
Clock conversion device, test system having the same, and method of...
- Patent number 12,032,019
- Issue date Jul 9, 2024
- Samsung Electronics Co., Ltd.
- Yongjeong Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit structure to measure outliers of process variation effects
- Patent number 12,025,658
- Issue date Jul 2, 2024
- Bitmain Development Inc.
- Christos Vezyrtzis
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Psuedo digital ASK demodulator with integrated buck boost and USB-P...
- Patent number 11,892,484
- Issue date Feb 6, 2024
- Cypress Semiconductor Corporation
- Prasanna Venkateswaran Vijayakumar
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Solid state ESD SiC simulator
- Patent number 11,846,664
- Issue date Dec 19, 2023
- FEI Company
- Marcos Hernandez
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and a method for measuring a device current of a device u...
- Patent number 11,821,944
- Issue date Nov 21, 2023
- Infineon Technologies AG
- Josef-Paul Schaffer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Identifying data valid windows
- Patent number 11,815,554
- Issue date Nov 14, 2023
- Micron Technology, Inc.
- Phillip A. Rasmussen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Power profiling in an integrated circuit having a current sensing c...
- Patent number 11,808,804
- Issue date Nov 7, 2023
- NXP USA, INC.
- Antonio Mauricio Brochi
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic voltage scaling in hierarchical multitier regulator supply
- Patent number 11,803,230
- Issue date Oct 31, 2023
- KANDOU LABS, S.A.
- Armin Tajalli
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Estimation of unknown electronic load
- Patent number 11,768,248
- Issue date Sep 26, 2023
- KEITHLEY INSTRUMENTS, LLC
- William C. Weeman
- G01 - MEASURING TESTING
Information Patent Grant
Abnormality detection method and abnormality detection apparatus
- Patent number 11,762,035
- Issue date Sep 19, 2023
- Tokyo Electron Limited
- Tomoya Bessho
- G01 - MEASURING TESTING
Information Patent Grant
Power system component testing using a power system emulator-based...
- Patent number 11,754,637
- Issue date Sep 12, 2023
- University of Tennessee Research Foundation
- Fei Wang
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for matching both dynamic and static parameters...
- Patent number 11,742,332
- Issue date Aug 29, 2023
- Wolfspeed, Inc.
- Daniel John Martin
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Multichannel switch integrated circuit
- Patent number 11,728,803
- Issue date Aug 15, 2023
- Kabushiki Kaisha Toshiba
- Masatoshi Shinohara
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Enhanced in-system test coverage based on detecting component degra...
- Patent number 11,693,753
- Issue date Jul 4, 2023
- NVIDIA Corporation
- Gunaseelan Ponnuvel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Built-in self-test circuit and temperature measurement circuit incl...
- Patent number 11,686,766
- Issue date Jun 27, 2023
- Samsung Electronics Co., Ltd.
- Junhee Shin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Systems and methods for circuit failure protection
- Patent number 11,686,757
- Issue date Jun 27, 2023
- Hamilton Sundstrand Corporation
- Kamaraj Thangavelu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reference less glitch detection circuitry with autocalibration
- Patent number 11,662,378
- Issue date May 30, 2023
- Xilinx, Inc.
- Sourabh Sharma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for PLP capacitor health check
- Patent number 11,656,257
- Issue date May 23, 2023
- Kioxia Corporation
- Timothy Simon Butler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Source measure apparatus including feedback path and measurement path
- Patent number 11,619,666
- Issue date Apr 4, 2023
- Keysight Technologies, Inc.
- Nobuaki Iwaki
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing a digital electronic circuit to be tested, corre...
- Patent number 11,531,064
- Issue date Dec 20, 2022
- STMicroelectronics S.r.l.
- Matteo Brivio
- G11 - INFORMATION STORAGE
Information Patent Grant
Current sensor and method for sensing a strength of an electric cur...
- Patent number 11,500,014
- Issue date Nov 15, 2022
- Infineon Technologies AG
- Lifeng Guan
- G01 - MEASURING TESTING
Information Patent Grant
Error detection on integrated circuit input/output pins
- Patent number 11,467,211
- Issue date Oct 11, 2022
- SIGNIFY HOLDING B.V.
- Yuhong Fang
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Full load test system of electrical power converter and the test me...
- Patent number 11,460,516
- Issue date Oct 4, 2022
- Ship and Ocean Industries R&D Center
- Hsiao-Yu Hsu
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Method and apparatus for calculating kink current of SOI device
- Patent number 11,442,097
- Issue date Sep 13, 2022
- Soochow University
- Mingxiang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 11,428,718
- Issue date Aug 30, 2022
- SK Hynix Inc.
- Yu-Ri Lim
- G11 - INFORMATION STORAGE
Information Patent Grant
Droop detection and mitigation
- Patent number 11,402,413
- Issue date Aug 2, 2022
- Marvell Asia Pte, Ltd.
- Nitin Mohan
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CIRCUIT
- Publication number 20240319266
- Publication date Sep 26, 2024
- LAPIS Technology Co., Ltd.
- Takahiro YONEDA
- G01 - MEASURING TESTING
Information Patent Application
TEST DEVICE AND TEST METHOD IMPLEMENTING THE SAME
- Publication number 20240310439
- Publication date Sep 19, 2024
- Samsung Electronics Co., Ltd.
- Gyuyeol KIM
- G01 - MEASURING TESTING
Information Patent Application
COMMUNICATION DEVICE, VOLTAGE DETECTION METHOD, AND COMPUTER-READAB...
- Publication number 20240265799
- Publication date Aug 8, 2024
- Huawei Technologies Co., Ltd
- Dian XU
- G08 - SIGNALLING
Information Patent Application
CAPACITOR DETERIORATION DETECTION DEVICE AND CONVERTER SYSTEM
- Publication number 20240223070
- Publication date Jul 4, 2024
- FANUC Corporation
- Yuya Nakagawa
- G01 - MEASURING TESTING
Information Patent Application
TESTING OF ELECTRONIC EQUIPMENT
- Publication number 20240183899
- Publication date Jun 6, 2024
- Total Quality Systems
- Bryan Steadman
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT TESTING
- Publication number 20240175919
- Publication date May 30, 2024
- TouchNetix AS
- Steinar MYREN
- G01 - MEASURING TESTING
Information Patent Application
VOLTAGE DETECTION DEVICE AND VOLTAGE PROTECTION METHOD
- Publication number 20240168088
- Publication date May 23, 2024
- SigmaStar Technology Ltd.
- Wei-Ping WANG
- G01 - MEASURING TESTING
Information Patent Application
CAN TRANSCEIVER AND METHOD FOR THE CAN TRANSCEIVER
- Publication number 20240168090
- Publication date May 23, 2024
- NXP B.V.
- Lucas Pieter Lodewijk van Dijk
- G01 - MEASURING TESTING
Information Patent Application
SOLID STATE ESD SIC SIMULATOR
- Publication number 20240044964
- Publication date Feb 8, 2024
- FEI Company
- Marcos Hernandez
- G01 - MEASURING TESTING
Information Patent Application
DETECTION OF LOSS OF NEUTRAL
- Publication number 20230417808
- Publication date Dec 28, 2023
- SAGEMCOM ENERGY & TELECOM SAS
- Pierre LHUILLIER
- G08 - SIGNALLING
Information Patent Application
ESTIMATION OF UNKNOWN ELECTRONIC LOAD
- Publication number 20230393213
- Publication date Dec 7, 2023
- KEITHLEY INSTRUMENTS, LLC
- William C. Weeman
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR MATCHING BOTH DYNAMIC AND STATIC PARAMETERS...
- Publication number 20230361089
- Publication date Nov 9, 2023
- WOLFSPEED. INC.
- Daniel John MARTIN
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
SENSING ELECTRONIC DEVICE
- Publication number 20230305037
- Publication date Sep 28, 2023
- InnoLux Corporation
- Chao-Yin KUO
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR PLP CAPACITOR HEALTH CHECK
- Publication number 20230288464
- Publication date Sep 14, 2023
- KIOXIA Corporation
- Timothy Simon Butler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCL...
- Publication number 20230280398
- Publication date Sep 7, 2023
- Samsung Electronics Co., Ltd.
- Junhee Shin
- G01 - MEASURING TESTING
Information Patent Application
Psuedo Digital ASK Demodulator with Integrated Buck Boost and USB-P...
- Publication number 20230258694
- Publication date Aug 17, 2023
- CYPRESS SEMICONDUCTOR CORPORATION
- Prasanna Venkateswaran Vijayakumar
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
APPRATUS FOR PERFORMING MULTIPLE TESTS ON A DEVICE UNDER TEST
- Publication number 20230184821
- Publication date Jun 15, 2023
- NANYA TECHNOLOGY CORPORATION
- Chien-Hwa SU
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR CHIP AND TEST METHOD OF THE SAME
- Publication number 20230176112
- Publication date Jun 8, 2023
- Samsung Electronics Co., Ltd.
- Yeon Ho Jung
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR CIRCUIT FAILURE PROTECTION
- Publication number 20230083816
- Publication date Mar 16, 2023
- HAMILTON SUNDSTRAND CORPORATION
- Kamaraj Thangavelu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MONITORING CIRCUIT, INTEGRATED CIRCUIT INCLUDING THE SAME, AND OPER...
- Publication number 20230068821
- Publication date Mar 2, 2023
- Samsung Electronics Co., Ltd.
- Yongwoo KIM
- G05 - CONTROLLING REGULATING
Information Patent Application
REFERENCE LESS GLITCH DETECTION CIRCUITRY WITH AUTOCALIBRATION
- Publication number 20230049371
- Publication date Feb 16, 2023
- Xilinx, Inc.
- Sourabh SHARMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTICHANNEL SWITCH INTEGRATED CIRCUIT
- Publication number 20230028530
- Publication date Jan 26, 2023
- Kabushiki Kaisha Toshiba
- Masatoshi SHINOHARA
- G01 - MEASURING TESTING
Information Patent Application
DYNAMIC VOLTAGE SCALING IN HIERARCHICAL MULTI-TIER REGULATOR SUPPLY
- Publication number 20230010756
- Publication date Jan 12, 2023
- Kandou Labs, SA
- Armin Tajalli
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CIRCUIT STRUCTURE TO MEASURE OUTLIERS OF PROCESS VARIATION EFFECTS
- Publication number 20220349938
- Publication date Nov 3, 2022
- Bitmain Development Inc.
- Christos Vezyrtzis
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SYSTEM AND METHOD FOR PARALLEL TESTING OF ELECTRONIC DEVICE
- Publication number 20220276302
- Publication date Sep 1, 2022
- STMicroelectronics International N.V.
- Rajesh Narwal
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and a Method for Measuring a Device Current of a Device U...
- Publication number 20220268834
- Publication date Aug 25, 2022
- INFINEON TECHNOLOGIES AG
- Josef-Paul Schaffer
- G01 - MEASURING TESTING
Information Patent Application
POWER PROFILING IN AN INTEGRATED CIRCUIT HAVING A CURRENT SENSING C...
- Publication number 20220187358
- Publication date Jun 16, 2022
- NXP USA, Inc.
- Antonio Mauricio Brochi
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR AUTOMATED TESTING OF POWER SUPPLY UNITS
- Publication number 20210389384
- Publication date Dec 16, 2021
- Astec International Limited
- Hui Guan Gan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MODULAR MULTILEVEL CONVERTER SYSTEM AND VOLTAGE DETECTION METHOD AN...
- Publication number 20210384816
- Publication date Dec 9, 2021
- DELTA ELECTRONICS (SHANGHAI) CO., LTD.
- Peng XIAO
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
TESTING DEVICE FOR DETERMINING ELECTRICAL CONNECTION STATUS
- Publication number 20210373089
- Publication date Dec 2, 2021
- Powertech Technology Inc.
- Jian-Yu CIOU
- G01 - MEASURING TESTING

Current or voltage test

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

System and method for parallel testing of electronic device

Apparatus for performing multiple tests on a device under test

Monitoring circuit, integrated circuit including the same, and oper...

Modular multilevel converter system and voltage detection method an...

Clock conversion device, test system having the same, and method of...

Circuit structure to measure outliers of process variation effects

Psuedo digital ASK demodulator with integrated buck boost and USB-P...

Solid state ESD SiC simulator

Apparatus and a method for measuring a device current of a device u...

Identifying data valid windows

Power profiling in an integrated circuit having a current sensing c...

Dynamic voltage scaling in hierarchical multitier regulator supply

Estimation of unknown electronic load

Abnormality detection method and abnormality detection apparatus

Power system component testing using a power system emulator-based...

Methods and systems for matching both dynamic and static parameters...

Multichannel switch integrated circuit

Enhanced in-system test coverage based on detecting component degra...

Built-in self-test circuit and temperature measurement circuit incl...

Systems and methods for circuit failure protection

Reference less glitch detection circuitry with autocalibration

Systems and methods for PLP capacitor health check

Source measure apparatus including feedback path and measurement path

Method for testing a digital electronic circuit to be tested, corre...

Current sensor and method for sensing a strength of an electric cur...

Error detection on integrated circuit input/output pins

Full load test system of electrical power converter and the test me...

Method and apparatus for calculating kink current of SOI device

Semiconductor device

Droop detection and mitigation

Patents Applicationslast 30 patents

INTEGRATED CIRCUIT

TEST DEVICE AND TEST METHOD IMPLEMENTING THE SAME

COMMUNICATION DEVICE, VOLTAGE DETECTION METHOD, AND COMPUTER-READAB...

CAPACITOR DETERIORATION DETECTION DEVICE AND CONVERTER SYSTEM

TESTING OF ELECTRONIC EQUIPMENT

INTEGRATED CIRCUIT TESTING

VOLTAGE DETECTION DEVICE AND VOLTAGE PROTECTION METHOD

CAN TRANSCEIVER AND METHOD FOR THE CAN TRANSCEIVER

SOLID STATE ESD SIC SIMULATOR

DETECTION OF LOSS OF NEUTRAL

ESTIMATION OF UNKNOWN ELECTRONIC LOAD

METHODS AND SYSTEMS FOR MATCHING BOTH DYNAMIC AND STATIC PARAMETERS...

SENSING ELECTRONIC DEVICE

SYSTEMS AND METHODS FOR PLP CAPACITOR HEALTH CHECK

BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCL...

Psuedo Digital ASK Demodulator with Integrated Buck Boost and USB-P...

APPRATUS FOR PERFORMING MULTIPLE TESTS ON A DEVICE UNDER TEST

SEMICONDUCTOR CHIP AND TEST METHOD OF THE SAME

SYSTEMS AND METHODS FOR CIRCUIT FAILURE PROTECTION

MONITORING CIRCUIT, INTEGRATED CIRCUIT INCLUDING THE SAME, AND OPER...

REFERENCE LESS GLITCH DETECTION CIRCUITRY WITH AUTOCALIBRATION

MULTICHANNEL SWITCH INTEGRATED CIRCUIT

DYNAMIC VOLTAGE SCALING IN HIERARCHICAL MULTI-TIER REGULATOR SUPPLY

CIRCUIT STRUCTURE TO MEASURE OUTLIERS OF PROCESS VARIATION EFFECTS

SYSTEM AND METHOD FOR PARALLEL TESTING OF ELECTRONIC DEVICE

Apparatus and a Method for Measuring a Device Current of a Device U...

POWER PROFILING IN AN INTEGRATED CIRCUIT HAVING A CURRENT SENSING C...

SYSTEMS AND METHODS FOR AUTOMATED TESTING OF POWER SUPPLY UNITS

MODULAR MULTILEVEL CONVERTER SYSTEM AND VOLTAGE DETECTION METHOD AN...

TESTING DEVICE FOR DETERMINING ELECTRICAL CONNECTION STATUS