Method and apparatus for improved sensitivity in a mass spectrometer

Description

FIELD

The present teachings relate to method and apparatus for transmitting ions for the detection of ions in a sample.

INTRODUCTION

One application for mass spectrometry is directed to the study of biological samples, where sample molecules are converted into ions, in an ionization step, and then detected by a mass analyzer, in mass separation and detection steps. Various types of ionization techniques are presently known, which typically create ions in a region of nominal atmospheric pressure. Mass analyzers which can be quadrupole analyzers where RF/DC ion guides are used for transmitting ions within a narrow slice of mass-to-charge ratio (m/z) values, magnetic sector analyzers where a large magnetic field exerts a force perpendicular to the ion motion to deflect ions according to their m/z and time-of-flight (“TOF”) analyzers where measuring the flight time for each ion allows the determination of its m/z. The mass analyzer generally operates in a low-pressure environment typically requiring its placement in one or more differentially pumped vacuum chambers equipped with inter-chamber apertures that provide adjacent pressure separation. One or more apertures positioned between the ionization step and the mass analyzer vacuum chamber generally defines the interface for transmitting ions to the mass analyzer.

SUMMARY

In view of the foregoing, the present teachings provide an apparatus for transmitting ions for the detection of ions in a sample. The apparatus comprises an ion source for generating ions, from the sample, in a high-pressure region, for example, at atmospheric pressure, and a vacuum chamber for receiving the ions. The vacuum chamber has an inlet aperture for passing the ions from the high-pressure region into the vacuum chamber. In conjunction with the differential pressure, the diameter of the inlet aperture is sized to provide a supersonic free jet expansion, with a predefined barrel shock and Mach disc, to entrain the ions into the vacuum chamber. The apparatus also comprises an ion guide with a predetermined cross-section that is sized to radially confine the supersonic free jet expansion so as to capture essentially all of the ions. The ion guide can be positioned in the chamber between the inlet aperture and an exit aperture so that when RF voltage, supplied by a RF power supply, is applied to the ion guide, the ions in the supersonic free jet can be focused and directed to the exit aperture. In various embodiments, the inlet aperture can be of the type that comprises a sonic nozzle or sonic orifice and the ion guide can be a multipole ion guide.

The present teachings also provide a method for transmitting ions for the detection of ions in a sample. The method comprises providing an ion source, in a high-pressure region, for example, at atmospheric pressure, for generating ions from the sample, and a vacuum chamber positioned downstream of the ion source for receiving the ions. The vacuum chamber is provided with an inlet aperture for passing the ions from the high-pressure region into the vacuum chamber. In conjunction with the differential pressure, the method comprises sizing the diameter of the inlet aperture for providing a supersonic free jet expansion having a predefined barrel shock and a Mach disc. The ions, which pass through the inlet aperture, are entrained by the supersonic free jet expansion created in the vacuum chamber. The method further comprises providing an ion guide with a predetermined cross-section that is sized to radially confine the supersonic free jet expansion so as to capture essentially all of the ions. The ion guide can be positioned in the chamber between the inlet aperture and an exit aperture so that when RF voltage, supplied by a RF power supply, is applied to the ion guide, the ions in the supersonic free jet are focused and directed the exit aperture.

These and other features of the present teachings are set forth herein.

BRIEF DESCRIPTION OF THE DRAWINGS

The skilled person in the art will understand that the drawings, described below, are for illustration purposes only. The drawings are not intended to limit the scope of the present teachings in any way.

In the accompanying drawings:

FIG. 1 is a schematic view of a mass spectrometer according to the present teachings;

FIG. 2 is a more detailed schematic view of the inlet aperture, the ions and the supersonic free jet expansion according to the present teachings;

FIG. 3 is a schematic view of a prior art aperture and skimmer configuration;

FIG. 4 is a graphical representation of a computational simulation of the embodiment of FIG. 1;

FIGS. 5 to 10 are schematic and schematic cross-section views of various embodiments of the ion guide according to the present teachings;

FIGS. 11 & 12 are schematic cross-section views of various embodiments of the inlet aperture according to the present teachings;

FIG. 13 is a schematic view of various embodiments of the present teachings;

FIG. 14 is a schematic view of various embodiment of the present teachings; and

FIG. 15 is an intensity profile of a known compound demonstrating improved performance of a mass spectrometer in accordance with the present teachings over a prior art mass spectrometer.

In the drawings, like reference numerals indicate like parts.

DESCRIPTION OF VARIOUS EMBODIMENTS

It should be understood that the phrase “a” or “an” used in conjunction with the present teachings with reference to various elements encompasses “one or more” or “at least one” unless the context clearly indicates otherwise. Reference is first made to FIG. 1, which shows schematically a mass spectrometer, generally indicated by reference number 20. The mass spectrometer 20 comprises an ion source 22 for providing ions 30 from a sample of interest, not shown. The ion source 22 can be positioned in a high-pressure P0 region containing a background gas (not shown), generally indicated at 24, while the ions 30 travel towards a vacuum chamber 26, in the direction indicated by the arrow 38. The ions enter the chamber 26 through an inlet aperture 28, where the ions are entrained by a supersonic flow of gas, typically referred to as a supersonic free jet expansion 34 as will be described below. The vacuum chamber 26 further comprises an exit aperture 32 located downstream from the inlet aperture 28 and an ion guide 36 positioned between the apertures 28, 32 for radially confining, focusing and transmitting the ions 30 from the supersonic free gas jet 34. The exit aperture 32 in FIG. 1 is shown as the inter-chamber aperture separating the vacuum chamber 26, also known as the first vacuum chamber 26, from the next or second vacuum chamber 45 that houses a mass analyzer 44. Typical mass analyzers 44 in the present teachings, can include quadrupole mass analyzers, ion trap mass analyzers (including linear ion trap mass analyzer) and time-of-flight mass analyzers. The pressure P1 in the vacuum chamber 26 can be maintained by pump 42, and power supply 40 can be connected to the ion guide 36 to provide RF voltage in known manner. The ion guide 36 can be a set of quadrupole rods with a predetermined cross-section characterized by an inscribed circle with a diameter as indicated by reference letter D (also shown in FIG. 5), extending along the axial length of the ion guide 36 to define an internal volume 37. The ions 30 can initially pass through an orifice-curtain gas region generally known in the art for performing desolvation and blocking unwanted particulates from entering the vacuum chamber, but for the purpose of clarity, this is not shown in FIG. 1.

To help understand how the ions 30 can be radially confined, focused and transmitted between the inlet and exit apertures 28, 32, reference is now made to FIG. 2. The adiabatic expansion of a gas, from a nominal high-pressure P0 region, into a region of finite background pressure P1, forming an unconfined expansion of a supersonic free gas jet 34 (also known as a supersonic free jet expansion), has been well characterized. The inlet aperture 28 comprises a sonic orifice or a sonic nozzle, where the expansion of the gas through the orifice or nozzle can be divided into two distinct regions based upon the ratio of the flow speed to the local speed of sound. In the high-pressure P0 region, the flow speed near the orifice or the nozzle is lower than the local speed of sound. In this region the flow can be considered subsonic. As the gas expands from the inlet aperture 28 into the background pressure P1 the flow speed increases while the local speed of sound decreases. The boundary where the flow speed is equal to the speed of sound is called the sonic surface. This region is called the supersonic region or more commonly the supersonic free jet expansion, as will be described below. The shape of the aperture influences the shape of the sonic surface. When the aperture 28 can be defined as a thin plate, the sonic surface can be bowed out towards the P1 pressure region. The use of an ideally shaped nozzle, conventionally comprising a converging-diverging duct similar to that shown in FIG. 12, produces a sonic surface that is flat and lies at the exit of the nozzle. The converging portion can also be conveniently defined by the chamfer 31 surface indicated in FIG. 2, while the volume of the vacuum chamber 26 can define the diverging portion. A minimum area location of the converging-diverging duct is often called the throat 29, and in the present teachings, the diameter of the minimum area or throat 29 is Do as shown in FIG. 2. The velocity of the gas passing through the throat 29 becomes “choked” or “limited” and attains the local speed of sound, producing the sonic surface, when the absolute pressure ratio of the gas through the diameter Do is less than or equal to 0.528. In the supersonic free jet 34, the density of the gas decreases monotonically and the enthalpy of the gas from the high-pressure region 24 is converted into directed flow. The gas kinetic temperature drops and the flow speed exceeds that of the local speed of sound (hence the term supersonic expansion). As shown in FIG. 2 the expansion comprises a concentric barrel shock 46 and terminated by a perpendicular shock known as the Mach disc 48. As the ions 30 enter the vacuum chamber 26 through the inlet aperture 28, they are entrained in the supersonic free jet 34 and since the structure of the barrel shock 46 defines the region in which the gas and ions expand, virtually all of the ions 30 that pass through the inlet aperture 28 are confined to the region of the barrel shock 46. It is generally understood that the gas downstream of the Mach disc 48 can re-expand and form a series of one or more subsequent barrel shocks and Mach discs that are less well-defined compared to the primary barrel shock 46 and primary Mach disc 48. The density of ions 30 confined in the subsequent barrel shocks and Mach discs, however, can be correspondingly reduced as compared to the ions 30 entrained in the primary barrel shock 46 and the primary Mach disc 48.

The supersonic free jet expansion 34 can be generally characterized by the barrel shock diameter Db, typically located at the widest part as indicated in FIG. 2, and the downstream position Xm of the Mach disc 48, as measured from the inlet aperture 28, more precisely, from the throat 29 of the inlet aperture 28 producing the sonic surface. The Db and Xm dimensions can be calculated from the size of the inlet aperture, namely the diameter Do, the pressure at the ion source P0 and from the pressure P1 in the vacuum chamber, as described, for example, in the paper by Ashkenas, H., and Sherman, F. S., in deLeeuw, J. H., Editor of Rarefied Gas Dynamics, Fourth Symposium IV, volume 2, Academic Press, New York, 1966, p. 84:

Db=0.412×Do×√{square root over ((P0/P1))} (1)
Xm=0.67×Do×√{square root over ((P0/P1))} (2)

where P0 is the pressure around the ion source 22 region 24 upstream of the inlet aperture 28 and P1 is the pressure downstream of the aperture 28 as described above. For example, if the diameter of the inlet aperture 28 is approximately 0.6 mm, with a suitable pumping speed so that the pressure in the downstream vacuum chamber 26 is about 2.6 torr, and the pressure in the region of the ion source 22 is about 760 torr (atmosphere), then from equation (1), the predetermined diameter of the barrel shock Db is 4.2 mm with a Mach disc 48 located at approximately 7 mm downstream from the throat 29 of the inlet aperture 28, calculated from equation (2).

One of the most common prior-art methods of sampling the ions from the supersonic free jet 34, into the second vacuum chamber 45, which contains the mass analyzer 44, is through a skimmer 50 as indicated in FIG. 3. The tip 52 of the skimmer 50 can be positioned upstream or downstream of the Mach disc 48, at zones characterized by having distinct gas densities well known in fluid mechanics, to sample and pass ions 30 to the mass analyzer 44. In FIG. 3, the skimmer 50 samples the ions axially upstream of the Mach disc 48; while others have positioned the skimmer orthogonal to the supersonic free jet 34 and downstream of the Mach disc 48. In FIG. 3, a portion of the Mach disc 48 is indicated, but as generally know in fluid mechanics, the barrel shock can be attached to the skimmer, thus resulting in a modified profile from that which is shown. Whether positioned upstream or downstream of the Mach disc 48, the skimmer configurations of the prior art only sample a portion of the available ions 30 from the supersonic free jet expansion 34. Although not shown, it is common to apply a static electric field (electrostatic) between the inlet aperture 28 and the skimmer tip 52 to try to draw as many ions as possible towards the skimmer 50. The skimmer tip 52, however, needs to be maintained at a relatively small diameter in order to keep the pressure in the next chamber 45 as low as required for the mass analyzer 44 to function properly. This means that, even with the application of an electric field, not all of the ions 30 can be sampled through the skimmer 50, which reduces the sensitivity capability of the mass spectrometer. If the diameter of the inlet aperture 28 is increased in order to pass more ions 30 from the ion source 22, then the pressure within the supersonic free jet 34 is increased, making it more difficult to focus the ions 30 electrostatically.

All of these factors make it difficult to increase the sensitivity in the prior-art inlet aperture-skimmer configuration sampling system simply by increasing the inlet aperture diameter. While successful up to a point, expanding the diameter of the inlet aperture (with a concomitant increase in the size of the vacuum pumps to maintain the vacuum chamber pressures at the required low pressure) is not a practical solution, as eventually the cost and size of the vacuum pumps becomes too large to be commercially successful.

In all of the above prior art configurations, the ions to be analyzed requires focusing for passage through an entrance fringing field region between the inlet aperture 28 and the ion guide 36, thus requiring electrostatic focusing means within a region where the pressure or density is relatively large, leading to potential losses in sensitivity. Furthermore, if the ions require passage through another limiting aperture, such as the skimmer, before entering the ion guide, then there are likely to be losses before reaching the ion guide, resulting in further reduced sensitivity.

The applicants recognize that the supersonic free jet expansion 34 and barrel shock structure 46 expanding downstream from the throat 29 of the inlet aperture 28, can be an effective method of transporting the ions 30 and confining their initial expansion until the ions 30 are well within the volume 37 of the ion guide 36. The fact that all of the gas and ions 30 are confined to the region of the supersonic free jet 34, within and around the barrel shock 46 means that a large proportion of the ions 30 can be initially confined to the volume 37 of an ion guide 36 if the ion guide 36 is designed to accept the entire or nearly the entire free jet expansion 34. Additionally, the applicants recognize that the ion guide 36 can be positioned at a location so that the Mach disc 48 can be within the volume 37 of the ion guide 36. By locating the ion guide 36 downstream of the inlet aperture 28, and in a position to include essentially all of the diameter Db of the free jet expansion 34, a larger inlet aperture 28 can be used and thus a higher vacuum chamber 26 pressure P1 can be used while maintaining high efficiency in radially confining and focusing the ions 30 between the apertures 28, 32 thereby to allow more ions into the second vacuum chamber 45. Accordingly, with the appropriate RF voltage, ion guide dimensions and vacuum pressure, not only can the ion guide 36 provide radial ion confinement, but the ion guide 36 can also focus the ions 30 while the ions 30 traverse the internal volume between the inlet 28 and exit 32 apertures, as described, for example in U.S. Pat. No. 4,963,736 by Douglas and French, the contents of which are incorporated herein by reference. In the present teachings, although the function of the ion guide 36 can be described to provide both radial confinement and focusing of the ions, it is not essential that the ion guide 36 perform the ions focusing effect. Greater efficient ion transmission between the inlet and exit apertures 28, 32, however, can be achieved with the focusing capabilities of the ion guide 36.

In the example described above, where the barrel shock 46 diameter Db is approximately 4.2 mm and the position Xm of the Mach disc 48, measured from the throat of the inlet aperture 28, is about 7 mm, the predetermined cross-section of the ion guide 36 (in this instance, an inscribed circle of diameter D) can be about 4 mm in order for all or essentially all of the confined ions 30 in the supersonic free gas jet 34 to be contained within the volume 37 of the ion guide 36. An appropriate length for the ion guide 36 greater than 7 mm can be chosen so that effective RF ion radial confinement can be achieved. This results in maximum sensitivity without the necessity of increasing the vacuum pumping capacity and thus the cost associated with larger pumps. A graphical representation of these results from computational simulation showing how the supersonic free jet expansion 34 can be confined within the volume 37 of the ion guide 36 is shown in FIG. 4. The reference numbers in FIG. 4 are the same as the reference numbers indicated in FIG. 1.

As described above and in accordance with equations (1) and (2), the pressure P1 within the vacuum chamber 26 containing the ion guide 36 contributes to the characterization of the supersonic free jet 34 structure. If the pressure P1 is too low, then the diameter Db of the barrel shock 46 is large, and the ion guide 36 can require substantial practical efforts to be large enough to confine the ions 30 entrained by the supersonic free jet expansion 34. Consequently, if a large inscribed diameter D can be sized accordingly to a large barrel shock diameter Db, then larger voltages must be used in order to provide effective ion radial confinement and ion focusing. However, larger voltages can cause electrical breakdown and discharge, which can interfere with proper function of the ion guide and can introduce considerable complexity to the instrument for safe and reliable operation. Additionally, power supplies capable of providing large voltages tend to be priced high, which can drive up the cost of commercial instruments. Therefore it is most effective to keep the pressure relatively high so as to keep the jet diameter small, and to keep the diameter D of the ion guide as small as possible so that voltages are maintained below electrical breakdown.

Conversely, if the pressure P1 is too high, then the focusing action of the ion guide 36 is reduced. Consequently, the applicants have determined, through computational simulations of ion motion that fast and effective focusing action can be obtained at a pressure between about 1 and 10 torr. In this range the supersonic free jet's diameter Db is small for typical diameters of the aperture of about 0.4 and 1 mm, and the ion guide diameter can be practically applied. Specifically, the inscribed diameter D can be between about 2 and 8 mm. Effective confinement can be obtained with RF voltages of between about 50 and 300 Volts peak to peak, limited at the upper end only by the requirement not to exceed the breakdown voltage of the gas at the operating pressure. Typical RF frequencies can be between about 1 and 2 MHz, although other frequencies of between about 0.5 and 5 MHz can also be quite practical and effective.

While the present teachings are described in conjunction with various embodiments, it is not intended that the present teachings be limited to such embodiments. On the contrary, the present teachings encompass various alternatives, modifications, and equivalents, as will be appreciated by those of skill in the art. For example, the present applicants recognize that the throat 29 of the inlet aperture 28 can have a finite length, and it is desirable for the length to be as short as possible while maintaining structural integrity. In various embodiments, the inlet aperture 28 of FIG. 1 can be a sonic orifice 78 at the tip of a cone 80 as shown in FIG. 11, where the chamfer 31 is on the P1 (lower) pressure side, or the inlet aperture can be a converging nozzle 82 at the end of a tube 84 as shown in FIG. 12. In either example, the configuration of the aperture can be described as follows. At specific pressure differences (between Po and P1), the gas passing through the throat 29 is characterized as having choked flow or, more accurately “choked velocity”, where the velocity of the gas is sonic. This occurs for airflow when the downstream absolute pressure P1 is 52.8% of the upstream absolute pressure P0. In FIGS. 2, 11, 12, the throat 29 comprises the diameter Do adjacent to the vacuum pressure P1. Upstream and adjacent to the diameter Do, the gas accelerates towards sonic velocity and tends to entrain or drag the ions 30 and transmits them through the aperture 28 with high efficiency. When the length of the throat 29 is long, such as a capillary, the gas velocity at the entrance to the throat is subsonic and the gas drag into the entrance of the throat is reduced. The effects of a short throat length, therefore can be used to achieve optimum ion transmission from the high pressure region 24 into the vacuum chamber 26.

While the parameters used in the calculations above can provide improvements, as will be described in the example below, it can also be practical to use other combinations of inlet aperture diameter and pressure P1 for the present teachings. For example, in various embodiments, with an inlet aperture 28 diameter Do of about 0.1 mm and pressure P1 of about 0.1 torr, the predetermined diameter Db of the barrel shock 46 is calculated to be 3.6 mm. An ion guide 36 of approximately 4 mm diameter D would effectively capture the supersonic free jet 34 and radially confine the ions 30. Similarly, an inlet aperture 28 diameter Do of about 0.2 mm and a pressure P1 of about 10 torr would result in a predetermined diameter Db of 1.2 mm, so that a small ion guide 36 of approximately 1.2 mm diameter D, requiring therefore lower RF voltages, can be used. Furthermore, it can be understood that the configuration of the inlet aperture 28 of the present teachings, can conceivable be non-circular in its cross-section. For example, in various embodiments, the inlet aperture 28 can be square or triangular having a cross-sectional area that can be equivalent to a corresponding circular cross-section area with diameter Do.

The applicants appreciate that the predetermined cross-section of the ion guide 36 can be sized less than the predetermined diameter Db to be able to confine a corresponding portion of the ions in the supersonic free jet 34 while still achieving a significant improvement in sensitivity. For example, in various embodiments, the cross-section of the ion guide 36 can be sized so that the cross-section is at least 50% of the predetermined diameter Db.

Although the ion guide 36 of FIG. 1 is positioned so that the internal volume 37 envelops the supersonic free jet expansion 34 entirely along the linear axis, the applicants have contemplated the placement of the ion guide 36 downstream of the inlet aperture 28 such that the volume 37 of the ion guide 36 envelops some or none of the primary barrel shock 46 and the primary Mach disc 48. It can be appreciated that such a downstream placement of the ion guide 36 internal volume 37 to envelope none or part of the primary barrel shock 46 and the primary Mach disc 48 of FIGS. 1 and 2 can still envelope the subsequent re-expanded barrel shocks and Mach discs.

The applicants have contemplated the use of one or more inlet apertures 28 for achieving substantially the same ion transmission efficiency. For example, in various embodiments, two apertures 28a, 28b are shown in FIG. 13, but it is understood by those skilled in the art that additional apertures and their corresponding elements, as described next, are implicitly implied subject to practicality. The same numbering system has been used to denote common elements as those shown in FIG. 1 except with the addition of the letters “a” and “b”. Each of the apertures 28a, 28b can form corresponding supersonic free jet expansions 34a, 34b and barrel shocks 46a, 46b, and at least one of the free jets 34a, 34b being enveloped by their corresponding ion guides 36a, 36b. The accumulative cross-sectional area of the inlet apertures 28a, 28b can be equal to the cross-sectional area of a single inlet aperture 28 having the desired diameter as described above. The ions which are radially confined and transmitted by the one or more of the ion guides 36a, 36b can be further confined and focused and transmitted by an additional ion guide to combine the ions together into a single ion beam, not shown. It is also contemplated that the array of supersonic free jets 34a, 34b can be enveloped by one ion guide 36c, where the inscribed diameter D of ion guide 36c is appropriately sized, as shown in FIG. 14.

The ion guide 36 acting as ion confinement, focusing and guiding devices can be of the type indicated in FIGS. 5 to 10. The multipole ion guide of FIGS. 5, 6 and 7 can include the quadrupole (4 poles) 64, hexapole (6 poles) 66 and octapole (8 poles) 68 or higher number of poles 74. The poles 74 are elongated electrodes carrying the RF voltages generally known in the art. Other configurations containing greater number of poles, or electrodes of different shapes, are also possible. For example, the electrodes can consist of wires or rods and can be square instead of circular in cross section, or the electrodes can have cross sections that vary along the elongated length. In various embodiments, the poles 74 can be multiple electrode segments connected to corresponding power supplies to provide differential fields between adjacent segments. The ion guides of FIGS. 8, 9 and 10 are typically known as ring guide 70 where individual rings or plates 72 with holes 76 are generally aligned with respect to each other to form an axial passage for the ions 30 to traverse. The adjacent plates 72 can carry opposite phases of the RF voltage generally known in the art. The stacked plates 72 of FIG. 9 have substantially similar holes 76 diameters while the plates 72 of FIG. 10 vary in hole diameters so to provide a converging or focusing action. A combination of converging and diverging effect can be applicable either with the stacked plates 72 or with the elongated electrodes with varied cross section. Any RF focusing device which confines the ions 30 by means of inhomogeneous (in space) alternating electric fields can be used. In various embodiments, a quadrupole ion guide can be used to provide focusing action that is stronger toward the center of the device, and the ions can be more strongly confined to a narrow position near the axis. This can be advantageous for transmitting ions 30 through a small exit aperture 32 into the next chamber 45.

In various embodiments, the second vacuum chamber 45 can have an outlet aperture for passing ions from the second vacuum chamber 45 to the mass analyzer 44, where the mass analyzer 44 can be housed in a third vacuum chamber. The second vacuum chamber 45 can have an RF-only ion guide for radially confining, focusing and transporting the ions 30, as described in the '736 patent, between the exit aperture 32 and the outlet aperture. The exit aperture 32 functions as an inter-chamber aperture 32, as previously described. The RF-only ion guide can be constructed similarly as the ion guide 36. In use, the ions 30 pass from the first vacuum chamber 26 through the inter-chamber aperture 32 into the second vacuum chamber 45 where the ions 30 can be radially confined and focused by the RF-ion guide as the ions 30 traverse the RF-only ion guide. After the ions 30 pass from the second vacuum chamber 45, by way of the outlet aperture, into the third vacuum chamber, the mass analyzer 44 receives the ions 30 for mass analysis. The same power supply 40 which provides RF voltage to the ion guide 36 or a separate power supply can be connected to the RF-only ion guide for providing RF voltage in known manner.

The ion source 22, can be one of the many known types of ion sources depending of the type of sample to be analyzed. In various embodiments, the ion source 22 can be an electrospray or ion spray device, a corona discharge needle, a plasma ion source, an electron impact or chemical ionization source, a photo ionization source, a MALDI source or any combination thereof. Other desired types of ion sources known to the skilled person in the art may be used, and the ion source can create ions at atmospheric pressure, above atmospheric pressure, near atmospheric pressure, or less than atmospheric pressure, but higher than the pressure associated with the pressure in the vacuum chamber 26 so that the absolute pressure ratio P1/P0≦0.528.

Aspects of the present teachings may be further understood in light of the following examples, which should not be construed as limiting the scope of the present teachings in any way.

EXAMPLES

FIG. 15 shows the sensitivity of a triple quadrupole mass spectrometer system in accordance with the present teachings resulting from a 50 pg injection of the compound Reserpine at a sample flowrate of 200 uL/minute, using the Multiple-Reaction-Mode of operation monitoring m/z 195 fragment ion of the m/z 609 precursor. The height of the signal peak can be a direct indication of the sensitivity of the system. The response from two separate experiments have been superimposed in FIG. 15, where the vertical axis shows the normalized intensity and the horizontal axis is a function of time in arbitrary units.

The first (lower) peak, labeled API 4000, shows the response on a prior art mass spectrometer, API 4000 triple quadrupole mass spectrometer, manufactured by Applied Biosystem/MDS Sciex, which uses an inlet aperture diameter of 0.32 mm and a skimmer diameter of 2.4 mm.

The second (larger) peak, indicated by the label API 5000, shows the response on a triple quadrupole mass spectrometer instrument in accordance with the present teachings, where the inlet aperture diameter has been increased to 0.6 mm, and an RF quadrupole ion guide was used to capture and focus the ions from the supersonic free jet according to the present teachings. In this example, the pressure in the ion guide region was 2.6 torr, the diameter of the ion guide was 4 mm, and the calculated maximum diameter of the barrel shock of the Mach disc according to Equation (1) was 4.2 mm. The increase of approximately six-fold, indicated by the label 6×, in sensitivity demonstrates the ability to achieve significantly better mass spectrometry performance in accordance with the present teachings.

Claims

1. A mass spectrometer comprising: an ion source for generating ions in a high-pressure region; a vacuum chamber comprising an inlet aperture for passing the ions from the high-pressure region into the vacuum chamber, and an exit aperture for passing ions from the vacuum chamber; an ion guide between the inlet and exit apertures and having a predetermined cross-section defining an internal volume; a power supply for providing an RF voltage to the ion guide for radially confining the ions within the internal volume of the ion guide; wherein the configuration of the inlet aperture and the pressure difference between the ion source and the vacuum chamber provides a supersonic free jet expansion downstream of the inlet aperture, the supersonic free jet expansion comprising a barrel shock of predetermined diameter; and wherein the cross-section of the ion guide is sized to be at least 50% of the predetermined diameter of the barrel shock of the supersonic free jet expansion.
2. The mass spectrometer according to claim 1, wherein the inlet aperture comprises a sonic nozzle or sonic orifice.
3. The mass spectrometer according to claim 2, wherein the ion guide is selected from a quadrupole ion guide, a hexapole ion guide, an octapole ion guide, a ring guide and any combination thereof.
4. The mass spectrometer according to claim 3, wherein the ion guide is a quadrupole ion guide.
5. The mass spectrometer according to claim 3, wherein the high-pressure region is substantially atmospheric pressure.
6. The mass spectrometer according to claim 5, wherein the vacuum chamber has a pressure between about 0.1 and 10 torr.
7. The mass spectrometer according to claim 6, wherein the inlet aperture is circular and has a diameter between about 0.1 and 1 mm.
8. The mass spectrometer according to claim 7, wherein the predetermined cross-section forms an inscribed circle and has a diameter between about 1 and 8 mm.
9. The mass spectrometer according to claim 1, further comprising a mass analyzer receiving ions passed from the vacuum chamber.
10. A mass spectrometer comprising: a mass analyzer; an ion source for generating ions to be analyzed by the mass analyzer; a first vacuum chamber comprising an inlet aperture for receiving the ions and an exit aperture for transporting the ions from the first vacuum chamber; an ion guide having a predetermined cross-section, the ion guide positioned in the first vacuum chamber between the inlet and exit apertures; a power supply connected to the ion guide to provide an RF voltage thereto; wherein the size of the inlet aperture and the differential pressure between the ion source and the first vacuum chamber produces a supersonic free jet expansion in the first vacuum chamber; wherein the cross-section of the ion guide is sized to be at least 50% of the predetermined diameter of the barrel shock of the supersonic free jet expansion; and wherein ions within the supersonic free jet expansion are radially confined as the ions traverse the ion guide.
11. The mass spectrometer of claim 10 further comprising: a second vacuum chamber downstream of the first vacuum chamber; the second vacuum chamber comprising an inter-chamber aperture for receiving the ions from the first vacuum chamber; an outlet aperture for transporting the ions from the second vacuum chamber to the mass analyzer; and an RF-only ion guide positioned between the inter-chamber and outlet apertures.
12. The mass spectrometer of claim 11 further comprising a power supply connected to the RF-only ion guide in the second vacuum chamber to provide an RF voltage thereto, whereby ions are radially focused as the ions traverse the RF-only ion guide.
13. A method for performing mass analysis comprising: generating ions in a high pressure region; passing the ions into a vacuum chamber comprising an inlet aperture for passing the ions from the high-pressure region into the vacuum chamber, and an exit aperture for passing ions from the vacuum chamber; providing an ion guide between the inlet and exit apertures, the ion guide having a predetermined cross-section defining an internal volume; applying an RF voltage to the ion guide for radially confining the ions within the internal volume of the ion guide; wherein the configuration of the inlet aperture and the pressure difference between the high pressure region and the vacuum chamber provides a supersonic free jet expansion downstream of the inlet aperture, the supersonic free jet expansion comprising a barrel shock of predetermined diameter; and wherein the cross-section of the ion guide is sized to be at least 50% of the predetermined diameter of the barrel shock of the supersonic free jet expansion.
14. The method for performing mass analysis according to claim 13, wherein the inlet aperture comprises a sonic nozzle or sonic orifice.
15. The method for performing mass analysis according to claim 14, wherein the ion guide is selected from a quadrupole ion guide, a hexapole ion guide, an octapole ion guide, a ring guide and any combination thereof.
16. The method for performing mass analysis according to claim 15, wherein the ion guide is a quadrupole ion guide.
17. The method for performing mass analysis according to claim 15, wherein the high-pressure region is substantially atmospheric pressure.
18. The method for performing mass analysis according to claim 17, wherein the vacuum chamber has a pressure between about 0.1 and 10 torr.
19. The method for performing mass analysis according to claim 18, wherein the inlet aperture is circular and has a diameter between about 0.1 and 1 mm.
20. The method for performing mass analysis according to claim 19, wherein the predetermined cross-section forms an inscribed circle and has a diameter is between about 1 and 8 mm.

Method and apparatus for improved sensitivity in a mass spectrometer

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