Number | Date | Country | Kind |
---|---|---|---|
3 496/90-0 | Nov 1990 | CHX |
Number | Name | Date | Kind |
---|---|---|---|
3471702 | Van Veld | Oct 1969 | |
3524988 | Gaither, IV | Aug 1970 | |
3573476 | Falcoff et al. | Apr 1971 | |
3925850 | Lytton | Dec 1975 | |
3986778 | Mathisen et al. | Oct 1976 | |
4022534 | Kishner | May 1977 | |
4284356 | Heilman | Aug 1981 | |
4288160 | Lodzinski | Sep 1981 | |
4306450 | Moser | Dec 1981 | |
4490618 | Cielo | Dec 1984 | |
4758968 | Lord | Jul 1988 | |
4766647 | Ackermann, Jr. et al. | Aug 1988 | |
4786817 | Boissevain et al. | Nov 1988 | |
4845730 | Mercer | Jul 1989 | |
4963757 | Liefde et al. | Oct 1990 | |
4982477 | Hosel | Jan 1991 | |
4990793 | Bonigk et al. | Feb 1991 | |
5007136 | Artzt et al. | Apr 1991 | |
5025533 | Faas et al. | Jun 1991 | |
5054317 | Laubscher | Oct 1991 | |
5159189 | Anderegg et al. | Oct 1992 | |
5194911 | Stutz | Mar 1993 |
Number | Date | Country |
---|---|---|
0399315 | Nov 1990 | EPX |
1931929 | Feb 1979 | DEX |
3204146 | Aug 1983 | DEX |
3327966 | Feb 1985 | DEX |
0277331 | Mar 1990 | DEX |
0362538 | Apr 1990 | DEX |
0032153 | Feb 1989 | JPX |
0094248 | Apr 1989 | JPX |
2044443 | Oct 1980 | GBX |
2172102 | Sep 1986 | GBX |
2210907 | Jun 1989 | GBX |
Entry |
---|
Photothermal Methods of Optical Characterization of Materials, Murphy and Wetsel, Materials Evaluation, 44, Sep. 1986, 1224-1230. |