Number | Name | Date | Kind |
---|---|---|---|
4724318 | Binnig | Feb 1988 | |
5144225 | Talbot et al. | Sep 1992 | |
5381101 | Bloom et al. | Jan 1995 | |
5442300 | Nees et al. | Aug 1995 | |
5465046 | Campbell et al. | Nov 1995 | |
5488305 | Bloom et al. | Jan 1996 | |
5550479 | Wakana et al. | Aug 1996 |
Entry |
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Francis Ho, Applications of Scanning Force Microscopy for Voltage Measurements with High Spatial and Temporal Resolutions, PhD Dissertation, Stanford University, Feb. 1995. |