The present application claims priority from Japanese application serial no. 2014-214096, filed on Oct. 21, 2014, the content of which is hereby incorporated by reference into this application.
1. Field of the Invention
The present invention relates to a method and an apparatus for producing nanostructures on or over a substrate; and a substrate structure including a substrate and nanostructures disposed on or over the substrate.
2 . Description of Prior Art
Nanostructures (nanoscale structures) include any of metal materials and various organic and inorganic materials and have nanometer-order scale dimensions. Such nanostructures are increasingly examined. The nanostructures differ in properties from corresponding bulk materials, even when including an identical material, and are examined so as to be applied typically to electronic devices.
Known techniques for producing a plurality of nanostructures as a flat plane are exemplified by dynamic oblique deposition, DC plasma-enhanced chemical vapor deposition, hydrothermal crystallization of colloidal precursors, template-synthesis, molecular beam epitaxy, and reactive pulsed laser deposition, as described by Takayuki Kitamura et al. in“FRACTURE NANOMECHANICS”, PAN STANFORD PUBLISHING (2011), ISBN 978-981-4241-83-0.
U.S. Unexamined Patent Application Publication No. 20100328896 describes a technique for forming nanosprings by the dynamic oblique deposition, where the nanosprings include copper and have a spring diameter of about ten nanometers to about several micrometers.
Japanese Patent No. 4938365 describes a method for producing a nanoscale three-dimensional structure using carbonaceous dies. Japanese Unexamined Patent Application Publication (JP-A) No. 2014-101512 describes a technique for producing nanostructures by self-assembly.
Upon production of a plurality of nanostructures as a flat plane, structures to be formed and materials to be used have limitations differing from a production method to another. The dynamic oblique deposition is suitable for self-standing columnar structures that have a helical shape or a zigzag shape, where such columnar structures are hardly producible by production methods using a template or a die. However, conventional techniques using dynamic oblique deposition are limited in usable materials and in dimensions (sizes) of producible nanostructures. Specifically, the materials usable for the production of nanostructures are limited typically to silicon and tantalum oxides. The conventional techniques using dynamic oblique deposition therefore fail to produce nanostructures having fine dimensions in terms typically of a diameter of less than 100 nm from materials that are widely industrially applicable. The materials are exemplified by copper and aluminum.
Under these circumstances, the present invention has an object to provide a method and an apparatus for producing nanostructures, by which a wider variety of materials are applicable to form the nanostructures, and by which the nanostructures are producible with fine dimensions. The present invention has another object to provide nanoscale-structure-containing substrate structures from materials that are widely industrially applicable.
To achieve the objects, a production method according to the present invention includes a first step of evaporating a main material for the nanostructures onto a flat surface of a substrate to form a plurality of the nanostructures on or over the flat surface of the substrate. In the first step, the substrate is controlled to have an absolute temperature equal to or lower than 0.25 time the melting point (absolute temperature) of the main material for the nanostructures.
To achieve the objects, a production apparatus according to the present invention includes a vacuum chamber, a crucible, an electron gun, a stage, a cooling unit, a heating unit, a temperature sensor, and a controller. In the vacuum chamber, nanostructures are to be formed. The crucible is disposed in the vacuum chamber, and a material is to be placed in the crucible. The electron gun is disposed in the vacuum chamber and is configured to apply electron beams to the material in the crucible so as to evaporate the material. The stage is disposed in the vacuum chamber so as to face the crucible, and bears a member (substrate) on or over which the evaporated material is deposited. The stage is pivotally supported and is arranged so as to face the crucible at a variable angle. The cooling unit cools the stage. The heating unit heats the stage. The temperature sensor detects the temperature of the stage. The controller operates the cooling unit and the heating unit based on the temperature detected by the temperature sensor so as to control the temperature of the stage.
In addition, a substrate structure according to the present invention includes a substrate and a plurality of nanostructures. The substrate has a flat surface. The plurality of nanostructures are disposed vertically on or over the flat surface. The nanostructures have a diameter (wire diameter) of less than 100 nm and include a main material having a melting point equal to or lower than the melting point of copper.
The production method according to the present invention controls the substrate to have an absolute temperature equal to or lower than 0.25 time the melting point (absolute temperature) of the main material for the nanostructures. The production method can thereby form fine nanostructures having a desired shape from a desired material.
The production apparatus according to the present invention can control the substrate temperature by heating and cooling of the stage so as to form desired nanostructures. The production apparatus can thereby form fine nanostructures having a desired shape from a desired material.
The substrate structure according to the present invention can be provided as a substrate structure including fine nanostructures having a relatively low melting point. The substrate structure allows nanostructures to be industrially applicable more widely.
Other objects, configurations, and advantageous effects will be apparent from the description of embodiments below.
The present invention will be illustrated with reference to some embodiments and the attached drawings.
The production apparatus illustrated in
A substrate 31 having a flat surface (
Assume that the evaporated atom 32 is deposited on the substrate or on the atom 33 deposited on the substrate so as to produce appropriate nanostructures by the production method. In this case, the evaporated atom 32 should be deposited on track of the vapor flow without turning around the shaded area and entering the shadow 34 cast by the deposited atom. According to the first embodiment, the temperature of the substrate 31 is controlled to be equal to or lower than a predetermined temperature. The control prevents the evaporated atom 32 from having such energy as to turn around the shaded area and enter the shadow 34 cast by the deposited atom when the evaporated atom 32 approaches the substrate or the atom 33 deposited on the substrate.
At a substrate temperature Ts of 573K (absolute temperature, hereinafter the same), the material nickel does not form nanostructures with a desired helical shape, but forms a plurality of nickel blocks having a diameter of about 300 nm on the substrate 31. Also at a substrate temperature Ts of 483K, the material nickel does not form nanostructures with a desired helical shape, but forms a plurality of nickel blocks having a diameter of about 200 nm. At a substrate temperature Ts of 453K, the material forms nanostructures with a shape having a wire diameter of about 50 nm at the bottomportion and resembling a helical shape, but having an increasing diameter with growth. At a substrate temperature Ts of 383K, the material forms nanostructure with a desired, clear helical shape. The nanostructures each have a diameter (wire diameter) of about 20 nm at the bottom portion, where the diameter less increases with growth. The material nickel has a melting point of 1725K. The ratio of the substrate temperature Ts of 453K at which nanostructure with an approximate helical shape can be formed to the melting point is 0.26. The ratio of the substrate temperature Ts of 383K at which a clear helical shape can be formed to the melting point is 0.22. Specifically, assume that the absolute temperature of the substrate 31 is controlled to be equal to or lower than 0.25 time the melting point (absolute temperature) of nickel, where nickel is a main material to form the nanostructures. This can form fine nanostructures having a diameter of less than 100 nm and having a desired helical shape.
As illustrated in
The production apparatus according to the first embodiment employs a cooling unit that uses liquid nitrogen as a coolant. However, the production apparatus may employ any cooling unit which is not limited to this and is exemplified by a chiller. The use of the chiller eases the temperature control. The use of liquid nitrogen as a coolant can lower the lower limit of the temperature to which the substrate can be cooled. The lowered lower limit of the temperature range can widen the temperature range that is controllable.
The resulting nanoscale-structure-containing substrate structure formed with the production apparatus by the production method as described above includes fine nanostructures having a diameter of 100 nm and includes nickel, where nickel has a relatively low melting point and is industrially useful. The nanoscale-structure-containing substrate structure is applicable to a variety of industrial areas such as electronic devices.
The material copper does not form nanostructures with a desired helical shape at substrate temperatures Ts of 453K and 353K, but forms copper blocks having a diameter of about 200 nm on the substrate 31. At a substrate temperature Ts of 323K, the material forms nanostructures with a shape having a diameter of about 50 nm at the bottom portion and resembling a columnar, helical shape. However, the structures have an increasing diameter with growth and have a large diameter of about 200 nm at a growth of about 300 nm from the bottom portion. The material forms nanostructures with a desired, clear helical shape at a substrate temperature Ts of 300K. The nanostructures have a diameter of about 20 nm at the bottom portion, where the wire diameter less increases with growth. The material also forms nanostructures with a desired, clear helical shape at a lower substrate temperature Ts of 253K. The material copper has a melting point of 1306K. The ratio of the substrate temperature Ts of 323K at which the material forms nanostructures with an approximately helical shape to the melting point is 0.25. The ratios of the substrate temperatures Ts of 300K and 253K at which the material forms nanostructures with a desired, clear helical shape to the melting point are respectively 0.23 and 0.19.
The material nickel begins forming nanostructures with a helical shape at a substrate temperature Ts of 453K in the nickel nanostructures according to the first embodiment. In contrast, the material copper begins forming nanostructures with a helical shape at a substrate temperature Ts of 323K in the copper nanostructures according to the second embodiment. These demonstrate that the substrate temperature to be controlled varies from a material to another. In contrast, the ratios between the substrate temperatures and the melting points of the materials are focused herein. The ratio of the substrate temperature Ts at which the material begins forming nanostructures with a helical shape to the material melting point is 0.26 in the nickel nanostructures according to the first embodiment. The ratio of the substrate temperature Ts at which the material begins forming nanostructures with a helical shape to the material melting point is 0.25 in the copper nanostructures according to the second embodiment. These demonstrate that the substrate temperature may be controlled so as to give an approximately same ratio to the material melting point regardless of the kind of the material.
Assume that a material for nanostructures is evaporated onto a substrate by dynamic oblique deposition without the temperature control. In this case, the substrate receives the energy of atoms derived from the material and has an elevating temperature. In contrast, according to the second embodiment, the material is evaporated onto the substrate by dynamic oblique deposition while cooling the substrate to control the substrate temperature Ts to be 323K. Thus, the second embodiment can give fine, helical, copper nanostructures.
As described above, the second embodiment controls the absolute temperature of the substrate 31 to be equal to or lower than 0.25 time the melting point (absolute temperature) of copper, where copper is a main material for the nanostructures. The control can give fine nanostructures that have a diameter of less than 100 nm and have a desired helical shape. The substrate structure according to the second embodiment includes fine nanostructures having a diameter of less than 100 nm and including copper, where copper has a relatively low melting point and is industrially useful. The substrate structure is thereby applicable to a variety of industrial areas such as electronic devices.
The material aluminum does not form nanostructures with a desired helical shape at substrate temperatures Ts of 300K and 253K, but forms nanostructures with a desired, clear helical shape at a substrate temperature Ts of 233K. The resulting nanostructures have a diameter of about 20 nm at the bottom portion, where the diameter less increases with growth. The material aluminum has a melting point of 933K, and the ratio of the substrate temperature Ts of 233K at which the material gives nanostructures with a desired, clear helical shape to the melting point is 0.25.
The material nickel begins forming nanostructures with a helical shape at a substrate temperature Ts of 453K in the nickel nanostructures according to the first embodiment. The material copper begins forming nanostructures with a helical shape at a substrate temperature Ts of 323K in the copper nanostructures according to the second embodiment. The material aluminum begins forming nanostructures with a helical shape at a substrate temperature Ts of 253K in the aluminum nanostructures according to the third embodiment. These demonstrate that the substrate temperature to be controlled varies from a material to another. In contrast, the ratio of the substrate temperature Ts at which the material begins forming nanoscale microstructures with a helical shape to the material melting point is 0.26 in the nickel nanostructures according to the first embodiment. The ratio of the substrate temperature Ts at which the material begins forming nanoscale microstructures with a helical shape to the material melting point is 0.25 in the copper nanostructures according to the second embodiment. The ratio of the substrate temperature Ts at which the material begins forming nanoscale microstructures with a helical shape to the material melting point is 0.25 in the aluminum nanostructures according to the third embodiment. These demonstrate that the substrate temperature may be controlled so as to give an approximately same ratio of the substrate temperature to the material melting point regardless of the kind of the material.
As described above, the third embodiment controls the absolute temperature of the substrate 31 to be equal to or lower than 0.25 time the melting point (absolute temperature) of aluminum, where aluminum is a main material for nanostructures. The control can give fine nanostructures that have a wire diameter of less than 100 nm and have a desired helical shape. The substrate structure according to the third embodiment includes fine nanostructures having a wire diameter of less than 100 nm and including aluminum, where aluminum has a relatively low melting point and is industrially useful. The substrate structure is thereby applicable to a variety of industrial areas such as electronic devices.
The zigzag nanostructures can have shorter distances from adjacent nanostructures and can be disposed in a larger number per unit area as compared with the helical nanostructures. In contrast, the zigzag nanostructures are more geometrically anisotropic in the in-plane direction in the layer of the nanostructures as compared with the helical nanostructures. In consideration of the geometrical anisotropy (geometrical difference), the nanostructures can be applied to various uses by selecting the shape of the nanostructures from various structures including the zigzag shape in the fourth embodiment.
A substrate 31 having a flat surface (
The nanostructures 71 in the fifth embodiment use copper as a main material and have a zigzag shape. The planar layer 101 uses nickel as a main material and has a thickness of about 0.8 μm. The planar layer 101 prevents the nanostructures 71 from being exposed to the surface and can protect the nanostructures 71.
The main material for the planar layer 101 may be selected as appropriate according to an intended purpose such as the protection of the nanostructures 71. The main material for the planar layer 101 may be a material identical to, or different from, the main material for the nanostructures. For example, assume that the planar layer 101 is formed from a main material identical to the main material for the nanostructures 71. In this case, another layer of nanostructures 71 can be formed on the planar layer 101. This allows the layers of the nanostructures 71 to have an approximately larger thickness. Assume that another member (component) is bonded or adhered to the top of the nanostructures 71. In this case, the planar layer 101 may use, as a main material, a material that has good bondability or adhesiveness with the other member (component). Such good bondability or adhesiveness eases the bonding or adhesion between the nanostructures 71 and the other member and increases the reliability of the bonding or adhesion.
A plurality of planar layers 101 maybe formed from different main materials. For example in an embodiment, a first planar layer to be in contact with the top surface of the nanostructures is formed from a main material that has good adhesiveness with the nanostructures. In addition, a second planar layer is formed on the first planar layer from a main material that has good adhesiveness with the first planar layer and with the other member. This allows the other member to be adhered onto the nanostructures with good reliability, even when the other member includes a main material that has low adhesiveness with the nanostructures.
The planar layer 101 may be formed using the production apparatus illustrated in
Specifically, an atom 33 is evaporated onto a surface of the substrate 31 (
Assume that the substrate surface layer 111 in the sixth embodiment is formed from a main material identical to the main material for the nanostructures. In this case, the substrate 31 is bonded to the nanostructures 36 with an approximately larger bonding area. This allows the substrate 31 and the nanostructures 36 to be bonded to each other with better bonding reliability. Further assume that the substrate surface layer 111 is formed from a main material different from the main material for the nanostructures. Even in this case, the substrate 31 can be bonded to the nanostructures 36 with better bonding reliability by using a main material selected from materials that have good bondability both with the substrate 31 and with the nanostructures 36. A plurality of substrate surface layers 111 may be disposed as with the planar layer in the fifth embodiment.
As described above, the dynamic oblique deposition in the embodiments can give nanostructures having a shape selected from not only the shapes illustrated in
The present invention is not limited to the specific embodiments, but includes various modifications. For example, the embodiments have been described in detail so as to illustrate the present invention comprehensibly. The present invention is not always limited to embodiments each including all the described configurations. It is also possible to add, delete, and/or replace part of the configuration of an embodiment with another configuration.
Number | Date | Country | Kind |
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2014-214096 | Oct 2014 | JP | national |