Number | Date | Country | Kind |
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5-331484 | Dec 1993 | JPX |
Number | Name | Date | Kind |
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5358806 | Haraichi et al. | Oct 1994 |
Entry |
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Journal of Physics E: Scientific Instruments 1971, vol. 4, R. A. Hoover, "Measuring Surface Variations With the Scanning Electron Microscope Using Deposited Contamination Lines", pp. 747-749. |