This application claims priority to European application No. 05 405 466.3 filed Aug. 8, 2005.
This invention relates to solid-state photo-detecting, especially to phase-measuring techniques based on silicon integrated sensors. It further relates to offset-cancellation techniques in optical multi-channel data-acquisition systems. Furthermore it relates to validating measurement data in safety-critical applications by providing improved plausibility checks directly related to the chosen measurement method. Possible applications of the invention are found, for instance, in optical range detection as well as fluorescence life-time detection and other bio-sensing applications.
Various approaches describe the integration of silicon-based image sensors measuring intensity, amplitude and phase of an incident electro-magnetic wave front in the optical spectrum (e.g., WO-96/15626). These optical phase-measurement techniques can be used in optical range sensing. In combination with a dedicated light source, the pixel can be used as time-of-flight (TOF) ranging system (cf. EP-1′152′261 A) and/or in chemical and bio-chemical sensing (cf. EP-1′085′315 A). Homodyne signal detection systems are characterized by demodulating the incoming signal with the same base frequency of the reference signal. Hence, in homodyne optical TOF ranging systems, the active illumination source is synchronized with the driving signal of various photo gates, which leads to an information-carrying signal content at DC (f=0) and which in turn can be directly converted to digital values by appropriate analog-to-digital converters (ADCs) in modern information-processing systems. On the other hand, in heterodyne systems, the frequency of the light source differs slightly from the gate-controlling reference frequency and hence avoids potential problems with DC drift over power supply and temperature variations in practical implementations. This approach is characterized by the fact that the information-carrying part of the signal is hidden in the frequency content of the signal and has to be extracted by appropriate time-domain or frequency-domain analysis. In both cases, however, the signal of the incident optical wave front is demodulated by generating appropriate electrical fields in the gate-controlled silicon area of the sensor.
The electrical field is in most cases controlled by some applied voltage at the sensor input. In this region exhibiting commonly a stair-cased or linear potential gradient, the photo-generated electrons tend to drift towards the region in the semiconductor with the highest (deepest) potential well due to the electrical field created within the semiconducting material. By appropriately controlling the gates, the photo-generated charge carriers can be directed into the different integration gates or read-out nodes. From the resulting output signals, the characteristics of the incoming wave front can then be derived immediately.
A commonly used implementation is to provide a pixel with four outputs and to direct the photo-generated charge carriers to each output during one quarter of the full period of the incoming optical wave. The phase can be deduced from the four outputs corresponding to the relative phases 0°, 90°, 180° and 270° according to:
At the same time, the simplified equations for the amplitude and the intensity values become:
One of the main problems of state-of-the-art implementations of such systems, either homodyne systems such as described in the above-mentioned 4-outputs example or heterodyne phase measurement methods, appears as soon as the different output signal paths do not behave identically at constant illumination levels. These non-idealities might be caused by mismatch effects at the solid-state imager level and in the complementary metal-oxide semiconductor active-pixel sensor (CMOS APS) read-out path as well as with the non-ideal driving controls of the gates. As can be seen from Equations (1) and (2), the calculations are based on difference values, which can be severely affected by different offset or gain values.
It is an object of the present invention to provide a method that is insensitive to mismatch non-idealities of the different output paths. It is a further object to provide a redundant phase-measuring system. The pixel architecture according to the present invention shall also overcome the problems of non-homogenous photo-generation and transportation of photo-generated carriers below the photo gates and within the signal path.
These and other objects are solved by the method and the device as defined in the independent claims. Preferred embodiments are indicated in the dependent claims.
The first part of the invention overcomes the problem of non-ideal output response comprising effects such as mismatch by properly executing the sampling measurements in a suitable order. The second part of the invention describes the possibility to ensure redundant measurements within the above described phase measuring system using similar considerations as with the non-ideality compensation technique for optical phase measuring systems.
In practice, a pixel architecture containing at least one pair of signal output paths will always suffer from non-equal behavior of said signal paths of any pair. The idea of the invention is to perform the signal-capturing process in at least two measurement cycles. In the case of two distinct measurement cycles, a first cycle will be executed with the conventional setup with no phase delay in the control signals. It will then be followed by a second cycle which uses inverted control signals and hence reading the signal through the second path. At the end, by adding the results of the two cycles, offset values are entirely canceled. This principle can be easily extended to any number of distinct measurement cycles which are suitably merged, e.g., added or averaged, at the end.
The inventive method for characterizing a remote scene by means of temporally modulated electromagnetic radiation comprises the steps of:
At least one further measurement cycle comprising the above steps (a)-(g) is performed in which at least one storage element is allocated to a different phase than in the first measurement cycle, and electric signals from the first and the further measurement cycle are used in the evaluation step.
The inventive device for performing the method according to any of the preceding claims comprises:
a radiation source for emitting temporally modulated electromagnetic radiation,
a photodetector comprising
timing means for defining a common time base of the radiation source and the photodetector,
evaluation means for evaluating characteristics of the scene from the electric signals, and
control means for controlling the mutual phase relation of the radiation source and the photodetector.
The pixel operational architecture subject of the present invention is characterized by performing the following steps:
The second part of the present invention relates to a phase-measuring device and also relates to a TOF range camera measuring the characteristics (phase, amplitude and/or intensity) of the incoming wave front. The present method allows detecting whether a pixel and the associated signal paths are fully operational and working according to specifications. The basic idea is to create information redundancy by performing at least two complete sets of acquisitions of the same scene, however sampled with different phase shifts of the emitted CW-modulated illumination source. For example, in a homodyne measurement setup the introduction of a controlled but arbitrary angular phase shift δ or time-domain shift t of the transmitted CW-modulated light source introduces a corresponding shift in distance of
where c≈3·108 m/s is the light velocity in vacuum and f is the modulation frequency. As for a specific numerical example where f=20 MHz and δ=180°, a directly induced distance shift of ΔL=3.75 m will be observed.
Assuming now that the changes within the scene between two distance/phase maps are negligible compared to the distance/phase modification caused by said artificially induced phase shift, the difference of said two measurements has to be approximately the distance/phase value corresponding to said phase shift. This controllable difference of the distance/phase values between two sequential measurement cycles within a short period of time allows verifying the entire signal paths from the signal generation to the calculated output maps by applying simple plausibility checks.
The artificial phase shift can be chosen arbitrarily and/or switched by 180° for every measurement. Thus the second part of the invention can be combined with the idea of offset cancellation of the first part of the invention and hence, the system functionality can be verified at each measurement cycle without losing speed performance of the overall phase-measurement system. Furthermore, the amplitude value together with the intensity value can be used as a mean to check the quality of the performed phase measurement.
For all above-mentioned combinations of phase shifting, the order may be fixed, random or pseudo-random. The randomized phase-shift pairs potentially avoid or reduce harmonic interferences in the data-acquisition systems. Furthermore, randomized phase-delay keying enables the detection of all error-event combinations in the case of complex safety systems.
Embodiments of the invention are described in greater detail hereinafter relative to the attached schematic drawings.
In a preferred embodiment of the method according to the invention, electromagnetic radiation is emitted towards the scene to be imaged. At least part of said radiation is reflected and/or scattered from the scene. At least two, and generally n≧2, different phases Φ of the modulated electromagnetic radiation are selected. So far, the method corresponds to the prior art.
At the beginning, the control variables j and k are each set to one. Two encapsulated loops are performed. In an inner loop, wherein the control variable k is increased by one, readout phases Φj,k=0, 2π/n, . . . , (n−1)2π/n (or, in degrees, Φj,k=0, 360°/n, . . . , (n−1)·360°/n) are calculated. For each readout phase Φj,k a corresponding pixel output is read out, yielding an intermediate output signal output (Φj,k). The intermediate output signals output (Φj,k) are stored. In an outer loop, wherein the control variable j is increased by one, the steps described above are repeated, but with a different readout phase Φj,k for each output channel k. In each measurement cycle j, the readout phase Φj,k is shifted by 2π/n (or 360°/n) compared to the previous measurement cycle (j−1) for a given output channel k. After performing all n measurement cycles, the intermediate output signals output (Φj,k) are summed up for each readout phase Φ=0, 2π/n, . . . , (n−1)2π/n, yielding an output signal output (Φ). These output signals output (Φ), wherein Φ=0, 2π/n, . . . , (n−1)2π/n, are essentially free of mismatch non-idealities of the output channels. They can be evaluated using formulas such as Equations (1), (2) and/or (3) given above.
The principle of the method according to
A first preferred embodiment of the device 1 according to the present invention with a phase-measuring system for incident optical wave fronts is shown in
A second preferred embodiment of the device according to the present invention is characterized by extending the two measurement cycles of the first preferred embodiment of
A fourth embodiment of the device according to the present invention is characterized by extending the two measurement cycles of the third preferred embodiment of
A fifth embodiment of the device 1 according to the present invention comprises a phase-measuring system for incident optical wave fronts according to
A sixth preferred embodiment according to the present invention is characterized by extending the two measurement cycles of the fifth embodiment of
A seventh embodiment of the device 1 according to the present invention comprises a phase-measuring system for incident optical wave fronts according to
This invention is not limited to the preferred embodiments described above, to which variations and improvements may be made, without departing from the scope of protection of the present patent.
Number | Date | Country | Kind |
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05405466 | Aug 2005 | EP | regional |
Number | Name | Date | Kind |
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6100540 | Ducharme et al. | Aug 2000 | A |
20050190206 | Lang et al. | Sep 2005 | A1 |
Number | Date | Country |
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1 152 261 | Nov 2001 | EP |
1 085 315 | Jul 2003 | EP |
1 752 793 | Feb 2007 | EP |
WO 9615626 | Apr 1996 | WO |
WO 2004008175 | Jan 2004 | WO |
WO 2004027359 | Apr 2004 | WO |
Number | Date | Country | |
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20070034778 A1 | Feb 2007 | US |