Claims
- 1. A method of determining whether a test gem is a simulant gem or a gem which is simulated comprising the steps of:
- subjecting the test gem to heat flow relative to an electrically powered heat flow element in a probe tip while electric power is applied to the heat flow element by contacting the gem with a previously heated probe tip, the heat flow element being in close thermal relationship with a small gem contacting surface of the probe tip such that the heat flow element is thermally responsive to the test gem within a few seconds while power is applied thereto; and
- measuring the thermal response to the probe tip within a few seconds as an indication of the thermal conductivity of the test gem.
- 2. A method of determining whether a test gem is a simulant gem or a gem which is simulated comprising the steps of:
- subjecting the test gem to heat flow from an electrically powered thermoelectric device in a probe, the thermoelectric device being in close thermal relationship with a small gem contacting surface of the probe; and
- measuring a thermally responsive electrical parameter of said thermoelectric device within about a few seconds.
- 3. A method of determining whether a test gem is a simulant comprising the steps of subjecting the test gem to heat flow relative to an active heat flow element in a probe through a small gem contacting surface, maintaining power to the active heat flow element, and detecting a thermal response of the probe within a few seconds after the test gem is subjected to the change in heat flow, wherein:
- the gem is subjected to a change in heat flow by contacting it with a previously heated probe tip, and the active heat flow element is in close thermal contact with the gem contacting surface and is of small thermal mass such that the temperature of the active heat flow element is responsive to a diamond when a diamond is contacted but stabilizes to near steady state within a few seconds and the thermal response of the probe is sensed after the heat flow element stabilizes to near steady state.
Parent Case Info
This application is a continuation of application Ser. No. 240,126, filed Mar. 3, 1981, now U.S. Pat. No. 4,364,677 which is a continuation of Ser. No. 885,502, filed Apr. 10, 1978, now U.S. Pat. No. 4,255,962.
US Referenced Citations (5)
Foreign Referenced Citations (1)
Number |
Date |
Country |
855658 |
Jan 1960 |
GBX |
Non-Patent Literature Citations (1)
Entry |
Lagagette Instrument Company, "Operation and Maintenance for TC-100 Thermal Comparator". |
Continuations (2)
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Number |
Date |
Country |
Parent |
240126 |
Mar 1981 |
|
Parent |
885502 |
Apr 1978 |
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