Claims
- 1. A method of determining whether a test gem is a simulant gem or a gem which is simulated comprising the steps of:
- subjecting the test gem to heat flow from an electrically powered heat flow element in a probe tip while a pulse of electric power is applied to the heat flow element, the heat flow element being in close thermal relationship with a small gem contacting surface of the probe tip such that the heat flow element is thermally responsive to the test gem within a few seconds while power is applied thereto; and
- measuring the thermal response of the probe tip within a few seconds or less as an indication of the thermal conductivity of the test gem.
- 2. A method of determining whether a test gem is a simulant gem or a gem which is simulated comprising the steps of:
- preheating a probe tip by means of an electrically powered heat flow element in the tip;
- subjecting the test gem to heat flow from the heat flow element in the probe tip by contacting the test gem with the previously heated probe tip while applying electric power to the heat flow element, the heat flow element being in sufficiently close thermal relationship with a small gem contacting surface of the probe tip such that the heat flow element is thermally responsive to the test gem within a few seconds while power is applied thereto; and
- measuring the thermal response of the probe tip within a few seconds or less as an indication of the thermal conductivity of the test gem.
- 3. A method as claimed in claim 2 wherein electric power is applied to the heat flow element as a pulse.
- 4. A method as claimed in claim 1 or 2 wherein the measured thermal response is a change in temperature of the probe tip.
- 5. A method as claimed in claim 1 or 2 wherein the electrical resistance of a thermal resistance device in the probe tip is measured as an indication of the temperature of the probe in measuring the thermal response of the probe.
- 6. A method of determining whether a test gem is a simulant gem or a gem which is simulated comprising the steps of:
- subjecting the test gem to heat flow from an electrically powered thermoresistance device in a probe tip, the thermoresistance device being in close thermal relationship with a small gem contacting surface of the probe tip; and
- measuring the resistance of said thermoresistance device within a few seconds or less.
Parent Case Info
This application is a continuation, of application Ser. No. 885,502, filed Apr. 10, 1978 now U.S. Pat. No. 4,255,962.
US Referenced Citations (4)
Foreign Referenced Citations (1)
| Number |
Date |
Country |
| 855658 |
Dec 1960 |
GBX |
Non-Patent Literature Citations (3)
| Entry |
| Schulte "A Pulsed Thermal Comparator for the Measurement of Thermal Conductivity", in Proceeding of the 9th Conf. on Thermal Cond., 10/69, pp. 589-598. |
| Powell et al., "An Instrument Embodying the Thermal Comparator Technique for Thermal Conductivity", 1969. |
| Lafayette Instrument Company, "Operation and Maintenance for TC-100 Thermal Comparator". |
Continuations (1)
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Number |
Date |
Country |
| Parent |
885502 |
Apr 1978 |
|