Number | Date | Country | Kind |
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991072 | May 1999 | FI |
This application is a Continuation of International Application PCT/F100/00411 filed on May 9, 2000, which designated the U.S. and was published under PCT Article 21(2) in English, and which is incorporated herein in its entirety by reference.
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Entry |
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Copy of International Search Report for PCT/FI00/00411, completed Aug. 28, 2000. |
Copy of Finnich Office Action for Patent Appl. No. 991072, dated Apr. 26, 2000. |
Standard T 480 om-92; Specular Gloss Of Paper And Paperboard at 75 Degrees; TAPPI. |
J. Steurer, H. Giebel, and W. Altner, Ein lichtmikroskopisches Verfahren zur zweieinhalbdimensionalen Auswertung von Oberflächen, In Proc. 8. DAGM-Symp. Mustererkennung, 1986, Informatik Fachberichte 125, edited by G. Hartmann, pp. 66-70, Springer, Berlin. |
Number | Date | Country | |
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Parent | PCT/FI00/00411 | May 2000 | US |
Child | 09/953384 | US |