using photoelectric detection means

Industry

CPC
G01B11/303

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B11/00Measuring arrangements characterised by the use of optical means

Current Industry

G01B11/303using photoelectric detection means

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for inspecting a surface with artifical intellige...
- Patent number 12,320,759
- Issue date Jun 3, 2025
- Virtek Vision International Inc.
- Ahmed Elhossini
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for calibrating agricultural field surface profil...
- Patent number 12,298,443
- Issue date May 13, 2025
- Surya Saket Dasika
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Grant
Device and method for characterising the roughness profile of a tis...
- Patent number 12,264,911
- Issue date Apr 1, 2025
- UNIVERSIDAD CARLOS III DE MADRID
- Roberto Fernández Fernández
- G01 - MEASURING TESTING
Information Patent Grant
Imaging device
- Patent number 12,259,320
- Issue date Mar 25, 2025
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Yosuke Asai
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for determining reasonable sampling interval with...
- Patent number 12,235,098
- Issue date Feb 25, 2025
- China University of Geosciences (Wuhan)
- Yunfeng Ge
- G01 - MEASURING TESTING
Information Patent Grant
Identification apparatus
- Patent number 12,228,517
- Issue date Feb 18, 2025
- Canon Kabushiki Kaisha
- Yuki Yonetani
- G01 - MEASURING TESTING
Information Patent Grant
Laser device and method of using the same
- Patent number 12,224,547
- Issue date Feb 11, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yu-Hua Hsieh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement system and program
- Patent number 12,198,419
- Issue date Jan 14, 2025
- Mitutoyo Corporation
- Takanori Asamizu
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for inspecting reflective surfaces
- Patent number 12,174,008
- Issue date Dec 24, 2024
- NEXTSENSE GMBH
- Eduard Luttenberger
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
System, apparatus and method for improved location identification w...
- Patent number 12,162,160
- Issue date Dec 10, 2024
- Gecko Robotics, Inc.
- Alberto Pinero
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Vehicle with road surface condition detector
- Patent number 12,146,735
- Issue date Nov 19, 2024
- Honda Motor Co., Ltd.
- Ryosuke Yamazaki
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Method and system for measuring a surface topography of an object
- Patent number 12,146,740
- Issue date Nov 19, 2024
- Carl Zeiss Industrielle Messtechnik GmbH
- Daniel Bublitz
- G01 - MEASURING TESTING
Information Patent Grant
Photo-acoustic tomography defect testing system and method
- Patent number 12,146,861
- Issue date Nov 19, 2024
- Seurat Technologies, Inc.
- Francis L. Leard
- G01 - MEASURING TESTING
Information Patent Grant
Megasonic clean with cavity property monitoring
- Patent number 12,128,456
- Issue date Oct 29, 2024
- Applied Materials, Inc.
- Banqiu Wu
- B08 - CLEANING
Information Patent Grant
Phase unwrapping using segmentation
- Patent number 12,130,129
- Issue date Oct 29, 2024
- Arizona Board of Regents on behalf of the University of Arizona
- Rongguang Liang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for detecting texture of geometric element, geometric shape...
- Patent number 12,117,288
- Issue date Oct 15, 2024
- H.P.B. OPTOELECTRONICS CO., LTD.
- Hsuan-Yueh Hsu
- G01 - MEASURING TESTING
Information Patent Grant
Surface roughness and emissivity determination
- Patent number 12,098,914
- Issue date Sep 24, 2024
- Applied Materials, Inc.
- Eric Chin Hong Ng
- G01 - MEASURING TESTING
Information Patent Grant
Control system for the quality of processing pipes made of thermopl...
- Patent number 12,094,103
- Issue date Sep 17, 2024
- SICA S.p.A.
- Lorenzo Spagna
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for evaluating a status of a material in metallur...
- Patent number 12,085,384
- Issue date Sep 10, 2024
- PANERATECH, INC.
- Yakup Bayram
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Web edge metrology
- Patent number 12,080,869
- Issue date Sep 3, 2024
- Applied Materials, Inc.
- David Masayuki Ishikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface topography measurement systems
- Patent number 12,075,148
- Issue date Aug 27, 2024
- GelSight, Inc.
- Janos Rohaly
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Inspection robot having adjustable resolution
- Patent number 12,061,484
- Issue date Aug 13, 2024
- Gecko Robotics, Inc.
- Mark Loosararian
- B60 - VEHICLES IN GENERAL
Information Patent Grant
System, method, and apparatus for inspecting a surface
- Patent number 12,061,483
- Issue date Aug 13, 2024
- Gecko Robotics, Inc.
- Mark Loosararian
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Wafer surface defect inspection method and apparatus thereof
- Patent number 12,044,631
- Issue date Jul 23, 2024
- GlobalWafers Co., Ltd.
- Shang-Chi Wang
- G01 - MEASURING TESTING
Information Patent Grant
Wafer inspection apparatus and method
- Patent number 12,038,389
- Issue date Jul 16, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chung-Pin Chou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Payload with adjustable and rotatable sensor sleds for robotic insp...
- Patent number 12,013,705
- Issue date Jun 18, 2024
- Gecko Robotics, Inc.
- Mark Loosararian
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Surface topography measurement systems
- Patent number 12,010,415
- Issue date Jun 11, 2024
- GelSight, Inc.
- Janos Rohaly
- G01 - MEASURING TESTING
Information Patent Grant
System and method for determining field surface conditions using vi...
- Patent number 12,007,222
- Issue date Jun 11, 2024
- CNH Industrial Canada, Ltd.
- James W. Henry
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for monitoring a powder bed process in additive m...
- Patent number 11,964,435
- Issue date Apr 23, 2024
- Nanyang Technological University
- Matteo Seita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical measurement device and optical measurement method
- Patent number 11,960,101
- Issue date Apr 16, 2024
- Dai Nippon Printing Co., Ltd.
- Makio Kurashige
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR PACKAGE INSPECTION METHOD AND METHOD OF MANUFACTURING...
- Publication number 20250182267
- Publication date Jun 5, 2025
- Samsung Electronics Co., Ltd.
- Jaemin Jeon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SURFACE ROUGHNESS AND EMISSIVITY DETERMINATION
- Publication number 20250164238
- Publication date May 22, 2025
- Applied Materials, Inc.
- Eric Chin Hong Ng
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR ANALYSING THE SURFACE QUALITY OF A SUBSTRAT...
- Publication number 20250164239
- Publication date May 22, 2025
- IMAGINE OPTIC
- Xavier Levecq
- G01 - MEASURING TESTING
Information Patent Application
FLATNESS ERROR RESISTANT PHOTOMASK MEASUREMENT TECHNIQUES
- Publication number 20250164240
- Publication date May 22, 2025
- Corning Incorporated
- Thomas James Dunn
- G01 - MEASURING TESTING
Information Patent Application
LASER DEVICE AND METHOD OF USING THE SAME
- Publication number 20250149844
- Publication date May 8, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yu-Hua HSIEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
UNEVENNESS MEASURING DEVICE FOR SHEET-SHAPED MATERIAL, AND UNEVENNE...
- Publication number 20250139755
- Publication date May 1, 2025
- TORAY INDUSTRIES, INC.
- Shota Oishi
- G01 - MEASURING TESTING
Information Patent Application
TWIST AND TILT VERIFICATION USING DIFFRACTION PATTERNS
- Publication number 20250116512
- Publication date Apr 10, 2025
- Axcelis Technologies, Inc.
- Phillip Geissbühler
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL APPARATUS, OPTICAL INSPECTION SYSTEM, AND METHOD FOR IMAGIN...
- Publication number 20250093152
- Publication date Mar 20, 2025
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING THE FLATNESS OF FLEXIBLE WEB MATERIAL, METHO...
- Publication number 20250076037
- Publication date Mar 6, 2025
- KDESIGN GMBH
- Richard ZIMMERMANN
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
TOPOGRAPHICAL INSPECTION
- Publication number 20250076207
- Publication date Mar 6, 2025
- SPIRIT AEROSYSTEMS, INC
- Mark Haynes
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, APPARATUS AND METHOD FOR IMPROVED LOCATION IDENTIFICATION W...
- Publication number 20250033212
- Publication date Jan 30, 2025
- Gecko Robotics, Inc.
- Alberto Pinero
- B60 - VEHICLES IN GENERAL
Information Patent Application
MEASUREMENT SYSTEM AND MEASUREMENT METHOD
- Publication number 20250035434
- Publication date Jan 30, 2025
- Panasonic Intellectual Property Management Co., Ltd.
- AKIRA HASHIYA
- G01 - MEASURING TESTING
Information Patent Application
MACHINE TOOL
- Publication number 20250035435
- Publication date Jan 30, 2025
- Mitsubishi Electric Corporation
- Hiroki GOTO
- G01 - MEASURING TESTING
Information Patent Application
AN INSPECTION TOOL FOR INSPECTING A CONCRETE SURFACE
- Publication number 20250020627
- Publication date Jan 16, 2025
- HUSQVARNA AB
- Andreas Jonsson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE FOR DETERMINING REASONABLE SAMPLING INTERVAL WITH...
- Publication number 20250003741
- Publication date Jan 2, 2025
- CHINA UNIVERSITY OF GEOSCIENCES (WUHAN)
- Yunfeng GE
- G01 - MEASURING TESTING
Information Patent Application
IDENTIFICATION APPARATUS
- Publication number 20240426758
- Publication date Dec 26, 2024
- Canon Kabushiki Kaisha
- Yuki Yonetani
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR TACTILE INTELLIGENCE
- Publication number 20240401936
- Publication date Dec 5, 2024
- GELSIGHT, INC.
- Janos Rohaly
- G01 - MEASURING TESTING
Information Patent Application
RETROGRAPHIC SENSORS
- Publication number 20240384983
- Publication date Nov 21, 2024
- GELSIGHT, INC.
- Edward H. Adelson
- G01 - MEASURING TESTING
Information Patent Application
WEB EDGE METROLOGY
- Publication number 20240387792
- Publication date Nov 21, 2024
- Applied Materials, Inc.
- David Masayuki ISHIKAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTILAYER FILM MEASURING DEVICE AND MULTILAYER FILM MEASURING METHOD
- Publication number 20240369354
- Publication date Nov 7, 2024
- Interface Technology (ChengDu) Co., Ltd.
- LING-KUEI HUNG
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR ASCERTAINING THE SURFACE QUALITY OF AT LEAST...
- Publication number 20240367701
- Publication date Nov 7, 2024
- MATE GmbH
- Daniel Ludwig MIHALIC
- B61 - RAILWAYS
Information Patent Application
SURFACE IDENTIFICATION SENSOR USING REFLECTED LIGHT AND MACHINE LEA...
- Publication number 20240361122
- Publication date Oct 31, 2024
- Useful Sensors Inc.
- James Muyao Wang
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, METHOD, AND APPARATUS FOR INSPECTING A SURFACE
- Publication number 20240345580
- Publication date Oct 17, 2024
- Gecko Robotics, Inc.
- Mark Loosararian
- B60 - VEHICLES IN GENERAL
Information Patent Application
A SYSTEM AND METHOD FOR SENSING TOPOLOGY OF A PLANET
- Publication number 20240337482
- Publication date Oct 10, 2024
- Suyash Singh
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR TACTILE INTELLIGENCE
- Publication number 20240318954
- Publication date Sep 26, 2024
- GELSIGHT, INC.
- Janos ROHALY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM, APPARATUS AND METHOD FOR IMPROVED LOCATION IDENTIFICATION W...
- Publication number 20240316775
- Publication date Sep 26, 2024
- Gecko Robotics, Inc.
- Alberto Pinero
- B60 - VEHICLES IN GENERAL
Information Patent Application
WAFER INSPECTION APPARATUS AND METHOD
- Publication number 20240319109
- Publication date Sep 26, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chung-Pin Chou
- G01 - MEASURING TESTING
Information Patent Application
RETROGRAPHIC SENSING
- Publication number 20240247930
- Publication date Jul 25, 2024
- GELSIGHT, INC.
- Janos Rohaly
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR MEASURING HEIGHT PROPERTIES OF SURFACES
- Publication number 20240191986
- Publication date Jun 13, 2024
- Nikon Corporation
- Eric Peter Goodwin
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS AND METHOD FOR ROUGHNESS AND/OR DEFECT MEASUREM...
- Publication number 20240183655
- Publication date Jun 6, 2024
- ASML NETHERLANDS B.V.
- Alexander VON FINCK
- G01 - MEASURING TESTING

using photoelectric detection means

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and system for inspecting a surface with artifical intellige...

System and method for calibrating agricultural field surface profil...

Device and method for characterising the roughness profile of a tis...

Imaging device

Method and device for determining reasonable sampling interval with...

Identification apparatus

Laser device and method of using the same

Measurement system and program

Device and method for inspecting reflective surfaces

System, apparatus and method for improved location identification w...

Vehicle with road surface condition detector

Method and system for measuring a surface topography of an object

Photo-acoustic tomography defect testing system and method

Megasonic clean with cavity property monitoring

Phase unwrapping using segmentation

Method for detecting texture of geometric element, geometric shape...

Surface roughness and emissivity determination

Control system for the quality of processing pipes made of thermopl...

System and method for evaluating a status of a material in metallur...

Web edge metrology

Surface topography measurement systems

Inspection robot having adjustable resolution

System, method, and apparatus for inspecting a surface

Wafer surface defect inspection method and apparatus thereof

Wafer inspection apparatus and method

Payload with adjustable and rotatable sensor sleds for robotic insp...

Surface topography measurement systems

System and method for determining field surface conditions using vi...

Method and system for monitoring a powder bed process in additive m...

Optical measurement device and optical measurement method

Patents Applicationslast 30 patents

SEMICONDUCTOR PACKAGE INSPECTION METHOD AND METHOD OF MANUFACTURING...

SURFACE ROUGHNESS AND EMISSIVITY DETERMINATION

SYSTEMS AND METHODS FOR ANALYSING THE SURFACE QUALITY OF A SUBSTRAT...

FLATNESS ERROR RESISTANT PHOTOMASK MEASUREMENT TECHNIQUES

LASER DEVICE AND METHOD OF USING THE SAME

UNEVENNESS MEASURING DEVICE FOR SHEET-SHAPED MATERIAL, AND UNEVENNE...

TWIST AND TILT VERIFICATION USING DIFFRACTION PATTERNS

OPTICAL APPARATUS, OPTICAL INSPECTION SYSTEM, AND METHOD FOR IMAGIN...

METHOD FOR DETERMINING THE FLATNESS OF FLEXIBLE WEB MATERIAL, METHO...

TOPOGRAPHICAL INSPECTION

SYSTEM, APPARATUS AND METHOD FOR IMPROVED LOCATION IDENTIFICATION W...

MEASUREMENT SYSTEM AND MEASUREMENT METHOD

MACHINE TOOL

AN INSPECTION TOOL FOR INSPECTING A CONCRETE SURFACE

METHOD AND DEVICE FOR DETERMINING REASONABLE SAMPLING INTERVAL WITH...

IDENTIFICATION APPARATUS

SYSTEMS AND METHODS FOR TACTILE INTELLIGENCE

RETROGRAPHIC SENSORS

WEB EDGE METROLOGY

MULTILAYER FILM MEASURING DEVICE AND MULTILAYER FILM MEASURING METHOD

METHOD AND DEVICE FOR ASCERTAINING THE SURFACE QUALITY OF AT LEAST...

SURFACE IDENTIFICATION SENSOR USING REFLECTED LIGHT AND MACHINE LEA...

SYSTEM, METHOD, AND APPARATUS FOR INSPECTING A SURFACE

A SYSTEM AND METHOD FOR SENSING TOPOLOGY OF A PLANET

SYSTEMS AND METHODS FOR TACTILE INTELLIGENCE

SYSTEM, APPARATUS AND METHOD FOR IMPROVED LOCATION IDENTIFICATION W...

WAFER INSPECTION APPARATUS AND METHOD

RETROGRAPHIC SENSING

SYSTEMS AND METHODS FOR MEASURING HEIGHT PROPERTIES OF SURFACES

MEASURING APPARATUS AND METHOD FOR ROUGHNESS AND/OR DEFECT MEASUREM...