Number | Date | Country | Kind |
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991071 | May 1999 | FI |
This application is a Continuation of International Application PCT/F100/00412 filed May 9, 2000 which designated the U.S. and was published under PCT Article 21(2) in English, and which is hereby incorporated herein in its entirety by reference.
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Entry |
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Copy of International Search Report for PCT/FI00/00412, completed Aug. 24, 2000. |
Copy of Finnish Official Action for Patent Appl. No. 991071, dated Feb. 25, 2000. |
J. Steurer, H. Giebel and W. Altner, Ein lichtmikroskopisches Verfahren zur zweieinhalbdiumensionalen Auswertung von Oberflächen, In Proc. 8. DAGM-Symp. Mustererkennung, 1986, Informatik Fachberichte 125, edited by G. Hartmann, pp. 66-70, Springer, Berlin. |
Number | Date | Country | |
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Parent | PCT/FI00/00412 | May 2000 | US |
Child | 10/003333 | US |