Number | Date | Country | Kind |
---|---|---|---|
42 42 023.7 | Dec 1992 | DEX | |
43 00 610.8 | Jan 1993 | DEX |
Number | Name | Date | Kind |
---|---|---|---|
4982164 | Schiek et al. | Jan 1991 | |
5097215 | Eul et al. | Mar 1992 | |
5313166 | Eul et al. | May 1994 |
Entry |
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"S-Parameter Test Adapter ZPV-Z5", Rohde & Schwarz data sheet, Germany, pp. 1-4 (not dated). |
"16-Term Error Model And Calibration Procedure For On-Wafer Network Analysis Measurements", Butler et al., IEEE Transactions on Microwave Theory & Techniques, vol. 39, No. 12, Dec. 1991, pp. 211-2217. |