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Calibrating; Standards or reference devices
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G01R35/005
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PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R35/00
Testing or calibrating of apparatus covered by the preceding groups
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G01R35/005
Calibrating; Standards or reference devices
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Patents Grants
last 30 patents
Information
Patent Grant
Partial discharge measurement apparatus, partial discharge measurem...
Patent number
12,210,050
Issue date
Jan 28, 2025
Kabushiki Kaisha Toshiba
Akira Fujimoto
G01 - MEASURING TESTING
Information
Patent Grant
Current sensor configuration and calibration
Patent number
12,210,083
Issue date
Jan 28, 2025
Texas Instruments Incorporated
Erick Macias
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Transceiver for transmitting and receiving signals and method for t...
Patent number
12,203,992
Issue date
Jan 21, 2025
NXP USA, INC.
Guillaume Mouret
G01 - MEASURING TESTING
Information
Patent Grant
System and method for calibrating a non-contact energy metering ass...
Patent number
12,196,790
Issue date
Jan 14, 2025
SCHNEIDER ELECTRIC USA, INC.
Colin N. Gunn
G01 - MEASURING TESTING
Information
Patent Grant
Calibration system and method for magnetometers
Patent number
12,196,834
Issue date
Jan 14, 2025
COGNITIVE MEDICAL IMAGING LTD.
Fan Wang
G01 - MEASURING TESTING
Information
Patent Grant
AC/DC converter with power factor correction and method for calibra...
Patent number
12,194,877
Issue date
Jan 14, 2025
Vitesco Technologies GmbH
Philippe Boissiere
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Calibration system and calibration method for a vector network anal...
Patent number
12,188,968
Issue date
Jan 7, 2025
Rohde & Schwarz GmbH & Co. KG
Maximilian Friesinger
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for battery SOC correction, and battery manage...
Patent number
12,169,223
Issue date
Dec 17, 2024
Jiangsu Contemporary Amperex Technology Limited
Shan Huang
G01 - MEASURING TESTING
Information
Patent Grant
Self-correcting electrical current measuring devices
Patent number
12,164,015
Issue date
Dec 10, 2024
Vutility, Inc.
Micheal Austin
G01 - MEASURING TESTING
Information
Patent Grant
High-frequency component test device and method thereof
Patent number
12,163,989
Issue date
Dec 10, 2024
Industrial Technology Research Institute
Sih-Han Li
G01 - MEASURING TESTING
Information
Patent Grant
Probe card for testing power devices under high temperature and hig...
Patent number
12,158,481
Issue date
Dec 3, 2024
MAXONE SEMICONDUCTOR (SUZHOU) CO., LTD.
Liangyu Zhao
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for monitoring power lines
Patent number
12,153,116
Issue date
Nov 26, 2024
NUGRID POWER CORP.
Patrick Pablo Chavez
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Fast RF power measurement apparatus for production testing
Patent number
12,146,935
Issue date
Nov 19, 2024
Silicon Laboratories Inc.
Anant Verma
G01 - MEASURING TESTING
Information
Patent Grant
Current measurement system
Patent number
12,146,900
Issue date
Nov 19, 2024
LEM International SA
Damien Coutellier
G01 - MEASURING TESTING
Information
Patent Grant
Medium voltage sensor using a multi-component resistive voltage div...
Patent number
12,140,615
Issue date
Nov 12, 2024
Aclara Technologies LLC
Michael Giovannoni
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Measuring device
Patent number
12,130,320
Issue date
Oct 29, 2024
Osaka University
Tsuyoshi Sekitani
G01 - MEASURING TESTING
Information
Patent Grant
Operation circuit having lower calibration time and calibration met...
Patent number
12,111,379
Issue date
Oct 8, 2024
Richtek Technology Corporation
Yu-Hsin Lih
G01 - MEASURING TESTING
Information
Patent Grant
Method for electronic calibration of magnetic particle imaging system
Patent number
12,097,017
Issue date
Sep 24, 2024
Aselsan Elektronik Sanayi Ve Ticaret Anonim Sirketi
Can Baris Top
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Dual magnetometer calibration
Patent number
12,099,107
Issue date
Sep 24, 2024
Gatekeeper Systems, Inc.
Scott J. Carter
G01 - MEASURING TESTING
Information
Patent Grant
Timing-drift calibration
Patent number
12,094,553
Issue date
Sep 17, 2024
RAMBUS INC.
Yohan U. Frans
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Application of electrochemical impedance spectroscopy in sensor sys...
Patent number
12,082,929
Issue date
Sep 10, 2024
Medtronic MiniMed, Inc.
Ning Yang
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Method and apparatus for contactless voltage and current estimation...
Patent number
12,085,591
Issue date
Sep 10, 2024
HARTING Electric Stiftung & Co. KG
Vivek R. Dave
G01 - MEASURING TESTING
Information
Patent Grant
Current measurement circuit with multiple operation modes
Patent number
12,085,593
Issue date
Sep 10, 2024
Infineon Technologies AG
Christian Djelassi-Tscheck
G01 - MEASURING TESTING
Information
Patent Grant
Multichannel electrical power grid monitoring system for detecting...
Patent number
12,066,470
Issue date
Aug 20, 2024
3M Innovative Properties Company
Douglas B. Gundel
G01 - MEASURING TESTING
Information
Patent Grant
Integrated thin-film resistive sensor with integrated heater and me...
Patent number
12,066,514
Issue date
Aug 20, 2024
Cirrus Logic, Inc.
Vamsikrishna Parupalli
G01 - MEASURING TESTING
Information
Patent Grant
Electric field probe and magnetic field probe calibration system an...
Patent number
12,055,616
Issue date
Aug 6, 2024
Zhejiang University
Xingchang Wei
G01 - MEASURING TESTING
Information
Patent Grant
Integrators for current sensors
Patent number
12,055,617
Issue date
Aug 6, 2024
The United States of America, as represented by the Secretary of the Navy
Charles Nelatury
G01 - MEASURING TESTING
Information
Patent Grant
Hybrid harmonic source pull tuner system
Patent number
12,052,008
Issue date
Jul 30, 2024
Christos Tsironis
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Capacitance measurement method, system and apparatus, electronic de...
Patent number
12,044,716
Issue date
Jul 23, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
Bo Yang
G01 - MEASURING TESTING
Information
Patent Grant
Field probe isotropic compensation using orthogonal scalar field co...
Patent number
12,025,643
Issue date
Jul 2, 2024
ETS-Lindgren Inc.
Zhong Chen
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SELF-CORRECTING ELECTRICAL CURRENT MEASURING DEVICES
Publication number
20250060445
Publication date
Feb 20, 2025
Vutility, Inc.
Micheal M. Austin
G01 - MEASURING TESTING
Information
Patent Application
SELF-CALIBRATING CURRENT SENSOR PACKAGE
Publication number
20250060394
Publication date
Feb 20, 2025
Infineon Technologies AG
Simone FONTANESI
G01 - MEASURING TESTING
Information
Patent Application
SMART CURRENT TRANSFORMER SYSTEM
Publication number
20250052834
Publication date
Feb 13, 2025
Accuenergy (Canada) Inc.
Yufan Wang
G01 - MEASURING TESTING
Information
Patent Application
SMART CURRENT TRANSFORMER SYSTEM
Publication number
20250052844
Publication date
Feb 13, 2025
Accuenergy (Canada) Inc.
Yufan Wang
G01 - MEASURING TESTING
Information
Patent Application
TIMING-DRIFT CALIBRATION
Publication number
20250054561
Publication date
Feb 13, 2025
Rambus Inc.
Yohan U. Frans
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
POWER SENSOR ARRANGEMENT FOR ON-WAFER POWER CALIBRATION
Publication number
20250052845
Publication date
Feb 13, 2025
ROHDE & SCHWARZ GMBH & CO. KG
Christopher STUMPF
G01 - MEASURING TESTING
Information
Patent Application
TEST AND/OR MEASUREMENT SYSTEM AND METHOD FOR CALIBRATING A TEST AN...
Publication number
20250052846
Publication date
Feb 13, 2025
ROHDE & SCHWARZ GMBH & CO. KG
Julian HARMS
G01 - MEASURING TESTING
Information
Patent Application
FAST RF POWER MEASUREMENT APPARATUS FOR PRODUCTION TESTING
Publication number
20250044393
Publication date
Feb 6, 2025
Silicon Laboratories Inc.
Anant Verma
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF MONITORING POWER LINES
Publication number
20250044339
Publication date
Feb 6, 2025
NUGRID POWER CORP.
Farnoosh RAHMATIAN
G01 - MEASURING TESTING
Information
Patent Application
WAFER PROBE STATION AND METHOD FOR ESTABLISHING AN EVALUATION MODEL...
Publication number
20250044349
Publication date
Feb 6, 2025
MPI CORPORATION
ANDREJ RUMIANTSEV
G01 - MEASURING TESTING
Information
Patent Application
HIGH-FREQUENCY COMPONENT TEST DEVICE AND METHOD THEREOF
Publication number
20250044332
Publication date
Feb 6, 2025
Industrial Technology Research Institute
Sih-Han LI
G01 - MEASURING TESTING
Information
Patent Application
Current Sensing Calibration Method and Current Sensing Calibration...
Publication number
20250035730
Publication date
Jan 30, 2025
HIMAX TECHNOLOGIES LIMITED
Te-Chieh Kung
G01 - MEASURING TESTING
Information
Patent Application
DETECTION CIRCUIT FOR POWER LOAD AND METHOD FOR DETECTION THEREOF
Publication number
20250028007
Publication date
Jan 23, 2025
INFSITRONIX TECHNOLOGY CORPORATION
Hui-Tsung Yang
G01 - MEASURING TESTING
Information
Patent Application
SENSOR INTEGRATED CIRCUIT WITH CURRENT OUTPUT CALIBRATION
Publication number
20250027975
Publication date
Jan 23, 2025
ALLEGRO MICROSYSTEMS, LLC
Matthew Hein
G01 - MEASURING TESTING
Information
Patent Application
MEDIUM VOLTAGE SENSOR USING A MULTI-COMPONENT RESISTIVE VOLTAGE DIV...
Publication number
20250020704
Publication date
Jan 16, 2025
Aclara Technologies, LLC
Michael Giovannoni
G01 - MEASURING TESTING
Information
Patent Application
CALIBRATION METHOD FOR CALIBRATING A MEASUREMENT SYSTEM
Publication number
20250020752
Publication date
Jan 16, 2025
ROHDE &SCHWARZ GMBH & CO. KG
Julius SEEGER
G01 - MEASURING TESTING
Information
Patent Application
NON-INVASIVE RADIO-FREQUENCY ANALYTE SENSORS, SYSTEMS AND METHODS
Publication number
20250020748
Publication date
Jan 16, 2025
Know Labs, Inc.
John CRONIN
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CORRECTING CAPACITANCE MEASUREMENT VALUE UNDER HIGH LEAK...
Publication number
20250020751
Publication date
Jan 16, 2025
Shanghai Huali Integrated Circuit Corporation
Xiaoming LIU
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUS FOR AUTOMATIC TV ON/OFF DETECTION
Publication number
20250016301
Publication date
Jan 9, 2025
The Nielsen Company (US), LLC
Michael Jordan Liss
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Application
ZERO-PHASE CALIBRATION METHOD, COMPUTER DEVICE AND STORAGE MEDIUM
Publication number
20250004102
Publication date
Jan 2, 2025
TUNKIA CO., LTD.
Xinhua Zhou
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR PROVIDING A CALIBRATION NUMBER, COMPUTER PROGRAM PRODUCT...
Publication number
20250004037
Publication date
Jan 2, 2025
TRUMPF Photonic Components GmbH
Sven Bader
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Calibration Method of State of Charge, and Battery System for Provi...
Publication number
20240426924
Publication date
Dec 26, 2024
LG ENERGY SOLUTION, LTD.
Seongjun Yun
G01 - MEASURING TESTING
Information
Patent Application
SENSOR SYSTEM AND METHOD FOR CALIBRATING A SENSOR SYSTEM
Publication number
20240426886
Publication date
Dec 26, 2024
ROHDE & SCHWARZ GMBH & CO. KG
Thomas RUSTER
G01 - MEASURING TESTING
Information
Patent Application
CALIBRATION DEVICE, SETUP, AND METHOD FOR MEASURING A RADIO FREQUEN...
Publication number
20240426957
Publication date
Dec 26, 2024
ROHDE & SCHWARZ GMBH & CO. KG
Pedro RODRIGUEZ
G01 - MEASURING TESTING
Information
Patent Application
DC FAULT MANAGED POWER SYSTEM
Publication number
20240421594
Publication date
Dec 19, 2024
SCHNEIDER ELECTRIC USA, INC.
Paras Patodi
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
PROCESS-VOLTAGE SENSOR WITH SMALLER CHIP AREA
Publication number
20240410920
Publication date
Dec 12, 2024
MEDIATEK INC.
Yi-Ta Lin
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE CALIBRATION SYSTEM, INSPECTION APPARATUS, AND TEMPERATU...
Publication number
20240402021
Publication date
Dec 5, 2024
TOKYO ELECTRON LIMITED
Tomohiro OTA
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR ON-DIE IMPEDANCE CALIBRATION
Publication number
20240402278
Publication date
Dec 5, 2024
STMicroelectronics International N.V.
Ravinder Kumar KUMAR
G01 - MEASURING TESTING
Information
Patent Application
ASYMMETRIC COMPENSATION METHOD AND APPARATUS FOR TWO-PORT NEAR FIEL...
Publication number
20240402265
Publication date
Dec 5, 2024
China Electronic Product Reliability and Environmental Testing Research Insti...
Weiheng Shao
G01 - MEASURING TESTING
Information
Patent Application
Current Detection Circuit and Electronic Device
Publication number
20240402222
Publication date
Dec 5, 2024
Halo Microelectronics Co., Ltd.
Dongming Liu
G01 - MEASURING TESTING