Membership
Tour
Register
Log in
Calibrating; Standards or reference devices
Follow
Industry
CPC
G01R35/005
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R35/00
Testing or calibrating of apparatus covered by the preceding groups
Current Industry
G01R35/005
Calibrating; Standards or reference devices
Industries
Overview
Organizations
People
Information
Impact
Please log in for detailed analytics
Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for battery SOC correction, and battery manage...
Patent number
12,169,223
Issue date
Dec 17, 2024
Jiangsu Contemporary Amperex Technology Limited
Shan Huang
G01 - MEASURING TESTING
Information
Patent Grant
Self-correcting electrical current measuring devices
Patent number
12,164,015
Issue date
Dec 10, 2024
Vutility, Inc.
Micheal Austin
G01 - MEASURING TESTING
Information
Patent Grant
High-frequency component test device and method thereof
Patent number
12,163,989
Issue date
Dec 10, 2024
Industrial Technology Research Institute
Sih-Han Li
G01 - MEASURING TESTING
Information
Patent Grant
Probe card for testing power devices under high temperature and hig...
Patent number
12,158,481
Issue date
Dec 3, 2024
MAXONE SEMICONDUCTOR (SUZHOU) CO., LTD.
Liangyu Zhao
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for monitoring power lines
Patent number
12,153,116
Issue date
Nov 26, 2024
NUGRID POWER CORP.
Patrick Pablo Chavez
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Fast RF power measurement apparatus for production testing
Patent number
12,146,935
Issue date
Nov 19, 2024
Silicon Laboratories Inc.
Anant Verma
G01 - MEASURING TESTING
Information
Patent Grant
Current measurement system
Patent number
12,146,900
Issue date
Nov 19, 2024
LEM International SA
Damien Coutellier
G01 - MEASURING TESTING
Information
Patent Grant
Medium voltage sensor using a multi-component resistive voltage div...
Patent number
12,140,615
Issue date
Nov 12, 2024
Aclara Technologies LLC
Michael Giovannoni
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Measuring device
Patent number
12,130,320
Issue date
Oct 29, 2024
Osaka University
Tsuyoshi Sekitani
G01 - MEASURING TESTING
Information
Patent Grant
Operation circuit having lower calibration time and calibration met...
Patent number
12,111,379
Issue date
Oct 8, 2024
Richtek Technology Corporation
Yu-Hsin Lih
G01 - MEASURING TESTING
Information
Patent Grant
Method for electronic calibration of magnetic particle imaging system
Patent number
12,097,017
Issue date
Sep 24, 2024
Aselsan Elektronik Sanayi Ve Ticaret Anonim Sirketi
Can Baris Top
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Dual magnetometer calibration
Patent number
12,099,107
Issue date
Sep 24, 2024
Gatekeeper Systems, Inc.
Scott J. Carter
G01 - MEASURING TESTING
Information
Patent Grant
Timing-drift calibration
Patent number
12,094,553
Issue date
Sep 17, 2024
RAMBUS INC.
Yohan U. Frans
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Application of electrochemical impedance spectroscopy in sensor sys...
Patent number
12,082,929
Issue date
Sep 10, 2024
Medtronic MiniMed, Inc.
Ning Yang
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Method and apparatus for contactless voltage and current estimation...
Patent number
12,085,591
Issue date
Sep 10, 2024
HARTING Electric Stiftung & Co. KG
Vivek R. Dave
G01 - MEASURING TESTING
Information
Patent Grant
Current measurement circuit with multiple operation modes
Patent number
12,085,593
Issue date
Sep 10, 2024
Infineon Technologies AG
Christian Djelassi-Tscheck
G01 - MEASURING TESTING
Information
Patent Grant
Multichannel electrical power grid monitoring system for detecting...
Patent number
12,066,470
Issue date
Aug 20, 2024
3M Innovative Properties Company
Douglas B. Gundel
G01 - MEASURING TESTING
Information
Patent Grant
Integrated thin-film resistive sensor with integrated heater and me...
Patent number
12,066,514
Issue date
Aug 20, 2024
Cirrus Logic, Inc.
Vamsikrishna Parupalli
G01 - MEASURING TESTING
Information
Patent Grant
Electric field probe and magnetic field probe calibration system an...
Patent number
12,055,616
Issue date
Aug 6, 2024
Zhejiang University
Xingchang Wei
G01 - MEASURING TESTING
Information
Patent Grant
Integrators for current sensors
Patent number
12,055,617
Issue date
Aug 6, 2024
The United States of America, as represented by the Secretary of the Navy
Charles Nelatury
G01 - MEASURING TESTING
Information
Patent Grant
Hybrid harmonic source pull tuner system
Patent number
12,052,008
Issue date
Jul 30, 2024
Christos Tsironis
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Capacitance measurement method, system and apparatus, electronic de...
Patent number
12,044,716
Issue date
Jul 23, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
Bo Yang
G01 - MEASURING TESTING
Information
Patent Grant
Field probe isotropic compensation using orthogonal scalar field co...
Patent number
12,025,643
Issue date
Jul 2, 2024
ETS-Lindgren Inc.
Zhong Chen
G01 - MEASURING TESTING
Information
Patent Grant
System for calibration management and method of managing calibration
Patent number
12,025,687
Issue date
Jul 2, 2024
Rohde & Schwarz GmbH & Co. KG
Kai-Uwe Schmidt
G01 - MEASURING TESTING
Information
Patent Grant
Calibration system and method
Patent number
12,013,435
Issue date
Jun 18, 2024
Westinghouse Electric Company LLC
Timothy S. Meyers
G01 - MEASURING TESTING
Information
Patent Grant
Detection unit, semiconductor film layer inspection apparatus inclu...
Patent number
12,000,866
Issue date
Jun 4, 2024
EnVigth Co., Ltd.
Hyoung Sik Kim
G01 - MEASURING TESTING
Information
Patent Grant
Calibration and verification system and method for directional sensor
Patent number
11,994,410
Issue date
May 28, 2024
China National Petroleum Corporation
Zhuoran Meng
G01 - MEASURING TESTING
Information
Patent Grant
5-PS-resolution waveform-capture-device on a field-programmable gat...
Patent number
11,994,571
Issue date
May 28, 2024
OHIO STATE INNOVATION FOUNDATION
Noeloikeau Charlot
G01 - MEASURING TESTING
Information
Patent Grant
Ranging systems and methods for decreasing transitive effects in mu...
Patent number
11,982,730
Issue date
May 14, 2024
Lake Shore Cryotronics, Inc.
Houston Fortney
G01 - MEASURING TESTING
Information
Patent Grant
Parallel plate capacitor system for determining impedance character...
Patent number
11,965,873
Issue date
Apr 23, 2024
TransTech Systems, Inc.
Manfred Geier
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DC FAULT MANAGED POWER SYSTEM
Publication number
20240421594
Publication date
Dec 19, 2024
SCHNEIDER ELECTRIC USA, INC.
Paras Patodi
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
PROCESS-VOLTAGE SENSOR WITH SMALLER CHIP AREA
Publication number
20240410920
Publication date
Dec 12, 2024
MEDIATEK INC.
Yi-Ta Lin
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR ON-DIE IMPEDANCE CALIBRATION
Publication number
20240402278
Publication date
Dec 5, 2024
STMicroelectronics International N.V.
Ravinder Kumar KUMAR
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE CALIBRATION SYSTEM, INSPECTION APPARATUS, AND TEMPERATU...
Publication number
20240402021
Publication date
Dec 5, 2024
TOKYO ELECTRON LIMITED
Tomohiro OTA
G01 - MEASURING TESTING
Information
Patent Application
ASYMMETRIC COMPENSATION METHOD AND APPARATUS FOR TWO-PORT NEAR FIEL...
Publication number
20240402265
Publication date
Dec 5, 2024
China Electronic Product Reliability and Environmental Testing Research Insti...
Weiheng Shao
G01 - MEASURING TESTING
Information
Patent Application
Current Detection Circuit and Electronic Device
Publication number
20240402222
Publication date
Dec 5, 2024
Halo Microelectronics Co., Ltd.
Dongming Liu
G01 - MEASURING TESTING
Information
Patent Application
TEST SYSTEM AND METHOD FOR DATA VERIFICATION FOR THE SAME
Publication number
20240402238
Publication date
Dec 5, 2024
MPI Corporation
Andrej Rumiantsev
G01 - MEASURING TESTING
Information
Patent Application
CONFIGURATION METHOD OF CONFIGURING A MEASUREMENT INSTRUMENT
Publication number
20240385213
Publication date
Nov 21, 2024
ROHDE &SCHWARZ GMBH & CO. KG
Julius SEEGER
G01 - MEASURING TESTING
Information
Patent Application
Method of self-calibration current sensor
Publication number
20240369666
Publication date
Nov 7, 2024
Honeywell International Inc.
Zhi LIU
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHODS FOR MEASURING ARC DURATION
Publication number
20240361387
Publication date
Oct 31, 2024
Georgia Tech Research Corporation
Ning Guo
G01 - MEASURING TESTING
Information
Patent Application
HIGH CURRENT MEASURING DEVICE
Publication number
20240361359
Publication date
Oct 31, 2024
ROOTECH INC.
Changyong JEONG
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR INLINE CALIBRATION OF MULTIPLE RADIO FREQUENC...
Publication number
20240353460
Publication date
Oct 24, 2024
ROHDE & SCHWARZ GMBH & CO. KG
Bessem BACCOUCHE
G01 - MEASURING TESTING
Information
Patent Application
CALIBRATING A BATTERY OF AN INFORMATION HANDLING SYSTEM
Publication number
20240329178
Publication date
Oct 3, 2024
Dell Products L.P.
PEI-YING LIN
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
NON-CONTACTING ANGULAR ENCODER FOR DETERMINATION OF RELATIVE ORIENT...
Publication number
20240329274
Publication date
Oct 3, 2024
1789658 Ontario Ltd O/A Nova Mining Exploration Solutions
Benjamin David POLZER
G01 - MEASURING TESTING
Information
Patent Application
STATE CALIBRATION METHOD AND APPARATUS FOR LOW-VOLTAGE BATTERY, AND...
Publication number
20240319307
Publication date
Sep 26, 2024
CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
Xiyang ZUO
B60 - VEHICLES IN GENERAL
Information
Patent Application
CALIBRATION OF CIRCUITRY PARAMETERS FOR CURRENT SENSING
Publication number
20240319280
Publication date
Sep 26, 2024
TEXAS INSTRUMENTS INCORPORATED
Yicheng Zhou
G01 - MEASURING TESTING
Information
Patent Application
COMPUTING DEVICE CURRENT SENSOR CALIBRATION TRIGGER
Publication number
20240319306
Publication date
Sep 26, 2024
QUALCOMM Incorporated
Suresh SHENOY
G01 - MEASURING TESTING
Information
Patent Application
CALIBRATION FOR ROUTING RESISTANCE INDUCED ERROR
Publication number
20240310432
Publication date
Sep 19, 2024
TEXAS INSTRUMENTS INCORPORATED
Gautam Salil NANDI
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY CURRENT MEASUREMENT SYSTEM C...
Publication number
20240302472
Publication date
Sep 12, 2024
Analog Devices, Inc.
Brian Harrington
G01 - MEASURING TESTING
Information
Patent Application
VOLTAGE MEASUREMENT CHANNEL CALIBRATION FOR BATTERY MANAGEMENT SYSTEMS
Publication number
20240295612
Publication date
Sep 5, 2024
CYPRESS SEMICONDUCTOR CORPORATION
Roman Ogirko
G01 - MEASURING TESTING
Information
Patent Application
TEST POINT VOLTAGE SENSOR
Publication number
20240295622
Publication date
Sep 5, 2024
Schweitzer Engineering Laboratories, Inc.
Henry Loehner
G01 - MEASURING TESTING
Information
Patent Application
INTERCEPT-TEMPERATURE DRIFT CALIBRATION OF A SIGNAL STRENGTH DETECTOR
Publication number
20240280615
Publication date
Aug 22, 2024
Analog Devices, Inc.
Petrus M. Stroet
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC BOARD PROBING STATION
Publication number
20240280629
Publication date
Aug 22, 2024
NVIDIA Corporation
Akhilesh Sandeep Thakur
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR CALIBRATING VOLTAGE MEASUREMENTS IN A SYSTEM...
Publication number
20240272260
Publication date
Aug 15, 2024
Schneider Electric Industries SAS
Michel Hennequin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MEASUREMENT APPARATUS
Publication number
20240264262
Publication date
Aug 8, 2024
Anritsu Corporation
Takashi IWASE
G01 - MEASURING TESTING
Information
Patent Application
RANGING SYSTEMS AND METHODS FOR DECREASING TRANSITIVE EFFECTS IN MU...
Publication number
20240255599
Publication date
Aug 1, 2024
Lake Shore Cryotronics, Inc.
Houston Fortney
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
PEAK DETECTOR CALIBRATION
Publication number
20240248161
Publication date
Jul 25, 2024
INFINEON TECHNOLOGIES AG
Giovanni BOI
G01 - MEASURING TESTING
Information
Patent Application
METHOD, CENTRAL TEST CONTROL UNIT, MEASUREMENT SYSTEM
Publication number
20240241175
Publication date
Jul 18, 2024
Rohde& Schwarz GmbH & Co. KG
Thomas BRAUNSTORFINGER
G01 - MEASURING TESTING
Information
Patent Application
CIRCUIT WITH DYNAMIC CURRENT SENSE CALIBRATION
Publication number
20240230815
Publication date
Jul 11, 2024
TEXAS INSTRUMENTS INCORPORATED
Rushil KISHORE KUMAR
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
ELECTRIC CURRENT SENSOR, STEERING CONTROL DEVICE, AND METHOD FOR DE...
Publication number
20240230741
Publication date
Jul 11, 2024
HL MANDO CORPORATION
Kyu Yeong JE
B62 - LAND VEHICLES FOR TRAVELLING OTHERWISE THAN ON RAILS