Number | Name | Date | Kind |
---|---|---|---|
4129778 | Inoue et al. | Dec 1978 | |
4959848 | Parobek | Sep 1990 |
Number | Date | Country |
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0111854 | Sep 1979 | JPX |
Entry |
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D. P. Salamida, "Measurement of Selenium Thickness on Nickel Substrate Using Bremsstrahlung Radiation," Radiochem Radioanal. Letters, Mar. 1970, pp. 331-337. |
"Standard Method for Measurement of Coating Thickness by X-ray Spectrometry"; ASTM Designation: B 568-85; Feb. 22, 1985. |