for measuring thickness

Industry

CPC
G01B15/02

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B15/00Measuring arrangements characterised by the use of wave or particle radiation

Current Industry

G01B15/02for measuring thickness

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Measurement of metal or alloy coating
- Patent number 12,092,594
- Issue date Sep 17, 2024
- Schlumberger Technology Corporation
- Jill F. Geddes
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for utilizing radio-opaque fillers in multiple la...
- Patent number 12,083,390
- Issue date Sep 10, 2024
- Topgolf Callaway Brands Corp.
- David M. Melanson
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Grant
System and method for evaluating a status of a material in metallur...
- Patent number 12,085,384
- Issue date Sep 10, 2024
- PANERATECH, INC.
- Yakup Bayram
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for non-destructive metrology of thin layers
- Patent number 12,066,391
- Issue date Aug 20, 2024
- NOVA MEASURING INSTRUMENTS, INC.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for measuring a tubular strand
- Patent number 12,064,911
- Issue date Aug 20, 2024
- Sikora AG
- Armin Holle
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for evaluation of a status of a material in me...
- Patent number 12,061,155
- Issue date Aug 13, 2024
- PANERATECH, INC.
- Yakup Bayram
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for measuring a tubular strand
- Patent number 12,055,386
- Issue date Aug 6, 2024
- Sikora AG
- Armin Holle
- G01 - MEASURING TESTING
Information Patent Grant
Strength evaluation device and strength evaluation method
- Patent number 12,050,188
- Issue date Jul 30, 2024
- IHI Corporation
- Sayo Yamaha
- B32 - LAYERED PRODUCTS
Information Patent Grant
Blade portioner calibration
- Patent number RE50028
- Issue date Jul 2, 2024
- John Bean Technologies Corporation
- Jon A. Hocker
Information Patent Grant
Systems, apparatuses, and methods for measuring submerged surfaces
- Patent number 12,025,573
- Issue date Jul 2, 2024
- DELTA SUBSEA LLC
- Scott P. Dingman
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Ice thickness estimation for mobile object operation
- Patent number 12,007,248
- Issue date Jun 11, 2024
- Ford Global Technologies, LLC
- Arun Dutta
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Measurement of thickness of scale or corrosion
- Patent number 12,007,226
- Issue date Jun 11, 2024
- Schlumberger Technology Corporation
- Jill F. Geddes
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for combining x-ray metrology data sets to impr...
- Patent number 11,990,380
- Issue date May 21, 2024
- KLA Corporation
- Christopher Liman
- G01 - MEASURING TESTING
Information Patent Grant
Characterizing and measuring in small boxes using XPS with multiple...
- Patent number 11,988,502
- Issue date May 21, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath Pois
- G01 - MEASURING TESTING
Information Patent Grant
Lib anode coating measurement with dual x-ray
- Patent number 11,982,523
- Issue date May 14, 2024
- Honeywell International Inc.
- Gertjan Job Hofman
- G01 - MEASURING TESTING
Information Patent Grant
Assisted corrosion and erosion recognition
- Patent number 11,959,739
- Issue date Apr 16, 2024
- Baker Hughes Oilfield Operations LLC
- George Sheri
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Geometry based three dimensional reconstruction of a semiconductor...
- Patent number 11,953,316
- Issue date Apr 9, 2024
- Applied Materials Israel Ltd.
- Rafael Bistritzer
- G01 - MEASURING TESTING
Information Patent Grant
Line for inspecting empty glass containers
- Patent number 11,927,542
- Issue date Mar 12, 2024
- TIAMA
- Olivier Colle
- G01 - MEASURING TESTING
Information Patent Grant
Method and system utilizing imaging analysis for golf balls
- Patent number 11,911,667
- Issue date Feb 27, 2024
- Topgolf Callaway Brands Corp.
- Megan Ilnicky
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for non-destructive metrology of thin layers
- Patent number 11,906,451
- Issue date Feb 20, 2024
- Nova Ltd.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of calculating thickness of graphene layer and method of mea...
- Patent number 11,906,291
- Issue date Feb 20, 2024
- Samsung Electronics Co., Ltd.
- Eunkyu Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Antenna ice loading sensor and method
- Patent number 11,892,561
- Issue date Feb 6, 2024
- Nanowave Technologies Inc.
- Justin Dinsdale Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement system and method for measuring a measurement object, i...
- Patent number 11,874,105
- Issue date Jan 16, 2024
- INOEX GMBH INNOVATIONEN UND AUSRÜSTUNGEN FÜR DIE EXTRUSIONSTECHNIK
- Ralph Klose
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for monitoring deposition process
- Patent number 11,852,467
- Issue date Dec 26, 2023
- NOVA MEASURING INSTRUMENTS, INC.
- Heath A. Pois
- G01 - MEASURING TESTING
Information Patent Grant
Characterizing a sample by material basis decomposition
- Patent number 11,808,565
- Issue date Nov 7, 2023
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Andrea Brambilla
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method and inspection device for membrane electrode asse...
- Patent number 11,781,998
- Issue date Oct 10, 2023
- Toyota Jidosha Kabushiki Kaisha
- Shinya Takeshita
- G01 - MEASURING TESTING
Information Patent Grant
Feed-forward of multi-layer and multi-process information using XPS...
- Patent number 11,733,035
- Issue date Aug 22, 2023
- NOVA MEASURING INSTRUMENTS INC.
- Heath Pois
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for utilizing radio-opaque fillers in multiple la...
- Patent number 11,712,604
- Issue date Aug 1, 2023
- Topgolf Callaway Brands Corp.
- David M. Melanson
- G01 - MEASURING TESTING
Information Patent Grant
Conveyor system and measuring device for determining water content...
- Patent number 11,714,053
- Issue date Aug 1, 2023
- Troxler Electronic Laboratories, Inc.
- Wewage Hiran Linus Dep
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Methods and systems for overlay measurement based on soft X-ray Sca...
- Patent number 11,698,251
- Issue date Jul 11, 2023
- KLA Corporation
- Andrei V. Shchegrov
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARACTERIZING AND MEASURING IN SMALL BOXES USING XPS WITH MULTIPLE...
- Publication number 20240401940
- Publication date Dec 5, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath POIS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIB ANODE COATING MEASUREMENT WITH DUAL X-RAY
- Publication number 20240280360
- Publication date Aug 22, 2024
- Honeywell International Inc.
- Gertjan Job Hofman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY TRANSMISSION INSPECTION APPARATUS AND X-RAY TRANSMISSION INSP...
- Publication number 20240255445
- Publication date Aug 1, 2024
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Satoshi MATSUBARA
- G01 - MEASURING TESTING
Information Patent Application
CONVEYOR SYSTEM AND MEASURING DEVICE FOR DETERMINING WATER CONTENT...
- Publication number 20240210332
- Publication date Jun 27, 2024
- TROXLER ELECTRONIC LABORATORIES, INC.
- Wewage Hiran Linus Dep
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MONITORING DEPOSITION PROCESS
- Publication number 20240167814
- Publication date May 23, 2024
- NOVA MEASURING INSTRUMENTS, INC.
- Heath A. POIS
- G01 - MEASURING TESTING
Information Patent Application
DETECTION METHOD, SURFACE DENSITY DEVICE, DETECTION MEANS, AND STOR...
- Publication number 20240151521
- Publication date May 9, 2024
- CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
- Qiangjun WANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CALCULATING THICKNESS OF GRAPHENE LAYER AND METHOD OF MEA...
- Publication number 20240151522
- Publication date May 9, 2024
- Samsung Electronics Co., Ltd.
- Eunkyu LEE
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING THE THICKNESS OF A MATERIAL IN MA...
- Publication number 20240093983
- Publication date Mar 21, 2024
- PaneraTech, Inc.
- Yakup Bayram
- G01 - MEASURING TESTING
Information Patent Application
FEED-FORWARD OF MULTI-LAYER AND MULTI-PROCESS INFORMATION USING XPS...
- Publication number 20240085174
- Publication date Mar 14, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath POIS
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE INSPECTION METHOD
- Publication number 20240019380
- Publication date Jan 18, 2024
- Samsung Electronics Co., Ltd.
- Kihong Chung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR PRODUCING TRANSPARENT GAS BARRIER FILM
- Publication number 20240002620
- Publication date Jan 4, 2024
- Toyobo Co., Ltd.
- Kiyoshi ISEKI
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
- Publication number 20230408430
- Publication date Dec 21, 2023
- NOVA MEASURING INSTRUMENTS, INC.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method And System For Utilizing Radio-Opaque Fillers In Multiple La...
- Publication number 20230372781
- Publication date Nov 23, 2023
- Topgolf Callaway Brands Corp.
- David M. Melanson
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Application
SMALL SPOT
- Publication number 20230288196
- Publication date Sep 14, 2023
- NOVA MEASURING INSTRUMENTS INC.
- Heath POIS
- G01 - MEASURING TESTING
Information Patent Application
THZ MEASUREMENT METHOD AND THZ MEASUREMENT DEVICE FOR SURVEYING A M...
- Publication number 20230251083
- Publication date Aug 10, 2023
- CiTEX Holding GmbH
- Roland BÖHM
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
SYSTEMS, APPARATUSES, AND METHODS FOR MEASURING SUBMERGED SURFACES
- Publication number 20230204524
- Publication date Jun 29, 2023
- DELTA SUBSEA, LLC
- Scott P. DINGMAN
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD AND APPARATUS FOR EVALUATION OF A STATUS OF A MATERIAL IN ME...
- Publication number 20230152243
- Publication date May 18, 2023
- PaneraTech, Inc.
- YAKUP BAYRAM
- G01 - MEASURING TESTING
Information Patent Application
LIB ANODE COATING MEASUREMENT WITH DUAL X-RAY
- Publication number 20230113133
- Publication date Apr 13, 2023
- Honeywell International Inc.
- Gertjan Job Hofman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND INSTALLATION FOR MANUFACTURING AND INSPECTING METAL CONT...
- Publication number 20230111242
- Publication date Apr 13, 2023
- TECH PRO PACKAG, S.L.
- Unai GOMEZ ZUBICARAY
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY METHOD AND SYSTEM
- Publication number 20230074398
- Publication date Mar 9, 2023
- NOVA LTD
- VLADIMIR MACHAVARIANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
State Detection
- Publication number 20230055654
- Publication date Feb 23, 2023
- Essence SmartCare Ltd
- Ohad AMIR
- G08 - SIGNALLING
Information Patent Application
FILM THICKNESS MEASURING DEVICE AND FILM THICKNESS MEASURING METHOD
- Publication number 20230058064
- Publication date Feb 23, 2023
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR IN-LINE MEASUREMENT OF THE TEMPERATURE OF PRODUCTS TRAVE...
- Publication number 20230048626
- Publication date Feb 16, 2023
- L'air Liquide, Societe Anonyme Pour L'Etude et L'Exploitation Des Procedes Ge...
- Didier PATHIER
- A23 - FOODS OR FOODSTUFFS THEIR TREATMENT, NOT COVERED BY OTHER CLASSES
Information Patent Application
A SEALING ARRANGEMENT FOR DETECTING THICKNESS OF A SEALING ELEMENT...
- Publication number 20230034388
- Publication date Feb 2, 2023
- ANDRITZ OY
- Simo KARJALAINEN
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
MEASUREMENT OF METAL OR ALLOY COATING
- Publication number 20230018020
- Publication date Jan 19, 2023
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Jill F. Geddes
- G01 - MEASURING TESTING
Information Patent Application
ANALYZING A BURIED LAYER OF A SAMPLE
- Publication number 20230019567
- Publication date Jan 19, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Alexander Mairov
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT OF THICKNESS OF SCALE OR CORROSION
- Publication number 20230003517
- Publication date Jan 5, 2023
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Jill F. Geddes
- G01 - MEASURING TESTING
Information Patent Application
VEHICLE RADAR APPARATUS AND METHOD OF CONTROLLING THE SAME
- Publication number 20230003518
- Publication date Jan 5, 2023
- HL KLEMOVE CORP.
- Jingu LEE
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CREATING A DIGITAL TWIN OF AN INFRASTRUCTURE COMPONENT
- Publication number 20220414862
- Publication date Dec 29, 2022
- Stupp Bros., Inc.
- Mark Strong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
A HARVESTING HEAD FOR LENGTH DETERMINATION OF A TREE TRUNK AND AN A...
- Publication number 20220386542
- Publication date Dec 8, 2022
- LOG MAX AB
- Mikael ELIASSON
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING

for measuring thickness

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Measurement of metal or alloy coating

Method and system for utilizing radio-opaque fillers in multiple la...

System and method for evaluating a status of a material in metallur...

Method and system for non-destructive metrology of thin layers

Method and device for measuring a tubular strand

Method and apparatus for evaluation of a status of a material in me...

Method and device for measuring a tubular strand

Strength evaluation device and strength evaluation method

Blade portioner calibration

Systems, apparatuses, and methods for measuring submerged surfaces

Ice thickness estimation for mobile object operation

Measurement of thickness of scale or corrosion

Methods and systems for combining x-ray metrology data sets to impr...

Characterizing and measuring in small boxes using XPS with multiple...

Lib anode coating measurement with dual x-ray

Assisted corrosion and erosion recognition

Geometry based three dimensional reconstruction of a semiconductor...

Line for inspecting empty glass containers

Method and system utilizing imaging analysis for golf balls

Method and system for non-destructive metrology of thin layers

Method of calculating thickness of graphene layer and method of mea...

Antenna ice loading sensor and method

Measurement system and method for measuring a measurement object, i...

Method and system for monitoring deposition process

Characterizing a sample by material basis decomposition

Inspection method and inspection device for membrane electrode asse...

Feed-forward of multi-layer and multi-process information using XPS...

Method and system for utilizing radio-opaque fillers in multiple la...

Conveyor system and measuring device for determining water content...

Methods and systems for overlay measurement based on soft X-ray Sca...

Patents Applicationslast 30 patents

CHARACTERIZING AND MEASURING IN SMALL BOXES USING XPS WITH MULTIPLE...

LIB ANODE COATING MEASUREMENT WITH DUAL X-RAY

X-RAY TRANSMISSION INSPECTION APPARATUS AND X-RAY TRANSMISSION INSP...

CONVEYOR SYSTEM AND MEASURING DEVICE FOR DETERMINING WATER CONTENT...

METHOD AND SYSTEM FOR MONITORING DEPOSITION PROCESS

DETECTION METHOD, SURFACE DENSITY DEVICE, DETECTION MEANS, AND STOR...

METHOD OF CALCULATING THICKNESS OF GRAPHENE LAYER AND METHOD OF MEA...

SYSTEM AND METHOD FOR DETERMINING THE THICKNESS OF A MATERIAL IN MA...

FEED-FORWARD OF MULTI-LAYER AND MULTI-PROCESS INFORMATION USING XPS...

SUBSTRATE INSPECTION METHOD

METHOD AND APPARATUS FOR PRODUCING TRANSPARENT GAS BARRIER FILM

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS

Method And System For Utilizing Radio-Opaque Fillers In Multiple La...

SMALL SPOT

THZ MEASUREMENT METHOD AND THZ MEASUREMENT DEVICE FOR SURVEYING A M...

SYSTEMS, APPARATUSES, AND METHODS FOR MEASURING SUBMERGED SURFACES

METHOD AND APPARATUS FOR EVALUATION OF A STATUS OF A MATERIAL IN ME...

LIB ANODE COATING MEASUREMENT WITH DUAL X-RAY

METHOD AND INSTALLATION FOR MANUFACTURING AND INSPECTING METAL CONT...

METROLOGY METHOD AND SYSTEM

State Detection

FILM THICKNESS MEASURING DEVICE AND FILM THICKNESS MEASURING METHOD

METHOD FOR IN-LINE MEASUREMENT OF THE TEMPERATURE OF PRODUCTS TRAVE...

A SEALING ARRANGEMENT FOR DETECTING THICKNESS OF A SEALING ELEMENT...

MEASUREMENT OF METAL OR ALLOY COATING

ANALYZING A BURIED LAYER OF A SAMPLE

MEASUREMENT OF THICKNESS OF SCALE OR CORROSION

VEHICLE RADAR APPARATUS AND METHOD OF CONTROLLING THE SAME

METHOD FOR CREATING A DIGITAL TWIN OF AN INFRASTRUCTURE COMPONENT

A HARVESTING HEAD FOR LENGTH DETERMINATION OF A TREE TRUNK AND AN A...