Claims
- 1. A mass spectrometry method, including the steps of:
- (a) establishing a three-dimensional trapping field capable of storing ions having mass to charge ratio within a selected range within a three-dimensional trap volume bounded by a set of electrodes;
- (b) generating a notched broadband signal composed of frequency components, said notched broadband signal comprising a sufficient number of said frequency components to be capable of resonating out of the trap volume unwanted ions having mass-to-charge ratio outside a notch portion of said range, in such a manner that prior knowledge of unwanted mass to charge ratio ion frequencies of motion outside said notch portion is not necessary to determine the frequency components of said notched broadband signal; and
- (c) applying the notched broadband signal to at least one of the electrodes to resonate out of the trap volume unwanted ions having mass-to-charge ratio within the range but outside said notch portion of the range.
- 2. The method of claim 1, wherein the notched broadband signal has a second notch portion of said range distinct from said notch portion, and wherein the notched broadband signal comprises a sufficient number of the frequency components to be capable of resonating out of the trap unwanted ions having mass-to-charge ratio outside both the notch portion and the second notch portion.
- 3. A mass spectrometry method, including the steps of:
- (a) establishing a three-dimensional trapping field in an ion trap capable of trapping ions having mass to charge ratios in a trappable range of mass to charge ratios;
- (b) generating, from spaced discrete frequency components having calculated frequencies, a first part of a broadband waveform that spans a first frequency range from f1 to f2 corresponding to a first portion of the trappable range such that the first part of said broadband waveform in the time domain presents continuous excitation to unwanted ions having mass to charge ratios corresponding to secular frequencies within the first frequency range, where f1 is a first frequency and f2 is a second frequency greater than f1;
- (c) generating, from spaced discrete frequency components having calculated frequencies, a second part of the broadband waveform that spans a second frequency range from f3 to f4, where f3 is a third frequency greater than f2, and f4 is a fourth frequency greater than f3, and said second frequency range corresponds to a second portion of the trappable range distinct from the first portion of said trappable range such that the second part of said broadband waveform in the time domain presents continuous excitation to unwanted ions having mass to charge ratios corresponding to secular frequencies within the second frequency range;
- (d) generating a notched broadband waveform from said first part of the broadband waveform and said second part of the broadband waveform, where the notched broadband waveform has substantially no frequency components in a frequency range from f2 to f3 corresponding to a notch portion of the trappable range between the second portion of the trappable range and the first portion of the trappable range; and
- (e) applying the notched broadband waveform to the ion trap during a time period of a mass spectrometry operation, with sufficient voltage amplitude to rid the ion trap of unwanted ions within at least one of said first portion and said second portion, but not in said notch portion, of the trappable range.
- 4. The method of claim 3, wherein step (d) includes the step of generating the notched broadband waveform by summing together all the spaced discrete frequency components of the first part and the second part of the broadband waveform.
- 5. The method of claim 3, wherein the discrete frequency components that comprise the first part and the second part of the broadband waveform are spaced sufficiently close to each other such that application of the notched broadband waveform during step (e) rids the ion trap of substantially all unwanted ions and allows wanted ions to remain substantially unaffected by the notched broadband waveform.
- 6. A mass spectrometry method, including the steps of:
- (a) establishing a three-dimensional trapping field in an ion trap capable of trapping ions having a range of mass to charge ratios in a volume bounded by a set of electrodes;
- (b) generating a notch-filtered broadband signal that contains at least one notch in the frequency domain, from a broadband signal composed of a sum of discrete spaced frequency components corresponding to mass to charge ratios that span at least a portion of said range, by excluding from the frequency components that comprise the broadband signal one or more of said frequency components in said at least one notch, said notch-filtered broadband signal comprising a sufficient number of said frequency components such that in the time domain, said notch-filtered broadband signal, with sufficient voltage amplitude, presents continuous excitation to unwanted ions during a selected time period of a mass spectrometry operation; and
- (c) applying the notch-filtered broadband signal to at least one of the electrodes to resonate out of the ion trap substantially all unwanted ions having mass to charge ratio within the range but outside said notch-filtered portion of said range.
- 7. A mass spectrometry method, including the steps of:
- applying a notched broadband waveform to at least one electrode of an ion trap during a mass spectrometry operation, said notched broadband waveform having a shape in the frequency domain; and
- controlling at least a portion of the shape of the notched broadband waveform during a time period of the mass spectrometry operation, by changing the amplitude of one or more discrete spaced frequency components that comprise said notched broadband waveform.
CROSS-REFERENCE TO RELATED APPLICATION
This is a continuation of U.S. application Ser. No. 08/281,505, filed Jul. 27, 1994 now U.S. Pat. No. 5,449,905, which is a continuation of U.S. application Ser. No. 08/075,780 filed on Jun. 11, 1993 (now abandoned), which is a continuation of U.S. application Ser. No. 07/928,262 filed on Aug. 11, 1992 (issued as U.S. Pat. No. 5,256,875), which is a continuation-in-part of U.S. application Ser. No. 07/884,455 filed on May 14, 1992 (issued as U.S. Pat. No. 5,274,233 on Dec. 28, 1993), which is a continuation of U.S. application Ser. No. 07/662,191 filed on Feb. 28, 1991 (now abandoned).
US Referenced Citations (19)
Foreign Referenced Citations (1)
Number |
Date |
Country |
180328 |
May 1986 |
EPX |
Continuations (4)
|
Number |
Date |
Country |
Parent |
281505 |
Jul 1994 |
|
Parent |
75780 |
Jun 1993 |
|
Parent |
928262 |
Aug 1992 |
|
Parent |
662191 |
Feb 1991 |
|
Continuation in Parts (1)
|
Number |
Date |
Country |
Parent |
884455 |
May 1992 |
|