Number | Name | Date | Kind |
---|---|---|---|
3867618 | Oliver et al. | Feb 1975 | |
4016408 | Koetzle | Apr 1977 | |
4504929 | Takemae et al. | Mar 1985 | |
4553225 | Ohe | Nov 1985 | |
4779041 | Williamson, Jr. | Oct 1988 | |
4779043 | William, Jr. | Oct 1988 | |
4799021 | Cozzi | Jan 1989 | |
4809231 | Shannon et al. | Feb 1989 | |
4818934 | Tamamura | Apr 1989 | |
4827208 | Oliver et al. | May 1989 | |
4835458 | Kim | May 1989 | |
4841233 | Yoshida | Jun 1989 |
Entry |
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"Fundamentals of Testability-A Tutorial" by Fritzmeier et al., IEEE Transactions on Industrial Electronics, vol. 36, No. 2, May 1989, pp. 117-128. |