Marginal testing

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GPHYSICS G11Information storage G11CSTATIC STORES G11C29/00Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation

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G11C29/50Marginal testing

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Patents Grantslast 30 patents

Information Patent Grant
Memory device for supporting command bus training mode and method o...
- Patent number 12,217,823
- Issue date Feb 4, 2025
- Samsung Electronics Co., Ltd.
- Young-hun Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory array test structure and method of forming the same
- Patent number 12,217,826
- Issue date Feb 4, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd
- Meng-Han Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Determine optimized read voltage via identification of distribution...
- Patent number 12,217,803
- Issue date Feb 4, 2025
- Micron Technology, Inc.
- AbdelHakim S. Alhussien
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device, memory system, and operation method of memory device
- Patent number 12,211,581
- Issue date Jan 28, 2025
- Samsung Electronics Co., Ltd.
- Donghun Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and apparatus for testing inaccessible interface circuits i...
- Patent number 12,196,805
- Issue date Jan 14, 2025
- RAMBUS INC.
- Frederick A. Ware
- G01 - MEASURING TESTING
Information Patent Grant
Read window management in a memory system
- Patent number 12,198,777
- Issue date Jan 14, 2025
- Micron Technology, Inc.
- Li-Te Chang
- G11 - INFORMATION STORAGE
Information Patent Grant
Imprint recovery for memory arrays
- Patent number 12,190,947
- Issue date Jan 7, 2025
- Micron Technology, Inc.
- Jonathan J. Strand
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device performing sensing operation and method of operating...
- Patent number 12,190,973
- Issue date Jan 7, 2025
- SK Hynix Inc.
- Se Chun Park
- G11 - INFORMATION STORAGE
Information Patent Grant
DRAM retention test method for dynamic error correction
- Patent number 12,190,974
- Issue date Jan 7, 2025
- RAMBUS INC.
- Ely Tsern
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor memory apparatus and testing method thereof
- Patent number 12,190,980
- Issue date Jan 7, 2025
- Winbond Electronics Corp.
- Shao-Ching Liao
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses and methods for identifying memory devices of a semicon...
- Patent number 12,184,280
- Issue date Dec 31, 2024
- Dean Gans
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wordline system architecture supporting erase operation and I-V cha...
- Patent number 12,176,053
- Issue date Dec 24, 2024
- GLOBALFOUNDRIES U.S. Inc.
- Ramesh Raghavan
- G11 - INFORMATION STORAGE
Information Patent Grant
Scan-based voltage frequency scaling
- Patent number 12,170,124
- Issue date Dec 17, 2024
- Micron Technology, Inc.
- Leon Zlotnik
- G11 - INFORMATION STORAGE
Information Patent Grant
Three-dimensional memory device and method for detecting leakage state
- Patent number 12,165,727
- Issue date Dec 10, 2024
- Yangtze Memory Technologies Co., Ltd.
- Weihua Shi
- G11 - INFORMATION STORAGE
Information Patent Grant
Granular voltage tuning
- Patent number 12,158,814
- Issue date Dec 3, 2024
- PURE STORAGE, INC.
- Hari Kannan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatch in open loop
- Patent number 12,155,298
- Issue date Nov 26, 2024
- EM Microelectronic-Marin SA
- Alessandro Venca
- G11 - INFORMATION STORAGE
Information Patent Grant
Pulse detection in microelectronic devices, and related devices, sy...
- Patent number 12,154,645
- Issue date Nov 26, 2024
- Micron Technology, Inc.
- Linh H. Nguyen
- G11 - INFORMATION STORAGE
Information Patent Grant
Test device and test method thereof
- Patent number 12,154,644
- Issue date Nov 26, 2024
- NANYA TECHNOLOGY CORPORATION
- Yao-Chang Chiu
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of reprogramming data in nonvolatile memory device, method o...
- Patent number 12,154,646
- Issue date Nov 26, 2024
- Samsung Electronics Co., Ltd.
- Junyeong Seok
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device and operation method thereof
- Patent number 12,154,616
- Issue date Nov 26, 2024
- Samsung Electronics Co., Ltd.
- Yoon-Joo Eom
- G11 - INFORMATION STORAGE
Information Patent Grant
Readout from memory cells subjected to perturbations in threshold v...
- Patent number 12,148,496
- Issue date Nov 19, 2024
- Apple Inc.
- Nir Tishbi
- G11 - INFORMATION STORAGE
Information Patent Grant
Control system for UHF RFID passive tags
- Patent number 12,143,009
- Issue date Nov 12, 2024
- EM Microelectronic-Marin SA
- Alessandro Venca
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three-dimensional semiconductor memory device and method of detecti...
- Patent number 12,144,178
- Issue date Nov 12, 2024
- Samsung Electronics Co., Ltd.
- Taeyoung Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Soft decoding correctable page assisted reference voltage tracking
- Patent number 12,136,464
- Issue date Nov 5, 2024
- INNOGRIT TECHNOLOGIES CO., LTD.
- Chenrong Xiong
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device, memory system including the memory device, and test...
- Patent number 12,125,550
- Issue date Oct 22, 2024
- SK hynix Inc.
- Jun Hyuk Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Host apparatus and extension device
- Patent number 12,112,788
- Issue date Oct 8, 2024
- Kioxia Corporation
- Akihisa Fujimoto
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device comprising electrically floating body transistor
- Patent number 12,094,526
- Issue date Sep 17, 2024
- Zeno Semiconductor, Inc.
- Jin-Woo Han
- G11 - INFORMATION STORAGE
Information Patent Grant
Non-volatile memory device, operating method thereof, controller fo...
- Patent number 12,094,552
- Issue date Sep 17, 2024
- Samsung Electronics Co., Ltd.
- Sehwan Park
- G11 - INFORMATION STORAGE
Information Patent Grant
Timing-drift calibration
- Patent number 12,094,553
- Issue date Sep 17, 2024
- RAMBUS INC.
- Yohan U. Frans
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mediating directed refresh management induced row hammer and row ac...
- Patent number 12,086,270
- Issue date Sep 10, 2024
- Micron Technology, Inc.
- Yang Lu
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
ERROR DETECTION FOR PROGRAMMING SINGLE LEVEL CELLS
- Publication number 20250044953
- Publication date Feb 6, 2025
- Micron Technology, Inc.
- Tomer Tzvi Eliash
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR TESTING MEMORY
- Publication number 20250022531
- Publication date Jan 16, 2025
- HPROBE
- Quentin STAINER
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE AND OPERATION METHOD THEREOF
- Publication number 20250022504
- Publication date Jan 16, 2025
- Samsung Electronics Co., Ltd.
- YOON-JOO EOM
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE, MEMORY SYSTEM INCLUDING THE MEMORY DEVICE, AND TEST...
- Publication number 20250014669
- Publication date Jan 9, 2025
- SK HYNIX INC.
- Jun Hyuk LEE
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE FOR PERFORMING BAD BLOCK CHECK, METHOD OF OPERATING M...
- Publication number 20250014668
- Publication date Jan 9, 2025
- SK HYNIX INC.
- Sung Hwa HONG
- G11 - INFORMATION STORAGE
Information Patent Application
HOST APPARATUS AND EXTENSION DEVICE
- Publication number 20240428843
- Publication date Dec 26, 2024
- KIOXIA Corporation
- Akihisa FUJIMOTO
- G11 - INFORMATION STORAGE
Information Patent Application
NON-VOLATILE MEMORY
- Publication number 20240420794
- Publication date Dec 19, 2024
- Samsung Electronics Co., Ltd.
- Youhwan Kim
- G11 - INFORMATION STORAGE
Information Patent Application
NON-VOLATILE MEMORY WITH ADJUSTABLE RAMP RATE
- Publication number 20240412804
- Publication date Dec 12, 2024
- Western Digital Technologies, Inc.
- Sai Gautham Thoppa
- G11 - INFORMATION STORAGE
Information Patent Application
Memory Device Comprising Electrically Floating Body Transistor
- Publication number 20240404585
- Publication date Dec 5, 2024
- Zeno Semiconductor, Inc.
- Jin-Woo Han
- G11 - INFORMATION STORAGE
Information Patent Application
DATA CLUSTERING SYSTEM AND READ VOLTAGE DETERMINATION APPARATUS FOR...
- Publication number 20240404618
- Publication date Dec 5, 2024
- SK HYNIX INC.
- Jae Yong SON
- G11 - INFORMATION STORAGE
Information Patent Application
MULTIPLIER BASED DEVICE DEGRADATION READOUT CIRCUIT
- Publication number 20240386941
- Publication date Nov 21, 2024
- Micron Technology, Inc.
- Zhi Qi Huang
- G11 - INFORMATION STORAGE
Information Patent Application
READ VOLTAGE CALIBRATION METHOD, MEMORY STORAGE DEVICE AND MEMORY C...
- Publication number 20240377972
- Publication date Nov 14, 2024
- PHISON ELECTRONICS CORP.
- Szu-Wei Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGE LOSS TRACKING THROUGH TARGETED BIT COUNT
- Publication number 20240363188
- Publication date Oct 31, 2024
- Micron Technology, Inc.
- Steven Michael Kientz
- G11 - INFORMATION STORAGE
Information Patent Application
READ PASS VOLTAGE ADJUSTMENT AMONG MULTIPLE ERASE BLOCKS COUPLED TO...
- Publication number 20240347126
- Publication date Oct 17, 2024
- Micron Technology, Inc.
- Akira Goda
- G11 - INFORMATION STORAGE
Information Patent Application
VOLTAGE DOMAIN BASED ERROR MANAGEMENT
- Publication number 20240321380
- Publication date Sep 26, 2024
- Micron Technology, Inc.
- Leon Zlotnik
- G11 - INFORMATION STORAGE
Information Patent Application
VARYING-POLARITY READ OPERATIONS FOR POLARITY-WRITTEN MEMORY CELLS
- Publication number 20240312518
- Publication date Sep 19, 2024
- Micron Technology, Inc.
- Innocenzo Tortorelli
- G11 - INFORMATION STORAGE
Information Patent Application
MULTI-VOLTAGE RAM USED TO CROSS CLOCK AND VOLTAGE DOMAINS
- Publication number 20240296875
- Publication date Sep 5, 2024
- NVIDIA Corporation
- Jason Golbus
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE WITH DUAL INTERFACE, TEST METHOD AND TEST SYSTEM THEREOF
- Publication number 20240296900
- Publication date Sep 5, 2024
- SILICON MOTION, INC.
- Hsu-Ping OU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Memory Calibration and Margin Check
- Publication number 20240295976
- Publication date Sep 5, 2024
- Apple Inc.
- Robert E. Jeter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICES PROVIDING TEST MODE RELATED TO RELIABILITY
- Publication number 20240282350
- Publication date Aug 22, 2024
- SK HYNIX INC.
- Yun Suk HONG
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY APPARATUS AND TESTING METHOD THEREOF
- Publication number 20240282397
- Publication date Aug 22, 2024
- WINBOND ELECTRONICS CORP.
- Shao-Ching Liao
- G11 - INFORMATION STORAGE
Information Patent Application
Method And System For Estimating And Compensating For Leakage Curre...
- Publication number 20240282398
- Publication date Aug 22, 2024
- Meta Platforms Technologies, LLC
- Umanath Ramachandra Kamath
- G11 - INFORMATION STORAGE
Information Patent Application
SIGNAL TIMING ALIGNMENT BASED ON A COMMON DATA STROBE IN MEMORY DEV...
- Publication number 20240265961
- Publication date Aug 8, 2024
- III Holdings 2, LLC
- Michael C. Stephens
- G11 - INFORMATION STORAGE
Information Patent Application
TRACKING CHARGE LOSS IN MEMORY SUB-SYSTEMS
- Publication number 20240242774
- Publication date Jul 18, 2024
- Micron Technology, Inc.
- Guang Shen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
- Publication number 20240233854
- Publication date Jul 11, 2024
- SOCIONEXT INC.
- Hideo AKIYOSHI
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD FOR TUNING AN EXTERNAL MEMORY INTERFACE
- Publication number 20240233855
- Publication date Jul 11, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Zachary John BROWN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TIME DEPENDENT DIELECTRIC BREAKDOWN RELIABILITY TESTING OF A SRAM
- Publication number 20240203519
- Publication date Jun 20, 2024
- International Business Machines Corporation
- Giuseppe La Rosa
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY ARRAY TEST STRUCTURE AND METHOD OF FORMING THE SAME
- Publication number 20240194234
- Publication date Jun 13, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Meng-Han Lin
- G11 - INFORMATION STORAGE
Information Patent Application
METHODS FOR OPTIMIZING SEMICONDUCTOR DEVICE PLACEMENT ON A SUBSTRAT...
- Publication number 20240177743
- Publication date May 30, 2024
- Micron Technology, Inc.
- James S. Rehmeyer
- G11 - INFORMATION STORAGE
Information Patent Application
POWER SUPPLY CIRCUIT, MEMORY, TESTING DEVICE, MEMORY SYSTEM, AND EL...
- Publication number 20240170041
- Publication date May 23, 2024
- Yangtze Memory Technologies Co., Ltd.
- Yu WANG
- G11 - INFORMATION STORAGE

Marginal testing

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Memory device for supporting command bus training mode and method o...

Memory array test structure and method of forming the same

Determine optimized read voltage via identification of distribution...

Memory device, memory system, and operation method of memory device

Methods and apparatus for testing inaccessible interface circuits i...

Read window management in a memory system

Imprint recovery for memory arrays

Memory device performing sensing operation and method of operating...

DRAM retention test method for dynamic error correction

Semiconductor memory apparatus and testing method thereof

Apparatuses and methods for identifying memory devices of a semicon...

Wordline system architecture supporting erase operation and I-V cha...

Scan-based voltage frequency scaling

Three-dimensional memory device and method for detecting leakage state

Granular voltage tuning

Automatch in open loop

Pulse detection in microelectronic devices, and related devices, sy...

Test device and test method thereof

Method of reprogramming data in nonvolatile memory device, method o...

Memory device and operation method thereof

Readout from memory cells subjected to perturbations in threshold v...

Control system for UHF RFID passive tags

Three-dimensional semiconductor memory device and method of detecti...

Soft decoding correctable page assisted reference voltage tracking

Memory device, memory system including the memory device, and test...

Host apparatus and extension device

Memory device comprising electrically floating body transistor

Non-volatile memory device, operating method thereof, controller fo...

Timing-drift calibration

Mediating directed refresh management induced row hammer and row ac...

Patents Applicationslast 30 patents

ERROR DETECTION FOR PROGRAMMING SINGLE LEVEL CELLS

DEVICE AND METHOD FOR TESTING MEMORY

MEMORY DEVICE AND OPERATION METHOD THEREOF

MEMORY DEVICE, MEMORY SYSTEM INCLUDING THE MEMORY DEVICE, AND TEST...

MEMORY DEVICE FOR PERFORMING BAD BLOCK CHECK, METHOD OF OPERATING M...

HOST APPARATUS AND EXTENSION DEVICE

NON-VOLATILE MEMORY

NON-VOLATILE MEMORY WITH ADJUSTABLE RAMP RATE

Memory Device Comprising Electrically Floating Body Transistor

DATA CLUSTERING SYSTEM AND READ VOLTAGE DETERMINATION APPARATUS FOR...

MULTIPLIER BASED DEVICE DEGRADATION READOUT CIRCUIT

READ VOLTAGE CALIBRATION METHOD, MEMORY STORAGE DEVICE AND MEMORY C...

CHARGE LOSS TRACKING THROUGH TARGETED BIT COUNT

READ PASS VOLTAGE ADJUSTMENT AMONG MULTIPLE ERASE BLOCKS COUPLED TO...

VOLTAGE DOMAIN BASED ERROR MANAGEMENT

VARYING-POLARITY READ OPERATIONS FOR POLARITY-WRITTEN MEMORY CELLS

MULTI-VOLTAGE RAM USED TO CROSS CLOCK AND VOLTAGE DOMAINS

MEMORY DEVICE WITH DUAL INTERFACE, TEST METHOD AND TEST SYSTEM THEREOF

Memory Calibration and Margin Check

SEMICONDUCTOR DEVICES PROVIDING TEST MODE RELATED TO RELIABILITY

SEMICONDUCTOR MEMORY APPARATUS AND TESTING METHOD THEREOF

Method And System For Estimating And Compensating For Leakage Curre...

SIGNAL TIMING ALIGNMENT BASED ON A COMMON DATA STROBE IN MEMORY DEV...

TRACKING CHARGE LOSS IN MEMORY SUB-SYSTEMS

SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

METHOD FOR TUNING AN EXTERNAL MEMORY INTERFACE

TIME DEPENDENT DIELECTRIC BREAKDOWN RELIABILITY TESTING OF A SRAM

MEMORY ARRAY TEST STRUCTURE AND METHOD OF FORMING THE SAME

METHODS FOR OPTIMIZING SEMICONDUCTOR DEVICE PLACEMENT ON A SUBSTRAT...

POWER SUPPLY CIRCUIT, MEMORY, TESTING DEVICE, MEMORY SYSTEM, AND EL...