Claims
- 1. A method of improving the signal-to-noise using first and second mass spectrometers in tandem, with an ion detector and data system coupled to the second mass spectrometer, comprising selecting precursor ions with the first mass spectrometer, at least some of the precursor ions being multiply charged and having at least a predetermined number of charges, colliding or reacting the precursor ions in an intermediate chamber so that multiply charged precursor ions produce product ions which have at least one fewer charge than the multiply charged precursor ions with the predetermined number of charges, and using the second mass spectrometer or the ion detector and data system to allow only those ions which have an m/z value higher than the multiply charged precursor ions having at least the predetermined number of charges to be recorded for analysis by the ion detector and data system, so that only a signal due to multiply charged precursor ions having at least the predetermined number of charges is obtained in said data system.
- 2. A method according to claim 1 in which the second mass spectrometer is a quadrupole mass filter operated in an RF-only mode so that only ions above a selected cut-off mass are transmitted therethrough to said detector, said cut-off mass being defined by the edge of the stability diagram at q=0.908 for the precursor ion.
- 3. A method according to claim 1 in which the second mass spectrometer is a time-of-flight mass spectrometer having a data system, which can simultaneously record all product ions, and wherein said data system is programmed to only record ions which are greater in m/z than the precursor ions.
- 4. A method according to claim 1 in which the intermediate chamber is a collision cell comprising an RF quadrupole or multipole, having an RF voltage applied thereto, with the RF voltage adjusted so that only fragment ions higher in m/z than said precursor ions are stable therein.
- 5. A method according to claim 2 in which at least some of the precursor ions are singly charged, and said second mass spectrometer is operated at an RF voltage such that the ratio of the RF voltage of said second mass spectrometer to the RF voltage of said first mass spectrometer is slightly greater than 0.908/0.706, whereby, at least some product ions produced from said singly charged ions are not transmitted through said second mass spectrometer.
- 6. A method according to claim 5 in which the ratio is preferably about 1.3.
- 7. A method according to claim 2 in which said second mass spectrometer is operated at an RF voltage such that the ratio of the RF voltage of said second mass spectrometer to the RF voltage of said first spectrometer is slightly greater than 0.908n/0.706, n being an integer greater than 1, whereby, at least some product ions produced from ions having n or less charges are not transmitted through said second mass spectrometer.
- 8. A method according to claim 7 in which the ratio is preferably about 1.3n.
Parent Case Info
This application claim benefit to provisional application Ser. No. 60/048,182 filing date May 30, 1997.