Claims
- 1) A method for increasing the dynamic range of a mass spectrometer having at least one quadrupole ion filter and one mass analyzer, comprising the steps of:
a. passing a first sample of ions through the quadrupole ion filter and the mass analyzer; b. measuring the intensities of the mass spectrum of said first sample; c. identifying undesired ions within said first sample for ejection; d. introducing a second sample of ions into the mass spectrometer; e. applying the appropriate rf voltages to the quadrupole ion filter to eject the undesired ions; and f. detecting the mass spectrum of the desired ions in the mass analyzer.
- 2) The method of claim 1 comprising the further step of accumulating the desired ions in a ion trap interposed between the quadrupole ion filter and the mass analyzer.
- 3) The method of claim 1 wherein detecting the mass spectrum of the desired ions is performed in a mass analyzer selected from the group consisting of an ion trap mass spectrometer and a Fourier transform ion cyclotron resonance mass spectrometer.
- 4) The method of claim 2 wherein detecting the mass spectrum of the desired ions is performed in a mass analyzer selected from the group consisting of an ion trap mass spectrometer and a Fourier transform ion cyclotron resonance mass spectrometer.
- 5) The method of claim 1 wherein the ejection of the un desired ions is accomplish ed by applying resonant rf-only voltages to the quadrupole ion filter selected from the group consisting of dipolar excitation, quadrupolar excitation, and parametric excitation.
- 6) The method of claim 2 wherein the ejection of the undesired ions is accomplished by applying resonant rf-only voltages to the quadrupole ion filter from the group consisting of dipolar excitation, quadrupolar excitation, and parametric excitation.
- 7) The method of claim 1 wherein steps a-f are repeated to detect further undesired ions for ejection.
- 8) A method for increasing the dynamic range of a mass spectrometer having at least one quadrupole ion filter, an ion trap and a mass analyzer, comprising the steps of:
a. passing a first sample of ions through the quadrupole ion filter and the mass analyzer; b. measuring the intensities of the mass spectrum of said first sample; c. identifying undesired ions within said first sample for ejection; d. introducing a second sample of ions into the mass spectrometer; e. applying the appropriate rf voltages to the quadrupole ion filter to eject the undesired ions; f. accumulating desired ions in the ion trap, g. transferring the desired ions from the ion trap to the mass analyzer, and h. detecting the mass spectrum of the desired ions in the mass analyzer.
- 9) The method of claim 8 wherein detecting the mass spectrum of the desired ions is performed in a mass analyzer selected from the group consisting of an ion trap mass spectrometer and a Fourier transform ion cyclotron resonance mass spectrometer.
- 10) The method of claim 8 wherein the ejection of the undesired ions is accomplished by applying resonant rf-only voltages to the quadrupole ion filter selected from the group consisting of dipolar excitation, quadrupolar excitation, and parametric excitation.
- 11) The method of claim 8 wherein steps a-h are repeated to detect further undesired ions for ejection.
STATEMENT REGARDING GOVERNMENT RIGHTS
[0001] This invention was made with Government support under Contract DE-AC0676RLO1830 awarded by the U.S. Department of Energy. The Government has certain rights in the invention.