Claims
- 1. A process of inhibiting oxidation of a copper film formed by electroless plating, vacuum evaporation, sputtering or ion plating on a ceramic body, comprising the step of poisoning the catalytic activity of said copper film by temporarily subjecting the copper film formed on the surface of the ceramic body to an agent consisting of a hydrocarbon halide compound promptly after forming the copper film on the ceramic body, wherein the hydrocarbon halide is at least one member selected from the group consisting of trichloroethylene, perchloroethylene, freon, chlorobenzene, methyl chloride, methylene chloride, chloroform, and carbon tetrachloride, and removing said agent from said copper film, whereby said copper film has a measurably increased resistance to oxidation after removal of said agent, said increased resistance being a result of the action of said agent.
- 2. A process of inhibiting oxidation of a copper film formed on a ceramic body in accordance with claim 1, which further comprises the step of heat treating said copper film in an inert atmosphere before said step of subjecting said copper film to hydrocarbon halide compound.
- 3. A process of inhibiting oxidation of a copper film formed on a ceramic body in accordance with claim 1, which further comprises heat treating said copper film in an inert atmosphere before the step of subjecting said copper film to hydrocarbon halide compound, and heat treating said copper film in an inert atmosphere after the step of subjecting said copper film to hydrocarbon halide compound.
- 4. A process of inhibiting oxidation of a copper film formed on a ceramic body in accordance with claim 1, wherein said ceramic body comprises a member selected from the group consisting of dielectric, insulating, resistive and semiconductive material.
- 5. A process of inhibiting the oxidation of a copper film formed on a ceramic body in accordance with claim 1, wherein said hydrocabon halide compound is used in the form of a vapor.
- 6. A process of inhibiting the oxidation of a copper film formed on a ceramic body in accordance with claim 2, wherein said step of subjecting said copper film to hydrocarbon halide compound is effected within 30 minutes after said heat treatment.
- 7. A process of inhibiting oxidation of a copper film formed on a ceramic body in accordance with claim 1, wherein the ceramic body is a titanium oxide ceramic body having a copper film formed thereon by electroless plating and wherein the hydrocarbon halide is chloroform.
- 8. A process of forming an electrode of a ceramic capacitor, comprising the steps of
- preparing a dielectric ceramic body having a surface,
- forming a copper film serving as an electrode on said surface of said dielectric body by electroless plating, vacuum evaporation, sputtering or ion plating, and
- poisoning the catalytic activity of said copper film by temporarily subjecting the copper film formed on the surface of the ceramic body to an agent consisting of a hydrocarbon halide compound promptly after the step of forming the copper film on the ceramic body, wherein said hydrocarbon halide is at least one member selected from the group consisting of trichloroethylene, perchloroethylene, freon, chlorobenzene, methyl chloride, methylene chloride, chloroform and carbon tetrachloride, and removing said agent from said copper film, whereby said copper film has a measurably increased resistance to oxidation after removal of said agent, said increased resistance being a result of the action of said agent.
Parent Case Info
This is a continuation of application Ser. No. 194,984, filed Oct. 8, 1980, and now abandoned.
US Referenced Citations (14)
Non-Patent Literature Citations (1)
Entry |
Grunwald et al., Some Physical Properties of Electroless Copper Plating, 58, 1004, Oct. 1971. |
Continuations (1)
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Number |
Date |
Country |
Parent |
194984 |
Oct 1980 |
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