The present application is a National Stage of International Patent Application No. PCT PCT/EP2017/051552, filed on Jan. 25, 2017, which claims priority to and all the benefits of German Patent Application No. 10 2016 201 206.1, filed on Jan. 27, 2016, both of which are hereby expressly incorporated herein by reference in their entirety.
The invention relates to a method for machining a holding device for a light module.
Placement of SMD electronic components on a printed circuit board, in particular with a reflow soldering, is accompanied with high tolerances with respect to the positioning precision.
A method for producing an interconnect device that has at least one surface-mounted SMD semiconductor light source component is known from WO 2014/153576. At least one SMD LED is positioned on the interconnect device. The position of the light emitting region of the at least one SMD-LED is detected optically, and the at least one SMD-LED is mounted on the interconnect device based on the detected position of the light emitting region of the at least one SMD-LED.
One of the objects of the invention is to compensate for tolerances resulting during the placement of the SMD semiconductor light source component on a light module of a lighting device of a motor vehicle.
The fundamental object of the invention is achieved by a method for machining a holding device. Important features of the invention are also explained in the following description and illustrated in the drawings, wherein the features may be important to the invention in and of themselves as well as in different combinations, without explicit indication thereof.
Light is generated by an SMD semiconductor light source component disposed on the holding device. A light emission characteristic is determined for a light emitting surface of the SMD semiconductor light source component. The position of mechanical feature of the holding device is determined based on the characteristic of the light emission. The position of an optics element interacting with the SMD semiconductor light source component is determined based on the position of the mechanical feature in relation to the SMD semiconductor light source component.
The light emitting surface of an SMD semiconductor light source component does not always emit a homogenous light, and may have a different light center or light distribution over the light emitting surface from one SMD semiconductor light source component to another SMD semiconductor light source component.
With the proposed method, a displacement due to tolerances, which would lead to a light emission distribution not complying with specifications, can advantageously be prevented. Particularly tolerances relating to the light emission characteristic of the light emitting surface and/or the position of the SMD semiconductor light source component on the holding device can thus be easily compensated for.
Advantageously, other measures relating to the precise positioning of the SMD semiconductor light source component in relation to the holding device are no longer necessary. Moreover, less expensive SMD semiconductor light source components can be used, which exhibit a higher variation in the light distribution over the light emitting surface. As a result, a light module can be produced on the whole, which is characterized by a more precise light emission distribution at lower costs.
In one advantageous embodiment, first coordinates of an actual light center of the light emission characteristic are determined. The first coordinates are compared with second coordinates of a target light center of the light emission characteristic. The position of the mechanical feature with respect to the holding device is determined based on the results of the comparison. The position of the mechanical feature can thus be determined advantageously from the comparison.
In one advantageous embodiment, the optics element is secured in place by a respective attachment member that attaches to the mechanical feature. The mechanical feature can also be used directly for securing the optics element in place.
In an advantageous embodiment, coordinates of the mechanical feature are detected optically. The optics element is secured in place on the holding device based on the coordinates of the mechanical feature. The light emission characteristics of the light emitting surface with respect to the holding element can be advantageously determined via the position of the mechanical feature, and in a subsequent machining step, the optics element can be secured in place. Advantageously, other components can thus also be placed on the holding device in relation to the position of the mechanical feature. Moreover, the optical detection of the coordinates of the mechanical feature provide a possibility for rejecting a holding device in the framework of quality control when the coordinates of the mechanical feature are too far from the target coordinates.
In one advantageous embodiment, the mechanical feature comprises a hole passing through the holding device. The positioning of the hole comprises drilling a hole through the holding device. The mechanical feature can be formed in this manner in the holding device.
In one advantageous embodiment, the mechanical feature is a reference element. The positioning of the reference element comprises placing the reference element on the side of the holding device on which the SMD semiconductor light source component is placed. The detection of the coordinates can advantageously be improved through the reference element.
In one advantageous further development, the reference element comprises a detection feature spaced apart from the surface of the holding device. Advantageously, shadows cast by other components are thus reduced, and a focusing on the removed detection feature can advantageously lead to a more precise determination of the position of the reference element on the holding device.
Further features, application possibilities and advantages of the invention can be derived from the following description of exemplary embodiments of the invention, which are illustrated in the drawings. The same reference symbols are used in all of the figures for variables and features having equivalent functions, even with different embodiments. Therein:
The light module 6 comprises a holding device 10 on which an SMD semiconductor light source component 12 is disposed. An optics element 14 is likewise disposed on the holding device 10, which is designed as a reflector in the present example. As a matter of course, a transmission element can be placed on the holding device 10 instead of a reflector. The holding device 10 can be a printed circuit board, by way of example. Other embodiments are also conceivable, as a matter of course, in which the SMD semiconductor light source component 12 is disposed on a printed circuit board, and the printed circuit board is disposed on the holding device 10, wherein the holding device 10 does not need to be a printed circuit board, but can also be designed as a cooling element or an element with another function.
The SMD semiconductor light source component 12 generates a primary light distribution 16, which is converted to a secondary light distribution 18 by the optics element 14. The secondary light distribution 18 is emitted by the lighting device 2 in a main beam direction 20 for lighting a roadway in the direction of travel. The placement of the SMD semiconductor light source component 12 in relation to the optics element is also decisive for the positioning and generation of the secondary light distribution 18.
The mechanical feature 32a, 32b is a through hole in the present example, which is placed at the actual coordinates 34a, 34b by the holding device 10. The optics element 14 is secured in place in relation to the holding device 10 by an attachment member formed thereon, which engages in the through hole forming the mechanical feature 32a, 32b.
In another embodiment, the through hole can be detected optically, and the optics element is connected to the holding device, e.g. by an adhesive, at a location removed from the mechanical feature 32a, 32b, based on the detected actual coordinates 34a, 34b.
In one embodiment, the circular surface 62 has a first coloring that differs from a second coloring of the surface 58. If the mechanical feature 46 is illuminated, light is reflected by the circular surface 62 at a first wavelength, and from the surface 58 at a second wavelength, wherein the first wavelength differs from the second wavelength by at least 50 nm. In this manner, detection of the detection feature 48 can be improved.
The invention has been described in an illustrative manner. It is to be understood that the terminology which has been used is intended to be in the nature of words of description rather than of limitation. Many modifications and variations of the invention are possible in light of the above teachings. Therefore, within the scope of the appended claims, the invention may be practiced other than as specifically described.
Number | Date | Country | Kind |
---|---|---|---|
10 2016 201 206.1 | Jan 2016 | DE | national |
Filing Document | Filing Date | Country | Kind |
---|---|---|---|
PCT/EP2017/051552 | 1/25/2017 | WO | 00 |
Publishing Document | Publishing Date | Country | Kind |
---|---|---|---|
WO2017/129619 | 8/3/2017 | WO | A |
Number | Name | Date | Kind |
---|---|---|---|
9605826 | Cabanne | Mar 2017 | B2 |
10147683 | Haefner | Dec 2018 | B2 |
10631414 | Barqueros | Apr 2020 | B2 |
20050180157 | Watanabe et al. | Aug 2005 | A1 |
20120074438 | Hwang | Mar 2012 | A1 |
20130100685 | Weekamp | Apr 2013 | A1 |
20130215632 | Jackl | Aug 2013 | A1 |
20140109785 | Pauliac | Apr 2014 | A1 |
20150211843 | Petsch | Jul 2015 | A1 |
20150228549 | Mattina | Aug 2015 | A1 |
20150241011 | Bauer et al. | Aug 2015 | A1 |
20150364384 | Karch | Dec 2015 | A1 |
20160197044 | Haefner et al. | Jul 2016 | A1 |
20180153064 | Zorn | May 2018 | A1 |
Number | Date | Country |
---|---|---|
103574526 | Feb 2014 | CN |
104541099 | Apr 2015 | CN |
104976533 | Oct 2015 | CN |
105650564 | Jun 2016 | CN |
102005003213 | Aug 2005 | DE |
102014005298 | Sep 2014 | DE |
102014101784 | Aug 2015 | DE |
102014210654 | Dec 2015 | DE |
2693108 | Feb 2014 | EP |
3030055 | Jun 2016 | EP |
2014028954 | Feb 2014 | WO |
2014056012 | Apr 2014 | WO |
2014153576 | Oct 2014 | WO |
2015000894 | Jan 2015 | WO |
2015040108 | Mar 2015 | WO |
2016094913 | Jun 2016 | WO |
Entry |
---|
International Search Report for PCT International Application No. PCT/EP2017/051552 dated Apr. 18, 2017. |
Written Opinion of the International Searching Authority for PCT International Application No. PCT/EP2017/051552 dated Apr. 18, 2017. |
Number | Date | Country | |
---|---|---|---|
20190353318 A1 | Nov 2019 | US |