Number | Date | Country | Kind |
---|---|---|---|
3107943 | Mar 1981 | DEX |
Number | Name | Date | Kind |
---|---|---|---|
3881884 | Cook et al. | May 1975 | |
4132813 | Schaal | Jan 1979 |
Entry |
---|
IBM Technical Disclosure Bulletin, vol. 22, No. 10, Mar. 1980, Ceramic Shorted and Open Chips for Reliability Test of MC & MCp Substrates, Memis et al., p. 4474. |