Claims
- 1. A method for testing the performance of an optical device under test using a first and second pair of light beams, wherein each of said pairs of light beams comprises a first light beam having a frequency ωn and a second light beam having a frequency ωn+Δωfn, wherein n denotes the particular pair, wherein Δωfn may be either positive or negative, and wherein a first frequency of an (n+1)th pair of light beams is different from the first frequency of an nth pair of light beams by a second frequency interval Δωin, wherein Δωin may be either positive or negative, and wherein |Δωin|<|Δωfn| and |Δωin|<|Δωf(n+1)|, said method comprising the step of:determining a polarization mode dispersion vector to at least a first order of said optical device under test using light beams passed therethrough.
- 2. The method of claim 1, wherein said polarization mode dispersion vectors form a set of vectors comprising at least a first and a second first order vector; and further comprising the step of:determining a polarization mode dispersion vector to second order from said first and second first order vectors.
- 3. The method of claim 1, wherein said optical device under test has input and output interfaces, and said step of determining a polarization mode dispersion vector to first order of said optical device under test from each of said pairs of light beams further comprising the steps of:A. determining a rotation matrix R*, wherein R* describes the polarization characteristics of an optical device under test at a frequency ω; B. determining a rotation matrix R+, wherein R+ describes the polarization characteristics of said optical device under test at a frequency ω+Δωf; C. calculating a rotation matrix RΔ such that RΔ=R+R*T, wherein R*T is the transpose of R*; D. calculating a positive angle φ and a vector r, such that said angle φ and said vector r characterize the rotation represented by said matrix RΔ of said polarization characteristics of said optical device under test from said first frequency ω to said second frequency ω+Δωf; E. calculating a magnitude Δτ such that Δτ=φ/Δωf; and F. calculating a polarization mode dispersion vector to first order Ωt which describes the polarization mode dispersion at said output interface of said optical device under test, such that Ωt=Δτr and such that Ωt is defined to reside at the frequency ω+Δωf/2.
- 4. The method of claim 3, further comprising the step ofG. calculating a polarization mode dispersion vector to first order Ωs which describes the polarization mode dispersion at said input interface of said optical device under test.
- 5. The method of claim 4, wherein said step G) further comprises the steps of:calculating a rotation matrix RΔ/2 from said angle φ and said vector r, such that RΔ/2=cos φ/2·I+(1−cos φ/2)rr−sin φ/2rx; calculating a rotation matrix Rm such that Rm=RΔ/2 R*; and calculating said vector Ωs such that Ωs=RmTΩt.
- 6. The method of claim 4, wherein said step G) further comprises the steps of:calculating a rotation matrix RΔs such that RΔs=R*TR+, wherein R*T is the transpose of R*; calculating a positive angle φ and a vector r, such that said angle φ and said vector r characterize the rotation represented by said matrix RΔs of said polarization characteristics of said optical device under test from said first frequency ω to said second frequency ω+Δωf; calculating a magnitude Δτ such that Δτ=φ/Δωf; and calculating a polarization mode dispersion vector to first order Ωs which describes the polarization mode dispersion at said input interface of said optical device under test, such that Ωs=Δτr, and such that Ωs is defined to reside at the frequency ω+Δωf/2.
- 7. The method of claim 6, wherein said step of calculating a positive angle φ and a vector r, wherein said vector r comprises components r1, r2, and r3, said method further comprising the steps of:calculating φ, such that cos φ=½(Tr RΔ−1), wherein Tr RΔ=RΔ11+RΔ22+RΔ33; calculating r1, such that r1 sin φ=½(RΔ23−RΔ32); calculating r2, such that r2 sin φ=½(RΔ31−RΔ13); and calculating r3, such that r3 sin φ=½(RΔ12−RΔ21).
- 8. The method of claim 3, wherein said step of calculating a positive angle φ and a vector r, wherein said vector r comprises components r1, r2, and r3, said method further comprising the steps of:calculating φ, such that cos φ=½(Tr RΔ−1), wherein Tr RΔ=RΔ11+RΔ22+R66 33; calculating r1, such that r1 sin φ=½(RΔ23−RΔ32); calculating r2, such that r2 sin φ=½(RΔ31−RΔ13); and calculating r3, such that r3 sin φ=½(RΔ12−RΔ21).
- 9. The method of claim 3, wherein said step of determining a rotation matrix R* further comprises the steps of:A1) producing a first and a second light beam at said first frequency ω; A2) imparting a first polarization state to said first light beam produced at said frequency ω, such that a vector s*1 represents in Stokes space said first polarization state imparted to said first light beam produced at said frequency ω; A3) imparting a second polarization state to said second light beam produced at said frequency ω, such that a vector s*a representing in Stokes space said second polarization state imparted to said second light beam produced at said frequency ω is not parallel or anti-parallel to said vector s*1; A4) coupling said first and second light beams having a frequency ω to said input interface of said optical device under test such that said first and second light beams having a frequency ω propagate through said optical device under test; A5) measuring the polarization state of said first an d second light beams having a frequency ω at said output interface of said optical device under test; A6) determining vectors to represent in Stokes space said measured polarization states of said first and second light beams having a frequency ω, such that a vector t*1 represents said measured polarization state of said first light beam produced at said frequency ω, and such that a vector t*a represents said measured polarization state of said second light beam produced at said frequency ω, and A7) calculating a vector t*3 such that t*3=k t*1×t*a, wherein k is a constant chosen to assure that |t*3|=1; A8) calculating a vector t*2 such that t*2=t*3×t*1; A9) calculating a rotation matrix R*, such that R*=[t*11t*21t*31t*12t*22t*32t*13t*23t*33]; and wherein said step of determining a rotation matrix R+ further comprises the steps of: B1) producing a first and a second light beam at said second frequency ω+Δωf; B2) imparting a first polarization state to said first light beam produced at said frequency ω+Δωf, such that a vector s+1 represents in Stokes space said first polarization state imparted to said first light beam produced at said frequency or ω+Δωf; B3) imparting a second polarization state to said second light beam produced at said frequency ω+Δωf, such that a vector s+a representing in Stokes space said second polarization state imparted to said second light beam produced at said frequency ω+Δωf is not parallel or anti-parallel to said vector s+1; B4) coupling said first and second light beams having a frequency ω+Δωf to said input interface of said optical device under test such that said first and second light beams having a frequency ω+Δωf propagate through said optical device under test; B5) measuring the polarization state of said first and second light beams having a frequency ω+Δωf at said output interface of said optical device under test; B6) determining vectors to represent in Stokes space said measured polarization states of said first and second light beams having a frequency ω+Δωf, such that a vector t+1 represents said measured polarization state of said first light beam produced at said frequency ω+Δωf, and such that a vector t+a represents said measured polarization state of said second light beam produced at said frequency ω+Δωf; B7) calculating a vector t+3 such that t+3=k t+1×t+a, wherein k is a constant chosen to assure that |t+3|=1; B8) calculating a vector t+2 such that t+2=t+3×t+1; and B9) calculating a matrix R+, such that R+=[t+11t+21t+31t+12t+22t+32t+13t+23t+33].
- 10. A method for testing the performance of an optical device under test (DUT) having input and output interfaces by determining the polarization mode dispersion vector of said optical device under test using a pair of light beams applied to said input interface of said DUT and having, respectively, a first frequency ω and a second frequency ω+Δωf, wherein Δωf may be either positive or negative, said method comprising the steps of:A. determining a rotation matrix R*, wherein R* describes the polarization characteristics of an optical device under test at said first frequency ω; B. determining a rotation matrix R+, wherein R+ describes the polarization characteristics of said optical device under test at said second frequency ω+Δωf; C. calculating a rotation matrix RΔ such that RΔ=R+R*T, wherein R*T is the transpose of R*; D. calculating a positive angle φ and a vector r, such that said angle φ and said vector r characterize the rotation represented by said matrix RΔ of said polarization characteristics of said optical device under test from said first frequency ω to said second frequency ω+Δωf; E. calculating a magnitude Δτ such that Δτ=φ/Δωf; and F. calculating a polarization mode dispersion vector to first order Ωt which describes the polarization mode dispersion at said output interface of said optical device under test, such that ωt=Δτr, and such that Ωt is defined to reside at the frequency ω+Δωf/2.
- 11. The method of claim 10, further comprising the step ofG) calculating a polarization mode dispersion vector to first order Ωs which describes the polarization mode dispersion at said input interface of said optical device under test.
- 12. The method of claim 11, wherein said step G) further comprises the steps of:calculating a rotation matrix RΔ/2 from said angle φ and said vector r, such that RΔ/2=cos φ/2·I+(1−cos φ/2)rr−sin φ/2rx; calculating a rotation matrix Rm such that Rm=RΔ/2R*; and calculating said vector Ωs such that Ωs=RmTΩt.
- 13. The method of claim 11, wherein said step G) further comprises the steps of:calculating a rotation matrix RΔs such that RΔs=R*TR+, wherein R*T is the transpose of R*, calculating a positive angle φ and a vector r, such that said angle φ and said vector r characterize the rotation represented by said matrix RΔs of said polarization characteristics of said optical device under test from said first frequency ω to said second frequency ω+Δωf; calculating a magnitude Δτ such that Δτ=φ/Δωf; and calculating a polarization mode dispersion vector to first order Ωs which describes the polarization mode dispersion at said input interface of said optical device under test, such that Ωs=Δτr, and such that Ωs is defined to reside at the frequency ω+Δωf/2.
- 14. The method of claim 13, wherein said step of calculating a positive angle φ and a vector r, wherein said vector r comprises components r1, r2, and r3, further comprises the steps of:calculating φ, such that cos φ=½(TrRΔ−1), wherein TrRΔ=RΔ11+RΔ22+RΔ33; calculating r1, such that r1 sin φ=½(RΔ23−RΔ32); calculating r2, such that r2 sin φ=½(RΔ31−RΔ13); and calculating r3, such that r3 sin φ=½(RΔ12−RΔ21).
- 15. The method of claim 10, wherein said step of calculating a positive angle φ and a vector r, wherein said vector r comprises components r1, r2, and r3, further comprises the steps of:calculating φ, such that cos φ=½(TrRΔ−1), wherein TrRΔ=RΔ11+RΔ22+RΔ33; calculating r1, such that r1 sin φ=½(RΔ23−RΔ32); calculating r2, such that r2 sin φ=½(RΔ31−RΔ13); and calculating r3, such that r3 sin φ=½(RΔ12−RΔ21).
- 16. The method of claim 10, wherein said step of determining a rotation matrix R* further comprises the steps of:A1) producing a first and a second light beam at said first frequency ω; A2) imparting a first polarization state to said first light beam produced at said frequency ω, such that a vector s*1, represents in Stokes space said first polarization state imparted to said first light beam produced at said frequency ω; A3) imparting a second polarization state to said second light beam produced at said frequency ω, such that a vector s*a representing in Stokes space said second polarization state imparted to said second light beam produced at said frequency ω is not parallel or anti-parallel to said vector s*1; A4) coupling said first and second light beams having a frequency ω to said input interface of said optical device under test such that said first and second light beams having a frequency ω propagate through said optical device under test; A5) measuring the polarization state of said first and second light beams having a frequency ω at said output interface of said optical device under test; A6) determining vectors to represent in Stokes space said measured polarization states of said first and second light beams having a frequency ω, such that a vector t*1 represents said measured polarization state of said first light beam produced at said frequency ω, and such that a vector t*a represents said measured polarization state of said second light beam produced at said frequency ω, and A7) calculating a vector t*3 such that t*3=k t*1×t*a, wherein k is a constant chosen to assure that |t*3|=1; A8) calculating a vector t*2 such that t*2=t*3×t*1; A9) calculating a matrix R*, such that R*=[t*11t*21t*31t*12t*22t*32t*13t*23t*33]; and wherein said step of determining a rotation matrix R+ further comprises the steps of: B1) producing a first and a second light beam at said second frequency ω+Δωf; B2) imparting a first polarization state to said first light beam produced at said frequency ω+Δωf, such that a vector s−1 represents in Stokes space said first polarization state imparted to said first light beam produced at said frequency ω+Δωf; B3) imparting a second polarization state to said second light beam produced at said frequency ω+Δωf, such that a vector s+a representing in Stokes space said second polarization state imparted to said second light beam produced at said frequency ω+Δωf is not parallel or anti-parallel to said vector s+1; B4) coupling said first and second light beams having a frequency ω+Δωf to said input interface of said optical device under test such that said first and second light beams having a frequency ω+Δωf propagate through said optical device under test; B5) measuring the polarization state of said first and second light beams having a frequency ω+Δωf of at said output interface of said optical device under test; B6) determining vectors to represent in Stokes space said measured polarization states of said first and second light beams having a frequency ω+Δωf, such that a vector t+1 represents said measured polarization state of said first light beam produced at said frequency ω+Δωf, and such that a vector t+a represents said measured polarization state of said second light beam produced at said frequency ω+Δωf; B7) calculating a vector t+3 such that t−3=k t−1×t+a, wherein k is a constant chosen to assure that |t+3|=1; B8) calculating a vector t+2 such that t+2=t+3×t+1; and B9) calculating a matrix R+, such that R+=[t+11t+21t+31t+12t+22t+32t+13t+23t+33].
- 17. An apparatus for testing the performance of an optical device under test (DUT) having input and output interfaces by determining the polarization mode dispersion vector of said optical device under test using a pair of light beams applied to said input interface of said DUT and having respectively, a first frequency ω and a second frequency ω+Δωf, wherein Δωf may be either positive or negative, comprising:A. at least one rotation matrix determining device which first determines a rotation matrix R*, wherein R* describes the polarization characteristics of an optical device under test at said first frequency ω, and then determines a rotation matrix R+, wherein R+ describes the polarization characteristics of said optical device under test at said second frequency ω+Δωf; B. at least one calculation device which calculates i. a rotation matrix RΔ such that RΔ=R+R*T, wherein R*T is the transpose of R+; ii. a positive angle φ and a vector r, such that said angle φ and said vector r characterize the rotation represented by said matrix RΔ of said polarization characteristics of said optical device under test from said first frequency ω to said second frequency ω+Δωf; iii. a magnitude Δτ such that Δτ=φ/Δωf; and iv. a polarization mode dispersion vector to first order Ωt which describes the polarization mode dispersion at said output interface of said optical device under test, such that Ωt=Δτr, and such that Ωt is defined to reside at the frequency ω+Δωf/2.
- 18. The apparatus of claim 17, wherein said calculation device further calculatesa polarization mode dispersion vector to first order Ωs which describes the polarization mode dispersion at said input interface of said optical device under test.
- 19. The apparatus of claim 17, wherein said calculation device comprises electrical circuits.
- 20. The apparatus of claim 17, wherein said calculation device is a computer processor.
- 21. The apparatus of claim 17, wherein said rotation matrix determining device comprises:A1) an optical source device which produces a first and a second light beam to be passed through said optical device under test, first at said first frequency ω and then at said frequency ω+Δωf; A2) a polarizing device which imparts a first polarization state to said first light beam produced at said frequency ω, such that a vector s*1 represents in Stokes space said first polarization state imparted to said first light beam produced at said frequency ω, and imparts a second polarization state to said second light beam produced at said frequency ω, such that a vector s*a representing in Stokes space said second polarization state imparted to said second light beam produced at said frequency ω is not parallel or anti-parallel to said vector s*1, and imparts a first polarization state to said first light beam produced at said frequency ω+Δωf, wherein a vector s−1 represents in Stokes space said first polarization state imparted to said first light beam produced at said frequency ω+Δωf, and imparts a second polarization state to said second light beam produced at said frequency ω+Δωf, such that a vector s+a representing in Stokes space said second polarization state imparted to said second light beam produced at said frequency ω+Δωf is not parallel or anti-parallel to said vector s+1; and A3) a measuring device which measures the polarization state of each of said light beams after each of said beams has passed through said optical device under test, and determines a vector to represent in Stokes space each of said measured polarization states of each of said light beams, such that a vector t*1 represents said measured polarization state of said first light beam produced at said frequency ω, and such that a vector t*a represents said measured polarization state of said second light beam produced at said frequency ω, and such that a vector t+1 represents said measured polarization state of said first light beam produced at said frequency ω+Δωf, and such that a vector t+a represents said measured polarization state of said second light beam produced at said frequency ω+Δωf.
- 22. A method for determining polarization mode dispersion (PMD) for an optical device under test (DUT), said method comprising:for a first light beam having a first frequency and a first polarization state, a second light beam having said first frequency and a second polarization state, a third light beam having a second frequency and said first polarization state, and a fourth light beam having said second frequency and said second polarization state, said first and second frequencies comprising a first pair of frequencies, said first and second polarization states inserted in said DUT comprising input polarization states having Stokes vectors, and said second frequency being greater than said first frequency, performing the steps of: (A) inserting each of the light beams sequentially into said DUT; (B) measuring a respective output polarization state for each of said light beams exiting said DUT; (C) determining Stokes vectors for said output polarization state for each of said light beams; (D) determining a first order PMD vector from the Stokes vectors of said input polarization state and said output polarization state of said light beams; and for a fifth light beam having a third frequency and said first polarization state, a sixth light beam having said third frequency and said second polarization state, a seventh light beam having a fourth frequency and said first polarization state, and a eighth light beam having said fourth frequency and said second polarization state, said third and fourth frequencies comprising a second pair of frequencies, said first and second polarization states inserted in said DUT comprising input polarization states having Stokes vectors, said fourth frequency being greater than said third frequency, said second pair of frequencies being greater than said first pair of frequencies by a frequency interval less than said second frequency, performing the steps of: (E) inserting each of the second set of light beams sequentially into said DUT; (F) measuring a respective output polarization state for each of said second set of light beams exiting said DUT; (G) determining Stokes vectors for said output polarization state for each of said second set of light beams; and (H) determining a second order PMD vector from the Stokes vectors of said input polarization state and said output polarization state of said second set of light beams.
- 23. The method of claim 22, wherein said polarization mode dispersion vectors to a first order are defined herein as “first order vectors”, and wherein all said first order vectors form a set of vectors comprising at least a first and a second order vector; and further comprising the step ofdetermining a polarization mode dispersion vector to a second order from said first and second order PMD vectors.
- 24. The method of claim 22, wherein said optical device under test has input and output interfaces, and said step of determining a polarization mode dispersion vector to first order of said optical device under test from each of said pairs of frequencies, further comprising the steps of:A. determining a rotation matrix R*, wherein R* describes the polarization characteristics of an optical device under test at said first frequency ω; B. determining a rotation matrix R+, wherein R+ describes the polarization characteristics of said optical device under test at said second frequency ω+Δωf; C. calculating a rotation matrix RΔ such that RΔ=R+R*T, wherein R*T is the transpose of R*; D. calculating a positive angle φ and a vector r, such that said angle φ and said vector r characterize the rotation represented by said matrix RΔ of said polarization characteristics of said optical device under test from said first frequency ω to said second frequency ω+Δf; E. calculating a magnitude Δτ such that Δτ=φ/Δωf; and F. calculating a polarization mode dispersion vector to first order Ωt which describes the polarization mode dispersion at said output interface of said optical device under test, such that Ωt=Δτr, and such that Ωt is defined to reside at the frequency ω+Δωf/2.
- 25. The method of claim 24, further comprising the step ofG. calculating a polarization mode dispersion vector to first order Ωs which describes the polarization mode dispersion at said input interface of said optical device under test.
- 26. The method of claim 25, wherein said step G) further comprises the steps of:calculating a rotation matrix RΔ/2 from said angle φ and said vector r, such that RΔ/2=cos φ/2·I +(1−cos φ/2)rr−sin φ/2rx; calculating a rotation matrix Rm such that Rm=RΔ/2R*; and calculating said vector Ωs such that Ωs=RmTΩt.
- 27. The method of claim 25, wherein said step G) further comprises the steps of:calculating a rotation matrix RΔs such that RΔs=R*TR+, wherein R*T is the transpose of R*; calculating a positive angle φ and a vector r, such that said angle φ and said vector r characterize the rotation represented by said matrix RΔs of said polarization characteristics of said optical device under test from said first frequency ω to said second frequency ω+Δωf; calculating a magnitude Δτ such that Δτ=φ/Δωf; and calculating a polarization mode dispersion vector to first order Ωs which describes the polarization mode dispersion at said input interface of said optical device under test, such that Ωs=Δτr, and such that Ωs is defined to reside at the frequency ω+Δωf/2.
- 28. The method of claim 27, wherein said step of calculating a positive angle φ and a vector r, wherein said vector r comprises components r1, r2, and r3, said method further comprising the steps of:calculating φ, such that cos φ=_(Tr RΔ−1), wherein Tr RΔ=RΔ11+RΔ22+RΔ33; calculating r1, such that r1 sin φ=_(RΔ23−RΔ32); calculating r2, such that r2 sin φ=_(RΔ31−RΔ13); and calculating r3, such that r3 sin φ=_(RΔ12−RΔ21).
- 29. The method of claim 24, wherein said step of calculating a positive angle φ and a vector r, wherein said vector r comprises components r1, r2, and r3, said method further comprising the steps of:calculating φ, such that cos φ=_(Tr RΔ−1), where in Tr RΔ=RΔ11+RΔ22+RΔ33; calculating r1, such that r1 sin φ=_(RΔ23−RΔ32); calculating r2, such that r2 sin φ=_(RΔ31−RΔ13); and calculating r3, such that r3 sin φ=_(RΔ12−RΔ21).
- 30. The method of claim 24, wherein said step of determining a rotation matrix R* further comprises the steps of:A1) producing a first and a second light beam at said first frequency ω; A2) imparting a first polarization state to said first light beam produced at said frequency ω, such that a vector s*1 represents in Stokes space said first polarization state imparted to said first light beam produced at said frequency ω; A3) imparting a second polarization state to said second light beam produced at said frequency ω, such that a vector s*a representing in Stokes space said second polarization state imparted to said second light beam produced at said frequency ω is not parallel or anti-parallel to said vector s*1; A4) coupling said first and second light beams having a frequency ω to said input interface of said optical device under test such that said first and second light beams having a frequency ω propagate through said optical device under test; A5) measuring the polarization state of said first and second light beams having a frequency ω at said output interface of said optical device under test; A6) determining vectors to represent in Stokes space said measured polarization states of said first and second light beams having a frequency ω, such that a vector t*1 represents said measured polarization state of said first light beam produced at said frequency ω, and such that a vector t*a represents said measured polarization state of said second light beam produced at said frequency ω, and A7) calculating a vector t*3 such that t*3=k t*1×t*a, wherein k is a constant chosen to assure that |t*3|=1; A8) calculating a vector t*2 such that t*2=t*3×t*1; A9) calculating a rotation matrix R*, such that R*=[t*11t*21t*31t*12t*22t*32t*13t*23t*33]; and wherein said step of determining a rotation matrix R+ further comprises the steps of: B1) producing a first and a second light beam at said second frequency ω+Δωf; B2) imparting a first polarization state to said first light beam produced at said frequency ω+Δωf, such that a vector s+1 represents in Stokes space said first polarization state imparted to said first light beam produced at said frequency ω+Δωf; B3) imparting a second polarization state to said second light beam produced at said frequency ω+Δωf, such that a vector s+a representing in Stokes space said second polarization state imparted to said second light beam produced at said frequency ω+Δωf is not parallel or anti-parallel to said vector s+1; B4) coupling said first and second light beams having a frequency ω+Δωf to said input interface of said optical device under test such that said first and second light beams having a frequency ω+Δωf propagate through said optical device under test; B5) measuring the polarization state of said first and second light beams having a frequency ω+Δωf at said output interface of said optical device under test; B6) determining vectors to represent in Stokes space said measured polarization states of said first and second light beams having a frequency ω+Δωf, such that a vector t+1 represents said measured polarization state of said first light beam produced at said frequency ω+Δωf, and such that a vector t+a represents said measured polarization state of said second light beam produced at said frequency ω+Δωf; B7) calculating a vector t+3 such that t+3=k t+1×t+a, wherein k is a constant chosen to assure that |t+3|=1; B8) calculating a vector t+2 such that t+2=t+3×t+1; and B9) calculating a matrix R+, such that R+=[t+11t+21t+31t+12t+22t+32t+13t+23t+33].
Parent Case Info
This application claims the benefit of U.S. Provisional Application No. 60/120,655, filed Feb. 19, 1999.
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Provisional Applications (1)
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