The present application is a continuation-in-part of application Ser. No. 07/849,862 filed Mar. 12, 1992.
Number | Name | Date | Kind |
---|---|---|---|
2459129 | Gresham et al. | Jan 1949 | |
3476658 | Corwin | Nov 1969 | |
3610143 | Greenwood et al. | Oct 1971 | |
3668081 | Borner | Jun 1972 | |
3763030 | Zimmer | Oct 1973 | |
4033831 | Bakewell | Jul 1977 | |
4118288 | Ruckl | Oct 1978 | |
4135020 | Maxwell | Jan 1979 | |
4379737 | Mearig | Apr 1983 | |
4401520 | Steppan et al. | Aug 1983 | |
4789425 | Drake et al. | Dec 1988 | |
4915983 | Lake et al. | Apr 1990 |
Number | Date | Country |
---|---|---|
22053 | Feb 1982 | JPX |
102797 | Jun 1983 | JPX |
87249 | Mar 1989 | JPX |
859048 | Jan 1961 | GBX |
Entry |
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Xerox Disclosure Journal, "A Double Exposure Technique for Positive Resist Lift-off", vol. 7, No. 4, Jul./Aug. 1982, pp. 293-294. |
Electroplating, Frederick A. Lowenheim, McGraw Hill Book Co., Jan. 8, 1979, p. 147. |
Metal Mask Specifications, Version 01, Process Lab Micron Co., Ltd., 1991. |
From a catalogue of Process Lab. Micron Co., Ltd., a Japanese Corporation, date of publication of catalogue unknown. |
Number | Date | Country | |
---|---|---|---|
Parent | 849862 | Mar 1992 |