This application claims the benefit of priority from Chinese Patent Application No. 202311169355.9, filed on Sep. 12, 2023. The content of the aforementioned application, including any intervening amendments thereto, is incorporated herein by reference in its entirety.
This application relates to transfer of two-dimensional atomic crystal materials, and more particularly to a method for preparing wafer-scale two-dimensional (2D) material arrays.
Two-dimensional transition metal dichalcogenides (TMDs) represented by MoS2 and WSe2 et al have attracted extensive attention in the design and construction of new two-dimensional electronic devices due to their excellent structural and electrical properties, such as dangling-bond-free surface, atomically thin body thickness, comparable field-effect mobility, and an inherent propensity to adhere together through van der Waals (vdW) force. These characteristics present compelling prospects for pioneering advancement in device applications. In particular, the absence of dangling bonds on the surface can significantly reduce the carrier scatting. Thus, the gate electrode still exhibits an effective control of the 2D channel when the gate length of MoS2 transistor is scaled down to sub-1 nm, positioning 2D integrated circuits as a viable alternative beyond silicon.
It has been reported that, the continual optimization of the materials growth technology and the device fabrication processes have led to impressive performance metrics in 2D devices (especially MoS2-based transistors), including an ultralow contact resistance of 123 Ω·μm, a high carrier mobility (μ) of >100 cm2·V−1·s−1, a large saturation current (Ion) of 1.27 mA/μm at VDS=2.5 V, and a high on/off ratio of >108. The carrier mobility of 2D MoS2-FETs is comparable to amorphous silicon based thin film transistors (α-Si TFTs), while the leakage current (10−13 μA/μm) is as low as oxide semiconductor based thin film transistors (e.g., indium-gallium-zinc-oxide thin-film transistors (IGZO-TFTs)) which demonstrates its potential application in the construction of 2D pixel circuits (e.g., image sensors, photovoltaic imaging, and micro-LED display).
Currently, extensive researches have been focused on 2D devices in micro-scale range. For example, 2D transistors have shown promising applications as high-sensitivity active pixel image sensor. The image sensor typically contains a phototransistor and a switch transistor, each serving distinct functions in image capture and image processing. The proposed in-sensing processing, each pixel based on a single programmable MoS2 phototransistor, could streamline the crossbar architecture, resulting in reduction in footprint and energy consumption. Other applications, like skin-attachable tactile sensor, machine vision processor have also been demonstrated using micro-scale MoS2 pixel arrays. Moreover, leveraging their high on saturation current and low leakage current properties, the micro-scale MoS2-FETs exhibit advantages as high-performance active-matrix pixel circuits for micro-LED or OLED displays. These endeavors collectively represent successful attempts to promote micro-scale 2D devices into potential applications. In terms of the display performance, for a micro-LED display with a resolution of 320×240 pixels, 76,800 grains need to be integrated; and for a micro-LED display with a resolution of 1280×720 pixels, more than 770,000 grains need to be integrated. Therefore, to achieve the integration of large-scale grains onto a wafer, it is first required to transfer two-dimensional material arrays to the wafer scale, followed by deposition of source electrode and drain electrode on each array to obtain 2D FETs arrays, and interconnect the 2D arrays to obtain the two-dimensional driver circuit.
Currently, the 2D materials are obtained mainly by the mechanical exfoliation method and chemical vapor deposition (CVD) method. With the advancement of research and the development of growth technique, the continuous preparation of wafer-scale two-dimensional thin-film materials (e.g., MoS2, h-BN, and WSe2) has been preliminarily achieved by the CVD method. Compared to the traditional mechanical exfoliation method, the CVD method can solve the problems of small lateral dimensional size and difficult control in the number of layers to a certain extent. However, in the construction process of a new two-dimensional electronic devices, it is generally required to transfer grown 2D materials to a new target substrate (e.g., SiO2/Si substrate or flexible polyethylene terephthalate (PET) substrate) to achieve the compatibility with the silicon-based semiconductor preparation process or the preparation of flexible electronic devices.
The use of a 2D material transfer platform to localize and transfer different 2D materials is a common method for the development and characterization of prototype devices in laboratory. The commonly used transfer methods include dry transfer methods and wet transfer methods, in which a flexible organic polymer, such as polymethyl methacrylate (PMMA), polydimethylsiloxane (PDMS), polystyrene (PS), and polyvinyl acetate (PVA), is often employed as a transfer medium. The transfer of micrometer (μm)-scale and centimeter (cm)-scale 2D materials has been achieved through such methods. However, in order to realize a high-density two-dimensional electronic devices integration, it often requires photoresist spin-coating, optical exposure, developing, reactive ion etching (RIE), and photoresist removal processes to obtain a patterned two-dimensional material. However, these steps have complicated process, high cost, and large time consumption, and may introduce impurity particles to the material surface.
Chinese patent publication No. 115763219A provides a method for simply, efficiently, and economically preparing single-layer patterned two-dimensional materials, which is applicable to the formation of two-dimensional material arrays within a size of 3 mm×3 mm (for example, for the MoS2 particle with a size of 20 μm, about a few thousand MoS2 arrays can be obtained), but is not suitable for the transfer of a large-area film (e.g., MoS2 film with a diameter of 5 cm). In order to meet the existing commercial need for large-area integration of micro-LED grains, it is required to enable the two-dimensional material transfer technology to be applied to the wafer-scale substrate, to achieve the mass transfer of wafer-scale two-dimensional material arrays.
However, at least the following problems exist in the prior art. The existing low-cost, efficient, and simple transfer method of two-dimensional TMDs material arrays cannot satisfy the integration of large-scale micro-LEDs. Therefore, there is a need to develop a low-cost, repeatable, and fast transfer method of high-density two-dimensional materials that can be applied to wafer-scale substrates, so as to achieve the large-scale integration.
To overcome the defects in the prior art that it fails to prepare wafer-scale single-layer patterned two-dimensional materials, this application provides a method for preparing wafer-scale two-dimensional (2D) material arrays.
Technical solutions of this application are described as follows.
This application provides method for preparing a wafer-scale two-dimensional (2D) material array, comprising:
In an embodiment, the alcohol solvent is ethanol or isopropanol.
In an embodiment, a volume ratio of water to the alcohol solvent in the mixed solution is (1˜2): 1.
In an embodiment, a volume ratio of water to the alcohol solvent in the mixed solution is (1˜1.5): 1.
In an embodiment, a volume ratio of water to the alcohol solvent in the mixed solution is 1:1.
In an embodiment, the step (b) is performed through the following steps:
In an embodiment, the step (g) is performed through the following steps:
In an embodiment, the step of separating the PDMS stamp from the patterned 2D-TMDs film to transfer the patterned 2D-TMDs film onto the target substrate comprises:
In an embodiment, the target substrate is a silicon dioxide layer-containing silicon substrate, a glass substrate, a flexible polyimide substrate or a flexible polyethylene terephthalate substrate.
In an embodiment, an area of the growth substrate is not smaller than that of the PDMS stamp; and an area of the target substrate is not smaller than that of the PDMS stamp.
Compared to the prior art, this application has the following beneficial effects.
By adopting a patterned PDMS stamp and employing a water-ethanol or water-isopropanol mixture as the transfer medium, this application achieves the transfer of a wafer-scale patterned two-dimensional material film with simpler operation, higher cost-effectiveness, less time consumption and excellent repeatability.
In order to illustrate the technical solutions in the embodiments of the present disclosure or the prior art more clearly, the drawings required in the description of the embodiments or the prior art will be briefly described below. Obviously, presented in the drawings are merely some embodiments of the present disclosure, which are not intended to limit the disclosure. For those skilled in the art, other drawings may also be obtained according to the drawings provided herein without paying creative efforts.
In the figures: 1—PDMS stamp; 2—micro post; 3—monolayer 2D—TMDs film; 4—growth substrate; 5—target substrate; 6—patterned 2D—TMDs film.
The technical solutions in the embodiments of the present disclosure will be clearly and completely described below in conjunction with the accompanying drawings of the present disclosure. Obviously, described below are merely some embodiments of the disclosure, which are not intended to limit the disclosure. For those skilled in the art, other embodiments obtained based on these embodiments without paying creative efforts should fall within the scope of the disclosure.
The disclosure will be further described in detail in conjunction with the specific embodiments. The technical details not introduced in the embodiments can be referred to the relevant descriptions in the previous section.
As shown in
In an embodiment, the method includes the following steps.
The successful introduction of 2D-FETs by AIEC into a 300 mm silicon process line in 2019 confirms the compatibility with the back-end-of-line (BEOL) process, which provides a possible route for the research and development of devices in the post-Moore era. In addition, due to the continuous optimization of preparation process of the low contact resistance metals and the dielectric insulating layer, the 2D MoS2-based field-effect transistors (MoS2-FET) have on-state current values (ION=˜1.27 mA/um) and high mobility (122.6 cm2V−1s−1) comparable to those of low temperature poly-silicon (LTPS-TFTs). The MoS2-FETs are comparable to oxide semiconductors (e.g., indium-gallium-zinc-oxide thin-film transistors (IGZO-TFTs)) in terms of leakage current (10−13 μA/μm), which demonstrates its application potential in the construction of 2D pixel circuits (e.g., image sensors, photovoltaic imaging, display driver circuits). Currently, some researches have been carried out about the 2D device-based functional circuits. For example, a 32×32 MoS2-FETs pixel circuit has been prepared by monolithic integration of MoS2-FET with a Micro-LED display chip through a back-end-of-line (BEOL) process, and the driving function of micro-LED display matrices has been preliminarily verified. In terms of the display performance, for a micro-LED display with a resolution of 320×240 pixels, 76,800 grains need to be integrated; and for a micro-LED display with a resolution of 1280×720 pixels, more than 770,000 grains need to be integrated. Therefore, in order to adapt to the large-scale integration, it is necessary to prepare wafer-scale 2D-TMDs materials, and 2D-TMDs materials are patterned.
The wafer refers to the size of the silicon slice, such as 2 inches, 4 inches, 8 inches, and 12 inches. 2 inches indicate a silicon slice with a diameter of 5 cm. For example, for the MoS2 particle with a size of 20 μm, about a few thousand MoS2 arrays can be obtained, but it is not suitable for the transfer of a large-area film (e.g., MoS2 film with a diameter of 5 cm. The disclosure can transfer MoS2 films with a diameter of 5 cm (2 inches) in a single pass by formulating a suitable mixed solution as a transfer medium. As a result, more than 1 million MoS2 arrays can be obtained on the 2-inch wafer. In this embodiment, the mixed solution consists of water and ethanol or consists of water and isopropanol. The mixed solution has less polarity and better wettability than pure water. The polarity of the mixed solution (i.e., the contact angle of the drop with the growth substrate 4, and the contact angle of the drop with the PDMS stamp 1) is regulated by different mixing ratios, so as to rapidly separate the monolayer 2D-TMDs film 3 from the growth substrate 4.
The preparation of the 2-inch patterned 2D-TMDs film 6 was taken as an example to illustrate the specific steps.
500 mL of a water-ethanol mixed solution was prepared.
As shown in
As shown in
As shown in
The mixed solution was poured into a wide-mouth container (greater than 4 inches in diameter). As shown in
Due to the lower polarity, the mixed solution could easily penetrate into the interface between the monolayer 2D-TMDs film 3 and the substrate along the non-contact region, facilitating the rapid separation of the monolayer 2D-TMDs film 3 under the action of the capillary force.
Under the action of the mixed solution, the monolayer 2D-TMDs film 3 in the non-contact region was broken due to the high surface tension of the liquid. The monolayer 2D-TMDs film 3 in the contact region remained intact under the action of the inherent viscosity of the micro posts 2.
As shown in
As shown in
In an embodiment, the alcohol solvent was ethanol or isopropanol. Ethanol and isopropanol were readily available and relatively cheap, and thus were commonly used as alcohol solvent.
In an embodiment, the volume ratio of water to the alcohol solvent in the mixed solution was (1-2): 1. Within such volume ratio range, the mixed solution had a polarity, which made it suitable as a transfer medium to separate the monolayer 2D-TMDs film 3 from the growth substrate 4. Excessive water in the mixed solution would affect the transfer rate, and insufficient water would damage the material.
Preferably, the volume ratio of water to alcohol solvent in the mixed solution was (1-1.5): 1. By further narrowing the volume ratio range, the polarity of the mixed solutions in this range allowed for a better transfer rate.
Preferably, the volume ratio of water to the alcohol solvent in the mixed solution was 1:1, thereby facilitating the preparation of the mixed solution and the separation of the monolayer 2D-TMDs film 3 from the growth substrate 4.
As shown in
As shown in
The non-contact region could be simplified as the micron-scale capillary. As shown in
where h represented a capillary height; γl represented surface tension of the liquid; and θ1 and θ2were the contact angles of the droplets on the target substrate 5 and the PDMS surface 1, respectively.
Laplace pressure inside the capillary was calculated with different solutions, respectively. Under pure water conditions, the contact angles of the droplets on the SiO2/Si substrate and the patterned PDMS surface were 50.04° and 123.95°, respectively. Thus,
The value γl of pure water was estimated to be about 72.20×10−3 N/m, and h was 20 μm. Therefore, the calculated ΔP1 was about 0.3 kPa.
For the water-ethanol mixed solution in a volume ratio of 2:1, the contact angles of a droplet on the surfaces of the target substrate 5 and PDMS stamp 1 were 43.04° and 108.91°, respectively. Therefore, the
The value γl of the mixed solution was estimated to be about 33.58×10−3 N/m, and h was 20 μm. Therefore, the calculated ΔP2 was about 0.68 kPa.
For the water-ethanol mixed solution in a volume ratio of 1:1, the contact angles of a droplet on the surfaces of the target substrate 5 and the PDMS stamp 1 were 91.41° and 12.88°, respectively. Therefore,
The value γl of the mixed solution was estimated to be about 28.51×10−3 N/m, and h was 20 μm, so the calculated ΔP3 was about 1.35 kPa.
ΔP3 was 4.50 times larger than ΔP1, indicating that the water-ethanol mixed solution was more permeable. Thus, a low-polarity solution was essential for the fast transfer of 2D arrays.
Further, the step of “preparing a polydimethylsiloxane (PDMS) stamp 1 with a plurality of micro posts 2 in the periodic and regular arrangement” was performed through the following steps.
A patterned mold was designed.
The patterned mold was filled with PDMS by spin-coating.
The PDMS within the patterned mold was cured to obtain the cured PDMS.
The cured PDMS was demolded from the patterned mold to obtain the patterned PDMS stamp.
The PDMS stamp 1 was obtained by adopting the patterned mold, for example the SU-8 patterned mold, which was designed to meet the requirements (e.g., shape of the pattern, arrangement, and size). PDMS was coated into the patterned mold by the spin coating method. Under the action of centrifugal force, the patterned mold was spin-coated and filled with PDMS to form a flat and smooth surface. Since PDMS was a viscous liquid, the curing mold need to be cured after filling the PDMS inside the curing mold. After curing, the PDMS was demolded from the patterned mold, thereby obtaining the patterned PDMS stamp 1. As shown in
The process for continuously growing a monolayer 2D-TMDs film on the growth substrate was performed by chemical vapor deposition (CVD), metal-organic chemical vapor deposition (MOCVD), or plasma-enhanced chemical vapor deposition (PECVD). The 2D-TMDs films include molybdenum disulfide (MoS2), tungsten selenide (WSe2), or tungsten disulfide (WS2), or molybdenum selenide (MoSe2), or molybdenum telluride (MoTe2).
The CVD, MOCVD, and PECVD were all capable of generating the monolayer 2D-TMDs film 3. The selected TMDs thin film can be a monolayer and continuous MoS2 thin film, or WSe2 thin film, WS2 thin film, MoSe2 thin film, or MoTe2 thin film. The monolayer contiguous TMDs film was uniformly distributed on the growth substrate 4.
The step of “transferring the patterned 2D-TMDs film 6 onto a target substrate 5 to obtain the wafer-scale 2D material array” was performed through the following steps.
The plurality of micro posts 2, to which the patterned 2D-TMDs film 6 was adhered, were in intimate contact with the target substrate 5 such that the patterned 2D-TMDs film 6 was allowed to adhere to the target substrate 5.
The patterned 2D-TMDs film 6 was separated from the PDMS stamp 1 to be transferred to the target substrate 5.
As shown in
The step of separating the PDMS stamp 1 from the patterned 2D-TMDs film 6 to transfer the patterned 2D-TMDs film 6 onto the target substrate 5 was performed through the following steps.
The target substrate 5 was heated to a predetermined temperature.
The PDMS stamp 1 was lifted to separate the PDMS stamp 1 from the patterned 2D-TMDs film 6, thereby completing the transfer of the patterned 2D-TMDs film 6 to the target substrate 5.
In order to reduce the stickiness of the PDMS stamp 1, the PDMS stamp-patterned 2D-TMDs film-target substrate was placed onto a heating plate. The heating plate was heated to 80° C.-100° C. within three minutes, preferably 100° C., to reduce the viscosity of the PDMS to 0. The PDMS stamp 1 was lifted after the preset temperature was reached, to separate the patterned 2D-TMDs film 6 from the micro posts 2.
The target substrate 5 was a silicon dioxide layer-containing silicon substrate, a glass substrate, a flexible polyimide substrate or a flexible polyethylene terephthalate substrate.
The target substrate 5 in
The area of the growth substrate 4 was not smaller than the area of the PDMS stamp 1, and the area of the target substrate 5 was not smaller than the area of the PDMS stamp 1.
The micro posts 2 on the PDMS stamp 1 served as carriers for preparing and transferring the patterned 2D-TMDs film 6. If the area of the growth substrate 5 was smaller than the PDMS stamp 1, the micro posts 2 on the PDMS stamp 1 will not be fully covered by the monolayer 2D-TMDs film 3, and thus it failed to obtain the patterned 2D-TMDs film 6 in the predetermined arrangement. the grown continuous monolayer 2D-TMDs film 3 adhered to the upper surfaces of the micro posts 2, and then was transferred to the target substrate 5 by means of the surface viscosity of the micro posts 2 on the PDMS stamp 1. If the area of the target substrate 5 was smaller than the PDMS stamp 1, only a portion of the micro posts 2 could have a contact with the target substrate 5, and only a part of the patterned 2D-TMDs film 6 could be transferred, thereby failing to arrive at the patterned 2D materials in a predefined arrangement on the target substrate 5.
The patterned 2D material prepared by the method of the disclosure was applied to the preparation of 2D material transistors.
The disclosure can achieve low-cost, repeatable, and fast transfer of wafer-scale 2D arrays. The method eliminates the need for microfabrication processes, such as exposure step and etching step, and patterns 2D-TMDs film 3 while transferring wafer-scale 2D-TMDs film 3. The 2D-TMDs film 3 is separated rapidly from the growth substrate 4 by regulating the polarity of the transfer medium, which will greatly enhance the preparation efficiency and reduce the preparation cost. Based on this method, greater than 1 million 2D arrays can be rapidly transferred to the 2-inch wafer in a single operation, thereby facilitating promoting the commercialization of 2D integrated circuits.
It should be understood that the order of steps in the process of the disclosure is exemplary. It should be noted that the order of steps may be rearranged without departing from the protection scope of the present disclosure. The appended method claims give elements of the various steps in exemplary order, which is not intended to limit the disclosure.
In the description above, various features are combined in a single embodiment to simplify the disclosure. This description approach should not be interpreted as reflecting that embodiments of the claimed subject matter require more features than that listed in each claim. On the contrary, as reflected in the appended claims, the disclosure needs fewer features than the individual embodiments disclosed. Accordingly, the appended claims are clearly introduced into the detailed description, wherein each claim stands alone as a separate preferred embodiment of the disclosure.
The embodiments are described above to help those skilled in the art to implement the disclosure. Any modifications and replacements made by those skilled in the art without departing from the spirit of the disclosure should fall within the scope of the disclosure defined by the appended claims. Accordingly, the disclosure is not limited to the embodiments given herein.
The description above includes one or more embodiments. It should be noted that embodiments of the disclosure and the features therein may be combined with each other in the case of no contradiction. Accordingly, the embodiments described herein are intended to cover all such changes, modifications and variations that fall within the protection scope of the appended claims. Furthermore, the term “comprising” used in the specification or the claims covers in a manner similar to the term “including” which is open-ended. In addition, the term “or” in the description is non-exclusive.
The above-described embodiments provide a detailed description of the objects, technical solutions, and beneficial effects of the disclosure. It should be understood that described above are merely preferred embodiments of the disclosure, which are not intended to limit the disclosure. Any modifications, replacements, and improvements made by those skilled in the art without departing from the spirit of the disclosure should fall within the scope of the disclosure defined by the appended claims.
Number | Date | Country | Kind |
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202311169355.9 | Sep 2023 | CN | national |