The invention relates to a device and a method for producing a three-dimensional object by solidification of a solidifiable material under the action of electromagnetic radiation by means of energy input via an imaging unit comprising a specific number of discrete imaging elements (pixels). In particular, this invention relates to devices and methods in which the solidification of the material is based on the exposure by means of a raster mask, with the smallest physical resolution in the mask given by the size of a pixel and the Spatial Light Modulator (SLM) technology being applied for the imaging unit.
The literature specifies highly varying methods for the construction of three-dimensional objects of “light-hardening” photopolymers, cf. “Automated Fabrication—Improving Productivity in Manufacturing” by Marshall Burns, 1993 (ISBN 0-13-119462-3).
Known possibilities are, inter alia, the exposure by
These methods are described in the following patents:
EP 1250997A (=US2002155189A) “Device for producing a three-dimensional object” by Envision Technologies GmbH, April 2002.
German Patent DE69909136T “Rapid Prototyping Device and Rapid Prototyping Method”, July 2003 (equivalent: European Patent EP 1156922 “Rapid Prototyping Apparatus and Method of Rapid Prototyping”, August 2003) of DICON AS Lystrup, Denmark.
WO 01/00390 A by HAP, Sitec Industrietechnologie and DELTAMED Medizinprodukte GmbH.
WO 2005/110722 A of Envisiontec GmbH.
With laser-based systems for photo-polymerization, the light output in the exposure point is provided by the energy setting of the laser beam, whereby the hardening depth of the photopolymer can be controlled in that point. To selectively harden a corresponding layer, the laser beam is scanned over the cross-sectional surface to be correspondingly hardened. The contours of the cross-sectional surface to be hardened can be scanned by the laser beam as a curve.
With systems for photo-polymerization based on mask projection by means of projection systems with the SLM technology, the advantage is that an entire cross-sectional area can be exposed at once. The light areas of the projected raster image harden the photopolymer voxel by voxel.
The disadvantage in projection systems with SLM technology is that the light output distribution over the image surface can be very inhomogeneous (up to 50% absolute), depending on
The change of the properties of the light source over the service life will result in a variable error and thus in a changing homogeneity distribution. Moreover, a change of the light intensity of the light source does not result in a selective change as with a laser but would affect the entire projection image.
A constant error is concerned in case of homogeneity deviations caused by the optical system for coupling the light energy to the SLM and the projection optics.
The contours of the cross-sectional surface to be hardened can only be presented in rasters; the resolution depends on the number of image points/pixels and on the size of the projected image.
Moreover, the light intensity varies depending on the size of the exposed surface structure (higher light intensity with larger, contiguous surfaces; lower light intensity with smaller, filigree surface structures).
With the above mentioned WO 01/00390 A, the intensity of beams is controlled by controlling the permeability of the mask, wherein the intensity may be controlled via the selection of gray levels of a transmission LCD.
In WO 2005/110722 A, a multiple exposure is carried out on the subpixel level per layer for improving the resolution along the outside and inside contours of the cross-sectional areas of the object to be generated, said exposure consisting of a sequence of a plurality of images offset on the subpixel level in the image/building plane, wherein a separate mask/bitmap is generated for every offset image.
Neither WO 01/00390 A nor WO 2005/110722 show how the resolution and the fine adjustment in the image plane can be improved and how native inhomogeneities of the light source can be balanced better.
It is the object of the invention to improve device and method for the production of a three-dimensional object by solidification of a material solidifiable under the action of electromagnetic radiation, by means of energy input via an imaging unit comprising a prescribed number of discrete imaging elements (pixels) so that a higher precision, higher resolution and fine adjustment and/or a higher homogeneity of the system will be realized.
According to the present invention, a device for producing a three-dimensional object is provided, the device comprising: an imaging unit comprising a predetermined number of discrete imaging elements (pixels) for energy input capable of solidifying a solidifyable material under an action of electromagnetic radiation; a computer unit, an IC and/or a software implementation; wherein the computer unit, the IC and/or the software implementation respectively has the ability of controlling the energy input with respect to a cross-sectional area of a three-dimensional object to be produced by exposure by means of multiple successive raster masks (bitmaps).
According to the present invention, there is also provided a device for producing a three-dimensional object, the device comprising: raster imaging unit comprising a predetermined number of discrete imaging elements (pixels) arranged as point, line or matrix, wherein the imaging unit composes, from the pixels, an image related to a specific cross sectional area of the three-dimensional object to be produced and thus forms a raster mask (bitmap); wherein the imaging unit is designed to provide energy input for solidifying a solidifiable material under an action of electromagnetic radiation; wherein the imaging unit is arranged to be controlled such that at least two masks can be generated, including: a first overall mask (bitmap 1) covering the cross-sectional area; and a partial mask (bitmap 2) within the overall mask.
The present invention also provides a method for producing a three-dimensional object, the method comprising: providing an imaging unit comprising a predetermined number of discrete imaging elements (pixels); solidifying a solidifyable material in a matrix of volume pixels (voxels) under an action of electromagnetic radiation by means of energy input via the imaging unit; wherein an energy input, with respect to a cross-sectional area of the three-dimensional object to be produced, for the solidification of a volume pixel in the material to be hardened is controlled by a succession of multiple raster bitmaps to influence the hardening depth per voxel (volume pixel) in the solidifyable material.
The present invention further provides a method for producing a three-dimensional object, the method comprising: providing imaging unit comprising a predetermined number of discrete imaging elements (pixels); solidifying a solidifiable material under an action of electromagnetic radiation by means of energy input via the imaging unit; wherein the imaging unit composes, from the pixels, an image related to a cross-sectional area of the three-dimensional object and thus forms a raster mask (bitmap), wherein at least two masks are used per cross-sectional area of the three-dimensional object, including: a first overall mask (bitmap 1) covering the cross-sectional area; and a partial mask (bitmap 2) within the overall mask.
The invention will be described in more detail on the basis of further exemplary embodiments with reference to the attached Figures; however, the invention is by no means limited to the described embodiments and examples and drawings but can instead comprise any variations and modifications within the scope of the claims.
Device and method according to the invention allow to remove the inhomogeneities in the image level and thus achieve higher precision, higher resolution and fine adjustment.
It is possible with the invention to control, on the one hand, the hardening depth of a voxel in the material to be hardened by means of light output control on a pixel level, and on the other hand, selective portions of the cross-sectional area to be hardened can be specifically overexposed per cross-sectional area without changing the properties of the imaging unit including the light source, by selectively exposing—per building plane/exposure cycle—through one or several successive digital masks (bitmaps), wherein furthermore the BLACK/WHITE raster (or, respectively, LIGHT/DARK raster and/or COLOR raster) within the mask may preferably be different from mask to mask and/or the exposure times per mask may be varied.
Due to the exposure by means of a raster mask, a matrix of so-called voxels (volume pixels) will be hardened in the material to be hardened, wherein the XY raster is predetermined by the size, number and arrangement of the pixels, and the height (=hardening depth) of the voxels in the material can be controlled by the multiple exposure. Furthermore, in preferred embodiments, the light intensity and/or the spectrum can be controlled specifically via the gray value and/or the color value (the latter through the wavelength or the wavelength range of the electromagnetic radiation) per pixel.
In accordance with the invention and depending on the requirement, special portions of the structure to be generated—i.e. only within the cross-sectional area to be hardened—can be identified and selected. In accordance with the invention, an energy input can be very efficiently influenced in relation to a specific cross-sectional area—defined by its contours—of the three-dimensional object. Most suitably, within a cross-sectional area defined by a first bitmap, a second bitmap—or further bitmaps—is generated, wherein the first and second (and possibly additional) bitmaps are superposed by multiple exposure. The second bitmap and the possibly additional bitmaps then respectively form partial masks within an overall mask formed by the first bitmap. In accordance with the invention, the terms “partial mask” and “within the overall mask” typically mean that—compared with the overall mask, relative to the same or a smaller cross-sectional area thereof—a smaller or several smaller area(s) is (are) exposed. Second and possibly additional bitmaps need not be identical but can be varied as desired within the overall mask of the first bitmap. Thus, the partial masks formed in addition to the overall mask can be identical or different, or different sub-partial masks can be formed.
According to the invention, a VOXEL matrix can be generated by multiple exposure within a predetermined, defined overall image area of the building plane. An offsetting of images in the building level per cross-sectional area can be advantageously dispensed with. By means of a voxel matrix formation, e.g. a supporting structure, overhangs and/or particularly small/filigree portions can be formed significantly finer and more accurately.
The sequence of use of the overall mask and the partial mask(s) can be randomly selected, i.e. “first”, “second” and “additional” bitmaps does not specify any time sequence but merely designates different bitmaps of the multiple mask exposure. Most suitably, however, the first bitmap is first used with the overall mask. The respective bitmaps can be generated via the corresponding software algorithms. Exposure times per overall mask and per partial mask can be additionally controlled independently from each other by an electromechanical shutter.
By means of the multiple mask exposure according to the invention, the hardening depth of every single voxel can be pixel-precisely controlled so that, overall, the quality of the constructed component with regard to surface quality, green compact hardness, accuracy in every detail, and tolerances can be improved, and the condition of necessary supporting structures can also be optimized.
The multiple mask exposure according to the invention also allows an “overexposure” in selected areas of the voxel matrix to be hardened which would not be possible via a mere gray value scaling within the bitmap since a gray value adjustment will principally eliminate light energy at least partially, which is basically undesirable. Yet, for further fine adjustment, it can be of particular advantage to perform gray value and/or color value adjustments within the first, the second, and/or the further bitmaps. Additional fine adjustment can be achieved thereby, while limiting simultaneously the number of bitmaps within the overall mask which would be necessary—without gray value and/or color value adjustment—for reaching an identical fine adjustment. The gray value and/or the color value adjustment can be done pixel-specific with individual pixels or a part of the pixels per bitmap or, respectively, partial bitmap.
A clever selection and sequence of masks for partial exposure within an exposure cycle per cross-sectional area, particular exposure strategies can be realized—e.g. for hardening of overhangs, overexposure of filigree structures and material accumulations, reduction of material shrinkage within a building plane, etc.
The generation of the further exposure masks will be technically preferably accomplished entirely by software, and it is thus very flexible and applicable for all mask projection systems based on SML technology.
According to a particular embodiment of the invention, additional parameters can be stored and applied—by means of an additional gray value and/or color channel coding of the bitmap on a pixel level—which influence the hardening depth of the voxel in the hardenable material; this includes influencing
Due to the gray value and/or color channel coding of an individual pixel, it is possible to make a fine correction of the exposure parameters within the bitmap.
An additional control parameter is offered by an individual exposure time per bitmap which can be controlled by a shutter. Only when the digital image has been completely built up by the imaging unit, the shutter will be opened and subsequently closed again.
The principle of the present invention with respect to device and method is applicable to various types or manners of producing a three-dimensional object. The building or construction may be carried out in layers (layer-wise), however alternatively independently from layers. Other design options are possible. For example, the hardening process can be carried out continuously without layers; discontinuously (either with same or different or variable layer thicknesses); partially continuously and partially discontinuously (discontinuously either with same or different or variable layer thicknesses); or in a combination of various possibilities. The device and process according to the present invention is particularly suitable for building a three-dimensional object in a voxel matrix independent from layers.
Further, using multiple bitmaps, or the application of first and second or further rastered masks, per cross-sectional area may be used for one or more cross-sectional area(s) of the three-dimensional object to be produced.
Overexposure of Supporting Structures
As illustrated schematically in
Based on the data structure, it is possible for respective cross-sectional areas within the entire component (in
Hardening Depth with Large Versus Filigree Cross-Sectional Area Structures/Overexposure of Filigree Structures
With larger structures, more light output per area will be available than with filigree structures; this phenomenon results in a different hardening in xy-expansion (beyond the contour) and z-expansion (depth) per cross-sectional area.
If, for example, a 10 mm×10 mm large area is exposed once, it will harden e.g. to a thickness of 130 μm; a structure of 2 mm×10 mm instead will harden only 100 μm with the same exposure time. If the component is now built e.g. in layers of 100 μm, it may happen that, in the filigree portion, the generated layers do not enter into sufficient chemical bonding due to overexposure (130 μm depth hardening up to 30% into the previous layer), that the layers will separate in this portion, and that the component is defective. This phenomenon is particularly critical with filigree supporting structures.
Additionally, larger cross-sectional areas 31 can be allocated to suitable gray values precisely per pixel, whereas smaller cross-sectional areas 32, 33 are allocated to lower gray values or without gray value (i.e. white) precisely per pixel to obtain an even more uniform hardening depth (Z) and hardening expansion (XY) over the entire structure to be exposed. That is, larger structure areas are thereby darkened in accordance with their expansion.
Higher Green Compact Hardness or, Respectively, Overexposure of Massive Structures, or Higher Material Accumulations within One Component
With some components, there are volume portions with an accumulation of material whose wall thickness on the one hand exceeds the maximum possible hardening depth of the material in post-hardening or which are in a position within the component not reached by light energy or only to a limited extent in the post-hardening process.
Already during the generating process, such volume portions can achieve a higher green compact hardness by being specifically overexposed. This can be carried out by multiple exposure of cross-sectional areas. Alternatively or additionally, this can also be carried out by corresponding gray value allocation of the following cross-sectional areas, wherein in the latter case, the hardening depth in Z should exceed the current solidification several-fold.
Furthermore, the exposure times for the partial bitmaps—used for the post/overexposure of the selected area—can be successively increased, depending on the desired hardening depth.
Exposure Strategy for the Reduction of Shrinkage
Here, the basic idea illustrated schematically in
Exposure Strategy for Overhangs
In order to be able to generate, at overhangs 41, a more stable solidification in the area of the overhang for a certain partial structure 40, e.g. the first 3 construction planes are at first left out in the overhang area in the exposure cycles so that corresponding solidifications are carried out only in the main component area 42. Only after that, the overhang area 41 will be exposed with multiple energy with the fourth exposure cycle. According to the invention, with the fourth exposure cycle, first it is exposed with the bitmap 1 exposing a total exposure area (i.e. main component area 40 and overhang areas 41 to the left and right thereof) with a predetermined exposure time t1; and then, it is re-exposed with a partial bitmap 2 which only covers the overhang areas 41 left and right, with a longer exposure time t2, e.g. 4 to 5 times the exposure time in comparison with the exposure time t1 of bitmap 1 (see
Formation of Complex Voxel Matrices by the Combination of Multiple Mask Exposure and Gray Value and/or Color Value Adjustment
Another advantageous exemplary embodiment by the formation of complex voxel matrices is shown by means of
For all above described applications, fine adjustment within the partial bitmaps is possible through pixel-precise color channel coding, i.e. the bitmap mask/exposure mask can comprise, per pixel, additional black/white, gray value and/or color information by which the exposure intensity within the bitmap is controlled precisely per pixel. Moreover, in all applications, the exposure times per bitmap may be adjusted independent from each other so that an additional parameter is provided for the selective hardening depth of the voxel matrix.
There are no limits regarding the sequence and the design of the exposure patterns per overall mask and per partial mask of the multiple exposure according to the invention. Care should only be taken that, with each partial exposure, at least that energy will be reached which is necessary to start hardening the material or to harden it thoroughly.
The described exemplary embodiments can be randomly combined with each other. They are furthermore only exemplary and not understood as restricting by any means. Rather, they can be readily modified to realize the principle according to the invention by other embodiments.
Number | Date | Country | Kind |
---|---|---|---|
10 2006 019 964 | Apr 2006 | DE | national |
This application is a continuation of U.S. patent application Ser. No. 11/796,745, filed on Apr. 26, 2007, now U.S. Pat. No. 7,894,921, which claims the benefit of U.S. Provisional Patent Application No. 60/796,160, filed on Apr. 28, 2006, the contents of each of which are hereby incorporated by reference in their entirety.
Number | Name | Date | Kind |
---|---|---|---|
4575330 | Hull | Mar 1986 | A |
4837379 | Weinberg | Jun 1989 | A |
4929402 | Hull | May 1990 | A |
4999143 | Hull et al. | Mar 1991 | A |
5093130 | Fujii et al. | Mar 1992 | A |
5137662 | Hull et al. | Aug 1992 | A |
5139338 | Pomerantz et al. | Aug 1992 | A |
5143663 | Leyden et al. | Sep 1992 | A |
5157423 | Zur | Oct 1992 | A |
5171490 | Fudim | Dec 1992 | A |
5173266 | Kenney | Dec 1992 | A |
5174931 | Almquist et al. | Dec 1992 | A |
5236637 | Hull | Aug 1993 | A |
5247180 | Mitcham et al. | Sep 1993 | A |
5248456 | Evans, Jr. et al. | Sep 1993 | A |
5254979 | Trevett et al. | Oct 1993 | A |
5263130 | Pomerantz et al. | Nov 1993 | A |
5268994 | Keskes | Dec 1993 | A |
5289214 | Zur | Feb 1994 | A |
5298208 | Sibley et al. | Mar 1994 | A |
5306446 | Howe | Apr 1994 | A |
5345391 | Hull et al. | Sep 1994 | A |
5360981 | Owen et al. | Nov 1994 | A |
5391072 | Lawton et al. | Feb 1995 | A |
5437820 | Brotz | Aug 1995 | A |
5447822 | Hull et al. | Sep 1995 | A |
5510077 | Dinh et al. | Apr 1996 | A |
5529473 | Lawton et al. | Jun 1996 | A |
5545367 | Bae et al. | Aug 1996 | A |
5569431 | Hull | Oct 1996 | A |
5571471 | Hull | Nov 1996 | A |
5630981 | Hull | May 1997 | A |
5651934 | Almquist et al. | Jul 1997 | A |
5653925 | Batchelder | Aug 1997 | A |
5823778 | Schmitt et al. | Oct 1998 | A |
5858746 | Hubbell et al. | Jan 1999 | A |
5876550 | Feygin et al. | Mar 1999 | A |
5891382 | Almquist et al. | Apr 1999 | A |
5894036 | Tylko | Apr 1999 | A |
5897825 | Fruth et al. | Apr 1999 | A |
5902537 | Almquist et al. | May 1999 | A |
5943235 | Earl et al. | Aug 1999 | A |
5945058 | Manners et al. | Aug 1999 | A |
5980813 | Narang et al. | Nov 1999 | A |
6013099 | Dinh et al. | Jan 2000 | A |
6027324 | Hull | Feb 2000 | A |
6048487 | Almquist et al. | Apr 2000 | A |
6051179 | Hagenau | Apr 2000 | A |
6078038 | Cooper et al. | Jun 2000 | A |
6124858 | Ge et al. | Sep 2000 | A |
6153034 | Lipsker | Nov 2000 | A |
6158946 | Miyashita | Dec 2000 | A |
6171610 | Vacanti et al. | Jan 2001 | B1 |
6180050 | Arai et al. | Jan 2001 | B1 |
6200646 | Neckers et al. | Mar 2001 | B1 |
6280727 | Prior et al. | Aug 2001 | B1 |
6281903 | Martin et al. | Aug 2001 | B1 |
6334865 | Redmond et al. | Jan 2002 | B1 |
6352710 | Sawhney et al. | Mar 2002 | B2 |
6391245 | Smith | May 2002 | B1 |
6500378 | Smith | Dec 2002 | B1 |
6501483 | Wong et al. | Dec 2002 | B1 |
6508971 | Leyden et al. | Jan 2003 | B2 |
6547552 | Fudim | Apr 2003 | B1 |
6600965 | Hull et al. | Jul 2003 | B1 |
6630009 | Moussa et al. | Oct 2003 | B2 |
6764636 | Allanic et al. | Jul 2004 | B1 |
6828068 | Progler et al. | Dec 2004 | B2 |
6833231 | Moussa et al. | Dec 2004 | B2 |
6833234 | Bloomstein et al. | Dec 2004 | B1 |
6942830 | Mulhaupt et al. | Sep 2005 | B2 |
6963319 | Pate et al. | Nov 2005 | B2 |
6974656 | Hinczewski | Dec 2005 | B2 |
6989225 | Steinmann | Jan 2006 | B2 |
6995830 | de Jager | Feb 2006 | B2 |
7006887 | Nagano et al. | Feb 2006 | B2 |
7034811 | Allen | Apr 2006 | B2 |
7052263 | John | May 2006 | B2 |
7073883 | Billow | Jul 2006 | B2 |
7083405 | Koyagi et al. | Aug 2006 | B2 |
7128866 | Henningsen | Oct 2006 | B1 |
7133041 | Kaufman et al. | Nov 2006 | B2 |
7195472 | John | Mar 2007 | B2 |
7215430 | Kacyra et al. | May 2007 | B2 |
7261542 | Hickerson et al. | Aug 2007 | B2 |
7403213 | Morgan et al. | Jul 2008 | B1 |
7467939 | Sperry et al. | Dec 2008 | B2 |
7568904 | Koyagi et al. | Aug 2009 | B2 |
7573561 | Fries | Aug 2009 | B2 |
7783371 | John et al. | Aug 2010 | B2 |
7785093 | Holmboe et al. | Aug 2010 | B2 |
7790093 | Shkolnik et al. | Sep 2010 | B2 |
7831328 | Schillen et al. | Nov 2010 | B2 |
20010028495 | Quate et al. | Oct 2001 | A1 |
20010048183 | Fujita | Dec 2001 | A1 |
20010048184 | Ueno | Dec 2001 | A1 |
20020028854 | Allanic et al. | Mar 2002 | A1 |
20020153640 | John | Oct 2002 | A1 |
20020155189 | John | Oct 2002 | A1 |
20030067539 | Doerfel et al. | Apr 2003 | A1 |
20030074096 | Das et al. | Apr 2003 | A1 |
20030173714 | Ueno | Sep 2003 | A1 |
20030205849 | Farnworth | Nov 2003 | A1 |
20040008309 | Yamahara et al. | Jan 2004 | A1 |
20040027363 | Allen | Feb 2004 | A1 |
20040028293 | Allen et al. | Feb 2004 | A1 |
20040118309 | Fedor et al. | Jun 2004 | A1 |
20050023710 | Brodkin et al. | Feb 2005 | A1 |
20050084766 | Sandstrom | Apr 2005 | A1 |
20050208168 | Hickerson et al. | Sep 2005 | A1 |
20050248061 | Shkolnik et al. | Nov 2005 | A1 |
20050248062 | Shkolnik et al. | Nov 2005 | A1 |
20050259785 | Zhang | Nov 2005 | A1 |
20050288813 | Yang et al. | Dec 2005 | A1 |
20060055724 | Krawczyk et al. | Mar 2006 | A1 |
20060078638 | Holmboe et al. | Apr 2006 | A1 |
20060192312 | Wahlstrom et al. | Aug 2006 | A1 |
20060239588 | Hull et al. | Oct 2006 | A1 |
20060249884 | Partanen et al. | Nov 2006 | A1 |
20070074659 | Wahlstrom | Apr 2007 | A1 |
20070075458 | Wahlstrom et al. | Apr 2007 | A1 |
20070075459 | Reynolds et al. | Apr 2007 | A1 |
20070075460 | Wahlstrom et al. | Apr 2007 | A1 |
20070075461 | Hunter et al. | Apr 2007 | A1 |
20070077323 | Stonesmith et al. | Apr 2007 | A1 |
20070120842 | Hess | May 2007 | A1 |
20070257055 | Scott et al. | Nov 2007 | A1 |
20070259066 | Sperry et al. | Nov 2007 | A1 |
20080038396 | John et al. | Feb 2008 | A1 |
20080054531 | Kerekes et al. | Mar 2008 | A1 |
20080055581 | Rogers et al. | Mar 2008 | A1 |
20080169586 | Hull et al. | Jul 2008 | A1 |
20080169589 | Sperry et al. | Jul 2008 | A1 |
20080170112 | Hull et al. | Jul 2008 | A1 |
20080179786 | Sperry et al. | Jul 2008 | A1 |
20080179787 | Sperry et al. | Jul 2008 | A1 |
20080181977 | Sperry et al. | Jul 2008 | A1 |
20080206383 | Hull et al. | Aug 2008 | A1 |
20080217818 | Holmboe et al. | Sep 2008 | A1 |
20080226346 | Hull et al. | Sep 2008 | A1 |
20080231731 | Hull | Sep 2008 | A1 |
20080309665 | Gregory, II | Dec 2008 | A1 |
Number | Date | Country |
---|---|---|
4105314 | Aug 1991 | DE |
4102257 | Jul 1992 | DE |
4125534 | Feb 1993 | DE |
9319405.6 | May 1994 | DE |
4340108 | Sep 1997 | DE |
19716240 | Oct 1998 | DE |
19727554 | Jan 1999 | DE |
29911122 | Nov 1999 | DE |
19838797 | Mar 2000 | DE |
19929199 | Jan 2001 | DE |
10003374 | Aug 2001 | DE |
10018987 | Oct 2001 | DE |
20106887 | Oct 2001 | DE |
69909136 | May 2004 | DE |
10256672 | Jun 2004 | DE |
102004022961 | Dec 2005 | DE |
102006019964 | Oct 2007 | DE |
0009040 | Apr 1980 | EP |
0250121 | Dec 1987 | EP |
0426363 | May 1991 | EP |
0435564 | Jul 1991 | EP |
0466422 | Jan 1992 | EP |
0484086 | May 1992 | EP |
0958912 | Nov 1999 | EP |
1250995 | Oct 2002 | EP |
1250997 | Oct 2002 | EP |
1270185 | Jan 2003 | EP |
1192041 | Mar 2003 | EP |
1156922 | Jun 2003 | EP |
1338846 | Aug 2003 | EP |
1744871 | Sep 2005 | EP |
01894705 | Sep 2005 | EP |
1894705 | Sep 2005 | EP |
1894705 | Sep 2005 | EP |
1674243 | Jun 2006 | EP |
1849586 | Oct 2007 | EP |
1849587 | Oct 2007 | EP |
1876012 | Jan 2008 | EP |
1880830 | Jan 2008 | EP |
1894704 | Mar 2008 | EP |
1950032 | Jul 2008 | EP |
2011631 | Jan 2009 | EP |
2266781 | Dec 2010 | EP |
2254194 | Jul 1975 | FR |
2583334 | Dec 1986 | FR |
2634686 | Feb 1990 | FR |
2692053 | Dec 1993 | FR |
2696035 | Mar 1994 | FR |
63313819 | Dec 1988 | JP |
04371829 | Dec 1992 | JP |
05304073 | Nov 1993 | JP |
070329191 | Dec 1995 | JP |
08150662 | Jun 1996 | JP |
08192469 | Jul 1996 | JP |
2001252986 | Sep 2001 | JP |
2003503232 | Jan 2003 | JP |
2005081807 | Mar 2005 | JP |
2007298990 | Nov 2007 | JP |
9511007 | Apr 1995 | WO |
9515841 | Jun 1995 | WO |
9600422 | Jan 1996 | WO |
WO0021735 | Apr 2000 | WO |
WO 0100390 | Jan 2001 | WO |
0112679 | Feb 2001 | WO |
0112679 | Feb 2001 | WO |
0112679 | Feb 2001 | WO |
0172501 | Oct 2001 | WO |
WO0227408 | Apr 2002 | WO |
03059184 | Jul 2003 | WO |
03059184 | Jul 2003 | WO |
WO2005110722 | Nov 2005 | WO |
WO2009053099 | Apr 2009 | WO |
Entry |
---|
“Rapid Prototyping Using Three-Dimensional Computer Vision”, -Koivunen et al.,University of Pennsylvania Department of Computer and Information Science Technical report No. MS-CIS-92070. 1992. |
“A Parameterized Mask Model for Lithography Simulation”, -Zhu. Cadence Research Labs, Berkeley, CA. DAC '09, Jul. 26-31, 2009. |
English translation of JP2001252986A, from Lexis Nexis Total Patent. |
English translation of JP2005081807A, from Lexis Nexis Total Patent. |
English abstract of JP2003503232T, from Lexis Nexis Total Patent. |
English translation of JP05304073A, from Lexis Nexis Total Patent. |
English abstract of JP63313819A, from Lexis Nexis Total Patent. |
English translation of JP07329191A, from Lexis Nexis Total Patent. |
Opposition to EP 2 011 631, dated Apr. 12, 2012. |
European Patent Office (EPO) Notice of Opposition, dated Feb. 25, 2013. |
Huang, et al., “Computer Supported Force Analysis and Layer Imagine for Masked Rapid Prototyping System” Department of Mechanical Engineering, National Taiwan University of Science and technology, Taipei, Taiwan. |
Huang, et al., “On-line force monitoring of platform ascending rapid prototyping system” Journal of Materials Processing Technology 159 (2005) 257-264. |
English translation of JP 08150662 from: http://www19.ipdl.inpit.go.jp/PA1/result/main/woYeaMaDA408150662P1.htm. |
English translation of DE10256672 from Lexis Nexis Total Patent. |
Burns, “Automatic Fabrication Improving Productivity in Manufacturing,” 1993 (ISBN 0-13-119462-3). |
Wohlers Report 2000. “Rapid Prototyping & Tooling State of the Industry Annual Worldwide Progress Report”, T. Wohlers, Wohlers Association, Inc. Fort Collins, Colorado (2000). |
Stark, G.B., et al., “Biological Matrices and Tissue Reconstruction,” Springer Publications, Berlin (1998). |
Sachs, E., et al., “Three Dimensional Printing: Rapid Tooling and Prototypes Directly from CAD Model,” Journal of Engineering for Industry, 114:481-488 (1992). |
Kuhtreiber, W., Ph.D., et al., “Cell Encapsulation Technology and Therapeutics,” Birkhauser, Boston (1998). |
Landers, R., and Mulhaupt, R., “Desktop Manufacturing of Complex Objects, Prototypes and Biomedical Scaffolds by means of Computer-Assisted Design Combined with Computer-Guided 3D Plotting of Polymers and Reactive Oligomers,” Macromolecular Materials and Engineering, 282:17-22 (2000). |
Okada, T., and Ikeda, Y., “Tissue Reactions to Subcutaneously Implanted, Surface-Modified Silicones,” Journal of Biomedical Materials Research, 27:1509-1518 (1993). |
Relou, I.A., et al., “Effect of Culture Conditions on Endothelial Cell Growth and Responsiveness,” Tissue & Cell, 30 (5):525-538 (1998). |
Nikolaychik, V.V., et al., A New, Cryoprecipitate Based Coating for Improved Endothelial Cell Attachment and Growth on Medical Grade Artificial Surfaces:, ASAIO Journal, 40:M846-M852 (1994). |
Burns, “Automated Fabrication-Improving Productivity in Manufacturing” ISBN 0-13-119462-3, pp. VIII-XI, 40-67, 87-88, 192-231, 259-266, (1993). |
IEEE Super Resolution article abstract vol. 20, issue 3, pp. 21-36, May 2003. |
Copy of 37 CFR 1.99 Submission and declaration. |
Htt://www.hp.com/hpinfo/newsroom/press/2004/040609a.html “HP technology doubles the resolution of digital projection displays,” Jun. 9, 2004. |
W. Allen, R. Ulichney, “Wobulation: Doubling the Addressed Resolution,” SID 05 Digest, 2005. |
Wobulation, saved as PDF from the internet; wikipedia definition, citing several resolution-relate patents. |
Opposition to EP 1,849,587 dated Apr. 8, 2010. |
C. Sun, et al., “Projection Micro-Stereolithography Using Digital Micro-Mirror Dynamic Mask,” Sensors and Actuators A121 (2005) 113-120. |
S. Ventura, et al., “Freeform Fabrication of Functional Silicon Nitride Components by Direct Photoshaping,” Mat. Res. Sol. Symp. Proc., vol. 625 (2000). |
K. Takahashi, “A New Application of DMD to Photolithography and Rapid Prototyping System,” Institute of Electronics, Information, and Communication Engineers. |
3D Systems, Inc. v. Envisiontec, Inc., et al. Special Masters Report and Recommendation on the Parties' Summary Judgement Motions. |
Number | Date | Country | |
---|---|---|---|
20110101570 A1 | May 2011 | US |
Number | Date | Country | |
---|---|---|---|
60796160 | Apr 2006 | US |
Number | Date | Country | |
---|---|---|---|
Parent | 11796745 | Apr 2007 | US |
Child | 13005281 | US |