Method for producing a three-dimensional object by means of mask exposure

Information

  • Patent Grant
  • 8815143
  • Patent Number
    8,815,143
  • Date Filed
    Wednesday, January 12, 2011
    13 years ago
  • Date Issued
    Tuesday, August 26, 2014
    10 years ago
Abstract
The invention describes device and method for producing a three-dimensional object by solidifying a solidifiable material under an action of electromagnetic radiation by means of energy input via an imaging unit comprising a predetermined number of discrete imaging elements (pixels). The energy input related to a specific cross-sectional area of the three-dimensional object is controlled by exposure by means of multiple successive raster masks (bitmaps; e.g. bitmap 1 and bitmap 2 and possibly additional ones). The imaging unit is suitably controllable such that at least two masks can be generated, including a first overall mask covering the cross-sectional area (bitmap 1; with pixel-specific area elements exposing in white light) and a partial mask (bitmap 2; in which only a fraction of the area elements are exposed pixel-specifically with white light) within the overall mask. A voxel matrix may be formed. A hardness depth per voxel (volume pixel) can be specifically and precisely influenced in the solidifyable material.
Description
TECHNICAL FIELD

The invention relates to a device and a method for producing a three-dimensional object by solidification of a solidifiable material under the action of electromagnetic radiation by means of energy input via an imaging unit comprising a specific number of discrete imaging elements (pixels). In particular, this invention relates to devices and methods in which the solidification of the material is based on the exposure by means of a raster mask, with the smallest physical resolution in the mask given by the size of a pixel and the Spatial Light Modulator (SLM) technology being applied for the imaging unit.


BACKGROUND ART

The literature specifies highly varying methods for the construction of three-dimensional objects of “light-hardening” photopolymers, cf. “Automated Fabrication—Improving Productivity in Manufacturing” by Marshall Burns, 1993 (ISBN 0-13-119462-3).


Known possibilities are, inter alia, the exposure by

  • a) multimedia projector
  • b) LC display (reflexive, transmissive)
  • c) LED or laser diode line (which is moved over an area orthogonally to the line)
  • d) light valve technology (MEMS).


These methods are described in the following patents:

  • US Patent US005247180A “Stereolithographic Apparatus and Method of use” by Texas Instruments Inc., September 1993;
  • US Patent US005980813A “Rapid Prototyping using multiple materials” by SRI International, November 1999;
  • Utility model publication DE G 93 19 405.6 “Device for the production of a three-dimensional object (model) according to the principle of photo solidification” by the Research Center Informatics at the University of Karlsruhe, December 1993;
  • According to a similar method, the utility model publication DE 299 11 122 U1 “Device for producing a three-dimensional object”, DeltaMed inter alia, June 1999 describes an application for the generation of micro-technical, three-dimensional components.


EP 1250997A (=US2002155189A) “Device for producing a three-dimensional object” by Envision Technologies GmbH, April 2002.


German Patent DE69909136T “Rapid Prototyping Device and Rapid Prototyping Method”, July 2003 (equivalent: European Patent EP 1156922 “Rapid Prototyping Apparatus and Method of Rapid Prototyping”, August 2003) of DICON AS Lystrup, Denmark.


WO 01/00390 A by HAP, Sitec Industrietechnologie and DELTAMED Medizinprodukte GmbH.


WO 2005/110722 A of Envisiontec GmbH.


With laser-based systems for photo-polymerization, the light output in the exposure point is provided by the energy setting of the laser beam, whereby the hardening depth of the photopolymer can be controlled in that point. To selectively harden a corresponding layer, the laser beam is scanned over the cross-sectional surface to be correspondingly hardened. The contours of the cross-sectional surface to be hardened can be scanned by the laser beam as a curve.


With systems for photo-polymerization based on mask projection by means of projection systems with the SLM technology, the advantage is that an entire cross-sectional area can be exposed at once. The light areas of the projected raster image harden the photopolymer voxel by voxel.


The disadvantage in projection systems with SLM technology is that the light output distribution over the image surface can be very inhomogeneous (up to 50% absolute), depending on

    • a) the light source used;
    • b) the optical system for coupling the light energy to the SLM; and
    • c) by the vignetting of the projection optics.


The change of the properties of the light source over the service life will result in a variable error and thus in a changing homogeneity distribution. Moreover, a change of the light intensity of the light source does not result in a selective change as with a laser but would affect the entire projection image.


A constant error is concerned in case of homogeneity deviations caused by the optical system for coupling the light energy to the SLM and the projection optics.


The contours of the cross-sectional surface to be hardened can only be presented in rasters; the resolution depends on the number of image points/pixels and on the size of the projected image.


Moreover, the light intensity varies depending on the size of the exposed surface structure (higher light intensity with larger, contiguous surfaces; lower light intensity with smaller, filigree surface structures).


With the above mentioned WO 01/00390 A, the intensity of beams is controlled by controlling the permeability of the mask, wherein the intensity may be controlled via the selection of gray levels of a transmission LCD.


In WO 2005/110722 A, a multiple exposure is carried out on the subpixel level per layer for improving the resolution along the outside and inside contours of the cross-sectional areas of the object to be generated, said exposure consisting of a sequence of a plurality of images offset on the subpixel level in the image/building plane, wherein a separate mask/bitmap is generated for every offset image.


Neither WO 01/00390 A nor WO 2005/110722 show how the resolution and the fine adjustment in the image plane can be improved and how native inhomogeneities of the light source can be balanced better.


OBJECT OF THE INVENTION

It is the object of the invention to improve device and method for the production of a three-dimensional object by solidification of a material solidifiable under the action of electromagnetic radiation, by means of energy input via an imaging unit comprising a prescribed number of discrete imaging elements (pixels) so that a higher precision, higher resolution and fine adjustment and/or a higher homogeneity of the system will be realized.


SOLUTION OF THE PROBLEM

According to the present invention, a device for producing a three-dimensional object is provided, the device comprising: an imaging unit comprising a predetermined number of discrete imaging elements (pixels) for energy input capable of solidifying a solidifyable material under an action of electromagnetic radiation; a computer unit, an IC and/or a software implementation; wherein the computer unit, the IC and/or the software implementation respectively has the ability of controlling the energy input with respect to a cross-sectional area of a three-dimensional object to be produced by exposure by means of multiple successive raster masks (bitmaps).


According to the present invention, there is also provided a device for producing a three-dimensional object, the device comprising: raster imaging unit comprising a predetermined number of discrete imaging elements (pixels) arranged as point, line or matrix, wherein the imaging unit composes, from the pixels, an image related to a specific cross sectional area of the three-dimensional object to be produced and thus forms a raster mask (bitmap); wherein the imaging unit is designed to provide energy input for solidifying a solidifiable material under an action of electromagnetic radiation; wherein the imaging unit is arranged to be controlled such that at least two masks can be generated, including: a first overall mask (bitmap 1) covering the cross-sectional area; and a partial mask (bitmap 2) within the overall mask.


The present invention also provides a method for producing a three-dimensional object, the method comprising: providing an imaging unit comprising a predetermined number of discrete imaging elements (pixels); solidifying a solidifyable material in a matrix of volume pixels (voxels) under an action of electromagnetic radiation by means of energy input via the imaging unit; wherein an energy input, with respect to a cross-sectional area of the three-dimensional object to be produced, for the solidification of a volume pixel in the material to be hardened is controlled by a succession of multiple raster bitmaps to influence the hardening depth per voxel (volume pixel) in the solidifyable material.


The present invention further provides a method for producing a three-dimensional object, the method comprising: providing imaging unit comprising a predetermined number of discrete imaging elements (pixels); solidifying a solidifiable material under an action of electromagnetic radiation by means of energy input via the imaging unit; wherein the imaging unit composes, from the pixels, an image related to a cross-sectional area of the three-dimensional object and thus forms a raster mask (bitmap), wherein at least two masks are used per cross-sectional area of the three-dimensional object, including: a first overall mask (bitmap 1) covering the cross-sectional area; and a partial mask (bitmap 2) within the overall mask.





BRIEF DESCRIPTION OF THE DRAWINGS


FIGS. 1A to 1C schematically show an example of the principle of the invention with using multiple bitmaps relative to a specific cross-sectional area, wherein FIG. 1A illustratively exemplifies a support structure to be produced, and FIGS. 1B and 1C respectively show bitmaps 1 and 2 to be used for generating support structures;



FIGS. 2A to 2C schematically show an example of the principle of the invention with using multiple bitmaps relative to a specific cross-sectional area, wherein FIG. 2A illustratively exemplifies a structure to be produced comprising a relatively large cross-sectional area, and FIGS. 2B and 2C respectively show bitmaps 1 and 2 to be used per cross-sectional area;



FIGS. 3A and 3B schematically illustrate a basic concept according to another embodiment of the present invention wherein a specific, predetermined cross-sectional area is irradiated in partial steps by successive bitmap patterns, including a bitmap pattern 1 (FIG. 3A) and bitmap pattern 2 (FIG. 3B);



FIG. 4 schematically shows an advantageous exemplary embodiment for the stabilization of overhangs; and



FIGS. 5A to 5C show a further advantageous exemplary embodiment for producing complex voxel matrices (FIG. 5A) while using multiple bitmaps, including a bitmap 1 (FIG. 5B) and a bitmap 2 (FIG. 5C) per X, Y cross-sectional area, in order to obtain different hardening depths in Z direction for the voxel matrix.





DESCRIPTION OF THE PREFERRED EMBODIMENTS AND THE ADVANTAGES OF THE INVENTION

The invention will be described in more detail on the basis of further exemplary embodiments with reference to the attached Figures; however, the invention is by no means limited to the described embodiments and examples and drawings but can instead comprise any variations and modifications within the scope of the claims.


Device and method according to the invention allow to remove the inhomogeneities in the image level and thus achieve higher precision, higher resolution and fine adjustment.


It is possible with the invention to control, on the one hand, the hardening depth of a voxel in the material to be hardened by means of light output control on a pixel level, and on the other hand, selective portions of the cross-sectional area to be hardened can be specifically overexposed per cross-sectional area without changing the properties of the imaging unit including the light source, by selectively exposing—per building plane/exposure cycle—through one or several successive digital masks (bitmaps), wherein furthermore the BLACK/WHITE raster (or, respectively, LIGHT/DARK raster and/or COLOR raster) within the mask may preferably be different from mask to mask and/or the exposure times per mask may be varied.


Due to the exposure by means of a raster mask, a matrix of so-called voxels (volume pixels) will be hardened in the material to be hardened, wherein the XY raster is predetermined by the size, number and arrangement of the pixels, and the height (=hardening depth) of the voxels in the material can be controlled by the multiple exposure. Furthermore, in preferred embodiments, the light intensity and/or the spectrum can be controlled specifically via the gray value and/or the color value (the latter through the wavelength or the wavelength range of the electromagnetic radiation) per pixel.


In accordance with the invention and depending on the requirement, special portions of the structure to be generated—i.e. only within the cross-sectional area to be hardened—can be identified and selected. In accordance with the invention, an energy input can be very efficiently influenced in relation to a specific cross-sectional area—defined by its contours—of the three-dimensional object. Most suitably, within a cross-sectional area defined by a first bitmap, a second bitmap—or further bitmaps—is generated, wherein the first and second (and possibly additional) bitmaps are superposed by multiple exposure. The second bitmap and the possibly additional bitmaps then respectively form partial masks within an overall mask formed by the first bitmap. In accordance with the invention, the terms “partial mask” and “within the overall mask” typically mean that—compared with the overall mask, relative to the same or a smaller cross-sectional area thereof—a smaller or several smaller area(s) is (are) exposed. Second and possibly additional bitmaps need not be identical but can be varied as desired within the overall mask of the first bitmap. Thus, the partial masks formed in addition to the overall mask can be identical or different, or different sub-partial masks can be formed.


According to the invention, a VOXEL matrix can be generated by multiple exposure within a predetermined, defined overall image area of the building plane. An offsetting of images in the building level per cross-sectional area can be advantageously dispensed with. By means of a voxel matrix formation, e.g. a supporting structure, overhangs and/or particularly small/filigree portions can be formed significantly finer and more accurately.


The sequence of use of the overall mask and the partial mask(s) can be randomly selected, i.e. “first”, “second” and “additional” bitmaps does not specify any time sequence but merely designates different bitmaps of the multiple mask exposure. Most suitably, however, the first bitmap is first used with the overall mask. The respective bitmaps can be generated via the corresponding software algorithms. Exposure times per overall mask and per partial mask can be additionally controlled independently from each other by an electromechanical shutter.


By means of the multiple mask exposure according to the invention, the hardening depth of every single voxel can be pixel-precisely controlled so that, overall, the quality of the constructed component with regard to surface quality, green compact hardness, accuracy in every detail, and tolerances can be improved, and the condition of necessary supporting structures can also be optimized.


The multiple mask exposure according to the invention also allows an “overexposure” in selected areas of the voxel matrix to be hardened which would not be possible via a mere gray value scaling within the bitmap since a gray value adjustment will principally eliminate light energy at least partially, which is basically undesirable. Yet, for further fine adjustment, it can be of particular advantage to perform gray value and/or color value adjustments within the first, the second, and/or the further bitmaps. Additional fine adjustment can be achieved thereby, while limiting simultaneously the number of bitmaps within the overall mask which would be necessary—without gray value and/or color value adjustment—for reaching an identical fine adjustment. The gray value and/or the color value adjustment can be done pixel-specific with individual pixels or a part of the pixels per bitmap or, respectively, partial bitmap.


A clever selection and sequence of masks for partial exposure within an exposure cycle per cross-sectional area, particular exposure strategies can be realized—e.g. for hardening of overhangs, overexposure of filigree structures and material accumulations, reduction of material shrinkage within a building plane, etc.


The generation of the further exposure masks will be technically preferably accomplished entirely by software, and it is thus very flexible and applicable for all mask projection systems based on SML technology.


According to a particular embodiment of the invention, additional parameters can be stored and applied—by means of an additional gray value and/or color channel coding of the bitmap on a pixel level—which influence the hardening depth of the voxel in the hardenable material; this includes influencing

    • a) the light intensity by the brightness value (gray values from white=255 to black=0), and
    • b) the spectrum (initiator and absorption behavior) through the color information.


Due to the gray value and/or color channel coding of an individual pixel, it is possible to make a fine correction of the exposure parameters within the bitmap.


An additional control parameter is offered by an individual exposure time per bitmap which can be controlled by a shutter. Only when the digital image has been completely built up by the imaging unit, the shutter will be opened and subsequently closed again.


The principle of the present invention with respect to device and method is applicable to various types or manners of producing a three-dimensional object. The building or construction may be carried out in layers (layer-wise), however alternatively independently from layers. Other design options are possible. For example, the hardening process can be carried out continuously without layers; discontinuously (either with same or different or variable layer thicknesses); partially continuously and partially discontinuously (discontinuously either with same or different or variable layer thicknesses); or in a combination of various possibilities. The device and process according to the present invention is particularly suitable for building a three-dimensional object in a voxel matrix independent from layers.


Further, using multiple bitmaps, or the application of first and second or further rastered masks, per cross-sectional area may be used for one or more cross-sectional area(s) of the three-dimensional object to be produced.


EXAMPLES OF THE APPLICATION

Overexposure of Supporting Structures


As illustrated schematically in FIG. 1A, it is an important objective to minimize supporting structures 20 in general and in particular their contact points 21 to the constructed component 10. This can be done by the supporting structure 20 gaining—during the building process—a higher inherent strength due to a higher degree of polymerization, which in turn can be achieved by an overexposure by means of the application of the concept in accordance with the invention.


Based on the data structure, it is possible for respective cross-sectional areas within the entire component (in FIG. 1A in a perspective view schematically indicated by the upper cross-sectional surface)—to distinguish supporting structure data from component data and thus—only for the bitmap areas of the supporting structures 20 and/or selectively for the contact points 21—to generate an additional partial bitmap 2 within the overall bitmap 1 (covering the entire cross-sectional area), bitmap 2 being connected in series to the first bitmap 1 with a defined, i.e. identical or different exposure time in relation to the first mask exposure and being superposed on it to thus achieve an over/post-exposure only in the area of the supporting structures (FIGS. 1B and 1C).


Hardening Depth with Large Versus Filigree Cross-Sectional Area Structures/Overexposure of Filigree Structures


With larger structures, more light output per area will be available than with filigree structures; this phenomenon results in a different hardening in xy-expansion (beyond the contour) and z-expansion (depth) per cross-sectional area.


If, for example, a 10 mm×10 mm large area is exposed once, it will harden e.g. to a thickness of 130 μm; a structure of 2 mm×10 mm instead will harden only 100 μm with the same exposure time. If the component is now built e.g. in layers of 100 μm, it may happen that, in the filigree portion, the generated layers do not enter into sufficient chemical bonding due to overexposure (130 μm depth hardening up to 30% into the previous layer), that the layers will separate in this portion, and that the component is defective. This phenomenon is particularly critical with filigree supporting structures.



FIG. 2A shows schematically an example with a large cross-sectional area 31 and filigree cross-sectional areas 32, 33. The overall cross-sectional area for the component to be generated is indicated, in a perspective view, schematically in FIG. 2A by means of the upper cross-sectional area. Based on suitable algorithms, the structures of different area expansions 31 or, respectively, 32 and 33 are identified in the cross-sectional image, and one or multiple corresponding partial bitmap(s) 2, which lie within the overall bitmap 1 (covering the entire cross-sectional area) and superposing the latter, is (are) are generated for re-exposure of the filigree structures and provided with a corresponding exposure time. The structuring depth of the partial bitmaps will here be left to the operator.


Additionally, larger cross-sectional areas 31 can be allocated to suitable gray values precisely per pixel, whereas smaller cross-sectional areas 32, 33 are allocated to lower gray values or without gray value (i.e. white) precisely per pixel to obtain an even more uniform hardening depth (Z) and hardening expansion (XY) over the entire structure to be exposed. That is, larger structure areas are thereby darkened in accordance with their expansion.


Higher Green Compact Hardness or, Respectively, Overexposure of Massive Structures, or Higher Material Accumulations within One Component


With some components, there are volume portions with an accumulation of material whose wall thickness on the one hand exceeds the maximum possible hardening depth of the material in post-hardening or which are in a position within the component not reached by light energy or only to a limited extent in the post-hardening process.


Already during the generating process, such volume portions can achieve a higher green compact hardness by being specifically overexposed. This can be carried out by multiple exposure of cross-sectional areas. Alternatively or additionally, this can also be carried out by corresponding gray value allocation of the following cross-sectional areas, wherein in the latter case, the hardening depth in Z should exceed the current solidification several-fold.


Furthermore, the exposure times for the partial bitmaps—used for the post/overexposure of the selected area—can be successively increased, depending on the desired hardening depth.


Exposure Strategy for the Reduction of Shrinkage


Here, the basic idea illustrated schematically in FIGS. 3A and 3B is that a predetermined cross-sectional area to be hardened (represented here by area 60 as part of a dark hatched overall cross-sectional area) is not exposed and hardened as a whole and at once, but exposed and hardened by supplementary, successive bitmap patterns, including a bitmap 1 pattern and a bitmap 2 pattern in partial steps (FIGS. 3A and 3B). As shown in FIG. 3A, the bitmap pattern 1 particularly suitably comprises, in the radiated area, a grid structure 61 having appropriate thicknesses of the respective grid strands, while the bitmap pattern 2 according to FIG. 3B fills the gaps 62 of the radiated area. Thus, the material is allowed, after the first partial hardening due to the first bitmap pattern 1, to reflow into the “spaces” formed by the material shrinkage, in order to be then hardened by the supplementary bitmap pattern 2. The respective bitmap patterns are not limited to those shown here. Also, overlapping of radiated areas of the bitmap patterns may be provided.


Exposure Strategy for Overhangs



FIG. 4 shows schematically an advantageous exemplary embodiment for the stabilization of overhangs.


In order to be able to generate, at overhangs 41, a more stable solidification in the area of the overhang for a certain partial structure 40, e.g. the first 3 construction planes are at first left out in the overhang area in the exposure cycles so that corresponding solidifications are carried out only in the main component area 42. Only after that, the overhang area 41 will be exposed with multiple energy with the fourth exposure cycle. According to the invention, with the fourth exposure cycle, first it is exposed with the bitmap 1 exposing a total exposure area (i.e. main component area 40 and overhang areas 41 to the left and right thereof) with a predetermined exposure time t1; and then, it is re-exposed with a partial bitmap 2 which only covers the overhang areas 41 left and right, with a longer exposure time t2, e.g. 4 to 5 times the exposure time in comparison with the exposure time t1 of bitmap 1 (see FIG. 4). Reference number 45 shows a carrier plate.


Formation of Complex Voxel Matrices by the Combination of Multiple Mask Exposure and Gray Value and/or Color Value Adjustment


Another advantageous exemplary embodiment by the formation of complex voxel matrices is shown by means of FIG. 5A to 5C. This is schematically explained only on a small partial area of 3×3 pixels; however, it is clear that the same principle can also be applied to other, especially larger areas with more pixels. To obtain the voxel matrix shown in FIG. 5A with three different hardening depths, a first exposure is carried out, relative to the cross-sectional area defined by x and y, by means of a mask generated with a first bitmap 1, wherein additional gray values are allocated to the two pixels for the lowest hardening depth (indicated in the Figure front left with reference sign 51), and white is allocated to the other pixels (no gray value; indicated in the Figure by reference sign 52). Then, relative to the same cross-sectional area defined by x and y, a second exposure is carried out through a partial mask generated with a second bitmap 2, wherein white is allocated to the two pixels for the highest hardening depth (no gray value; indicated in the Figure rear right, with reference sign 53), while the other pixels are entirely darkened (black; indicated by reference sign 54 in the Figure). As a result, a complex voxel matrix is obtained with only two exposure steps per cross-sectional area.


For all above described applications, fine adjustment within the partial bitmaps is possible through pixel-precise color channel coding, i.e. the bitmap mask/exposure mask can comprise, per pixel, additional black/white, gray value and/or color information by which the exposure intensity within the bitmap is controlled precisely per pixel. Moreover, in all applications, the exposure times per bitmap may be adjusted independent from each other so that an additional parameter is provided for the selective hardening depth of the voxel matrix.


There are no limits regarding the sequence and the design of the exposure patterns per overall mask and per partial mask of the multiple exposure according to the invention. Care should only be taken that, with each partial exposure, at least that energy will be reached which is necessary to start hardening the material or to harden it thoroughly.


The described exemplary embodiments can be randomly combined with each other. They are furthermore only exemplary and not understood as restricting by any means. Rather, they can be readily modified to realize the principle according to the invention by other embodiments.

Claims
  • 1. A method for producing a three-dimensional object, comprising: supplying solidification energy to a portion of a solidifiable material corresponding to a cross-section of the three-dimensional object in accordance with a first bitmap mask; andsupplying solidification energy to the portion of the solidifiable material corresponding to the cross-section of the three-dimensional object in accordance with a second bitmap mask, wherein the second bitmap mask is a partial mask within the first bitmap mask.
  • 2. The method of claim 1, wherein each of the first bitmap mask and the second bitmap mask includes a plurality of locations each having an associated gray value or color value that defines the energy input for a corresponding one of the discrete imaging elements.
  • 3. The method of claim 1, wherein the cross-section of the three-dimensional object has a first region and a second region, the first region and the second region are complementary to one another, the first bitmap mask defines energy inputs sufficient to solidify the solidifiable material for each of the discrete imaging elements corresponding to the first region, and the second bitmap mask defines energy inputs sufficient to solidify the solidifiable material for each of the discrete imaging elements corresponding to the second region.
  • 4. A method for producing a three-dimensional object, comprising: supplying solidification energy to a portion of a solidifiable material corresponding to a cross-section of the three-dimensional object in accordance with a first bitmap mask;supplying solidification energy to the portion of the solidifiable material corresponding to the cross-section of the three-dimensional object in accordance with a second bitmap mask, wherein the cross-section of the three-dimensional object has a first region and a second region, the first bitmap mask defines energy inputs sufficient to solidify the solidifiable material for each of a plurality of discrete imaging elements corresponding to the first region and the second region and the second bitmap defines energy inputs sufficient to solidify the solidifiable material for each of the discrete imaging elements in the plurality of discrete imaging elements corresponding to the second region but not those corresponding to the first region.
  • 5. The method of claim 4, wherein the first region has a first cross-sectional area, the second region has a second cross-sectional area, and the second cross-sectional area is less than the first cross-sectional area.
  • 6. The method of claim 4, wherein the multiple bitmap masks correspond to a first solidification depth for the first region and a second solidification depth for the second region, and the second solidification depth is greater than the first solidification depth.
  • 7. The method of claim 4, wherein the second region corresponds to an object overhang.
Priority Claims (1)
Number Date Country Kind
10 2006 019 964 Apr 2006 DE national
CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a continuation of U.S. patent application Ser. No. 11/796,745, filed on Apr. 26, 2007, now U.S. Pat. No. 7,894,921, which claims the benefit of U.S. Provisional Patent Application No. 60/796,160, filed on Apr. 28, 2006, the contents of each of which are hereby incorporated by reference in their entirety.

US Referenced Citations (142)
Number Name Date Kind
4575330 Hull Mar 1986 A
4837379 Weinberg Jun 1989 A
4929402 Hull May 1990 A
4999143 Hull et al. Mar 1991 A
5093130 Fujii et al. Mar 1992 A
5137662 Hull et al. Aug 1992 A
5139338 Pomerantz et al. Aug 1992 A
5143663 Leyden et al. Sep 1992 A
5157423 Zur Oct 1992 A
5171490 Fudim Dec 1992 A
5173266 Kenney Dec 1992 A
5174931 Almquist et al. Dec 1992 A
5236637 Hull Aug 1993 A
5247180 Mitcham et al. Sep 1993 A
5248456 Evans, Jr. et al. Sep 1993 A
5254979 Trevett et al. Oct 1993 A
5263130 Pomerantz et al. Nov 1993 A
5268994 Keskes Dec 1993 A
5289214 Zur Feb 1994 A
5298208 Sibley et al. Mar 1994 A
5306446 Howe Apr 1994 A
5345391 Hull et al. Sep 1994 A
5360981 Owen et al. Nov 1994 A
5391072 Lawton et al. Feb 1995 A
5437820 Brotz Aug 1995 A
5447822 Hull et al. Sep 1995 A
5510077 Dinh et al. Apr 1996 A
5529473 Lawton et al. Jun 1996 A
5545367 Bae et al. Aug 1996 A
5569431 Hull Oct 1996 A
5571471 Hull Nov 1996 A
5630981 Hull May 1997 A
5651934 Almquist et al. Jul 1997 A
5653925 Batchelder Aug 1997 A
5823778 Schmitt et al. Oct 1998 A
5858746 Hubbell et al. Jan 1999 A
5876550 Feygin et al. Mar 1999 A
5891382 Almquist et al. Apr 1999 A
5894036 Tylko Apr 1999 A
5897825 Fruth et al. Apr 1999 A
5902537 Almquist et al. May 1999 A
5943235 Earl et al. Aug 1999 A
5945058 Manners et al. Aug 1999 A
5980813 Narang et al. Nov 1999 A
6013099 Dinh et al. Jan 2000 A
6027324 Hull Feb 2000 A
6048487 Almquist et al. Apr 2000 A
6051179 Hagenau Apr 2000 A
6078038 Cooper et al. Jun 2000 A
6124858 Ge et al. Sep 2000 A
6153034 Lipsker Nov 2000 A
6158946 Miyashita Dec 2000 A
6171610 Vacanti et al. Jan 2001 B1
6180050 Arai et al. Jan 2001 B1
6200646 Neckers et al. Mar 2001 B1
6280727 Prior et al. Aug 2001 B1
6281903 Martin et al. Aug 2001 B1
6334865 Redmond et al. Jan 2002 B1
6352710 Sawhney et al. Mar 2002 B2
6391245 Smith May 2002 B1
6500378 Smith Dec 2002 B1
6501483 Wong et al. Dec 2002 B1
6508971 Leyden et al. Jan 2003 B2
6547552 Fudim Apr 2003 B1
6600965 Hull et al. Jul 2003 B1
6630009 Moussa et al. Oct 2003 B2
6764636 Allanic et al. Jul 2004 B1
6828068 Progler et al. Dec 2004 B2
6833231 Moussa et al. Dec 2004 B2
6833234 Bloomstein et al. Dec 2004 B1
6942830 Mulhaupt et al. Sep 2005 B2
6963319 Pate et al. Nov 2005 B2
6974656 Hinczewski Dec 2005 B2
6989225 Steinmann Jan 2006 B2
6995830 de Jager Feb 2006 B2
7006887 Nagano et al. Feb 2006 B2
7034811 Allen Apr 2006 B2
7052263 John May 2006 B2
7073883 Billow Jul 2006 B2
7083405 Koyagi et al. Aug 2006 B2
7128866 Henningsen Oct 2006 B1
7133041 Kaufman et al. Nov 2006 B2
7195472 John Mar 2007 B2
7215430 Kacyra et al. May 2007 B2
7261542 Hickerson et al. Aug 2007 B2
7403213 Morgan et al. Jul 2008 B1
7467939 Sperry et al. Dec 2008 B2
7568904 Koyagi et al. Aug 2009 B2
7573561 Fries Aug 2009 B2
7783371 John et al. Aug 2010 B2
7785093 Holmboe et al. Aug 2010 B2
7790093 Shkolnik et al. Sep 2010 B2
7831328 Schillen et al. Nov 2010 B2
20010028495 Quate et al. Oct 2001 A1
20010048183 Fujita Dec 2001 A1
20010048184 Ueno Dec 2001 A1
20020028854 Allanic et al. Mar 2002 A1
20020153640 John Oct 2002 A1
20020155189 John Oct 2002 A1
20030067539 Doerfel et al. Apr 2003 A1
20030074096 Das et al. Apr 2003 A1
20030173714 Ueno Sep 2003 A1
20030205849 Farnworth Nov 2003 A1
20040008309 Yamahara et al. Jan 2004 A1
20040027363 Allen Feb 2004 A1
20040028293 Allen et al. Feb 2004 A1
20040118309 Fedor et al. Jun 2004 A1
20050023710 Brodkin et al. Feb 2005 A1
20050084766 Sandstrom Apr 2005 A1
20050208168 Hickerson et al. Sep 2005 A1
20050248061 Shkolnik et al. Nov 2005 A1
20050248062 Shkolnik et al. Nov 2005 A1
20050259785 Zhang Nov 2005 A1
20050288813 Yang et al. Dec 2005 A1
20060055724 Krawczyk et al. Mar 2006 A1
20060078638 Holmboe et al. Apr 2006 A1
20060192312 Wahlstrom et al. Aug 2006 A1
20060239588 Hull et al. Oct 2006 A1
20060249884 Partanen et al. Nov 2006 A1
20070074659 Wahlstrom Apr 2007 A1
20070075458 Wahlstrom et al. Apr 2007 A1
20070075459 Reynolds et al. Apr 2007 A1
20070075460 Wahlstrom et al. Apr 2007 A1
20070075461 Hunter et al. Apr 2007 A1
20070077323 Stonesmith et al. Apr 2007 A1
20070120842 Hess May 2007 A1
20070257055 Scott et al. Nov 2007 A1
20070259066 Sperry et al. Nov 2007 A1
20080038396 John et al. Feb 2008 A1
20080054531 Kerekes et al. Mar 2008 A1
20080055581 Rogers et al. Mar 2008 A1
20080169586 Hull et al. Jul 2008 A1
20080169589 Sperry et al. Jul 2008 A1
20080170112 Hull et al. Jul 2008 A1
20080179786 Sperry et al. Jul 2008 A1
20080179787 Sperry et al. Jul 2008 A1
20080181977 Sperry et al. Jul 2008 A1
20080206383 Hull et al. Aug 2008 A1
20080217818 Holmboe et al. Sep 2008 A1
20080226346 Hull et al. Sep 2008 A1
20080231731 Hull Sep 2008 A1
20080309665 Gregory, II Dec 2008 A1
Foreign Referenced Citations (72)
Number Date Country
4105314 Aug 1991 DE
4102257 Jul 1992 DE
4125534 Feb 1993 DE
9319405.6 May 1994 DE
4340108 Sep 1997 DE
19716240 Oct 1998 DE
19727554 Jan 1999 DE
29911122 Nov 1999 DE
19838797 Mar 2000 DE
19929199 Jan 2001 DE
10003374 Aug 2001 DE
10018987 Oct 2001 DE
20106887 Oct 2001 DE
69909136 May 2004 DE
10256672 Jun 2004 DE
102004022961 Dec 2005 DE
102006019964 Oct 2007 DE
0009040 Apr 1980 EP
0250121 Dec 1987 EP
0426363 May 1991 EP
0435564 Jul 1991 EP
0466422 Jan 1992 EP
0484086 May 1992 EP
0958912 Nov 1999 EP
1250995 Oct 2002 EP
1250997 Oct 2002 EP
1270185 Jan 2003 EP
1192041 Mar 2003 EP
1156922 Jun 2003 EP
1338846 Aug 2003 EP
1744871 Sep 2005 EP
01894705 Sep 2005 EP
1894705 Sep 2005 EP
1894705 Sep 2005 EP
1674243 Jun 2006 EP
1849586 Oct 2007 EP
1849587 Oct 2007 EP
1876012 Jan 2008 EP
1880830 Jan 2008 EP
1894704 Mar 2008 EP
1950032 Jul 2008 EP
2011631 Jan 2009 EP
2266781 Dec 2010 EP
2254194 Jul 1975 FR
2583334 Dec 1986 FR
2634686 Feb 1990 FR
2692053 Dec 1993 FR
2696035 Mar 1994 FR
63313819 Dec 1988 JP
04371829 Dec 1992 JP
05304073 Nov 1993 JP
070329191 Dec 1995 JP
08150662 Jun 1996 JP
08192469 Jul 1996 JP
2001252986 Sep 2001 JP
2003503232 Jan 2003 JP
2005081807 Mar 2005 JP
2007298990 Nov 2007 JP
9511007 Apr 1995 WO
9515841 Jun 1995 WO
9600422 Jan 1996 WO
WO0021735 Apr 2000 WO
WO 0100390 Jan 2001 WO
0112679 Feb 2001 WO
0112679 Feb 2001 WO
0112679 Feb 2001 WO
0172501 Oct 2001 WO
WO0227408 Apr 2002 WO
03059184 Jul 2003 WO
03059184 Jul 2003 WO
WO2005110722 Nov 2005 WO
WO2009053099 Apr 2009 WO
Non-Patent Literature Citations (34)
Entry
“Rapid Prototyping Using Three-Dimensional Computer Vision”, -Koivunen et al.,University of Pennsylvania Department of Computer and Information Science Technical report No. MS-CIS-92070. 1992.
“A Parameterized Mask Model for Lithography Simulation”, -Zhu. Cadence Research Labs, Berkeley, CA. DAC '09, Jul. 26-31, 2009.
English translation of JP2001252986A, from Lexis Nexis Total Patent.
English translation of JP2005081807A, from Lexis Nexis Total Patent.
English abstract of JP2003503232T, from Lexis Nexis Total Patent.
English translation of JP05304073A, from Lexis Nexis Total Patent.
English abstract of JP63313819A, from Lexis Nexis Total Patent.
English translation of JP07329191A, from Lexis Nexis Total Patent.
Opposition to EP 2 011 631, dated Apr. 12, 2012.
European Patent Office (EPO) Notice of Opposition, dated Feb. 25, 2013.
Huang, et al., “Computer Supported Force Analysis and Layer Imagine for Masked Rapid Prototyping System” Department of Mechanical Engineering, National Taiwan University of Science and technology, Taipei, Taiwan.
Huang, et al., “On-line force monitoring of platform ascending rapid prototyping system” Journal of Materials Processing Technology 159 (2005) 257-264.
English translation of JP 08150662 from: http://www19.ipdl.inpit.go.jp/PA1/result/main/woYeaMaDA408150662P1.htm.
English translation of DE10256672 from Lexis Nexis Total Patent.
Burns, “Automatic Fabrication Improving Productivity in Manufacturing,” 1993 (ISBN 0-13-119462-3).
Wohlers Report 2000. “Rapid Prototyping & Tooling State of the Industry Annual Worldwide Progress Report”, T. Wohlers, Wohlers Association, Inc. Fort Collins, Colorado (2000).
Stark, G.B., et al., “Biological Matrices and Tissue Reconstruction,” Springer Publications, Berlin (1998).
Sachs, E., et al., “Three Dimensional Printing: Rapid Tooling and Prototypes Directly from CAD Model,” Journal of Engineering for Industry, 114:481-488 (1992).
Kuhtreiber, W., Ph.D., et al., “Cell Encapsulation Technology and Therapeutics,” Birkhauser, Boston (1998).
Landers, R., and Mulhaupt, R., “Desktop Manufacturing of Complex Objects, Prototypes and Biomedical Scaffolds by means of Computer-Assisted Design Combined with Computer-Guided 3D Plotting of Polymers and Reactive Oligomers,” Macromolecular Materials and Engineering, 282:17-22 (2000).
Okada, T., and Ikeda, Y., “Tissue Reactions to Subcutaneously Implanted, Surface-Modified Silicones,” Journal of Biomedical Materials Research, 27:1509-1518 (1993).
Relou, I.A., et al., “Effect of Culture Conditions on Endothelial Cell Growth and Responsiveness,” Tissue & Cell, 30 (5):525-538 (1998).
Nikolaychik, V.V., et al., A New, Cryoprecipitate Based Coating for Improved Endothelial Cell Attachment and Growth on Medical Grade Artificial Surfaces:, ASAIO Journal, 40:M846-M852 (1994).
Burns, “Automated Fabrication-Improving Productivity in Manufacturing” ISBN 0-13-119462-3, pp. VIII-XI, 40-67, 87-88, 192-231, 259-266, (1993).
IEEE Super Resolution article abstract vol. 20, issue 3, pp. 21-36, May 2003.
Copy of 37 CFR 1.99 Submission and declaration.
Htt://www.hp.com/hpinfo/newsroom/press/2004/040609a.html “HP technology doubles the resolution of digital projection displays,” Jun. 9, 2004.
W. Allen, R. Ulichney, “Wobulation: Doubling the Addressed Resolution,” SID 05 Digest, 2005.
Wobulation, saved as PDF from the internet; wikipedia definition, citing several resolution-relate patents.
Opposition to EP 1,849,587 dated Apr. 8, 2010.
C. Sun, et al., “Projection Micro-Stereolithography Using Digital Micro-Mirror Dynamic Mask,” Sensors and Actuators A121 (2005) 113-120.
S. Ventura, et al., “Freeform Fabrication of Functional Silicon Nitride Components by Direct Photoshaping,” Mat. Res. Sol. Symp. Proc., vol. 625 (2000).
K. Takahashi, “A New Application of DMD to Photolithography and Rapid Prototyping System,” Institute of Electronics, Information, and Communication Engineers.
3D Systems, Inc. v. Envisiontec, Inc., et al. Special Masters Report and Recommendation on the Parties' Summary Judgement Motions.
Related Publications (1)
Number Date Country
20110101570 A1 May 2011 US
Provisional Applications (1)
Number Date Country
60796160 Apr 2006 US
Continuations (1)
Number Date Country
Parent 11796745 Apr 2007 US
Child 13005281 US