Number | Date | Country | Kind |
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4126582 | Aug 1991 | DEX | |
4142481 | Dec 1991 | DEX |
Number | Date | Country |
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0159880 | Dec 1985 | EPX |
0194331 | Sep 1986 | EPX |
Entry |
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"Image Analysis Algorithm for Detection Defects in Repetitive Patterns" vol. 24, No. 85, Apr. 1991, Havant GB. |
Sobey et al., "Detection and Sizing Visual Features in Wood Using Total Measures and a Classification Algorithm", vol. 22, No. 4, 1989 Elmsford, N.Y. US. |
Patent Abstract of Japan, JP60124783, Meidensha KK, "Picture Processing Unit", Nov. 12, 1985. |
Patent Abstract of Japan, JP2252392, Ricoh Co. Ltd., "Picture Quality Evaluating Method", Dec. 12, 1990. |