using a design-rule based approach

Industry

CPC
G06T7/0006

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G06Computing G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL G06T7/00Image analysis

Current Industry

G06T7/0006using a design-rule based approach

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatus for aligning a lens holder in a small-height...
- Patent number 12,363,408
- Issue date Jul 15, 2025
- Zebra Technologies Corporation
- Carl D. Wittenberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mask inspection for semiconductor specimen fabrication
- Patent number 12,361,535
- Issue date Jul 15, 2025
- Applied Materials Israel Ltd.
- Ronen Madmon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Computer system, dimension measurement method, and storage medium
- Patent number 12,345,522
- Issue date Jul 1, 2025
- HITACHI HIGH-TECH CORPORATION
- Yutaka Okuyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and devices for detecting surface defects based on perceptu...
- Patent number 12,333,704
- Issue date Jun 17, 2025
- XI'AN MICROELECTRONICS TECHNOLOGY INSTITUTE
- Shuaibing Guo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Identifying object shape, rotation, and position for printing and q...
- Patent number 12,319,074
- Issue date Jun 3, 2025
- Optomatic LLC
- Joshua Jacques Slocumb
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection device and inspection method
- Patent number 12,313,564
- Issue date May 27, 2025
- Toyota Jidosha Kabushiki Kaisha
- Tomohiro Matsuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated turbine blade to shroud gap measurement
- Patent number 12,307,648
- Issue date May 20, 2025
- Baker Hughes Oilfield Operations LLC
- Clark A. Bendall
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for detecting product defect in detection image, computing d...
- Patent number 12,307,649
- Issue date May 20, 2025
- Hon Hai Precision Industry Co., Ltd.
- Jung-Hao Yang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning electron microscope device, semiconductor manufacturing de...
- Patent number 12,307,650
- Issue date May 20, 2025
- Samsung Electronics Co., Ltd.
- Yunje Cho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Control of a manufacturing process using contour curvature analysis...
- Patent number 12,299,868
- Issue date May 13, 2025
- Applied Materials Israel Ltd.
- Einat Frishman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Computing device for predicting a profile using deep learning and o...
- Patent number 12,299,869
- Issue date May 13, 2025
- Samsung Electronics Co., Ltd.
- Hyeok Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Experimental set up for studying temperature gradient driven cracking
- Patent number 12,288,320
- Issue date Apr 29, 2025
- University of South Carolina
- Travis Knight
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
FIB-SEM 3D tomography for measuring shape deviations of HAR structures
- Patent number 12,288,705
- Issue date Apr 29, 2025
- Carl Zeiss SMT GmbH
- Amir Avishai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Parameterizing x-ray scattering measurement using slice-and-image t...
- Patent number 12,288,706
- Issue date Apr 29, 2025
- Carl Zeiss SMT GmbH
- Hans Michael Stiepan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for predicting substrate image
- Patent number 12,271,114
- Issue date Apr 8, 2025
- ASML Netherlands B.V.
- Scott Anderson Middlebrooks
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Battery cell electrode alignment inspection method for battery pack...
- Patent number 12,266,093
- Issue date Apr 1, 2025
- Hyundai Motor Company
- Hokyeong Oh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fabricated layout correlation
- Patent number 12,260,160
- Issue date Mar 25, 2025
- Battelle Memorial Institute
- Adam Kimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method of measuring uniformity based on pupil image a...
- Patent number 12,260,539
- Issue date Mar 25, 2025
- Samsung Electronics Co., Ltd.
- Minho Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Stack assist system
- Patent number 12,258,215
- Issue date Mar 25, 2025
- SAT Technologies USA Holdings, Inc.
- Marcel van Schijndel
- B66 - HOISTING LIFTING HAULING
Information Patent Grant
Automated bot for error-free racking-stacking
- Patent number 12,254,332
- Issue date Mar 18, 2025
- RELIANCE JIO INFOCOMM USA, INC.
- Arun Rajagopal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Intelligent real-time defect prediction, detection, and AI driven a...
- Patent number 12,254,383
- Issue date Mar 18, 2025
- Accenture Global Solutions Limited
- Shoban Babu Balasubramani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Real-time anomaly detection for industrial processes
- Patent number 12,253,849
- Issue date Mar 18, 2025
- Intel Corporation
- Tara K. Thimmanaik
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for real-time quality control of a film in a sp...
- Patent number 12,255,110
- Issue date Mar 18, 2025
- Samsung Electronics Co., Ltd.
- Gaurav Kumar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for inspection of IC devices
- Patent number 12,254,613
- Issue date Mar 18, 2025
- Battelle Memorial Institute
- Nicholas Darby
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Ingot growing apparatus and monitoring method thereof
- Patent number 12,247,939
- Issue date Mar 11, 2025
- SK SILTRON CO., LTD.
- Min Jae Yoon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for scanning wafer
- Patent number 12,243,218
- Issue date Mar 4, 2025
- Taiwan Semiconductor Manufacturing Company Ltd.
- Pei-Hsuan Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Localization of lens focus parameter estimation and subsequent came...
- Patent number 12,236,643
- Issue date Feb 25, 2025
- Edge 3 Technologies
- Tarek El Dokor
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Unit or an apparatus for controlling or managing products or rolls
- Patent number 12,234,047
- Issue date Feb 25, 2025
- Pulsar S.r.l.
- Massimo Franzaroli
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Variation trimming for re-programmable and/or reconfigurable analog...
- Patent number 12,236,179
- Issue date Feb 25, 2025
- ASPINITY, INC.
- Brandon David Rumberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fully automated SEM sampling system for e-beam image enhancement
- Patent number 12,230,013
- Issue date Feb 18, 2025
- ASML Netherlands B.V.
- Wentian Zhou
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
LEATHER DEFECT DETECTION SYSTEM
- Publication number 20250232428
- Publication date Jul 17, 2025
- Feng Chia University
- Sze Teng LIONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRAINING A MACHINE LEARNING PROCESS FOR USE IN EVALUATING A SUBSTRATE
- Publication number 20250232430
- Publication date Jul 17, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Boaz Dudovich
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR REGISTRATION BETWEEN IMAGES INFORMATIVE OF...
- Publication number 20250225646
- Publication date Jul 10, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Ishai SCHWARZBAND
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CREEPAGE STAGE DETERMINATION SYSTEMS AND METHODS FOR ALUMINUM-CONTA...
- Publication number 20250225641
- Publication date Jul 10, 2025
- HEFEI GENERAL MACHINERY RESEARCH INSTITUTE CO., LTD
- Tao CHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEGMENTATION-BASED CARE AREA SETUP FOR INSPECTION OF A SPECIMEN USI...
- Publication number 20250225640
- Publication date Jul 10, 2025
- KLA Corporation
- Raja Barnwal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STABILIZATION OF A MANUFACTURING PROCESS OF A SPECIMEN BY SHAPE ANA...
- Publication number 20250225642
- Publication date Jul 10, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Einat FRISHMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT REGION DETECTION DEVICE AND WAFER DEFECT DETECTION SYSTEM IN...
- Publication number 20250217960
- Publication date Jul 3, 2025
- Samsung Electronics Co., Ltd.
- Minsu Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for manufacturing and inspecting a factory joint during inst...
- Publication number 20250217961
- Publication date Jul 3, 2025
- NEXANS
- Espen DOEDENS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Stack Assist System
- Publication number 20250214777
- Publication date Jul 3, 2025
- SAT Technologies USA Holdings, Inc.
- Marcel van Schijndel
- B66 - HOISTING LIFTING HAULING
Information Patent Application
CROSSTALK CORRECTION FOR IMAGES OF SEMICONDUCTOR SPECIMENS
- Publication number 20250209604
- Publication date Jun 26, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Lior AKERMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMPROVEMENTS IN OR RELATING TO INSPECTION AND QUALITY CONTROL
- Publication number 20250209605
- Publication date Jun 26, 2025
- Cheyney Design & Development Ltd.
- Richard Parmee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DESIGN TO FABRICATED LAYOUT CORRELATION
- Publication number 20250209243
- Publication date Jun 26, 2025
- Battelle Memorial Institute
- Adam Kimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCREW CONSTRUCTION INFERENCE DEVICE, SCREW CONSTRUCTION INFERENCE M...
- Publication number 20250208056
- Publication date Jun 26, 2025
- THE JAPAN STEEL WORKS, LTD
- Tomoya ODA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION METHOD, SYSTEM, AND APPARATUS, DEVICE, STORAGE ME...
- Publication number 20250200740
- Publication date Jun 19, 2025
- CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) LIMITED
- Yinhang TU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED BOT FOR ERROR-FREE RACKING-STACKING
- Publication number 20250199831
- Publication date Jun 19, 2025
- RELIANCE JIO INFOCOMM USA, INC.
- Arun Rajagopal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
UNIT OR AN APPARATUS FOR CONTROLLING OR MANAGING PRODUCTS OR ROLLS
- Publication number 20250187767
- Publication date Jun 12, 2025
- PULSAR S.R.L.
- Massimo FRANZAROLI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CORRECTING RULE VIOLATIONS IN A LAYOUT
- Publication number 20250190673
- Publication date Jun 12, 2025
- D2S, INC.
- Mariusz A. Niewczas
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD OF FINDING PIXEL-TO-DESIGN TARGET FOR DRAM INSPEC...
- Publication number 20250191171
- Publication date Jun 12, 2025
- KLA Corporation
- Jun Jiang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Systems and Methods for Inspection of IC Devices
- Publication number 20250191172
- Publication date Jun 12, 2025
- Battelle Memorial Institute
- Nicholas Darby
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR OVERLAY METROLOGY USING A PHASE MASK
- Publication number 20250191170
- Publication date Jun 12, 2025
- KLA Corporation
- Iftach Galon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Voice Coil Winding Real-Time Quality Control Method, System, And Co...
- Publication number 20250173854
- Publication date May 29, 2025
- AAC Microtech (Changzhou) Co., Ltd.
- Zhichen Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR INSPECTING VEHICLE BRAKE PADS
- Publication number 20250173686
- Publication date May 29, 2025
- Valvoline Licensing and Intellectual Property LLC
- Adam Sworski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY INSPECTION DEVICE AND X-RAY INSPECTION METHOD
- Publication number 20250172509
- Publication date May 29, 2025
- SK On Co., Ltd.
- Hyung Joon KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND DEVICES FOR DETECTING SURFACE DEFECTS BASED ON PERCEPTU...
- Publication number 20250166160
- Publication date May 22, 2025
- XI'AN MICROELECTRONICS TECHNOLOGY INSTITUTE
- Shuaibing GUO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR DEFECT LOCATION BINNING IN CHARGED-PARTICLE...
- Publication number 20250166166
- Publication date May 22, 2025
- ASML NETHERLANDS B.V.
- Shengcheng JIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATIC DETECTION OF MASK DEFECTS IN SEMICONDUCTOR PROCESSING
- Publication number 20250166159
- Publication date May 22, 2025
- International Business Machines Corporation
- Choong Ho Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR EMPLOYING ADAPTIVE PIXEL SELECTOR TECHNIQUES...
- Publication number 20250157094
- Publication date May 15, 2025
- Bank of America Corporation
- Kumar Gaurav Gupta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE MEASURING APPARATUS AND PROGRAM
- Publication number 20250116503
- Publication date Apr 10, 2025
- Mitutoyo Corporation
- Hiroyuki Yoshida
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE MEASURING APPARATUS
- Publication number 20250116504
- Publication date Apr 10, 2025
- Mitutoyo Corporation
- Hiroyuki Yoshida
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ACTIVE LEARNING TO IMPROVE WAFER DEFECT CLASSIFICATION
- Publication number 20250117921
- Publication date Apr 10, 2025
- ASML NETHERLANDS B.V.
- Blagorodna ILIEVSKA ALCHEVA
- G06 - COMPUTING CALCULATING COUNTING

using a design-rule based approach

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Methods and apparatus for aligning a lens holder in a small-height...

Mask inspection for semiconductor specimen fabrication

Computer system, dimension measurement method, and storage medium

Methods and devices for detecting surface defects based on perceptu...

Identifying object shape, rotation, and position for printing and q...

Inspection device and inspection method

Automated turbine blade to shroud gap measurement

Method for detecting product defect in detection image, computing d...

Scanning electron microscope device, semiconductor manufacturing de...

Control of a manufacturing process using contour curvature analysis...

Computing device for predicting a profile using deep learning and o...

Experimental set up for studying temperature gradient driven cracking

FIB-SEM 3D tomography for measuring shape deviations of HAR structures

Parameterizing x-ray scattering measurement using slice-and-image t...

Method and apparatus for predicting substrate image

Battery cell electrode alignment inspection method for battery pack...

Fabricated layout correlation

Apparatus and method of measuring uniformity based on pupil image a...

Stack assist system

Automated bot for error-free racking-stacking

Intelligent real-time defect prediction, detection, and AI driven a...

Real-time anomaly detection for industrial processes

Methods and systems for real-time quality control of a film in a sp...

Systems and methods for inspection of IC devices

Ingot growing apparatus and monitoring method thereof

Method and system for scanning wafer

Localization of lens focus parameter estimation and subsequent came...

Unit or an apparatus for controlling or managing products or rolls

Variation trimming for re-programmable and/or reconfigurable analog...

Fully automated SEM sampling system for e-beam image enhancement

Patents Applicationslast 30 patents

LEATHER DEFECT DETECTION SYSTEM

TRAINING A MACHINE LEARNING PROCESS FOR USE IN EVALUATING A SUBSTRATE

SYSTEMS AND METHODS FOR REGISTRATION BETWEEN IMAGES INFORMATIVE OF...

CREEPAGE STAGE DETERMINATION SYSTEMS AND METHODS FOR ALUMINUM-CONTA...

SEGMENTATION-BASED CARE AREA SETUP FOR INSPECTION OF A SPECIMEN USI...

STABILIZATION OF A MANUFACTURING PROCESS OF A SPECIMEN BY SHAPE ANA...

DEFECT REGION DETECTION DEVICE AND WAFER DEFECT DETECTION SYSTEM IN...

Method for manufacturing and inspecting a factory joint during inst...

Stack Assist System

CROSSTALK CORRECTION FOR IMAGES OF SEMICONDUCTOR SPECIMENS

IMPROVEMENTS IN OR RELATING TO INSPECTION AND QUALITY CONTROL

DESIGN TO FABRICATED LAYOUT CORRELATION

SCREW CONSTRUCTION INFERENCE DEVICE, SCREW CONSTRUCTION INFERENCE M...

DEFECT INSPECTION METHOD, SYSTEM, AND APPARATUS, DEVICE, STORAGE ME...

AUTOMATED BOT FOR ERROR-FREE RACKING-STACKING

UNIT OR AN APPARATUS FOR CONTROLLING OR MANAGING PRODUCTS OR ROLLS

CORRECTING RULE VIOLATIONS IN A LAYOUT

SYSTEM AND METHOD OF FINDING PIXEL-TO-DESIGN TARGET FOR DRAM INSPEC...

Systems and Methods for Inspection of IC Devices

SYSTEM AND METHOD FOR OVERLAY METROLOGY USING A PHASE MASK

Voice Coil Winding Real-Time Quality Control Method, System, And Co...

SYSTEM AND METHOD FOR INSPECTING VEHICLE BRAKE PADS

X-RAY INSPECTION DEVICE AND X-RAY INSPECTION METHOD

METHODS AND DEVICES FOR DETECTING SURFACE DEFECTS BASED ON PERCEPTU...

SYSTEMS AND METHODS FOR DEFECT LOCATION BINNING IN CHARGED-PARTICLE...

AUTOMATIC DETECTION OF MASK DEFECTS IN SEMICONDUCTOR PROCESSING

SYSTEM AND METHOD FOR EMPLOYING ADAPTIVE PIXEL SELECTOR TECHNIQUES...

IMAGE MEASURING APPARATUS AND PROGRAM

IMAGE MEASURING APPARATUS

ACTIVE LEARNING TO IMPROVE WAFER DEFECT CLASSIFICATION