Claims
- 1. A method of forming a copper oxide superconducting material comprising the steps of:
- forming a copper oxide superconducting material having a superconducting molecular structure; and
- adding a halogen into said copper oxide superconducting material by heat diffusion after the formation of said copper oxide superconducting material.
- 2. The method of claim 1, further comprising the step of annealing said superconducting material.
- 3. The method of claim 1, wherein said halogen is added at a concentration of 1/100% to 200% of oxygen vacancies.
- 4. The method of claim 1, wherein said superconducting material is single or polycrystalline.
- 5. The method of claim 1 wherein said halogen element is selected from the group consisting of fluorine, iodine and bromine.
- 6. The method of claim 1 further comprising the step of forming a passivation film on said copper oxide superconducting material either before of after adding said halogen element.
- 7. The method of claim 6 wherein said passivation film comprises a material selected from the group consisting of silicon nitride, aluminum nitride, aluminum oxide, tantalum oxide, titanium oxide, copper oxide, barium oxide and yttrium oxide.
- 8. A method of forming an oxide superconducting material comprising:
- preparing a copper oxide superconducting material having a superconducting molecular structure; and
- adding a halogen element into said copper oxide superconducting material by ion injection after the formation of said copper oxide superconducting material.
- 9. The method of claim 8, further comprising the step of thermal annealing said superconducting material.
- 10. The method of claim 8, wherein said halogen is fluorine.
- 11. The method of claim 8 wherein said halogen element is selected from the group consisting of fluorine, iodine and bromine.
- 12. The method of claim 8 further comprising the step of forming a passivation film on said copper oxide superconducting material either before of after adding said halogen element.
- 13. The method of claim 12 wherein said passivation film comprises a material selected from the group consisting of silicon nitride, aluminum nitride, aluminum oxide, tantalum oxide, titanium oxide, copper oxide, barium oxide and yttrium oxide.
- 14. A method of forming a copper oxide superconducting material comprising the steps of:
- forming a copper oxide superconducting material having a superconducting molecular structure; and
- adding a halogen element into said copper oxide superconducting material by heat diffusion or ion injection after forming said copper oxide superconducting material in order to set a suitable atomic arrangement, wherein said copper oxide superconducting material is (A.sub.1-x B.sub.x).sub.y Cu.sub.z O.sub.w X.sub.v,
- where A is one or more elements selected from Group IIa of the periodic table, Bis one or more elements of alkaline metals, X is said halogen element and x=0-1.0, y=2.0 -4.0, z=1.0-4.0, w=4.0-8.0 and v=0.01 to 3.0.
- 15. The method of claim 14, further comprising the step of annealing said superconducting material.
- 16. The method of claim 14, wherein said halogen is added at a concentration of 1/100% to 200% of oxygen vacancies.
- 17. The method of claim 14, wherein said superconducting material is single or polycrystalline.
- 18. The method of claim 14 wherein said halogen element is selected from the group consisting of fluorine, iodine and bromine.
- 19. The method of claim 14 further comprising the step of forming a passivation film on said copper oxide superconducting material either before of after adding said halogen element.
- 20. The method of claim 19 wherein said passivation film comprises a material selected from the group consisting of silicon nitride, aluminum nitride, aluminum oxide, tantalum oxide, titanium oxide, copper oxide, barium oxide and yttrium oxide.
Priority Claims (2)
Number |
Date |
Country |
Kind |
62-111614 |
May 1987 |
JPX |
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62-138580 |
Jun 1987 |
JPX |
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Parent Case Info
This application is a continuation of Ser. No. 07/463,920, filed Jan. 10, 1990, now abandoned, which itself was a divisional of application Ser. No. 07/190,352, filed May 5, 1988, now U.S. Pat. No. 4,916,116.
US Referenced Citations (1)
Number |
Name |
Date |
Kind |
4567061 |
Hayashi et al. |
Jan 1986 |
|
Foreign Referenced Citations (1)
Number |
Date |
Country |
61-039321 |
Feb 1986 |
JPX |
Non-Patent Literature Citations (3)
Entry |
Kawazaki et al., "Compositional and Structural analyses for Optimizing the Preparation conditions of superconducting (La.sub.1-x Sr.sub.x).sub.y CuO.sub.4-.delta. films by sputtering" Jpn. J. Appl. Phys. 26(4) Apr. 1987, L388-390. |
Politis et al., "Preparation and superconducting properties of La.sub.1.8 Sr.sub.0.2 CuO.sub.4 and YBa.sub.2 Cu.sub.3 O.sub.6.5 " Extended Abstract, edited by Gubser et al., Apr. 1987, pp. 141-143. |
Tonouchi et al., "Hall Coefficient of La-Sr-Cu Oxide Superconducting Compound", Jpn. J. Appl. Phys. 26(4) Apr. 1987, L519-520. |
Divisions (1)
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Number |
Date |
Country |
Parent |
190352 |
May 1988 |
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Continuations (1)
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Number |
Date |
Country |
Parent |
463920 |
Jan 1990 |
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