Number | Date | Country | Kind |
---|---|---|---|
62-185297 | Jul 1987 | JPX |
Number | Name | Date | Kind |
---|---|---|---|
3562555 | Ahrons | Feb 1971 | |
4216389 | Carter | Aug 1980 | |
4409501 | Eickerman et al. | Oct 1983 | |
4451742 | Aswell | May 1984 | |
4654829 | Jiang et al. | Mar 1987 | |
4712196 | Uesugi | Dec 1987 | |
4788454 | Tanagawa et al. | Nov 1988 |
Entry |
---|
J. of Sol. St. Circuits: "A Reliable 1-Mbit Dram with a Multi-Bit-Test Mode", by M. Kumanoya et al., vol. SC-20, No. 5, 10/85: pp. 909-913. |
IEEE J. of Sol. St. Circuits: "A Fast 256X4 CMOS Dram with a Distributed Sense and Unique Restore Circuit", by H. Miyamoto et al., vol. SC-22, No. 5, 10/87: pp. 861-867. |
Weste, Neil: Principles of CMOS VLSI Design, a System Perspective, Addison-Wesley Publishing Co., Reading, Mass., 1985: pp. 227-229. |