Science, vol. 220, pp. 43-44, Apr. 1, 1983, Robinson-in 250/306, "IBM Images Surfaces by Electron Tunneling". |
Science News, vol. 123, p. 213, Apr. 2, 1983-Thomsen-in 250/306, "Tunneling Electrons for Microscopy". |
Physical Review Letter; pp. 57-60, Jul. 5, 1972-Binning et al., "Surface Studies by Scanning Tunneling Microscopy". |
Physics Today, pp. 21-22, Apr. 1982, "Microscopy by Vacuum Tunneling". |
G. Binnig et al., "Surface Studies by Scanning Tunneling Microscopy", Physical Review Letters, pp. 57-61, Jul. 5, 1982. |
G. Binning et al., "7.times.7 Reconstruction on Si(111)Resolved in Real Space", Physical Review Letters, pp. 120-123, Jan. 10, 1983. |
Peter Gwynne, "IBM Researchers Utilize Vacuum Tunneling for High-Resolution Microscopy Technique", Industrial Research & Development, pp. 72-73, May 1983. |
B. Kazan et al., "Image-Storage Panels Based on Field-Effect Control of Conductivity", Proceedings of the IEEE, vol. 56(3), pp. 285-295, Mar. 1968. |
James A. Amick, "A Review of Electrofax Behavior", RCA Review, pp. 753-769, Dec. 1959. |
Dessaner & Clark, "Xerography & Related Processes", The Focal Press, pp. 59-61, 1965. |
M. E. Mochel et al., "Electron Beam Writing on a 20-.ANG. Scale in Metal .beta.-Aluminas", Applied Physics Letters, vol. 42(4), pp. 392-394, Feb. 15, 1983. |